throbber
Filed on behalf of: Samsung Electronics Co., Ltd.
`
`By: Steven L. Park (stevenpark@paulhastings.com)
`
`Naveen Modi (naveenmodi@paulhastings.com)
`Paul Hastings LLP
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`
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`
`____________________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`
`____________________
`
`SAMSUNG ELECTRONICS CO., LTD.
`Petitioner
`
`v.
`
`ELBRUS INTERNATIONAL LIMITED
`Patent Owner
`
`____________________
`
`U.S. Patent No. 6,366,130
`
`____________________
`
`
`DECLARATION OF DR. R. JACOB BAKER
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`Page 1 of 83
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`SAMSUNG EXHIBIT 1002
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`

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`TABLE OF CONTENTS
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`Introduction ..................................................................................................... 1
`I.
`Qualifications .................................................................................................. 1
`II.
`Summary of Opinions ..................................................................................... 5
`III.
`IV. The ’130 Patent ............................................................................................... 7
`V.
`Claim Construction ......................................................................................... 9
`A.
`Latching Sense Amplifier (Claims 1 and 3) ....................................... 10
`B.
`Stage (Claims 1, 3, and 9) .................................................................. 11
`VI. The Prior Art Discloses or Suggests Every Feature of the Challenged
`Claims of the ’130 Patent ............................................................................. 12
`A.
`Brief Description of the Prior Art ...................................................... 12
`Sukegawa and Lu, Individually or in Combination with Other
`B.
`References, Disclose or Suggest Every Feature of the
`Challenged Claims of the ’130 Patent ................................................ 14
`Sukegawa and Lu Disclose or Suggest the Features of
`1.
`Claims 1-2, 5-6, and 9 .............................................................. 14
`Sukegawa, Lu, and Watanabe Disclose or Suggest the
`Features of Claim 3 .................................................................. 40
`Sukegawa, Lu, and Hardee Disclose or Suggest the
`Features of Claim 7 .................................................................. 55
`VII. Conclusion .................................................................................................... 58
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`2.
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`3.
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`-i-
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
`I, R. Jacob Baker, declare as follows:
`
`I.
`
`INTRODUCTION
`
`1.
`
`I have been retained by Samsung Electronics Co., Ltd. (“Petitioner”)
`
`as an independent expert consultant in this proceeding before the United States
`
`Patent and Trademark Office. Although I am being compensated at my rate of
`
`$450 per hour for the time I spend on this matter, no part of my compensation is
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`dependent on the outcome of this proceeding, and I have no other interest in this
`
`proceeding.
`
`2.
`
`I understand that this proceeding involves U.S. Patent No. 6,366,130
`
`(“the ’130 Patent”) (Ex. 1001), the application for which was filed on February 17,
`
`2000, as U.S. Patent Application No. 09/505,656, and issued on April 2, 2002. I
`
`also understand, as demonstrated by the face of the ’130 Patent, that the ’130
`
`Patent purports to claim priority to February 17, 1999, the filing date of U.S.
`
`Provisional Application No. 60/120,531 (“the ’531 provisional application”).
`
`3.
`
`I have been asked to consider whether certain references disclose or
`
`suggest the features recited in the claims of the ’130 Patent. My opinions are set
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`forth below.
`
`II. QUALIFICATIONS
`I serve as a Professor of Electrical and Computer Engineering at the
`4.
`
`University of Nevada, Las Vegas (“UNLV”). I have been teaching electrical
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`1
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
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`engineering at UNLV since 2012. Before this, I was a Professor of Electrical and
`
`Computer Engineering with Boise State University beginning in 2000. Before my
`
`position at Boise State University, I was an Associate Professor of Electrical
`
`Engineering between 1998 and 2000 and an Assistant Professor of Electrical
`
`Engineering between 1993 and 1998, both at the University of Idaho. I have been
`
`teaching electrical engineering since 1991. I received my Ph.D. in Electrical
`
`Engineering from the University of Nevada, Reno, in 1993. I also received a MS
`
`and BS in Electrical Engineering from UNLV in 1988 and 1986, respectively.
