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IPR2017-01844, No. 1301 Exhibit - US Patent No 7,893,501 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1301 Exhibit - US Patent No 7,893,501 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 2304 Exhibit - Office Action dated March 29, 2010 (P.T.A.B. Nov. 8, 2017)
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IPR2017-01844, No. 2304 Exhibit - Office Action dated March 29, 2010 (P.T.A.B. Nov. 8, 2017)
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IPR2017-01844, No. 1302 Exhibit - Shanfield Declaration (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1302 Exhibit - Shanfield Declaration (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1333 Exhibit - M Green et al, Ultrathin 4 nm SiO2 and Si O N gate dielectric layers for silicon microelectronics Understanding the processing, structure, and physical and elec...
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IPR2017-01844, No. 1333 Exhibit - M Green et al, Ultrathin 4 nm SiO2 and Si O N gate dielectric layers for silicon microelectronics Understanding the processing, structure, and physical and electrical
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IPR2017-01844, No. 1335 Exhibit - Infringement contentions dated February 1 2017 (P.T.A.B. Jan. 9, 2018)
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IPR2017-01844, No. 1335 Exhibit - Infringement contentions dated February 1 2017 (P.T.A.B. Jan. 9, 2018)
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IPR2017-01844, No. 1309 Exhibit - J Plummer et al, Silicon VLSI Technology Fundamentals, Practice, and Modeling, 1st ed 2000 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1309 Exhibit - J Plummer et al, Silicon VLSI Technology Fundamentals, Practice, and Modeling, 1st ed 2000 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1317 Exhibit - US Patent No 6,228,777 Arafa (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1317 Exhibit - US Patent No 6,228,777 Arafa (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1329 Exhibit - US Patent No 5,286,344 to Blalock et al Blalock (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1329 Exhibit - US Patent No 5,286,344 to Blalock et al Blalock (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1327 Exhibit - High k dielectrics Current status and Materials Properties Considerations, Wilk, GD, et al, J App Phy Vol 89, No 10, May 15, 2001 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1327 Exhibit - High k dielectrics Current status and Materials Properties Considerations, Wilk, GD, et al, J App Phy Vol 89, No 10, May 15, 2001 (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1306 Exhibit - US Patent Publication No 20020000611 to Hokazono et al Hokazono (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1306 Exhibit - US Patent Publication No 20020000611 to Hokazono et al Hokazono (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1330 Exhibit - Interaction of Transition Metals with Silicon 100 The Ni Si, Co Si and AuSi100 Systems, by Steven Naftel, Graduate Program in Chemistry, The University of We...
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IPR2017-01844, No. 1330 Exhibit - Interaction of Transition Metals with Silicon 100 The Ni Si, Co Si and AuSi100 Systems, by Steven Naftel, Graduate Program in Chemistry, The University of Western Ont
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IPR2017-01844, No. 1328 Exhibit - WO Publication No 2002043151 with certified English translation Shimizu (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1328 Exhibit - WO Publication No 2002043151 with certified English translation Shimizu (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 2301 Exhibit - Request for Continued Examination dated March 29, 2010 (P.T.A.B. Nov. 8, 2017)
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IPR2017-01844, No. 2301 Exhibit - Request for Continued Examination dated March 29, 2010 (P.T.A.B. Nov. 8, 2017)
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IPR2017-01844, No. 1315 Exhibit - US Patent No 6,444,566 to Tsai et al Tsai (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 1315 Exhibit - US Patent No 6,444,566 to Tsai et al Tsai (P.T.A.B. Jul. 26, 2017)
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IPR2017-01844, No. 2306 Exhibit - McGraw Hill Dictionary of Scientific and Technical Terms 2003 (P.T.A.B. Nov. 8, 2017)
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IPR2017-01844, No. 2306 Exhibit - McGraw Hill Dictionary of Scientific and Technical Terms 2003 (P.T.A.B. Nov. 8, 2017)
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