throbber
Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 1 of 47
`
`Exhibit 6
`in support of the Declaration
`of Kat Li
`
`

`

`US007544276B2
`
`(12) United States Patent
`Zhang et al.
`
`(10) Patent No.:
`(45) Date of Patent:
`
`US 7,544,276 B2
`Jun. 9, 2009
`
`(54) BIASED PULSE DC REACTIVE SPUTTERING
`OF OXDE FILMS
`
`(75) Inventors: Hongmei Zhang, San Jose, CA (US);
`Mukundan Narasimhan, San Jose, CA
`(US); Ravi B. Mullapudi, San Jose, CA
`(US); Richard E. Demaray, Portola
`Valley, CA (US)
`73) Assignee: Spring Works, LLC, Minnetonka, MN
`9.
`pring
`(US)
`Subject to any disclaimer, the term of this
`y
`patent is extended or adjusted under 35
`U.S.C. 154(b) by 529 days.
`(21) Appl. No.: 11/228,834
`(22) Filed:
`Sep. 16, 2005
`
`*) Notice:
`
`(65)
`
`Prior Publication Data
`US 2006/OO54496 A1
`Mar. 16, 2006
`
`Related U.S. Application Data
`(62) Division of application No. 10/101,863, filed on Mar.
`16, 2002, now Pat. No. 7,378,356.
`(51) Int. Cl.
`(2006.01)
`C23C I4/34
`(52) U.S. Cl. .............................. 204/298.08; 204/298.2:
`204/298.06
`(58) Field of Classification Search .............. 204/298.2,
`204/298.06, 298.08
`See application file for complete search history.
`References Cited
`
`(56)
`
`U.S. PATENT DOCUMENTS
`
`3, 1967 Heil
`3,309,302 A
`3,616,403 A 10, 1971 Collins et al.
`3,850,604 A 11/1974 Klein
`4,111,523 A
`9, 1978 Kaminow et al.
`4,437,966 A
`3/1984 Hope et al.
`4,587.225 A
`5/1986 Tsukuma et al.
`
`
`
`4,619,680 A 10/1986 Nourishargh et al.
`RE32,449 E
`6, 1987 Claussen
`4,710,940 A 12/1987 Sipes, Jr.
`4,785.459 A 11/1988 Baer
`4.915,810 A
`4/1990 Kestigian et al.
`4,978,437 A 12, 1990 Wirz
`
`(Continued)
`FOREIGN PATENT DOCUMENTS
`
`EP
`
`O 51.0883 A2 10, 1992
`
`(Continued)
`OTHER PUBLICATIONS
`
`Affinito et al., “PML/oxide/PML Barrier Layer Performance Differ
`ences Arising from Use of UV or Electron Beam Polymerization of
`the PML Layers.” Thin Solid Films vol. 308-309, pp. 19-25 (1997).
`(Continued)
`Primary Examiner Rodney G McDonald
`(74) Attorney, Agent, or Firm—Finnegan, Henderson,
`Farabow, Garrett & Dunner, LLP
`
`(57)
`
`ABSTRACT
`
`A biased pulse DC reactor for sputtering of oxide films is
`presented. The biased pulse DC reactor couples pulsed DC at
`a particular frequency to the target through a filter which
`filters out the effects of a bias power applied to the substrate,
`protecting the pulsed DC power supply. Films deposited uti
`lizing the reactor have controllable material properties Such
`as the index of refraction. Optical components such as
`waveguide amplifiers and multiplexers can be fabricated
`using processes performed on a reactor according to the
`present invention.
`
`13 Claims, 27 Drawing Sheets
`
`Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 2 of 47
`
`18
`
`

`

`U.S. PATENT DOCUMENTS
`
`5,085,904
`5,107,538
`5,119,460
`5,173,271
`5,174,876
`5,196,041
`5,200,029
`5,206,925
`5,225,288
`5,237,439
`5,252,194
`5,287.427
`5,296,089
`5,303,319
`5,306,569
`5,309,302
`5,338,625
`5,355,089
`5,381,262
`5,427,669
`5,457.569
`5,475,528
`5,478,456
`5483,613
`5.499,207
`5,512,147
`5,538,796
`5,555,127
`5,563,979
`5,565,071
`5,569,520
`5,591.520
`5,597,660
`5,603,816
`5,607,560
`5,607,789
`5,612, 152
`5,613,995
`5,654,054
`5,654,984
`5,686,360
`5,689,522
`5,693,956
`5,718,813
`5,719,976
`5,731,661
`5,738,731
`5,755,938
`5,757,126
`5,762,768
`5,771,562
`5,792,550
`5,811,177
`5,830,330
`5,831,262
`5,841,931
`5,847,865
`5,849,163
`5,853,830
`5,855,744
`5,870,273
`5,882,946
`5,900,057
`5,930,584
`5,942,089
`5.948,215
`5,952,778
`5,961,682
`5,966,491
`5,977,582
`6,001,224
`
`2, 1992
`4, 1992
`6, 1992
`12, 1992
`12, 1992
`3, 1993
`4, 1993
`4, 1993
`7, 1993
`8, 1993
`10, 1993
`2, 1994
`3, 1994
`4, 1994
`4, 1994
`5, 1994
`8, 1994
`10, 1994
`1, 1995
`6, 1995
`10, 1995
`12, 1995
`12, 1995
`1, 1996
`3, 1996
`4, 1996
`T. 1996
`9, 1996
`10, 1996
`10, 1996
`10, 1996
`1/1997
`1/1997
`2, 1997
`3, 1997
`3, 1997
`3, 1997
`3, 1997
`8, 1997
`8, 1997
`11, 1997
`11, 1997
`12, 1997
`2, 1998
`2, 1998
`3, 1998
`4, 1998
`5, 1998
`5, 1998
`6, 1998
`6, 1998
`8, 1998
`9, 1998
`11, 1998
`11, 1998
`11, 1998
`12, 1998
`12, 1998
`12, 1998
`1, 1999
`2, 1999
`3, 1999
`5, 1999
`7, 1999
`8, 1999
`9, 1999
`9, 1999
`10, 1999
`10, 1999
`11, 1999
`12, 1999
`
`Deak et al.
