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` Exhibit 6
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 2 of 14
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`U.S. Patent No. 6,807,505 (“’505 Patent”)
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`Accused Products
`Apple products including computers containing JEDEC DDR4 SDRAM and related versions, such as the Apple Mac Pro
`(“Apple Mac Pro”) infringe at least Claim 1 of the ’505 Patent.
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`Claim 1
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`Claim 1
`1[pre]. An electronic circuit comprising:
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`Apple Mac Pro
`To the extent the preamble is limiting, the Apple Mac Pro comprises an electronic
`circuit as claimed.
`For example, the Apple Mac Pro includes at least 32GB of 2666MHz DDR4 ECC
`memory compliant to DDR4 JEDEC Standard JESD79-4, Sep. 2012.
`See, e.g.:
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`1
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 3 of 14
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`Claim 1
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`Apple Mac Pro
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`1[a] a plurality of input/output (I/O)
`nodes for connecting the electronic
`circuit to a further electronic circuit via
`interconnects,
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`https://www.apple.com/mac-pro/specs/
`The Apple Mac Pro comprises a plurality of input/output (I/O) nodes for connecting the
`electronic circuit to a further electronic circuit via interconnects.
`For example, the DDR4 memory within the Apple Mac Pro includes a plurality of I/O
`pins/nodes, such as BA0-1, BG0-1, A0-A9, A10/AP, A11, A12/BC_n, A13,
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`2
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 4 of 14
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`Claim 1
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`Apple Mac Pro
`WE_n/A14, CAS_n/A15, RAS_n/A16, RESET_n, CKE, ACT_n, ODT, CLK_t,
`CLK_c, DML_n, DBIL_n, DMU_n/DBIU_n, Parity, and Alert_n, that are used to
`connect the DDR4 SDRAM to a further electronic circuit (e.g., memory controller or
`processor chip) via interconnecting wires between the I/O pins and pins of the further
`electronic circuit.
`See, e.g.:
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`3
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 5 of 14
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`Claim 1
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`Apple Mac Pro
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`4
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 6 of 14
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`Claim 1
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`Apple Mac Pro
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`1[b] a main unit for implementing a
`normal mode function of the electronic
`circuit,
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
`The Apple Mac Pro comprises a main unit for implementing a normal mode function of
`the electronic circuit.
`For example, in the DDR4 memory within the Apple Mac Pro, during normal operation
`data transfer occurs between the internal DRAM core and the 8 DQs.
`See, e.g.:
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`5
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 7 of 14
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`Claim 1
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`Apple Mac Pro
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`1[c] and a test unit for testing the
`interconnects,
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
`The Apple Mac Pro comprises a test unit for testing the interconnects.
`For example, in the DDR4 memory within the Apple Mac Pro, the DDR4 memory
`device supports a connectivity test mode, in which circuitry generates MT[9:0] internal
`signals and generates, from the MT[9:0] signals, output signals.
`See, e.g.:
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`6
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 8 of 14
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`Claim 1
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`Apple Mac Pro
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`1[d] the electronic circuit having a
`normal mode in which the I/O nodes are
`logically connected to the main unit and
`a test mode in which the I/O nodes are
`logically connected to the test unit,
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
`In the Apple Mac Pro, the electronic circuit has a normal mode in which the I/O nodes
`are logically connected to the main unit and a test mode in which the I/O nodes are
`logically connected to the test unit.
`For example, in the DDR4 memory within the Apple Mac Pro, in the normal mode of
`the DDR4 SDRAM, the I/O pins are connected to the main unit. The DDR4 CT mode is
`enabled through the Test Enable pin, entering a test mode in which the I/O pins (nodes)
`function as a set of test input and output pins and the normal memory function is
`bypassed.
`See, e.g.:
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`7
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 9 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`8
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 10 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`9
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 11 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`In the Apple Mac Pro, the test unit comprises at least one combinatorial circuit
`implementing at least one of an XNOR function and an XOR function with at least two
`function inputs and a function output, the function inputs being connected to particular
`I/O nodes arranged to operate as input nodes of the test circuit and the function output
`being connected to a particular I/O node arranged to operate as output node of the test
`circuit.
`For example, the DDR4 SDRAM in the Apple Mac Pro has combinatorial circuits
`implementing XOR functions with three inputs connected to I/O pins and one output.
`See, e.g.:
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`1[e] wherein the test unit comprises at
`least one combinatorial circuit
`implementing at least one of an XNOR
`function and an XOR function with at
`least two function inputs and a function
`output, the function inputs being
`connected to particular I/O nodes
`arranged to operate as input nodes of the
`test circuit and the function output being
`connected to a particular I/O node
`arranged to operate as output node of the
`test circuit.
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`10
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 12 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`11
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 13 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`12
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`Case 6:21-cv-00263-ADA Document 1-6 Filed 03/16/21 Page 14 of 14
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`Claim 1
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`Apple Mac Pro
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`DDR4 JEDEC Standard JESD79-4, Sep. 2012.
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`13
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