`
`5.
`
`As further described in my CV, I am a licensed Professional Engineer
`
`in the State of Idaho and have more than 25 years of experience, including
`
`extensive experience in circuit design and manufacture of Dynamic Random
`
`Access Memory (DRAM) semiconductor integrated circuit chips and CMOS
`
`Image Sensors (CISs) at Micron in Boise, Idaho. I also spent considerable time
`
`working on the development of Flash memory while at Micron. My efforts resulted
`
`in more than a dozen Flash-memory related patents. Among many other
`
`experiences, I led the development of the delay-locked loop (DLL) in the late
`
`1990s so that Micron DRAM products could transition to the DDR memory
`
`standard. I also provided technical assistance with Micron’s acquisition of Photobit
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`during 2001 and 2002. This assistance included help transitioning the manufacture
`
`of CIS products into Micron’s DRAM process technology. I have worked as a
`
`2
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
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`consultant at other companies designing memory chips, including Sun, Oracle, and
`
`Contour Semiconductor. I have worked at other companies designing CISs,
`
`including Aerius Photonics, Lockheed-Martin, and OmniVision.
`
`6.
`
`I am the author of several books covering the area of integrated circuit
`
`design including: DRAM Circuit Design: Fundamental and High-Speed Topics
`
`(two editions), CMOS Circuit Design, Layout, and Simulation (three editions), and
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`CMOS Mixed-Signal Circuit Design (two editions). I have authored, and/or co-
`
`authored, more than 100 papers and presentations in the areas of solid-state circuit
`
`design and packaging.
`
`7.
`
`As a professor, I have been the main advisor to five Doctoral students
`
`and over 65 Masters students.
`
`8.
`
`I am the named inventor on over 137 granted U.S. patents in
`
`integrated circuit design including flash memory, DRAM, and CMOS image
`
`sensors.
`
`9.
`
`I have received numerous awards for my work, including the
`
`Frederick Emmons Terman (the “Father of Silicon Valley”) Award. The Terman
`
`Award is bestowed annually upon an outstanding young electrical/computer
`
`engineering educator in recognition of the educator’s contributions to the
`
`profession.
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`3
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`10.
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
`I have also received the IEEE Circuits and Systems Education Award
`
`(2011), the IEEE Power Electronics Best Paper Award (2000), and I am a Fellow
`
`of the IEEE for contributions to memory circuit design.
`
`11.
`
`In addition, I have received the President’s Research and Scholarship
`
`Award (2005), Honored Faculty Member recognition (2003), Outstanding
`
`Department of Electrical Engineering Faculty recognition (2001), all from Boise
`
`State University. I have also received the Tau Beta Pi Outstanding Electrical and
`
`Computer Engineering Professor Award the three years I have been at UNLV.
`
`12.
`
`I have also given over 50 invited talks at conferences and universities
`
`in the areas of integrated circuit design including: AMD, Arizona State University,
`
`Beijing Jiaotong University, Carleton University, Carnegie Mellon, Columbia
`
`University, Dublin City University (Ireland), École Polytechnique de Montréal,
`
`Georgia Tech, Gonzaga University, Hong Kong University of Science and
`
`Technology, Indian Institute of Science (Bangalore, India), Instituto de Informatica
`
`(Brazil), Instituto Tecnológico y de Estudios Superiores de Monterrey, ITESM
`
`(Mexico), Iowa State University, Laval University, Lehigh University, Princeton
`
`University, Temple University, University of Alabama, University of Arkansas,
`
`University of Buenos Aires (Argentina), University of Illinois, Urbana-Champaign,
`
`Utah State University, University of Nevada, Las Vegas, University of Houston,
`
`University of Idaho, University of Nevada, Reno, University of Macau, University
`
`4
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`Declaration of Dr. R. Jacob Baker
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`of Toronto, University of Utah, Yonsei University (Seoul, Korea), University of
`
`Maryland, IEEE Electron Devices Conference (NVMTS), IEEE Workshop on
`
`Microelectronics and Electron Devices (WMED), the Franklin Institute, National
`
`Semiconductor, AMI semiconductor, Micron Technology, Rendition, Saintgits
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`College (Kerala, India), Southern Methodist University, Sun Microsystems,
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`Stanford University, ST Microelectronics (Delhi, India), Tower (Israel), Foveon,
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`ICySSS keynote, and Xilinx.