`Benton et al.
`Bruce et al.
`Chen et al.
`Buchal et al.
`Tumminelli et al.
`Bruce et al.
`Nakazawa et al.
`Beeson et al.
`Misono et al.
`Demaray et al.
`Atkins et al.
`Chen et al.
`Ford et al.
`Hiraki
`Vollmann
`Bates et al.
`Treger
`Arima et al.
`Drummond
`Liou et al.
`LaBorde
`Humpal et al.
`Bruce et al.
`Miki et al.
`Bates et al.
`Schaffer et al.
`Abdelkader et al.
`Bruce et al.
`Demaray et al.
`Bates
`Migliorini et al.
`Bates
`Demaray et al.
`Hirabayashi et al.
`Treger et al.
`Bates
`Bhandarkar et al.
`Tropsha et al.
`Hershbarger et al.
`Harvey, III et al.
`Beach
`Shi et al.
`Drummond et al.
`Henry et al.
`So et al.
`Shindo et al.
`Fukui et al.
`Harvey, III et al.
`Goyet al.
`Harvey, III et al.
`Phillips et al.
`Shi et al.
`Lantsman
`Greywall et al.
`Foresi et al.
`Gopinath et al.
`Ichikawa et al.
`McCaulley et al.
`Halsey et al.
`Sogabe et al.
`Otani
`Buchal et al.
`Sun et al.
`Sprouletal.
`Lantsman
`Haskal et al.
`Lee et al.
`DiGiovanni
`Fleming et al.
`Drummond et al.
`
`Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 3 of 47
`
`US 7,544.276 B2
`Page 2
`
`6,004,660
`6,024,844
`6,046,081
`6,051,114
`6,051.296
`6,052,397
`6,057,557
`6,058,233
`6,071,323
`6,077,642
`6,080,643
`6,088.492
`6,093.944
`6,106.933
`6,117,279
`6,146,225
`6,154,582
`6,157,765
`6,162,709
`6,165,566
`6,176,986
`6, 197, 167
`6, 198,217
`6,204,111
`6,210,544
`6,214,660
`6,232,242
`6,236,793
`6.242,129
`6,248,291
`6,248.640
`6,261,917
`6,280,585
`6,281,142
`6,287,986
`6,288,835
`6,290,821
`6,290,822
`6,300,215
`6,302,939
`6,306,265
`6,344,419
`6,350,353
`6,356,694
`6,358,810
`6,361.662
`6,365,319
`6,391,166
`6,409,965
`64 13.382
`6,413,645
`6,416,598
`6.423,776
`6,433,380
`6,444,750
`6.452,717
`6,488,822
`6,506,289
`6,511,615
`6,533,907
`6,537,428
`6,563,998
`6,576,546
`6,602.338
`6,605,228
`6,615,614
`6,632.563
`6,673,716
`6,750,156
`6,760,520
`6,768,855
`6,827,826
`6,846,765 B2
`
`12, 1999
`2, 2000
`4, 2000
`4, 2000
`4, 2000
`4, 2000
`5/2000
`5/2000
`6, 2000
`6, 2000
`6, 2000
`T/2000
`T/2000
`8, 2000
`9, 2000
`11, 2000
`11, 2000
`12, 2000
`12, 2000
`12, 2000
`1, 2001
`3, 2001
`3, 2001
`3, 2001
`4, 2001
`4, 2001
`5/2001
`5/2001
`6, 2001
`6, 2001
`6, 2001
`T/2001
`8, 2001
`8, 2001
`9, 2001
`9, 2001
`9, 2001
`9, 2001
`10, 2001
`10, 2001
`10, 2001
`2, 2002
`2, 2002
`3, 2002
`3, 2002
`3, 2002
`4, 2002
`5/2002
`6, 2002
`T/2002
`T/2002
`T/2002
`T/2002
`8, 2002
`9, 2002
`9, 2002
`12, 2002
`1, 2003
`1, 2003
`3, 2003
`3, 2003
`5/2003
`6, 2003
`8, 2003
`8, 2003
`9, 2003
`10, 2003
`1, 2004
`6, 2004
`T/2004
`T/2004
`12, 2004
`1/2005
`
`Topolski et al.
`Drummond et al.
`Kuo
`Yao et al.
`McCaulley et al.
`Jeon et al.
`Ichikawa
`Dragone
`Kawaguchi
`Ogata et al.
`Noguchi et al.
`Kaneko et al.
`VanDover
`Nagai et al.
`Smolanoff et al.
`Sheats et al.
`Bazylenko et al.
`Bruce et al.
`Raoux et al.
`Tropsha
`Watanabe et al.
`Tanaka
`Suzuki et al.
`Uemoto et al.
