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CIRCUIT WITH INTERCONNECT TEST UNIT AND A METHOD OF TESTING INTERCONNECTS BETWEEN A FIRST AND A SECOND ELECTRONIC CIRCUIT

09/402,154 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)
Filed Sept. 29, 1999
Examiner CRAIG S MILLER
Class 702
Art Group 2857
Patent No. 6,622,108
Case Type Utility - 702/118000
Status Patented Case
Parent PCT/IB99/00172 -
Child 10/621,002 Patented
Child 98200288.3
Child 98201482.1
Child 98204042.0
Last Updated: 11 months, 1 week ago
Date # Transaction