`
`PROVISIONAL PATENT
`
`NON-VOLATILE MEMORY MODULE
`
`BACKGROUND OF THE INVENTION
`
`[0001]
`
`Certain types of memory modules comprise a plurality of dynamic
`
`random-access memory (DRAM) devices mounted on a printed circuit board (PCB). These
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`memory modules are typically mounted in a memory slot or socket of a computer system
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`(e.g., a server system or a personal computer) and are accessed by the processor of the
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`computer system to provide volatile memory to the computer system.
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`BRIEF DESCRIPTION OF THE DRAWINGS
`
`[0002]
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`Figure 1 is a block diagram of an example 512MB DDR2 (PC2-3200)
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`memory module in accordance with certain embodiments described herein.
`
`[0003]
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`Figure 2 is a block diagram of an example memory module with ECC
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`(error-correcting code) having a first memory bank with nine volatile memory elements and a
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`second memory bank with five non-volatile memory elements in accordance with certain
`
`embodiments described herein.
`
`[0004]
`
`Figure 3 is a block diagram of an example memory module with ECC and
`
`having a logic element and microcontroller unit integrated into a single device.
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`DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
`
`[0005]
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`Figure 1 is a block diagram of an example memory module 10 compatible
`
`with certain embodiments described herein. The memory module 10 comprises a printed-
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`circuit card (PCB) 20, a first memory bank 30 on the PCB 20, and a second memory bank 40
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`on the PCB 20. The first memory bank 30 comprises a first plurality of volatile memory
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`elements 32 and the second memory bank 40 comprises a second plurality of non-volatile
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`memory elements 42. Certain embodiments described herein advantageously provide non-
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`volatile storage via the second memory bank 40 in addition to high-performance (e.g., high
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`speed) storage via the first memory bank 30. Certain embodiments described herein utilize
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`the second memory bank 40 as a flash "mirror" to provide back-up of the volatile first
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`memory bank 30 in the event of power interruptions.
`
`[0006]
`
`In certain embodiments, the memory module 10 is configured to be in
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`electrical communication with a host system. Examples of host systems include, but are not
`
`-1-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 1
`
`
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`limited to, blade servers, 1U servers, personal computers (PCs), and other applications in
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`which space is constrained or limited.
`
`[0007]
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`In certain embodiments, the memory module 10 has a memory capacity of
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`512-MB, 1-GB, 2-GB, 4-GB, or 8-GB. Other memory capacities are also compatible with
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`certain embodiments described herein. In addition, memory modules 10 having widths of
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`4 bytes, 8 bytes, 16 bytes, 32 bytes, or 32 bits, 64 bits, 128 bits, 256 bits, as well as other
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`widths (in bytes or in bits), are compatible with embodiments described herein.
`
`[0008]
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`In certain embodiments, the PCB 20 has an industry-standard form factor.
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`For example, the PCB 10 can have a low profile (LP) form factor with a height of
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`30 millimeters and a width of 133.35 millimeters. In certain other embodiments, the PCB 10
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`has a very low profile (VLP) form factor with a height of 18.3 millimeters. Other form
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`factors including, but not limited to, small-outline (SO-DIMM), unbuffered (UDIMM),
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`registered (RDIMM), fully-buffered (FBDIMM), mini-DIMM, VLP mini-DIMM, and
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`micro-DIMM are also compatible with certain embodiments described herein.
`
`[0009]
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`The PCB 20 comprises an interface 22 that is configured to be in electrical
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`communication with the host system (not shown). For example, the interface 22 can
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`comprise a plurality of edge connections which fit into a corresponding slot connector of the
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`host system. The interface 22 provides a conduit for power voltage as well as data and
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`address signals between the memory module 10 and the host system. For example, the
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`interface 22 can comprise a standard 240-pin DDR2 edge connector.
`
`[0010]
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`In certain embodiments, the first plurality of volatile memory elements 32
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`comprises two or more dynamic random-access memory (DRAM) elements. Types of
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`DRAM elements 32 compatible with certain embodiments described herein include, but are
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`not limited to, DDR, DDR2, DDR3, and synchronous DRAM (SDRAM). For example, in
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`the block diagram of Figure 1, the first memory bank 30 comprises eight 64Mx8 DDR2
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`SDRAM elements 32. In addition, volatile memory elements 32 having bit widths of 4, 8,
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`16, 32, as well as other bit widths, are compatible with certain embodiments described herein.
