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Displaying 114-128 of
342 results
1001 Exhibit: US Patent No 6,792,373 to Tabor
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IPR2015-01627, No. 1001 Exhibit - US Patent No 6,792,373 to Tabor (P.T.A.B. Jul. 27, 2015)
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1006 Exhibit: A Rao, AP Jayasumana, and YK Malaiya, Optimal Clustering and Sta...
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IPR2015-01627, No. 1006 Exhibit - A Rao, AP Jayasumana, and YK Malaiya, Optimal Clustering and Statistical Identification of Defective ICs using IDDQ Testing, Defect Based Testing, 2000, Pr...
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1008 Exhibit: Diane K Michelson, Statistically Calculating Reject Limits at Par ametr...
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IPR2015-01627, No. 1008 Exhibit - Diane K Michelson, Statistically Calculating Reject Limits at Par ametric Test, 1997 IEEECPMT International Electronics Manufacturing Technology Symposium...
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1009 Exhibit: C Michael Whitney and Leslie Fowler, Motorolas Engineering Data An...
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IPR2015-01627, No. 1009 Exhibit - C Michael Whitney and Leslie Fowler, Motorolas Engineering Data Analysis System (P.T.A.B. Jul. 27, 2015)
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1003 Exhibit: Curriculum Vitae of Dr Jacob Abraham
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IPR2015-01627, No. 1003 Exhibit - Curriculum Vitae of Dr Jacob Abraham (P.T.A.B. Jul. 27, 2015)
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1002 Exhibit: Declaration of Dr Jacob Abraham
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IPR2015-01627, No. 1002 Exhibit - Declaration of Dr Jacob Abraham (P.T.A.B. Jul. 27, 2015)
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1014 Exhibit: US Patent No 5,240,866 to Friedman et al
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IPR2015-01627, No. 1014 Exhibit - US Patent No 5,240,866 to Friedman et al (P.T.A.B. Jul. 27, 2015)
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1004 Exhibit: W Ponik, Teradyne Inc
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IPR2015-01627, No. 1004 Exhibit - W Ponik, Teradyne Inc (P.T.A.B. Jul. 27, 2015)
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1005 Exhibit: W Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ D...
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IPR2015-01627, No. 1005 Exhibit - W Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ Data, in International Test Conference 2000 Proceedings, at pages 189 198 Oct 3, 2000 (...
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1007 Exhibit: Automotive Electronics Council, Guidelines for Part Average Testing,...
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IPR2015-01627, No. 1007 Exhibit - Automotive Electronics Council, Guidelines for Part Average Testing, AEC Q001 Rev A, October 8, 1998 (P.T.A.B. Jul. 27, 2015)
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1016 Exhibit: IEEE, The Authoritative Dictionary of IEEE Standards Terms 7th Ed 2...
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IPR2015-01627, No. 1016 Exhibit - IEEE, The Authoritative Dictionary of IEEE Standards Terms 7th Ed 2000 (P.T.A.B. Jul. 27, 2015)
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1012 Exhibit: US Patent No 6,598,194 to Madge et al
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IPR2015-01627, No. 1012 Exhibit - US Patent No 6,598,194 to Madge et al (P.T.A.B. Jul. 27, 2015)
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1013 Exhibit: US Patent No 5,497,381 to ODonoghue et al
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IPR2015-01627, No. 1013 Exhibit - US Patent No 5,497,381 to ODonoghue et al (P.T.A.B. Jul. 27, 2015)
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2001 Exhibit: Ex 2001 Fairchilds Brief ISO Motion to Stay
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CBM2015-00060, No. 2001 Exhibit - Ex 2001 Fairchilds Brief ISO Motion to Stay (P.T.A.B. May. 6, 2015)
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2010 Exhibit: 20161109 Comparison of Singh Declarations
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IPR2016-01833, No. 2010-28 Exhibit - 20161109 Comparison of Singh Declarations (P.T.A.B. Dec. 27, 2016)
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