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METHOD AND APPARATUS FOR BUILT-IN SELF TEST OF INTEGRATED CIRCUITS PROVIDING FOR SEPARATE ROW AND COLUMN ADDRESSES

08/917,013 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)
Filed Aug. 21, 1997
Examiner DO H YOO
Class 365
Art Group 2818
Patent No. 6,011,748
Case Type Utility - 365/233000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Parent 60/28,059 Expired
Parent 60/28,060 Expired
Last Updated: 4 years, 4 months ago
Date # Transaction