`
`Volatile memory elements 32 compatible with certain embodiments described herein have
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`packaging which include, but are not limited to, thin small-outline package (TSOP), ball-
`
`-2-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 2
`
`
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`grid-array (BGA), fine-pitch BGA (FBGA), micro-BGA (µEGA), mini-BGA (mBGA), and
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`chip-scale packaging (CSP).
`
`[0011]
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`In certain embodiments, the second pluarlity of non-volatile memory
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`elements 42 comprises two or more flash memory elements. Types of flash memory
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`elements 42 compatible with certain embodiments described herein include, but are not
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`limited to, NOR flash, NAND flash, and multi-level cell (MLC). For example, in the block
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`diagram of Figure 1, the second memory bank 40 comprises 512 MB of flash memory
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`organized as four 128Mbx8 NAND flash memory elements 42. In addition, non-volatile
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`memory elements 42 having bit widths of 4, 8, 16, 32, as well as other bit widths, are
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`compatible with certain embodiments described herein. Non-volatile memory elements 42
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`compatible with certain embodiments described herein have packaging which include, but are
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`not limited to, thin small-outline package (TSOP), ball-grid-array (BGA), fine-pitch BGA
`(FBGA), micro-BGA (µBGA), mini-BGA (mBGA), and chip-scale packaging (CSP).
`
`Figure 2 is a block diagram of an example memory module 10 with ECC
`[0012]
`(error-correcting code) having a first memory bank 30 with nine volatile memory elements 32
`and a second memory bank 40 with five non-volatile memory elements 42 in accordance with
`certain embodiments described herein. The additional memory element 32 of the first
`memory bank 30 and the additional memory element 42 of the second memory bank 40
`
`provide the ECC capability.
`
`[0013]
`
`As schematically illustrated by Figure 1, in certain embodiments, the
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`memory module 10 further comprises a voltage monitor circuit 50, a microcontroller unit
`(MCU) 60, a logic element 70, and a capacitor module 80. In certain embodiments, the MCU
`60 provides memory management for the second memory bank 40 and controls data transfer
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`between the first memory bank 30 and the second memory bank 40. The MCU 60 of certain
`embodiments comprises a 16-bit microcontroller, although other types of microcontrollers are
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`also compatible with certain embodiments described herein. In certain embodiments, the
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`capacitor module 80 comprises a step-up transformer 82, a step-down transformer 84, and a
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`capacitor bank 86.
`
`[0014]
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`In certain embodiments, the logic element 70 comprises a field-
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`programmable gate array (FPGA). Other types of logic elements 70 compatible with certain
`
`-3-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 3
`
`
`
`embodiments described herein include, but are not limited to, a programmable-logic device
`
`(PLD), an application-specific integrated circuit (ASIC), a custom-designed semiconductor
`
`device, a complex programmable logic device (CPLD). In certain embodiments, the logic
`
`element 70 is a custom device. In certain embodiments, the logic element 70 comprises
`
`various discrete electrical elements, while in certain other embodiments, the logic element 70
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`comprises one or more integrated circuits. Figure 3 is a block diagram of an example
`
`memory module 10 having a microcontroller unit 60 and logic element 70 integrated into a
`
`single device.
`
`[0015]
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`Under normal operation in certain embodiments, the host system accesses
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`the first memory bank 30, rather than the second memory bank 40, because the volatile
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`memory elements 32 have superior read/write characteristics. The voltage monitor circuit 50
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`monitors the power supplied by the host system via the interface 22. Upon detecting a low
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`power (e.g., indicative of a powering down of the host system), the voltage monitor circuit 50
`sends a signal to the MCU 60 which responds by executing a write cycle on the second
`memory bank 40. During this write cycle, data is read from the first memory bank 30 and is
`
`transferred to the second memory bank 40 via the MCU 60.