`Sasaki
`Uemoto et al.
`Hata et al.
`Lawrence et al.
`Johnson
`Nakagama et al.
`Nam
`Quek et al.
`Obinata et al.
`Basceri et al.
`Mihara
`Nilsson et al.
`McLeod
`Fleming et al.
`Shin
`Rabin et al.
`Fu et al.
`Forster et al.
`Gopalraja et al.
`Weber
`Dornfest et al.
`Chiba et al.
`Heath et al.
`Wang
`Nagata et al.
`Wang et al.
`Graffet al.
`Sircar
`Akkapeddi et al.
`Shin
`Touhsaent
`Endo
`Moslehi
`Demaray et al.
`Dawes et al.
`Demaray et al.
`Xiong et al.
`Farah et al.
`Gilbert et al.
`Chen et al.
`Kawaguchi et al.
`Makikawa et al.
`Krasnov et al.
`D’Couto et al.
`Le et al.
`Medin et al.
`Bakke et al.
`Demaray et al.
`Imamura et al.
`
`

`

`US 7,544.276 B2
`Page 3
`
`6,884,327
`7,262,131
`2001/00271.59
`2001/0031122
`2001.0034106
`2001/0041460
`2002fOO33330
`2002/0076133
`2002/0106297
`2002/0134671
`2002/0170821
`2002/019 1916
`2003, OO19326
`2003/0022487
`2003/0042131
`2003/0044118
`2003, OO63883
`2003/0077914
`2003/OO79838
`2003/OO97858
`2003/O1273.19
`2003/0134054
`2003. O141186
`2003.0143853
`2003/01732O7
`2003/0173208
`2003/O174391
`2003/0175142
`2003.0185266
`2004/OO77161
`2004/O105644
`2004/O2593.05
`2005, OOOO794
`2005/OOO6768
`2005, 004.8802
`2005/O175287
`2005, 0183946
`2006, OO57283
`2006/0057304
`2006, OO71592
`2006/0134522
`2007/0053139
`
`B2
`B2
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`A1
`
`4, 2005
`8, 2007
`10, 2001
`10, 2001
`10, 2001
`11, 2001
`3, 2002
`6, 2002
`8, 2002
`9, 2002
`11, 2002
`12, 2002
`1, 2003
`1, 2003
`3, 2003
`3, 2003
`4, 2003
`4, 2003
`5/2003
`5/2003
`T/2003
`T/2003
`T/2003
`T/2003
`9, 2003
`9, 2003
`9, 2003
`9, 2003
`10, 2003
`4, 2004
`6, 2004
`12, 2004
`1 2005
`1/2005
`3, 2005
`8, 2005
`8, 2005
`3, 2006
`3, 2006
`4, 2006
`6, 2006
`3, 2007
`
`Pan et al.
`Narasimhan et al.
`Kaneyoshi
`Lackritz et al.
`Moise et al.
`Wiggins
`Demaray et al.
`Li et al.
`Ueno et al.
`Demaray et al.
`Sandlin et al.
`Frish et al.
`Han et al.
`Yoon et al.
`Johnson
`Zhou et al.
`Demaray et al.
`Le et al.
`Brcka
`Strohhofer et al.
`Demaray et al.
`Demaray et al.
`Wang et al.
`Celii et al.
`Zhang et al.
`Pan et al.
`Pan et al.
`Milonopoulou et al.
`Henrichs
`Chen et al.
`Dawes
`Demaray et al.
`Demaray et al.
`Narasimhan et al.
`Zhang et al.
`Pan et al.
`Pan et al.
`Zhang et al.
`Zhang et al.
`Narasimhan et al.
`Zhang et al.
`Zhang et al.
`
`FOREIGN PATENT DOCUMENTS
`
`Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 4 of 47
`
`O 652 308 A2
`EP
`O 639 655 A1
`EP
`O 820 088 A2
`EP
`O 867 985 B1
`EP
`1068899 A1
`EP
`1092 689 A1
`EP
`1189 080 A2
`EP
`2-054764 A2
`JP
`6-010127. A
`JP
`6-10O333 A
`JP
`T-224379 A
`JP
`T-233469
`JP
`2002-261.87
`KR
`WO96/23085
`WO
`WO97/35044
`WO
`WOOO, 21898 A1
`WO
`WOOO,22742 A2
`WO
`WOOO,36665 A1
`WO
`WOO1/82297 A1
`WO
`WO O2, 12932 A2
`WO
`WO WO 2004/021532 A1
`WO WO 2004/077519 A2
`WO WO 2004/106581 A2
`WO WO 2004/106582 A2
`WO WO 2006/063308 A2
`
`10, 1994
`2, 1995
`1, 1998
`9, 1998
`1, 2001
`4/2001
`3, 2002
`2, 1990
`1, 1994
`12/1994
`8, 1995
`9, 1995
`4/2002
`8, 1996
`9, 1997
`4/2000
`4/2000
`6, 2000
`11, 2001
`2, 2002
`3, 2004
`9, 2004
`12, 2004
`12, 2004
`6, 2006
`
`WO WO 2007/027535
`
`3, 2007
`
`OTHER PUBLICATIONS
`Affinito et al., “Polymer-Oxide Transparent Barrier Layers.” Society
`of Vacuum Coaters, 39th Ann. Technical Conference Proceedings,
`May 5-10, 1996, Philadelphia, PA, pp. 392–397 (1996).
