Patent Database Search Results: apd/19760101->19980609 AND (DRAM and "redundant...
`
`Page 1 of 3
`
`Searching US Patent Collection...
`
`Results of Search in US Patent Collection db for:
`(APD/19760101->19980609 AND (DRAM AND "redundant memory")): 390 patents.
`Hits 1 through 50 out of 390
`
`Next 50 Hits
`
`Jump To
`
`Refine Search
`
`apd/19760101->19980609 AND (DRAM and "redunda
`
`PAT.
`Title
`NO.
`Integrated circuitry for semiconductor memory
`1 7,705,383
`Flash EEprom system
`2 7,447,069
`Semiconductor memory circuitry
`3 6,967,369
`Integrated circuit I/O using a high performance bus interface
`4 6,598,171
`5 6,570,790 Highly compact EPROM and flash EEPROM devices
`6 6,460,110
`Semiconductor memory
`7 6,392,948
`Semiconductor device with self refresh test mode
`8 6,373,747
`Flash EEprom system
`9 6,317,370
`Timing fuse option for row repair
`10 6,307,273 High contrast, low noise alignment mark for laser trimming of redundant memory
`arrays
`Semiconductor memory circuitry including die sites for 16M to 17M memory cells
`in an 8" wafer
`12 6,272,577 Data processing system with master and slave devices and asymmetric signal swing
`bus
`13 6,266,753 Memory manager for multi-media apparatus and method therefor
`14 6,252,281
`Semiconductor device having an SOI substrate
`15 6,243,829 Memory controller supporting redundant synchronous memories
`16 6,223,248
`Circuits systems and methods for re-mapping memory row redundancy during two
`cycle cache access
`
`11 6,288,421
`
`http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%...
`
`5/9/2017
`
`Limestone Memory Systems, LLC – Exhibit 2015, p. 1
`
`

`

`Patent Database Search Results: apd/19760101->19980609 AND (DRAM and "redundant...
`
`Page 2 of 3
`
`17 6,208,567
`
`Semiconductor device capable of cutting off a leakage current in a defective array
`section
`Three dimensional structure memory
`18 6,208,545
`Synchronous SRAM having global write enable
`19 6,205,514
`20 6,194,738 Method and apparatus for storage of test results within an integrated circuit
`21 6,182,257
`BIST memory test system
`22 6,178,549 Memory writer with deflective memory-cell handling capability
`23 6,154,851 Memory repair
`24 6,149,316
`Flash EEprom system
`25 6,141,768
`Self-corrective memory system and method
`26 6,134,681
`Semiconductor memory device with spare memory cell
`27 6,133,640
`Three-dimensional structure memory
`28 6,130,837
`Storage device employing a flash memory
`29 6,130,468
`Fuse, memory incorporating same and method
`30 6,130,442 Memory chip containing a non-volatile memory register for permanently storing
`information about the quality of the device and test method therefor
`31 6,122,213 Device and method for repairing a memory array by storing each bit in multiple
`memory cells in the array
`32 6,115,828 Method of replacing failed memory cells in semiconductor memory device
`33 6,115,299 Device and method for repairing a memory array by storing each bit in multiple
`memory cells in the array
`34 6,105,152 Devices and methods for testing cell margin of memory devices
`35 6,104,645 High speed global row redundancy system
`36 6,097,643
`Semiconductor storage apparatus and method of manufacturing of the same
`37 6,093,933 Method and apparatus for fabricating electronic device
`38 6,081,463
`Semiconductor memory remapping
`39 6,078,534
`Semiconductor memory having redundancy circuit
`40 6,073,258 Method and device for performing two dimensional redundancy calculations on
`embedded memories avoiding fail data collection
`Fault-tolerant computer system with online recovery and reintegration of redundant
`components
`42 6,069,064 Method for forming a junctionless antifuse
`43 6,066,886
`Semiconductor wafer in which redundant memory portion is shared by two
`neighboring semiconductor memory portions and is connected to the semiconductor
`memory portions
`44 6,066,539 Honeycomb capacitor and method of fabrication
`45 6,055,611 Method and apparatus for enabling redundant memory
`46 6,055,204
`Circuits, systems, and methods for re-mapping memory column redundancy
`47 6,055,196
`Semiconductor device with increased replacement efficiency by redundant memory
`cell arrays
`48 6,049,505 Method and apparatus for generating memory addresses for testing memory devices
`49 6,046,945 DRAM repair apparatus and method
`
`41 6,073,251
`
`http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%...
`
`5/9/2017
`
`Limestone Memory Systems, LLC – Exhibit 2015, p. 2
`
`

`

`Patent Database Search Results: apd/19760101->19980609 AND (DRAM and "redundant...
`
`Page 3 of 3
`
`50 6,044,029 Device and method for repairing a memory array by storing each bit in multiple
`memory cells in the array
`
`http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%...
`
`5/9/2017
`
`Limestone Memory Systems, LLC – Exhibit 2015, p. 3
`
`