`
`13.
`
`Details of my professional and educational background, as well as a
`
`listing of other matters on which I have provided consulting and/or provided
`
`testimony as a technical expert, are provided in my Curriculum Vitae, attached as
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`Appendix A to this Declaration.
`
`III. SUMMARY OF OPINIONS
`All of the opinions contained in this Declaration are based on the
`14.
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`documents I reviewed, my experience and background, and my knowledge and
`
`professional judgment. In forming the opinions expressed in this Declaration, I
`
`reviewed the ’130 Patent (Ex. 1001); the prosecution file history for the ’130
`
`Patent (Ex. 1003); the file history of the inter partes reexamination (control no.
`
`95/000,657) (“the ’657 proceeding”) for the ’130 Patent, excerpts of which I
`
`understand are being submitted as Ex. 1004; U.S. Patent No. 5,828,241 to
`
`Sukegawa (“Sukegawa”) (Ex. 1005); U.S. Patent No. 6,249,469 to Hardee
`
`5
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`Declaration of Dr. R. Jacob Baker
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`(“Hardee”) (Ex. 1007); U.S. Patent No. 6,108,254
`to Watanabe et al.
`
`(“Watanabe”) (Ex. 1006); “Half-VDD Bit-Line Sensing Scheme in CMOS
`
`DRAM’s,” IEEE Journal of Solid-State Circuits, Vol. SC-19, No. 4, August 1984
`
`by Nicky Chau-Chun Lu et al. (“Lu”) (Ex. 1008); and excerpts from the Modern
`
`Dictionary of Electronics (7th ed. 1999) (Ex. 1009), while drawing on my
`
`experience and knowledge in the field.
`
`15. My opinions have also been guided by my appreciation of how a
`
`person of ordinary skill in the art would have understood the claims of the ’130
`
`Patent at the time of the alleged invention, which I have been asked to initially
`
`assume is February 17, 1999, the filing date of the ’531 provisional application
`
`from which the ’130 Patent purports to claim priority. At the time of the alleged
`
`invention, a person of ordinary skill in the art related to the technology of the ’130
`
`Patent would have had an undergraduate degree in Electrical Engineering or
`
`equivalent and at least two to three years of experience in the design and/or
`
`analysis of data transfer circuits or the equivalent. In determining the level of
`
`ordinary skill, I was asked to consider, for example, the types of problems
`
`encountered in the art, prior solutions to those problems, the rapidity with which
`
`innovations are made, the sophistication of the technology, and the educational
`
`level of active workers in the field.
`
`6
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`16.
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
`Based on my experience and expertise, it is my opinion that certain
`
`references disclose or suggest all the features recited in claims 1-3, 5-7, and 9 (“the
`
`challenged claims”) of the ’130 Patent.
`
`IV. THE ’130 PATENT
`The ’130 Patent is purportedly directed to a data transfer scheme that
`17.
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`includes two bus drivers, a precharge circuit, two complementary bus lines, and a
`
`latching sense amplifier. See, e.g., Ex. 1001 2:1-8. Figure 1 of the ’130 Patent
`
`illustrates two bus drivers 11, 12 (consisting of transistors 20, 21, 22, and 23) and
`
`two complementary bus lines 14, 15 as inputs to a latching sense amplifier 16:
`
`18.
`
`The data transfer scheme operates in two phases: a precharge phase
`
`and a data transfer phase (Ex. 1001 2:12-13), with the bus drivers and
`
`
`
`7
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`complementary bus lines operating in opposite phases to the latching sense
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`amplifier (Ex. 1001 2:43-44). In other words, when the complementary bus lines
`
`and the bus drivers are in the precharge phase, the sense amplifier is in data
`
`transfer phase and vice versa.