`Alder, T. et al., “High-Efficiency Fiber-to-Chip Coupling Using Low
`Loss Tapered Single-Mode Fiber.” IEEE Photonics Technology Let
`ters, 12(8): 1016-1018 (2000).
`Almeida, Vilson R. et al., “Nanotaper for compact mode conversion.”
`Optics Letters, 28(15): 1302-1304 (2003).
`Asghari et al., “ASOC A Manufacturing Integrated Optics Tech
`nology.” Part of the SPIE Conference on Integrated Optics Devices
`III, vol. 3620, pp. 252-262 (Jan. 1999).
`Barbier et al. "Amplifying Four-Wavelength Combiner, Based on
`Erbium/Etterbium-Doped Waveguide Amplifiers and Integrated
`Splitters', IEEE Photonics Technology Letters, vol. 9, pp. 315-317.
`1997, 4 pages.
`Barbier, Denis, “Performances and potentioal applications of erbium
`doped planar waveguide amplifiers and lasers. GeeO, pp. 58-6 (date
`unknown).
`Beach R.J., “Theory and optimization of lens ducts.” Applied Optics,
`35:12:2005-15 (1996).
`Belkind et al., “Using pulsed direct current power for reactive sput
`tering of Al-O. J. Vac. Sci. Technol. A 17(4), pp. 1934-1940 (Jul.
`1999).
`Bestwick, T., "ASOC silicon integrated optics technology.” Part of
`the SPIE Conferences on Photonics Packaging and Integration, SPIE
`vol. 3631, pp. 182-190 (Jan. 1999).
`Borsella et al., “Structural incorporation of silver insoda-lime glass
`by the ion-exchange process: a photoluminescence spectroscopy
`study”. Applied Physics A71, pp. 125-132 (2000).
`Byer et al., “Nonlinear Optics and Solid-state Lasers.” IEEE Journal
`On Selected Topics in Quantum Electronics, vol. 6, No. 6,pp. 921-929
`(Nov. 2000).
`Campbell et al., “Titanium dioxide (TiO)-based gate insulators.”
`IBM.J. Res. Develop. 43(3), 383-391, (May 1999).
`Chang, C.Y. (edited by), “ULSI Technology.” The McGraw-Hill
`Companies, Inc., New York, 1996, Chapter 4, pp. 169-170,226-231
`(1996).
`Chen et al. “Development of Supported Bifunctional Electrocatalysts
`for Unitized Regenerative Fuel Cells,” Journal of the Electrochemi
`cal Society, 149(8), A1092-99, (2002).
`Choi et al., “Er-Al-codoped silicate planar light waveguide-type
`amplifier fabricated by radio-frequency sputtering. Optics Letters,
`vol. 25, No. 4, pp. 263-265 (Feb. 15, 2000).
`Cooksey et al. "Predicting Permeability & Transmission Rate for
`Multilayer Materials.” Foodtechnology, vol. 53, No. 9, pp. 60-63
`(Sep. 1999).
`Crowder, et al., “Low-Temperature Single-Crystal Si TFT's Fabri
`cated on Si Films Processed via Sequential Lateral Solidification.”
`IEEE, vol. 19, No. 8 (Aug. 1998), pp. 306–308.
`Delavaux et al., “Integrated optics erbium ytterbium amplifier system
`in 10 Gb's fiber transmission experiment', 22nd European Confer
`ence on Optical Communication—ECOC'96, Oslo, 4 pages (1996).
`Distiributed Energy Resources: Fuel Cells, Projects, http://www.
`eere.energy.gov/der/fuel cells/projects.html (2003).
`DuPont Teijin Films, Mylar 200 SBL 300, Product Information
`(2000).
`Electrometals Technologies Limited, Financial Report for the year
`2002, Corporate Directory, Chairman's Review, Review of Opera
`tions (2002).
`E-Tek website: FAQ. Inside E-Tek, E-Tek News, Products: http://
`www.etek-inc.com/ (2003).
`Flytzanis et al., “nonlinear Optics in Composite Materials.” E. Wolf,
`Progress in Optics XXIX (c) Elsevier Scince Publishers B.V., pp.
`323-425 (1991).
`Frazao et al., “EDFA Gain Flattening Using Long-Period Fibre Grat
`ings Based on the Electric Arc Technique.” (date unknown).
`
`

`

`US 7,544.276 B2
`Page 4
`
`Fujii et al., “1.54 mm photoluminescence of Er" doped into SiO,
`films containing Si nanocrystals: Evidence for energy transfer from
`Si nanocrystals for Er'. Appl. Phys. Lett. 71 (9), pp. 1198-1200
`(Sep. 1997).
`Garcia, C. “Size Dependence of Lifetime and Absorption Cross Sec
`tion of SiNanocrystals Embedded in SiO.” Appl. Phys. Lett., vol. 82,
`No. 10, pp. 1595-1597 (Mar. 2003).
`Goossens et al., “Sensitization of TiO, with p-type semiconductor
`polymers.” Delft Interfaculty Research Center, Delft University of
`Technology Laboratory of Inorganic Chemistry, The Netherlands
`(1998).
`Greene et al., “Morphological and electrical properties of rfsputtered
`Y203-doped ZrO2 thin films,” J. Vac. Sci. Tecnol., vol. 13, No. 1
`(Jan./Feb. 1976), pp. 72-75.
`Han, Hak-Seung et al. “Optical Gain at 1.54 m in Erbium-Doped
`Silicon Nanocluster Sensitized Waveguide.” Appl. Phys. Lett... vol.