`
`[0016]
`
`As schematically illustrated by Figure 1, the logic element 70 of certain
`
`embodiments is in electrical communication with the second memory bank 40 and the MCU
`60. The logic element 70 can provide signal level translation between the volatile memory
`elements 32 (e.g., 1.8V SSTL-2 for DDR2 SDRAM elements) and the non-volatile memory
`elements 42 (e.g., 3V TTL for NAND flash memory elements). In certain embodiments, the
`logic element 70 is also programmed to perform address decoding for the first memory bank
`
`30 and the second memory bank 40.
`
`[0017]
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`During normal operation in certain embodiments, the step-up transformer
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`82 keeps the capacitor bank 86 charged at a peak value. In certain embodiments, the step-
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`down transformer 84 acts as a voltage regulator to ensure that regulated voltages are supplied
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`to the memory elements (e.g., 1.8V to the volatile DRAM elements 32 and 3.0V to the non-
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`volatile flash memory elements 42) during power down.
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`In certain embodiments, the
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`memory module 10 further comprises switch 90 (e.g., FET switch) that switches between the
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`charged capacitor bank 86 and system power received via the interface 22. The switch 90 of
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`-4-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 4
`
`
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`certain embodiments advantageously ensures that the volatile memory elements 32 are
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`powered long enough for the data to be stored in the non-volatile memory elements 42, and
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`then switches over to the system power.
`
`[0018] When normal operation resumes, data is transferred from the non-volatile
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`memory bank 40 to the volatile memory bank 30 via the MCU 60. The host system can then
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`resume accessing the volatile memory bank 30 of the memory module 10.
`
`In certain
`
`embodiments, the transfer of data from the volatile memory bank 30 to the non-volatile
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`memory bank 40, or from the non-volatile memory bank 40 to the volatile memory bank 30,
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`takes less than one minute per GB.
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`Various embodiments of the present invention have been described above.
`
`[0019]
`Although this invention has been described with reference to these specific embodiments, the
`descriptions are intended to be illustrative of the invention and are not intended to be
`limiting. Various modifications and applications may occur to those skilled in the art without
`departing from the true spirit and scope of the invention.
`
`3051314
`102506
`
`-5-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 5
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`
`
`Figure 1:
`
`1 1.
`
`42
`
`
`
`4 0
`
`1
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`(
`
`20
`
`30
`
`32
`
`1
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`I
`
`-1--
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`DATA
`
`ADDR/CONT
`
`SWITCH
`
`MCU
`
`DATA
`
`ADDR/CONT
`
`FPGA
`
`70
`
`60
`
`90
`
`POWER
`OUTPUT
`
`SWITCH
`
`4,
`
`STEP
`DOWN
`VOLTAGE
`
`CAPACITOR
`BANK
`
`STEP UP
`VOLTAGE
`
`4
`
`VOLTAGE
`MONITOR
`
`84
`
`86
`
`82
`
`DATA
`
`ADDR/CONT
`
`50
`
`22
`
`Standard DIMM interface
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 6
`
`
`
`Figure 2:
`
`1 10
`
`r 20
`
`32
`
`,
`
`40
`
`42
`
`1
`
`1— 7 — -1-- 7 — 7 --- 7 .-- --E--- 7—
`A
`
`DATA
`
`ADDR/CONT
`
`SWITCH
`
`-1- -T.
