`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 1 of 6 PageID #: 1367
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`EXHIBIT I
`EXHIBIT I
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`
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`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 2 of 6 PageID #: 1368
`EXHIBIT I - USP 6,794,677 - OmniVision Technologies, Inc. OV8858 (PureCel)
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`1. A semiconductor integrated circuit device comprising:
`(A) a first circuit pattern having (B) a first linear pattern and placed in (C) a region in which a group of elements having a
`repetitive pattern are formed; and
`(D) a second circuit pattern having (E) a second linear pattern and placed in (F) a region in which components other than the
`group of elements are formed,
`(G) a dummy pattern being inserted in (F) the region in which (D) the second circuit pattern is placed such that a sum perimeter
`of (B) the first linear pattern, (E) the second linear pattern, and (G) the dummy pattern per unit area is equal to or less than a
`perimeter of (B) the first linear pattern per unit area.
`
`SUBJECT TO CHANGE
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`1
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`
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`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 3 of 6 PageID #: 1369
`EXHIBIT I - USP 6,794,677 - OmniVision Technologies, Inc. OV8858 (PureCel)
`
`Claim 1
`
`A semiconductor integrated circuit device comprising:(A) a first circuit pattern having (B) a first linear pattern and placed in (C) a
`region in which a group of elements having a repetitive pattern are formed; and
`
` (A)
`
` (B)
`
`(C)
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`Figure 5.2.4 6T SRAM at Poly
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`SUBJECT TO CHANGE
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`2
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`
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`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 4 of 6 PageID #: 1370
`EXHIBIT I - USP 6,794,677 - OmniVision Technologies, Inc. OV8858 (PureCel)
`
`Claim 1
`
`(D) a second circuit pattern having (E) a second linear pattern and placed in (F) a region in which components other than the
`group of elements are formed,(G) a dummy pattern being inserted in (F) the region in which (D) the second circuit pattern is
`placed
`
`(D)
`
`(G)
`
` (E)
`
`(F)
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`Figure 2.4.1 Overview of Standard Logic
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`SUBJECT TO CHANGE
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`3
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`
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`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 5 of 6 PageID #: 1371
`EXHIBIT I - USP 6,794,677 - OmniVision Technologies, Inc. OV8858 (PureCel)
`
`Claim 1
`
`such that a sum perimeter of (B) the first linear pattern, (E) the second linear pattern, and (G) the dummy pattern per unit area is
`equal to or less than a perimeter of (B) the first linear pattern per unit area.
`
`(A) a first circuit pattern
`
` (B)
`
`(D) a second circuit pattern
`
` (G)
`
` (E)
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`Figure 5.2.4 6T SRAM at Poly
`
`Figure 2.4.1 Overview of Standard Logic
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`SUBJECT TO CHANGE
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`4
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`
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`Case 1:16-cv-00290-MN Document 45-9 Filed 11/22/17 Page 6 of 6 PageID #: 1372
`EXHIBIT I - USP 6,794,677 - OmniVision Technologies, Inc. OV8858 (PureCel)
`
`Claim 1
`
`such that a sum perimeter of (B) the first linear pattern, (E) the second linear pattern, and (G) the dummy pattern per unit area is
`equal to or less than a perimeter of (B) the first linear pattern per unit area.
`
`(A) a first circuit pattern
`
` (B)
`
`(D) a second circuit pattern
`
`(G)
`
`(E)
`
`Figure 5.2.4 6T SRAM at Poly
`
`Both photographs depicted with
`same scale
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`SUBJECT TO CHANGE
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`5
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