`79, No. 27, pp. 4568-4570 (Dec. 2001).
`Hayakawa et al., “Enhanced fluorescence from Eu" owing to surface
`plasma oscillation of silver particles in glass'. Journal of Non-Crys
`talline Solids, vol. 259, pp. 16-22 (1999).
`Hayakawa et al., “Field enhancement effect of small Ag particles on
`the fluorescence from Eui-doped SiO, glass”, Appl. Phys. Lett., vol.
`74, No. 11, pp. 1513-1515 (Mar. 1999).
`Hayfield, P.C.S., “Development of a New Material-Monolithic
`Ti4O7 Ebonix Ceramic.” Royal Society Chemistry, (2002).
`Hehlen et al. “Spectroscopic Properties of Er"- and Yb'-doped
`Soda-Lime Silicate and Aluminosilicate Glasses.” Physical Review
`B. vol. 56, No. 15, pp. 9302-9318 (Oct. 1997).
`Hehlen et al. “Uniform Upconversion in High-Concentration Er"-
`doped Soda Lime Silicate and Aluminosilicate Glasses.” Optics Let
`ters, vol. 22, No. 11, pp. 772-774 (Jun. 1997).
`Horst et al., “Compact, Tunable Optical Devices in Silicon
`Oxynitride Wave Guide Technology.” IBM Research Division, 3
`pages (1999).
`Hubner, J. and Guldberg-Kjaer, S., “Planar Er-andYb-Doped Ampli
`fiers and Lasers.” COM Technical University of Denmark, 10. Sup.th
`European Conf. On Integrated Optics, Session WeB2, pp. 71-74
`(2001).
`Hwang, Man-Soo et al., “The effect of pulsed magnetron Sputtering
`on the properties of indium tin oxide thin films.” Elsevier Science
`B.V., p. 29-33, (2003).
`Im, et al. "Controlled Super-lateral Growth of Si Films for
`Microsctructural Manipulation and Optimization.” Materials Sci
`ence Program (1998), pp. 603-617.
`Im, et al., “Crystalline Si Films for Integrated Active-Matrix
`LiquidCrystal Displays.” MrS Bulletin (Mar. 1996), pp.39-48.
`Im, et al., “Single-crystal Si films for thin-film transistor devices.”
`American Institute of Physics (1997), pp. 3434-3436.
`Itoh, M. et al., "Large reduction of singlemode-fibre coupling loss in
`1.5% delta planar lightwave circuits using spot-size converters.”
`Electronics Letters, 38(2):72-74 (2002).
`Jackson et al. "An Accurate Compact EDFA Model.” Dept. of Elec
`trical and Computer Engineering, University of BC (date unknown).
`Janssen et al. “Photoinduced electron transfer from conjugated poly
`mers onto nanocrystalline TiO.” Eindhoven University of Technol
`ogy, The Netherlands (date unknown).
`Johnson, J.E. et al., “Monolithically Integrated Semiconductor Opti
`cal Amplifier and Electroabsorption Modulator with Dual
`Waveguide Spot-Size Converter Input.” IEEE Journal of Selected
`Topics in Quantum Electronics, 6(1):19-25, (2000).
`Jonsson L.B. et al. "Frequency response in pulsed DC reactive sput
`tering processes.” Thin Solid Films, vol. 365, pp. 43-48 (2000).
`Kato et al., “Recent progress on PLC hybrid integration.” Part of the
`SPIE Conference on Optoelectric Integrated Circuits III, SPIE. vol.
`3631, pp. 28-36 (Jan. 1999).
`Kato, Kuniharu et al., “PLC Hybrid Integration Technology and Its
`Application to Photonic Components.” IEEE Journal of Selected
`Topics in Quantum Electronics, 6(1):4-13 (2000).
`Kelly et al., “Reactive pulsed magnetron Sputtering process for alu
`mina films,” J. Vac. Sci. Technol. A 18(6), pp. 2890-2896 (Nov. 2000).
`Kelly et al., “Control of the structure and properties of aluminum
`oxide coatings deposited by pulsed magnetron Sputtering.” J. Vac.
`Sci. Technol. A 17(3), pp. 945-953 (May 1999).
`
`Kik. P.G. etal. "Gain Limiting Processes in Er-doped SiNanocrystal
`Waveguides in SiO.J. Appl. Phys., vol. 91, No. 1, pp. 534-536 (Jan.
`1, 2002).
`Kim et al. “Frequency-dependent pulsed direct current magnetron
`sputtering of titanium oxide films,” J. Vac. Sci. Technol. A 19(2);
`429-434 (Mar. 2001).
`Kim et al. “Mixture Behaviour and Microwave Dielectric Properties
`in the Low-fired TiO,-CuO System.” Jpn. J. Appl. Phys. 39, 2696
`2700, (2000).
`Ladouceur, F. et al., “8.8 Evaluation of Results', Silica-based Buried
`Channel Waveguides and Devices. Chapman & Hall, London, pp.
`98-99 (1996).
`Ladouceur, F. et al., “Effect of side wall roughness in buried channel
`waveguides.” IEEE Proc., vol. 141, pp. 242-248 (Aug. 1994).
`Lamb, William B., “Designing Nonfoil Containing Skins for VIP
`Applications.” DuPont VIA Symposium Presenation, (1999).
`Lamb, William et al. “Designing Non-Foil Containing Skins for
`Vacuum InsulationPanel (VIP) Applications.” Vuoto, vol. XXVIII,
`No. 1-2 Gennaio-Giugno 1999, pp. 55-58 (1999).