`
`70
`
`J
`
`60
`
`POWER
`OUTPUT
`
`90
`
`4
`
`DATA
`
`ADDR/CONT
`
`50
`
`DATA
`
`ADDR/CONT
`
`---84
`
`--- 8O-86
`
`82
`
`22
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 7
`
`
`
`Figure 3:
`
`1 10
`
`( 20
`
`30
`
`32
`
`42
`
`40
`
`60, 70
`
`•
`
`DATA
`
`A1ADDR/CONT
`
`V
`
`SWITCH
`
`DATA
`
`ADDR/CONT
`
`POWER
`OUTPUT
`
`DATA
`
`ADDR/CONT
`
`90
`
`50
`
`84
`
`86
`
`82
`
`22
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 8
`
`
`
`Provisional Application
`COVER SHEET
`
`Attorney Docket No.: NETL.040PR
`First Named Inventor: Jayesh R. Bhakta
`Title: NON-VOLATILE MEMORY MODULE
`
`Direct all correspondence to Customer No.: 20995
`
`Date: June 1, 2007
`Page 1 of 2
`
`Commissioner for Patents
`P.O. Box 1450
`Alexandria, VA 22313-1450
`
`The following enclosures are transmitted herewith to be filed in the Provisional Patent Application of:
`
`Inventors:
`
`First Inventor
`Residence Address :
`
`Jayesh R. Bhakta
`12220 Rose Street, Cerritos, CA 90703
`
`: Chi She Chen
`Second Inventor
`944 Crystal Water Lane, Walnut, CA 91789
`Residence Address :
`
`Third Inventor
`Residence Address :
`
`Jeffrey C. Solomon
`16 Silver Fir, Irvine, CA 92604
`
`APPLICATION ELEMENTS:
`
`(X)
`
`(X)
`
`Specification in 5 pages.
`
`Drawings in 3 pages.
`
`FILING FEES:
`
`FEE TYPE
`Basic Filing
`
`FEE CALCULATION
`LARGE FEE
`1005 ($200)
`
`37 CFR § 1.16(d)
`
`CALCULATION
`
`TOTAL
`$200
`
`TOTAL FEE DUE
`
`$200
`
`This invention WAS NOT made by an agency of the United States Government or under a contract
`with an agency of the United States Government.
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 9
`
`
`
`Provisional Application
`COVER SHEET
`
`Attorney Docket No.: NETL.040PR
`First Named Inventor: Jayesh R. Bhakta
`Title: NON-VOLATILE MEMORY MODULE
`
`Direct all correspondence to Customer No.: 20995
`
`Date: June 1, 2007
`Page 2 of 2
`
`Commissioner is hereby authorized to charge any additional fees which may be required, or credit
`any overpayment to Account No. 11-1410.
`
`Bruce Itchkawitz
`Registration No. 47,677
`Attorney of Record
`Customer No. 20,995
`(949) 760-0404
`
`3832877
`060107
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 10
`
`
`
`Electronic Patent Application Fee Transmittal
`
`Application Number:
`
`Filing Date:
`
`Title of Invention:
`
`NON-VOLATILE MEMORY MODULE
`
`First Named Inventor/Applicant Name:
`
`Jayesh R. Bhakta
`
`Filer:
`
`Bruce S. ltchkaeitz/Amy Perez
`
`Attorney Docket Number:
`
`NETL.040PR
`
`Filed as Large Entity
`
`Provisional Filing Fees
`
`Description
`
`Fee Code
`
`Quantity
`
`Amount
`
`Sub-Total in
`USD($)
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`Provisional application filing
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`1005
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`1
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`200
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`200
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`Basic Filing:
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`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 11
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`Sub-Total in
`USD($)
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`Miscellaneous:
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`200
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`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 12
`
`
`
`Electronic Acknowledgement Receipt
`
`EFS ID:
`
`Application Number:
`
`1832654
`
`60941586
`
`International Application Number:
`
`Confirmation Number:
`
`2324
`
`Title of Invention:
`
`NON-VOLATILE MEMORY MODULE
`
`First Named Inventor/Applicant Name:
`
`Jayesh R. Bhakta
`
`Customer Number:
`
`20995
`
`Filer:
`
`Bruce S. ltchkaeitz/Brandon Hamada
`
`Filer Authorized By:
`
`Bruce S. ltchkaeitz
`
`Attorney Docket Number:
`
`NETL.040PR
`
`Receipt Date:
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`Filing Date:
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`Time Stamp:
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`Application Type:
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`01-JUN-2007
`
`18:53:16
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`Provisional
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`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 13
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`
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`1
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`Specification
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`prov.pdf
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`256635
`
`no
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`5
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`Warnings:
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`Information:
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`2
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`draw.pdf
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`46305
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`no
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`3
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`Warnings:
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`Information:
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`3
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`Transmittal of New Application
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`trans.pdf
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`42954
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`no
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`2
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`Warnings:
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`Information:
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`4
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`Fee Worksheet (PTO-06)
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`fee-info.pdf
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`8114
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`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 14
`
`