`
`19.
`
`Figure 2 of the ’130 Patent discloses a latching sense amplifier:
`
`
`
`20.
`
`I understand that the ’130 Patent includes 9 claims with claims 1 and
`
`8 being independent and claims 2-7 and 9 being dependent from claim 1. I further
`
`understand that claim 9 was added during reexamination. As I note above, I was
`
`asked to opine with respect to some of the claims of the ’130 Patent. I have
`
`reproduced claim 1 below:
`
`1. A data transfer arrangement comprising:
`
`8
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
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`two bus drivers;
`
`a voltage precharge source;
`
`a differential bus coupled to the bus drivers and to the voltage precharge
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`source; aid [sic]
`
`a latching sense amplifier coupled to the differential bus;
`
`wherein the latching sense amplifier comprises:
`
`a first stage including a cross-coupled latch coupled to a differential data
`
`bus; and
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`an output stage coupled to an output of said first stage;
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`wherein the output of the first stage is coupled to an input of the output
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`stage;
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`wherein the differential bus and the differential data bus are precharge to a
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`voltage Vpr between Vdd and ground, where Vpr = K*Vdd, and K is a
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`precharging voltage factor.
`
`V. CLAIM CONSTRUCTION
`I understand that a claim subject to inter partes review receives the
`21.
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`broadest reasonable construction in light of the specification of the patent in which
`
`it appears. I also understand that in these proceedings, any term that is not
`
`construed should be given its plain and ordinary meaning under the broadest
`
`reasonable construction. I have followed these principles in my analysis. I discuss
`
`9
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`Declaration of Dr. R. Jacob Baker
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` Inter Partes Review of U.S. Patent No. 6,366,130
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`a few terms below and what I understand to be Petitioner’s constructions of these
`
`terms.
`
`A. Latching Sense Amplifier (Claims 1 and 3)
`Independent claim 1 and dependent claim 3 of the ’130 Patent recite a
`22.
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`“latching sense amplifier.” I understand Petitioner has offered that the broadest
`
`reasonable construction of the term “latching sense amplifier” that is consistent
`
`with the use of the term in the claims and specification of the ’130 Patent is “a
`
`circuit, including a latch, that detects and amplifies signals.” I have used this
`
`construction in my analysis and agree with it because the specification describes its
`
`latching sense amplifier to include a latch (see, e.g., Ex. 1001 2:39-40, 2:48-50) for
`
`detecting (see, e.g., Ex. 1001 2:33-38, 2:64-67) and amplifying received signals
`
`(see, e.g., Ex. 1001 2:64-67). Furthermore, latching sense amplifiers were well
`
`known at the time of the alleged invention of the ’130 Patent, and this construction
`
`is consistent with the understanding of one of ordinary skill in the art at the time of
`
`the alleged invention of the ’130 Patent as well as dictionary definitions for similar
`
`terms (see, e.g., Ex. 1009 at 679 (defining “sense amplifier” as “[a] circuit used to
`
`sense low-level voltages … and to amplify these signals to the logic voltage levels
`
`of the system”). In my opinion, the claims additionally specify what a “latching
`
`sense amplifier” has to include. For example, claim 1 requires that the “latching
`
`10
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`sense amplifier” include both a first stage with a cross-coupled latch and an output
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`stage. See, e.g., Ex. 1001 4:8-13.
`
`B.
`23.