`Lange etal, “High Gain Ultra-Short Length Phosphate glass Erbium
`Doped Fiber Amplifier Material”. OSA Optical Fiber Communica
`tions (OFC), 3 pages (2002).
`Laporta et al., “Diode-pumped cw bulk Er: Yb: glass laser', 1952
`Optics Letters vol. 16, No. 24/Dec. 15, 6 pages (1991).
`Laurent-Lund, C. et al., “PECVD Grown Multiple Core Planar
`Waveguides with Extremely Low Interface Reflections and Losses.”
`IEEE Photonics Technology Letters, vol. 10, No. 10, pp. 1431-1433
`(Oct. 1998).
`Lee et al., “Effect of size and roughness on light transmission in a
`S/SiO. Sub.2 waveguide: Experiments and model.” Department of
`Materials Science and Engineering, Massachusetts Institute of Tech
`nology, (Jul. 12, 2000).
`Lee et al. “Effects of interfacial layer growth on the electrical char
`acteristics of thin titanium oxide films on silicon.” Applied Physics
`Letters, 74(21), 3143-3145, (May 1999).
`Love, J.D. et al., “Quantifying Loss Minimisation in Single-Mode
`Fibre Tapers.” Electronics Letters, 22(17):912-914, (1986).
`Mardare et al. “On the structure of Titanium Oxide Thin Films.”
`Analele Stintifice Ale Universitatii AL. I. Cuza IASA. vol. XLV
`XLVI, 201-208 (1999).
`Marques, P.V.S. et al., “Planar Silica-on-Silicon Waveguide Lasers
`Based in Two Layer Core Devices.” 10. Sup,th European Conference
`on Integrated Optics, Session WeB2, pp. 79-82 (2001).
`Meijerink et al. Luminescence of AG" In Crystalline and Glassy
`SrB07, Journal of Physics and Chemistry of Solids, vol. 54, No. 8,
`pp. 901-906, (1993).
`Mesnaoui et al. "Spectroscopic properties of AG' ions in phospage
`glasses of NaPO. AgPO system”, European Journal of Solid State
`and Inorganic Chemistry, vol. 29, pp. 1001-1013, 14 pages (1992).
`Mitomi, O. et al., Design of a Single-Mode Tapered Waveguide for
`Low-Loss Chip-to-Fiber Coupling.: IEEE Journal of Quantum Elec
`tronics, 30(8): 1787-1793, (1994).
`Mizuno et al. “Temperature dependence of oxide decomposition on
`titanium surfaces in UHV.” Submitted to Journal of Vacuum Science
`and Technology, (Oct. 28, 2001).
`Ohkubo et al., “Polarization-Insensitive Arrayed-Waveguide Grating
`Using Pure Si)2 Cladding.” Fifth Optoelectronics and Communica
`tion Conference (OECC 2000) Technical Digest, 2 pages (Jul. 2000).
`Ohmi et al., “Rare earth metal oxides for high-K gate insulator.”
`Tokyo Institute of Technology,(date unknown).
`Ohtsuki et al., “Gain Characteristics of a high concentration Er"-
`doped phosphate glass waveguide”. J. Appl. Phys. 78(6), pp. 3617
`3621 (1995).
`Ono et al., “Design of a Low-loss Y-branch Optical Waveguide.” Fifth
`Optoelectronic and Communications Conference (OECC 2000)
`Technical Digest, 2 pages (Jul. 2000).
`Padmini et al. “Realization of High-Tunability Barium Strontium
`Titanate Thin Films by RF Magnetron Sputtering.” College of Engi
`neering, University of California, Santa Barbara. (date unknown).
`Panet al., “Planar Erj+-doped aluminosilicate waveguide amplifier
`with more than 10 dB gain across C-band.” Optical Society of
`America, 3 pages (2000).
`
`Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 5 of 47
`
`

`

`US 7,544.276 B2
`Page 5
`
`Peters et al., “Formation mechanism of silver nanocrystals made by
`ion irradiation of Na'—Ag" ion-exchanged sodalime silicate glass'.
`Nuclear Instruments and Methods in Physics Research B 168, pp.
`237-244 (2000).
`Rajarajan, M. et al., et al., “Numerical Study of Spot-Zise Expanders
`for an Efficient OEIC to SMF Coupling.” IEEE Photonics Technol
`ogy Letters, 10(8): 1082-1084, (1998).
`Ramaswamy et al., “Ion-Exchanged Glass Waveguides: A Review”.
`Journal of Lightwave Technology, vol. 6, No. 6, pp.984-1001 (1988).
`Roberts et al., “The Photoluminescence of Erbium-doped Silicon
`Monoxide.” Department of Electronics and Computer Science, 7
`pages (Jun. 1996).
`Sanyo Vacuum Industries Co., Ltd. Products Info, TiO, (2003).
`http://www.sanyovac.co.jp/Englishweb/products/ETiO2.htm.
`Schermer, R. et al., “Investigation of Mesa Dielectric Waveguides.”.
`Proceedings of the OSA Integrated Photonics Research Topical
`Meeting and Exhibit, Paper No. IWB3 (Jun. 2001).
`Schiller et al. “PVD Coating of Plastic Webs and Sheets with High
`Rates on Large Areas.” European Materials Research Society 1999
`Spring Meeting, Jun. 1-4, 1999, Strasbourg, France (1999).
