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IPR2015-01087, No. 1028 Exhibit - Ex 1028 Construction Analysis Samsung KM44C4000J 7 16 Megabit DRAM Report 9311 300 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1028 Exhibit - Ex 1028 Construction Analysis Samsung KM44C4000J 7 16 Megabit DRAM Report 9311 300 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1038 Exhibit - Ex 1038 A Four Level Metal Fully Planarized Interconnect Uttecht (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1038 Exhibit - Ex 1038 A Four Level Metal Fully Planarized Interconnect Uttecht (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1021 Exhibit - Ex 1021 US 5675174 Nakajima (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1021 Exhibit - Ex 1021 US 5675174 Nakajima (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1040 Exhibit - Ex 1040 Excerpt from Handbook of Thin Film Deposition Seshan (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1040 Exhibit - Ex 1040 Excerpt from Handbook of Thin Film Deposition Seshan (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1039 Exhibit - Ex 1039 Excerpt from Reexam 90011607 Reexam Patent Owner Statement (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1039 Exhibit - Ex 1039 Excerpt from Reexam 90011607 Reexam Patent Owner Statement (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1019 Exhibit - Ex 1019 Excerpt from Handbook of Refractory Carbides and Nitrides (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1019 Exhibit - Ex 1019 Excerpt from Handbook of Refractory Carbides and Nitrides (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1037 Exhibit - Ex 1037 Development of new electrolytic and electroless gold plating processes (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1037 Exhibit - Ex 1037 Development of new electrolytic and electroless gold plating processes (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1003 Exhibit - Ex 1003 US 6057221 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1003 Exhibit - Ex 1003 US 6057221 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1029 Exhibit - Ex 1029 Construction Analysis Lattice ispLSI2032 180L CPLD Report 9712 573 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1029 Exhibit - Ex 1029 Construction Analysis Lattice ispLSI2032 180L CPLD Report 9712 573 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1018 Exhibit - Ex 1018 Thermal Conductivity of Metals April 1, 2015 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1018 Exhibit - Ex 1018 Thermal Conductivity of Metals April 1, 2015 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1013 Exhibit - Ex 1013 Excerpt from Reexam 90011607 Order Granting Reexam Request (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1013 Exhibit - Ex 1013 Excerpt from Reexam 90011607 Order Granting Reexam Request (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1001 Exhibit - Ex 1001 Declaration of Dr Thomas (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1001 Exhibit - Ex 1001 Declaration of Dr Thomas (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1005 Exhibit - Ex 1005 New Standard IEEE Dictionary (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1005 Exhibit - Ex 1005 New Standard IEEE Dictionary (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1042 Exhibit - Ex 1042 Ineos USA LLC v Berry Plastics Corp, No 2014 1540, 2015 WL 1727013 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1042 Exhibit - Ex 1042 Ineos USA LLC v Berry Plastics Corp, No 2014 1540, 2015 WL 1727013 (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1041 Exhibit - Ex 1041 A new bulge test technique for the determination of Youngs modulus and Poissons ratio of thin films Vlassak (P.T.A.B. May. 4, 2015)
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IPR2015-01087, No. 1041 Exhibit - Ex 1041 A new bulge test technique for the determination of Youngs modulus and Poissons ratio of thin films Vlassak (P.T.A.B. May. 4, 2015)
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