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9 Notice: Updated Mandatory Notices

Document IPR2015-00421, No. 9 Notice - Updated Mandatory Notices (P.T.A.B. Jan. 28, 2015)

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3 Notice: Related Matters

Document CBM2015-00060, No. 3 Notice - Related Matters (P.T.A.B. Jan. 13, 2015)

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2 Power of Attorney: Power of Attorney

Document CBM2015-00060, No. 2 Power of Attorney - Power of Attorney (P.T.A.B. Jan. 13, 2015)

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6 Notice: Related Matters

Document IPR2015-00421, No. 6 Notice - Related Matters (P.T.A.B. Jan. 9, 2015)

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7 Power of Attorney: Power of Attorney

Document IPR2015-00421, No. 7 Power of Attorney - Power of Attorney (P.T.A.B. Jan. 9, 2015)

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5 Notice: Related Matters

Document IPR2015-00421, No. 5 Notice - Related Matters (P.T.A.B. Jan. 6, 2015)

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1 Power of Attorney: Power of Attorney

Document IPR2015-00421, No. 1 Power of Attorney - Power of Attorney (P.T.A.B. Dec. 11, 2014)

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2014 Exhibit: C2C v Oracle, No 15 1242 Fed Cir Nov 16, 2016

Document IPR2016-01833, No. 2014-32 Exhibit - C2C v Oracle, No 15 1242 Fed Cir Nov 16, 2016 (P.T.A.B. Dec. 27, 2016)

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2005 Exhibit: 20150304 018 ORDER Granting Stay pending IPR CBM

Document IPR2016-01833, No. 2005-23 Exhibit - 20150304 018 ORDER Granting Stay pending IPR CBM (P.T.A.B. Dec. 27, 2016)

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3001 Exhibit: Exhibit

Document IPR2015-01627, No. 3001 Exhibit - Exhibit (P.T.A.B. Jan. 29, 2016)

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1011 Exhibit: Higaki, Remote Monitoring and Control of Semiconductor Processing

Document IPR2016-01833, No. 1011-11 Exhibit - Higaki, Remote Monitoring and Control of Semiconductor Processing (P.T.A.B. Sep. 16, 2016)

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1017 Exhibit: DECLARATION OF JULIE S TURNER IN SUPPORT OF UNOPPOSED...

Document IPR2015-01627, No. 1017 Exhibit - DECLARATION OF JULIE S TURNER IN SUPPORT OF UNOPPOSED MOTION FOR ADMISSION PRO HAC VICE (P.T.A.B. Aug. 18, 2015)

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1011 Exhibit: US Patent No 6,240,329 to Sun

Document IPR2015-01627, No. 1011 Exhibit - US Patent No 6,240,329 to Sun (P.T.A.B. Jul. 27, 2015)

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1010 Exhibit: Robert Trahan and Kevin Dean, A Comprehensive IC Yield Analysis S...

Document IPR2015-01627, No. 1010 Exhibit - Robert Trahan and Kevin Dean, A Comprehensive IC Yield Analysis System in RS1, 1990 IEEESEMI Advanced Manufacturing Conference, pp 99 103 (P.T.A.B...

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1015 Exhibit: US Patent No 6,366,108

Document IPR2015-01627, No. 1015 Exhibit - US Patent No 6,366,108 (P.T.A.B. Jul. 27, 2015)

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