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Displaying 189-203 of 516 results

1018 Exhibit: US Patent No 6,512,266

Document IPR2017-01841, No. 1018-17 Exhibit - US Patent No 6,512,266 (P.T.A.B. Jul. 26, 2017)

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1202 Exhibit: Exhibit 1202 Shanfield Declaration

Document IPR2017-01843, No. 1202-26 Exhibit - Exhibit 1202 Shanfield Declaration (P.T.A.B. Jul. 26, 2017)

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2227 Exhibit: US Patent No 5,505,816

Document IPR2017-01843, No. 2227-55 Exhibit - US Patent No 5,505,816 (P.T.A.B. Apr. 20, 2018)

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2220 Exhibit: US Pat No 5,792,695

Document IPR2017-01843, No. 2220-48 Exhibit - US Pat No 5,792,695 (P.T.A.B. Apr. 20, 2018)

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2224 Exhibit: Kastenmeier, et al, J VAC SCI TECH 2102 2000

Document IPR2017-01843, No. 2224-52 Exhibit - Kastenmeier, et al, J VAC SCI TECH 2102 2000 (P.T.A.B. Apr. 20, 2018)

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2201 Exhibit: Request for Continued Examination dated March 29, 2010

Document IPR2017-01843, No. 2201-27 Exhibit - Request for Continued Examination dated March 29, 2010 (P.T.A.B. Nov. 8, 2017)

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1209 Exhibit: J Plummer et al, Silicon VLSI Technology Fundamentals, Practice, an...

Document IPR2017-01843, No. 1209-8 Exhibit - J Plummer et al, Silicon VLSI Technology Fundamentals, Practice, and Modeling, 1st ed 2000 (P.T.A.B. Jul. 26, 2017)

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1130 Exhibit: Infringement contentions dated February 1 2017

Document IPR2017-01842, No. 1130-30 Exhibit - Infringement contentions dated February 1 2017 (P.T.A.B. Jan. 9, 2018)

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1108 Exhibit: US Patent No 6,228,777 Arafa

Document IPR2017-01842, No. 1108-7 Exhibit - US Patent No 6,228,777 Arafa (P.T.A.B. Jul. 26, 2017)

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1124 Exhibit: US Patent No 6,512,266

Document IPR2017-01842, No. 1124-23 Exhibit - US Patent No 6,512,266 (P.T.A.B. Jul. 26, 2017)

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1128 Exhibit: High k dielectrics Current status and Materials Properties Considerat...

Document IPR2017-01842, No. 1128-27 Exhibit - High k dielectrics Current status and Materials Properties Considerations, Wilk, GD, et al, J App Phy Vol 89, No 10, May 15, 2001 (P.T.A.B. Jul. 26, 2017)

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1111 Exhibit: S Kang and Y Leblebici, CMOS Digital Integrated Circuits Analysis an...

Document IPR2017-01842, No. 1111-10 Exhibit - S Kang and Y Leblebici, CMOS Digital Integrated Circuits Analysis and Design, 2d ed 2003 (P.T.A.B. Jul. 26, 2017)

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1109 Exhibit: US Patent No 6,406,963 to Woerlee et al Woerlee

Document IPR2017-01842, No. 1109-8 Exhibit - US Patent No 6,406,963 to Woerlee et al Woerlee (P.T.A.B. Jul. 26, 2017)

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1227 Exhibit: December 19, 2017 Conference Call Transcript

Document IPR2017-01843, No. 1227-33 Exhibit - December 19, 2017 Conference Call Transcript (P.T.A.B. Jan. 9, 2018)

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1120 Exhibit: E Gusev et al, Growth and characterization of ultrathin nitride silicon ...

Document IPR2017-01842, No. 1120-19 Exhibit - E Gusev et al, Growth and characterization of ultrathin nitride silicon oxide films, IBM J Res And Dev, Vol 43, No 3, at 265 286 May 3, 1999 (P.T.A.B. Jul. 26...

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