`
`Stage (Claims 1, 3, and 9)
`
`Independent claim 1 and dependent claims 3 and 9 recite a “stage.” I
`
`understand Petitioner has offered that the broadest reasonable construction of the
`
`term “stage” that is consistent with the use of the term in the claims of the ’130
`
`Patent is “portion of a circuit.” I have used this construction in my analysis and
`
`agree with it. In my experience and in the field, the term “stage” is sometimes used
`
`to refer to a portion of a circuit. This construction is consistent with dictionary
`
`definitions for the term. See, e.g., Ex. 1009 at 728 (defining “stage” as “[a] single
`
`section of a multisection circuit or device”). This meaning is further reinforced by
`
`the claims. Claim 1 specifies that a latching sense amplifier comprises of a “first
`
`stage” and an “output stage,” and claims 3 and 9 use the terms in the context of
`
`particular circuitry found within a “first stage” and an “output stage.” See, e.g.,
`
`Ex.1001 4:8-13, 4:21-23, Reexam Cert. 1:20-21. As the latching sense amplifier is
`
`itself a circuit, it follows accordingly that particular “stages” of the circuit reflect a
`
`portion of the circuit. My understanding is also consistent with the specification’s
`
`use of the term “stage.” Ex. 1001 3:4-5.
`
`11
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`VI. THE PRIOR ART DISCLOSES OR SUGGESTS EVERY FEATURE
`OF THE CHALLENGED CLAIMS OF THE ’130 PATENT
`
`24.
`
`I have reviewed several references, discussed further below, that I
`
`understand are prior art to the ’130 Patent. In my opinion, these references disclose
`
`or suggest all features of the challenged claims of the ’130 Patent.
`
`A. Brief Description of the Prior Art
`Sukegawa describes “a type of signal transmission circuit wherein the
`25.
`
`signal is amplified and transmitted by means of the positive feedback of an
`
`intermediate amplifier circuit having input/output shared terminals.” Sukegawa
`
`1:11-15. The signal transmission circuit disclosed sought to increase the signal
`
`transmission distance as well as increase the speed and lower the power
`
`consumption of a transmission. Id. 4:52-55. Sukegawa discloses that its signal
`
`transmission circuit comprises of “a driver circuit, a receiver circuit, an equalizer
`
`circuit, and an intermediate amplifier circuit.” Id. 4:62-65. The intermediate
`
`amplifier circuit relies on positive feedback to amplify the signal provided by the
`
`driver circuit and transmit the amplified signal to the receiver circuit. See, e.g., id.
`
`5:1-4.
`
`26.
`
`Lu describes a signal transmission system, and in particular, a sense
`
`amplifier utilized by DRAMs (Dynamic Random Access Memory). See, e.g., Lu
`
`Abstract. Lu introduces “a sensing scheme for CMOS DRAM’s [sic] in which the
`
`bit line is precharge to half-VDD.” Id. 451. Similar to Sukegawa, Lu discloses the
`
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`need to develop signal transmission systems faster in speed and lower in power
`
`consumption. See, e.g., id. 453-54.
`
`27.
`
`Watanabe relates to the transmission of signals in electronic circuits.
`
`See, e.g., Watanabe Abstract, 1:10-13. Specifically, Watanabe introduces a “data
`
`transfer circuit incorporated in a DRAM.” Id. 3:38-39. “[T]he data transfer circuit
`
`comprises a differential amplifier circuit 10, an equalizing circuit 11, a data latch
`
`circuit 12, a pair of first data lines 13, a pair of second data lines 14, and a pair of
`
`data output lines 15.” Id. 3:41-44; see also, e.g., id. Fig. 1. Like Sukegawa and Lu,
`
`the circuit disclosed by Watanabe was motivated by a need to increase the
`
`transmission speed of signals in electronic circuits. See, e.g., id. 2:52-56 (“No time
`
`is therefore required to equalize either data lines, unlike in the conventional data
`
`transfer scheme. Hence, data can be transferred at high speed in DRAM according
`
`to the present invention.”).
`
`28.
`
`Hardee
`
`is yet another prior art reference relating
`
`to signal
`
`transmission, and in particular, “integrated circuit memories” and “sense amplifiers
`
`for use therein.” See, e.g., Hardee 1:8-10. Hardee introduces a sense amplifier
`
`highlighted by three “salient” features:
`
`(1) the connection of each sense amplifier via transistors
`
`or other switching devices to the power supply lines
`
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`without directly connecting together power supply lines
`
`for multiple sense amplifiers;
`
`(2) the use of local read amplifiers;
`
`(3) the use of local write circuitry.