`Second International Symposium of Polymer Surface Modification:
`Relevance to Adhesion, Preliminary Program (1999).
`Seventh International Conference on TiO, Photocatalysis: Funda
`mentals & Applications, Toronto, Ontario, Canada, Final Program
`(Nov. 7-21, 2002).
`Sewell, P. et al., “Rib Waveguide Spot-Size Transformers: Modal
`Properties,” Journal of Lightweave Technology, 17(5):848-856,
`(1999).
`Shaw etal. “Use of Vapor Deposited Acrlate Coatings to Improve the
`Barrier Properties of MetallizedFilm.’ Society of Vacuum Coaters
`505/856-7 168, 37th Annual Technical Conference Proceedings, pp.
`240-244 (1994).
`Shin et al. “Dielectric and Electrical Properties of Sputter Grown
`(Ba,Sr)TiO Thin Films,” J. Appl. Phys., vol. 86, No. 1, pp. 506-513
`(Jul 1999).
`Shmulovich et al., “Recent progress in Erbium-doped waveguide
`amplifiers.” Bell Laboratories, 3 pages (1999).
`Slooff et al. "Optical properties of Erbium-doped organic
`polydentate cage complexes'. J. Appl. Phys. 83, pp. 497-503 (Jan.
`1998).
`Smith, R.E., “Reduced Coupling Loss Using a Tapered-Rib Adia
`batic-Following Fiber Coupler.” IEEE Photonics Technology Letters,
`8(8): 1052-1054 (1996).
`Strohhofer, et al. “Energy transfer to Erin Agion-exchanged glass”.
`FOM Institute for Atomic and Molecular Physics, 10 pages (date
`unknown).
`Sugiyama et al., “Gas Permeation Through the Pinholes of Plastic
`Film Laminated with Aluminum Foil.” Vuoto, vol. XXVIII, N.
`1-2–Gennaio-Guigno (1999).
`Tervonen, A., “Challenges and opportunities for integrated optics in
`optical networks.” Part of the SPIE Conference in Integrated Optics
`Devices III, SPIE vol. 3620, pp. 2-11 (Jan. 1999).
`Ting et al., “Study of planarized sputter-deposited SiO2.” J. Vac. Sci.
`Technol., 15(3) pp. 1105-1112 (May/Jun. 1978).
`Treichel et al., “The influence of pulsed magnetron Sputtering on
`topography and crystallinity of TiO2 films on glass. Space and
`Coatings Technology, vol. 123, pp. 268-272 (2000).
`Tukamoto, H. et al., “Electronic Conductivity of LiCoOs and Its
`Enhancement by Magnesium Doping.” J. Electrochem. Soc., vol. 44.
`No. 9, pp. 3164-3168 (Sep. 1997).
`Van Dover, R.B. "Amorphous Lanthanide-Doped TiOx Dielectric
`Films.” Appl. Phys. Lett., vol. 74, No. 20, pp. 3041-3043 (May 1999).
`Viljanen et al., “Planar Optical Coupling Elements for Multimode
`Fibers with Two-Step Ion Migration Process'. Applied Physics, 24.
`No. 1, pp. 61-63 (Jan. 1981).
`Villegas et al., “Optical spectroscopy ofa Soda lime glass exchanged
`with silver'. Physics and Chemistry of Glasses 37(6), pp. 248-253
`(1996).
`Von Rottkay et al. “Influence of stoichiometry on electrochromic
`cerium-titanium oxide compounds.” Lawrence Berkeley National
`Laboratory, UC Berkeley, CA, (date unknown).
`
`Westlinder et al. “Simulation and Dielectric Characterization of
`Reactive dc Magnetron Cosputtered (TaOs) (TiO). Thin Films.”
`J. Vac. Sci. Technol. B. vol. 20, No. 3, pp. 855-861 (May/Jun. 2002).
`Wilkes, Kenneth T. "Gas Permeation Through Vacuum Barrier Films
`and its Effect on VIP Thermal Performance. Vacuum Insulation
`Panel Symp., Baltimore, Maryland, (May 3, 1999).
`Yanagawa, H. et al., “Index-and-Dimensional Taper and Its Applica
`tion to Photonic Devices,” Journal of Lightwave Technology,
`10(5):587-591 (1992).
`Yoshikawa, K. et al., “Spray formed aluminium alloys for Sputtering
`targets.” Power Metallurgy, vol.43, No. 3 (2000).
`Zhang, Hongmeietal. “High Dielectric Strength, High kTiO Films
`by Pulsed DC, Reactive Sputter Deposition.” (2001).
`Office Action issued on Sep. 27, 2004 in U.S. Appl. No. 10/291,179.
`Response to Office Action filed on Mar. 14, 2005 in U.S. Appl. No.
`10/291,179.
`Office Action issued on Jun. 15, 2005 in U.S. Appl. No. 10/291,179.
`Office Action issued on May 2, 2002 in U.S. Patent No. 6,533,907.
`Response to Office Action filed on Sep. 3, 2002 in U.S. Patent No.
`6,533,907.
`Office Action issued on Feb. 12, 2004 in U.S. Appl. No. 09/903,081.
`Response to Office Action filed on Aug. 10, 2004 in U.S. Appl. No.
`09/903,081.
`Office Action issued on Sep. 10, 2004 in U.S. Appl. No. 09/903,081.
`Amendment/RCE filed on Aug. 10, 2004 in U.S. Appl. No.
