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Displaying 294-308 of
342 results
1013 Exhibit: Exhibit 1013 Complaint
Document
CBM2015-00060, No. 1013 Exhibit - Exhibit 1013 Complaint (P.T.A.B. Jan. 13, 2015)
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1012 Exhibit: US Patent No 6,598,194 to Madge
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IPR2015-01994, No. 1012 Exhibit - US Patent No 6,598,194 to Madge (P.T.A.B. Sep. 28, 2015)
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1010 Exhibit: Robert Trahan and Kevin Dean, A Comprehensive IC Yield Analysis S...
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IPR2015-01994, No. 1010 Exhibit - Robert Trahan and Kevin Dean, A Comprehensive IC Yield Analysis System in RS1, 1990 IEEESEMI Advanced Manufacturing Conference, pp 99 103 (P.T.A.B...
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1002 Exhibit: Declaration of Dr Jacob Abraham
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IPR2015-01994, No. 1002 Exhibit - Declaration of Dr Jacob Abraham (P.T.A.B. Sep. 28, 2015)
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1004 Exhibit: W Ponik, Teradynes J957 VLSI Test System Getting VLSI to the Mark...
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IPR2015-01994, No. 1004 Exhibit - W Ponik, Teradynes J957 VLSI Test System Getting VLSI to the Market on Time, December 1985, pp 57 62 (P.T.A.B. Sep. 28, 2015)
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3001 Exhibit: Exhibit
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IPR2015-01994, No. 3001 Exhibit - Exhibit (P.T.A.B. Jan. 29, 2016)
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1011 Exhibit: US Patent No 6,240,329 to Sun
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IPR2015-01994, No. 1011 Exhibit - US Patent No 6,240,329 to Sun (P.T.A.B. Sep. 28, 2015)
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1003 Exhibit: Curriculum Vitae of Dr Jacob Abraham
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IPR2015-01994, No. 1003 Exhibit - Curriculum Vitae of Dr Jacob Abraham (P.T.A.B. Sep. 28, 2015)
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1013 Exhibit: US Patent No 5,497,381 to O Donoghue
Document
IPR2015-01994, No. 1013 Exhibit - US Patent No 5,497,381 to O Donoghue (P.T.A.B. Sep. 28, 2015)
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1015 Exhibit: US Patent No 6,366,108 ONeill
Document
IPR2015-01994, No. 1015 Exhibit - US Patent No 6,366,108 ONeill (P.T.A.B. Sep. 28, 2015)
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1006 Exhibit: A Rao, AP Jayasumana, and YK Malaiya, Optimal Clustering and Sta...
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IPR2015-01994, No. 1006 Exhibit - A Rao, AP Jayasumana, and YK Malaiya, Optimal Clustering and Statistical Identification of Defective IC s using IDDQ Testing, Defect Based Testing, 2000, Pr...
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1005 Exhibit: W Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ D...
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IPR2015-01994, No. 1005 Exhibit - W Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ Data, in International Test Conference 2000 Proceedings, at pages 189 198 Oct 3, 2000 (...
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1008 Exhibit: Diane K Michelson, Statistically Calculating Reject Limits at Parametr...
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IPR2015-01994, No. 1008 Exhibit - Diane K Michelson, Statistically Calculating Reject Limits at Parametric Test, 1997 IEEECPMT International Electronics Manufacturing Technology Symposium...
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1016 Exhibit: IEEE, The Authoritative Dictionary of IEEE Standards Terms 7th Ed 2...
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IPR2015-01994, No. 1016 Exhibit - IEEE, The Authoritative Dictionary of IEEE Standards Terms 7th Ed 2000 (P.T.A.B. Sep. 28, 2015)
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1001 Exhibit: US Patent No 6,792,373 to Tabor
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IPR2015-01994, No. 1001 Exhibit - US Patent No 6,792,373 to Tabor (P.T.A.B. Sep. 28, 2015)
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