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Displaying 429-443 of
516 results
1320 Exhibit: US Patent No 6,512,266
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IPR2017-01844, No. 1320 Exhibit - US Patent No 6,512,266 (P.T.A.B. Jul. 26, 2017)
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1316 Exhibit: Togo, M et al Low Leakage and High Reliability 15 nm SiON Gate Diel...
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IPR2017-01844, No. 1316 Exhibit - Togo, M et al Low Leakage and High Reliability 15 nm SiON Gate Dielectric Using Radical Oxynitridation for Sub 01 um CMOS, 2000 Symposium on VLSI Tech...
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2302 Exhibit: US Patent No 6,437,404 Xiang
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IPR2017-01844, No. 2302 Exhibit - US Patent No 6,437,404 Xiang (P.T.A.B. Nov. 8, 2017)
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2305 Exhibit: US Patent No 3,390,022
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IPR2017-01844, No. 2305 Exhibit - US Patent No 3,390,022 (P.T.A.B. Nov. 8, 2017)
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1323 Exhibit: D Baglee et al, Reduced Hot Electron Effects in MOSFETs with an Op...
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IPR2017-01844, No. 1323 Exhibit - D Baglee et al, Reduced Hot Electron Effects in MOSFETs with an Optimized LDD Structure, IEEE Electron Device Letters, Vol EDL 5, No 10, at 389 391 Oct 19...
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1305 Exhibit: US Patent No 5,472,890 to Oda Oda
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IPR2017-01844, No. 1305 Exhibit - US Patent No 5,472,890 to Oda Oda (P.T.A.B. Jul. 26, 2017)
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1326 Exhibit: Kastenmeier et al, Remote plasma etching of silicon nitride and silicon...
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IPR2017-01844, No. 1326 Exhibit - Kastenmeier et al, Remote plasma etching of silicon nitride and silicon dioxide using NF3O2 gas mixtures, J Vac Sci Technol A 164, JulAug 1998 Kastenmeier ...
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1308 Exhibit: US Patent No 6,072,237 to Jang et al Jang
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IPR2017-01844, No. 1308 Exhibit - US Patent No 6,072,237 to Jang et al Jang (P.T.A.B. Jul. 26, 2017)
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1319 Exhibit: US Patent No 5,726,479
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IPR2017-01844, No. 1319 Exhibit - US Patent No 5,726,479 (P.T.A.B. Jul. 26, 2017)
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1322 Exhibit: J Moon et al, A New LDD Structure Total Overlap with Polysilicon Spa...
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IPR2017-01844, No. 1322 Exhibit - J Moon et al, A New LDD Structure Total Overlap with Polysilicon Spacer TOPS, IEEE Electron Device Letters, Vol 11, No 5, at 221 223 May 1990 (P.T.A.B. Ju...
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1314 Exhibit: US Patent No 6,110,827 to Chien et al Chien
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IPR2017-01844, No. 1314 Exhibit - US Patent No 6,110,827 to Chien et al Chien (P.T.A.B. Jul. 26, 2017)
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1307 Exhibit: US Patent Publication No 20020145156 to Igarashi et al Igarashi
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IPR2017-01844, No. 1307 Exhibit - US Patent Publication No 20020145156 to Igarashi et al Igarashi (P.T.A.B. Jul. 26, 2017)
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1332 Exhibit: US Patent No 6,326,301 to Venkatesan et al Venkatesan
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IPR2017-01844, No. 1332 Exhibit - US Patent No 6,326,301 to Venkatesan et al Venkatesan (P.T.A.B. Jul. 26, 2017)
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1311 Exhibit: J Rabaey et al, Digital Integrated Circuits, at 40 44 2d ed 2003 Rabae...
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IPR2017-01844, No. 1311 Exhibit - J Rabaey et al, Digital Integrated Circuits, at 40 44 2d ed 2003 Rabaey (P.T.A.B. Jul. 26, 2017)
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1303 Exhibit: Applicants Amendment and Response dated August 6, 2010
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IPR2017-01844, No. 1303 Exhibit - Applicants Amendment and Response dated August 6, 2010 (P.T.A.B. Jul. 26, 2017)
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