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Amit Raj Pandey Peggy A. Nissen Shridhar G. Bendi

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METHOD OF EXHAUSTIVELY TESTING AN EMBEDDED ROM USING GENERATED ATPG TEST PATTERNS

10/770,170 | U.S. Patent Application

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Location ELECTRONIC

Filed Feb. 2, 2004

Examiner PHUNG M CHUNG

Class 714

Art Group 2117

Patent No. 7,568,134

Case Type Utility - 714/718000

Status Patented Case

Last Updated: 4 years, 6 months ago

Date	#	Transaction
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METHOD OF EXHAUSTIVELY TESTING AN EMBEDDED ROM USING GENERATED ATPG TEST PATTERNS

10/770,170 | U.S. Patent Application

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