`
`See i.d. 5:24-32.
`
`29.
`
`All the prior art references mentioned above relate to signal
`
`transmission and were motivated to improve the efficiency of such transmissions.
`
`As such, one of ordinary skill in the art at the time of the alleged invention of the
`
`’130 Patent would have been motivated to combine the teachings of these
`
`references.
`
`B.
`
`30.
`
`Sukegawa and Lu, Individually or in Combination with Other
`References, Disclose or Suggest Every Feature of the Challenged
`Claims of the ’130 Patent
`1.
`
`Sukegawa and Lu Disclose or Suggest the Features of
`Claims 1-2, 5-6, and 9
`In my opinion and as shown in the charts below, Sukegawa and Lu
`
`disclose or suggest each and every feature recited in claims 1-2, 5-6, and 9 of the
`
`’130 Patent.
`
`a. Claim 1
`In my opinion, Sukegawa and Lu disclose or suggest each and every
`
`31.
`
`feature recited in claim 1.
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`Claim Language
`
`Sukegawa and Lu
`
`1. A data transfer
`
`Sukegawa discloses a data transfer arrangement.
`
`arrangement
`
`For example, Sukegawa introduces “[a] signal transmission
`
`comprising:
`
`circuit which enables the distance of signal transmission as
`
`measured by the length of the wiring electrically connecting a
`
`driver circuit and a receiver circuit of the signal transmission
`
`circuit
`
`to be increased, while the signal delay and power
`
`consumption are reduced.” Sukegawa Abstract.
`
`Fig.
`
`1 of Sukegawa “is a circuit diagram illustrating an
`
`embodiment of the signal transmission circuit in accordance
`
`with the invention.” Sukegawa 6:37-39.
`
`two bus drivers;
`
`Sukegawa discloses two bus drivers (e.g._, transistor group 26-
`
`27 and transistor group 28-29). See, e.g., Sukegawa Fig.
`
`1
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`Claim Language
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`Sukegawa and Lu
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`Declaration of Dr. R. Jacob Baker
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`Inter Partes Review of U.S. Patent No. 6,366,130
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`(annotated below).
`
`FIG.
`
`1
`
`Sukegawa discloses that “[d]river circuit 2 comprises input
`
`terminal IN, enable EN terminal, NAND gates 22, 23, CMOS
`
`inverters 21, 24, 25, pMOS transistors 26, 28, and nMOS
`
`transistors 27, 29. The input terminal IN of driver circuit 2 is
`
`connected through CMOS inverter 21 to one input terminal of
`
`NAND gate 22, and the input terminal IN is also connected to
`
`one input terminal of NAND gate 23. Enable EN terminal is
`
`connected to the other input terminals of NAND gates 22, 23.
`
`In the driver circuit 2, in the initial precharge state, the enable
`
`EN terminal is at L level, while node N1 and node N2 on the
`
`output sides of NAND gates 22, 23 are at H level.” Sukegawa
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`Claim Language
`
`Sukegawa and Lu
`
`8:11-23; see also, e.g., id. 9: 14-21.
`
`a voltage
`
`Sukegawa discloses a Voltage precharge source (e-g., BLR).
`
`precharge source;
`
`See, e.g., Sukegawa Fig. 1 (annotated below).
`
`See also,
`
`e.g., Sukegawa 8:24-31 (“On the other hand,
`
`equalizer circuit 3 comprises BLR node with the balance
`
`signal applied to it, precharge (referred to as PC hereinafter)
`
`node and nMOS transistors 30-32. The BLR node is connected
`
`to the drain of nMOS transistor 30 and the drain of nMOS
`
`transistor 31, and the BLR node becomes the power source
`
`voltage VDD/2 in the initial precharge source.”), 7:29-37.
