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Displaying 444-458 of 458 results

2021 Exhibit: Ocean Semiconductor LLC v Renesas Electronics Corp et al, No 620 ...

Document IPR2021-01348, No. 2021-51 Exhibit - Ocean Semiconductor LLC v Renesas Electronics Corp et al, No 620 cv 1213 ADA, Notice of Electronic Filing, DI 46 (P.T.A.B. Nov. 26, 2021)

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2019 Exhibit: Ocean Semiconductor LLC v Huawei Device USA Inc, No 420 cv 991 ...

Document IPR2021-01348, No. 2019-49 Exhibit - Ocean Semiconductor LLC v Huawei Device USA Inc, No 420 cv 991 ALM, DI 17, Memorandum Opinion and Order (P.T.A.B. Nov. 26, 2021)

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2024 Exhibit: Defendants��� Preliminary Invalidity Contentions

Document IPR2021-01348, No. 2024-54 Exhibit - Defendants��� Preliminary Invalidity Contentions (P.T.A.B. Nov. 26, 2021)

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1006 Exhibit: Bushman, S, et al, Integration of the APC Framework with AMDs Fab2...

Document IPR2022-01196, No. 1006 Exhibit - Bushman, S, et al, Integration of the APC Framework with AMDs Fab25 Factory System, Proc SPIE 3882, Process, Equipment, and Materials Control in Integra...

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1010 Exhibit: Alptekin S E, A suggested model program for CIM education Industria...

Document IPR2022-01196, No. 1010 Exhibit - Alptekin S E, A suggested model program for CIM education Industrial and Manufacturing Engineering, May 218 1990 Alptekin (P.T.A.B. Jun. 30, 2022)

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1008 Exhibit: Moyne J, White, J, Existing and Envisioned Control Environment for S...

Document IPR2022-01196, No. 1008 Exhibit - Moyne J, White, J, Existing and Envisioned Control Environment for Semiconductor Manufacturing, Run to Run Control in Semiconductor Manufacturing, CRC...

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1004 Exhibit: Order Granting Defendants Opposed Motion to Modify Scheduling O...

Document IPR2022-01196, No. 1004 Exhibit - Order Granting Defendants Opposed Motion to Modify Scheduling Order in 620 cv 1210, 1212, 1214, 1215, and 1216 WDTX (P.T.A.B. Jun. 30, 2022)

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1012 Exhibit: Kenneth W Tobin Jr, Thomas P Karnowski, Fred Lakhani, Integrated a...

Document IPR2022-01196, No. 1012 Exhibit - Kenneth W Tobin Jr, Thomas P Karnowski, Fred Lakhani, Integrated applications of inspection data in the semiconductor manufacturing environment, Proc SP...

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1005 Exhibit: Decision Denying Institution of IPR2021 01348

Document IPR2022-01196, No. 1005 Exhibit - Decision Denying Institution of IPR2021 01348 (P.T.A.B. Jun. 30, 2022)

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1001 Exhibit: US Patent No 6,836,691

Document IPR2022-01196, No. 1001 Exhibit - US Patent No 6,836,691 (P.T.A.B. Jun. 29, 2022)

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1003 Exhibit: Declaration of PK Mozumder, PhD

Document IPR2022-01196, No. 1003 Exhibit - Declaration of PK Mozumder, PhD (P.T.A.B. Jun. 30, 2022)

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1011 Exhibit: Cherrington, B E, An Integrated Approach to Graduate Education in M...

Document IPR2022-01196, No. 1011 Exhibit - Cherrington, B E, An Integrated Approach to Graduate Education in Manufacturing SystemsThe UT Dallas Model, Journal of Engineering Education, Jan8214...

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1009 Exhibit: Barna, G, APC in the Semiconductor Industry, History and Near Term...

Document IPR2022-01196, No. 1009 Exhibit - Barna, G, APC in the Semiconductor Industry, History and Near Term Prognosis, IEEESEMI Advanced Semiconductor Manufacturing Conference 1996 Barna...

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1007 Exhibit: Yelverton, M, et al, Factory Wide Run to Run Process Control, Solid S...

Document IPR2022-01196, No. 1007 Exhibit - Yelverton, M, et al, Factory Wide Run to Run Process Control, Solid State Technology, Vol 42, No 12, p 45 1999 Yelverton (P.T.A.B. Jun. 30, 2022)

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1002 Exhibit: Prosecution History of US Patent No 6,836,691

Document IPR2022-01196, No. 1002 Exhibit - Prosecution History of US Patent No 6,836,691 (P.T.A.B. Jun. 29, 2022)

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