`
`a differential bus
`
`Sukegawa discloses a differential bus (e.g., LINE, LINE_)
`
`coupled to the bus coupled to the bus drivers (e.g., transistor group 26-27 and
`
`Page 19 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`drivers and to the
`
`transistor group 28-29) and to the voltage precharge source
`
`voltage precharge
`
`(e_g., BLR). See, e.g., Sukegawa Fig. 1 (armotated below).
`
`source; aid [sic]
`
`Voltage precharge source
`
`“As shown in FIG. 1, in this intermediate amplifier circuit 1,
`
`positive line LINE which connects connecting terminal 3a of
`
`equalizer circuit 3 and input terminal 4a of receiver circuit 4 is
`
`connected to input/output shared terminal la at node 101, and
`
`negative line N-LINE (where N- represents the negative side)
`
`which connects output terminal 3b of equalizing circuit 3 and
`
`input
`
`terminal 4b of receiver circuit 4 is connected to
`
`input/output shared terminal lb at node 102.” Sukegawa 6:54-
`
`61.
`
`18
`
`Page 20 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`One of ordinary skill in the art at the time of the alleged
`
`invention of the ’130 Patent would have recognized LINE and
`
`develop on these two bus lines. See, e.g., Sukegawa 7:38-43.
`
`LINE_ as the “differential bus” because a voltage differential
`
`(i.e., a difference in voltages between the two bus lines) can
`
`a latching sense
`
`Sukegawa discloses a latching sense amplifier (shown in
`
`amplifier coupled purple) coupled to the differential bus (e.g., LINE, LINE_)_
`
`to the differential
`
`See, e.g., Sukegawa Fig. 1 (annotated below).
`
`bus;
`
`Latching sense
`amplifier
`
`FIG.
`
`7
`
`
`
`BS7
`I
`
`
`
`—
`
`6
`
`The purple box drawn above for the latching sense amplifier is
`
`consistent with Petitioner’s proposed construction of “latching
`
`sense amplifier,” as it is a circuit, including a latch, that detects
`
`19
`
`Page 21 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`and amplifies signals. Each intermediate amplifier 1, 1A, and
`
`1B provides a latch that detects and amplifies the signal on
`
`LINE and LINE_. See, e.g., Sukegawa Fig. 2, 7: 1-8:6.
`
`Sukegawa further discloses that “[a]s shown in FIG. 1, in this
`
`intermediate amplifier circuit 1, positive line LINE which
`
`connects connecting terminal 3a of equalizer circuit 3 and
`
`input
`
`terminal 4a of receiver circuit 4 is connected to
`
`input/output shared terminal la at node 101, and negative line
`
`N—LINE (where N— represents the negative side) which
`
`connects output terminal 3b of equalizing circuit 3 and input
`
`terminal 4b of receiver circuit 4 is connected to input/output
`
`shared terminal lb at node 102.” Sukegawa 6:54-61.
`
`wherein the
`
`Sukegawa discloses a latching sense amplifier
`
`(shown in
`
`latching sense
`
`purple) wherein a first stage (e.g., IN AMP 1, shown in light
`
`amplifier
`
`blue) includes a cross-coupled latch (e.g., transistors 10, 11,
`
`comprises: a first
`
`14, 15) coupled to a differential data bus (pink lines). See, e.g.,
`
`stage including a
`
`Sukegawa Fig. 1 (annotated below).
`
`cross-coupled
`
`latch coupled to a
`
`Page 22 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`differential data
`
`bus; and
`
`Differential
`
`data bus
`
`The light blue box drawn above for the first stage is consistent
`
`with Petitioner’s proposed construction of “stage,” as it is a
`
`“portion of a circuit.” Namely, the first stage is a portion of the
`
`latching sense amplifier. In particular, intermediate amplifier 1
`
`latches and amplifies voltages received through nodes la and
`
`lb, and outputs the amplified voltages through the same nodes.
`
`See, e.g., Sukegawa 7:1-8:6.
`
`Fig. 2 of Sukegawa further discloses the first stage and its
`
`cross—coupled latch: “a circuit diagram illustrating the specific
`
`Page 23 of 83
`
`21
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`configuration of the first
`
`intermediate amplifier circuit 1.”
`
`Sukegawa 6:66-67.
`
`PMOS part of cross-coupled latch
`
`NMOS part of cross-coupled latch
`
`One of ordinary skill
`
`in the an at the time of the alleged
`
`invention of the ’l30 Patent would have recognized, based on
`
`Sukegawa’s disclosure, that the cross-coupled latch comprises
`
`of transistors 10, ll, 14, and 15 because these transistors act to
`
`regenerate full logic levels (both high and low) on LINE and
`
`LINE_. See, e.g., Sukegawa 9: 14-21.
`
`Page 24 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`Moreover,
`
`these transistors are cross—coupled because the
`
`output of a first transistor (e.g., 10) is tied to the input of a
`
`second transistor (e.g., 11), and the output of the second
`
`transistor (e.g., 11) is tied to the input of the first transistor
`
`(e.g., 10).
`
`Output of transistor 10 connected
`to input of transistor 11
`
`Output of transistor 11 connected
`to input of transistor 10
`
`Likewise, the output of transistor 14 is tied to the input of
`
`transistor 15, and vice versa.
`
`23
`
`Page 25 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`Output of transistor 15 connected
`to input of transistor 14
`
`Output of transistor 14 connected
`to input of transistor 15
`
`The first stage is further coupled to the differential data bus Via
`
`LINE, LINE_ and transistors 34, 35 (see e.g., Sukegawa Fig. 1
`
`(annotated below), 6:54-61):
`
`Page 26 of 83
`
`24
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`Differential
`
`data bus
`
`Coupling first stage to
`
`differential data bus
`
`One of ordinary skill in the art at the time of the alleged
`
`invention of the ’130 Patent would have recognized lines
`
`associated with nodes C (shown above in pink) as the
`
`“differential data bus” because the pink highlighted lines
`
`represent an amplified voltage differential representative of the
`
`data to be read out by the latching sense amplifier. See, e.g.,
`
`Page 27 of 83
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`Sukegawa 9:14-24. Indeed, one of ordinary skill in the art at
`
`the time of the alleged invention of the ’ 130 Patent would have
`
`understood the pink highlighted lines to include differential
`
`data because of the amplified voltage differential on these
`
`lines.
`
`Moreover, Fig. 5 of Sukegawa also teaches one intermediate
`
`amplifier (i.e. first stage) prior to the receiver circuit 4 (as
`
`discussed below, the receiver circuit is Sukegawa’s “output
`
`stage”), and thus the first stage and the differential data bus
`
`can be coupled without going through additional intermediate
`
`amplifiers:
`
`an output stage
`
`Sukegawa discloses a latching sense amplifier wherein an
`
`coupled to an
`
`output stage (e.g., receiver circuit 4, shown in orange) is
`
`output of said
`
`coupled to an output of the first stage (e.g., IN AMP 1, shown
`
`first stage;
`
`in light blue), and wherein the output of the first stage is
`
`wherein the
`
`coupled to an input of the output stage. See, e.g., Sukegawa
`
`Page 28 of 83
`
`

`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`Claim Language
`
`Sukegawa and Lu
`
`output of the first
`
`Fig. 1 (annotated below).
`
`stage is coupled
`
`to an input of the
`
`output stage;
`
` _ ._._
`
`.
`
`‘_
`
`‘
`
`0
`
`V
`
`Output of first stage coupled
`
`to input ofoutput stage
`
`
`
`The orange box drawn above for the output stage comprises of
`
`receiver circuit 4 and is consistent with Petitioner’s proposed
`
`construction of “stage,” as it
`
`is a “portion of a circuit.”
`
`Namely, the output stage is a portion of the latching sense
`
`amplifier circuit. In particular, the identified “output stage”
`
`Page 29 of 83
`
`27
`
`

`
`Claim Language
`
`Sukegawa and Lu
`
`Declaration of Dr. R. Jacob Baker
`
`Inter Partes Review of U.S. Patent No. 6,366,130
`
`performs the function of receiving and driving the output

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