`09/903,081.
`Office Action issued on Mar 17, 2005 in U.S. Appl. No. 09/903,081.
`Response to Office Action issued on Jun. 17, 2005 in U.S. Appl. No.
`09/903,081.
`Office Action issued on Jul. 8, 2005 in U.S. Appl. No. 09/903,081.
`Office Action issued on May 14, 2003 in U.S. Appl. No. 10/101,492.
`Response to Office Action filed on Aug. 14, 2003 in U.S. Appl. No.
`10/101,492.
`Office Action issued on Sep. 3, 2003 in U.S. Appl. No. 10/101,492.
`Response to Office Action filed on Mar. 3, 2004 in U.S. Appl. No.
`10/101,492.
`Office Action issued on Feb. 24, 2004 in U.S. Appl. No. 10/101,863.
`Response to Office Action filed on Jul. 23, 2004 in U.S. Appl. No.
`10/101,863.
`Office Action issued on Oct. 6, 2004 in U.S. Appl. No. 10/101,863.
`Office Action dated Jan. 13, 2005, received in U.S. Appl. No.
`10/101,863.
`Response to office Action filed on Jun. 10, 2005 in U.S. Appl. No.
`10/101,863.
`Office Action issued on Aug. 4, 2005, in U.S. Appl. No. 10/101,863.
`Office Action dated Mar. 25, 2005, received in U.S. Appl. No.
`10/954, 182.
`Office Action issued on Oct. 22, 2003 in U.S. Appl. No. 10/101.341.
`Response to Office Action filed on Feb. 23, 2004 in U.S. Appl. No.
`10/101,341.
`Office Action issued on Jun. 10, 2004 in U.S. Appl. No. 10/101.341.
`Response to Office Action filed on Dec. 8, 2004 in U.S. Appl. No.
`10/101,341.
`Office Action issued on May 4, 2004 in U.S. Appl. No. 10/101,493.
`International Search Report issued on Nov. 21, 2003 in PCT/US03/
`24.809.
`Office Action issued on Mar. 14, 2005 in U.S. Appl. No. 10/789,953.
`International Search Report issued on Oct. 11, 2004 in PCT/US2004/
`OO5531.
`Written Opinion issued on Oct. 11, 2004 in PCT/US2004/005531.
`Office Action issued on Mar. 24, 2005 in U.S. Appl. No. 10/851,542.
`Pct international Search Report of Application No. PCT/US2004/
`0.14524 dated Mar. 2, 2005.
`PCT International Search Report of Application No. PCT/US2004/
`0.14523 dated Jan. 17, 2005.
`Belkind, A. et al., “Pulsed-DC Reactive Sputtering of Dielectrics:
`Pulsing Parameter Effects.”43rd Annual Technical Conference Pro
`ceedings-Denver: 86-90 (Apr. 15-20, 2000).
`Scholl, R., “Power Supplies for Pulsed Plasma Technologies: State
`Of-The-Art And Outlook.” Advances Energy Industries, Inc., pp. 1-8
`(1999).
`Scholli, R., “Power Systems for Reactive Sputtering of Insulating
`Films.” Advances Energy Industries, Inc., pp. 1-8 (Aug. 2001).
`
`Case 6:20-cv-00636-ADA Document 252 Filed 11/21/22 Page 6 of 47
`
`

`

`US 7,544.276 B2
`Page 6
`
`Office Action dated Dec. 1, 2006, in U.S. Appl. No. 10/291,179.
`Office Action dated Dec. 18, 2006, in U.S. Appl. No. 09/903,081.
`Office Action dated Dec. 1, 2006, in U.S. Appl. No. 1 1/100,856.
`Response dated Feb. 6, 2007, in U.S. Appl. No. 10/101,863.
`Response to Office Action dated Dec. 6, 2006, in U.S. Appl. No.
`10/954, 182.
`Supplemental Preliminary Amendment dated Feb. 6, 2007, in U.S.
`Appl. No. 11/191,643.
`Response to Office Action dated Dec. 21, 2006, in U.S. Appl. No.
`11/228,805.
`Response to Office Action dated Nov. 8, 2006, to the Korean Patent
`Office in Application No. 10-2005-70 16055.
`Response to Office Action dated Jan. 26, 2007, in U.S. Appl. No.
`10/851,542.
`Preliminary Amendment dated Jul. 21, 2006, in U.S. Appl. No.
`11/297,057.
`Supplemental Preliminary Amendment, Substitute Specification
`with Markings, Substitute Specification without Markings, and
`Replacement Drawing Sheets dated Dec. 6, 2006 in U.S. Appl. No.
`11/297,057.
`Continuation application and Preliminary Amendment dated Dec.
`13, 2006.
`Voluntary Amendment dated Aug. 15, 2006 in TW Appl. No.
`94143175.
`PCT International Search Report and Written Opinion for Applica
`tion No. PCT/US05/44781 dated Oct. 3, 2006.
`Specification dated Sep. 2, 2005, for U.S. Appl. No. 1 1/218,652.
`Office Action issued Sep. 21, 2005 in U.S. Appl. No. 1 1/100,856.
`Office Action issued on Oct. 25, 2005, in U.S. Appl. No. 10/954,182.
`Office Action issued on Oct. 3, 2005 in U.S. Appl. No. 10/650.461.
`Agrawal, G.P. in: Fiber-Optic Communication Systems, 2nd Edi
`tion, John Wiley & Sons, New York, pp. 361-399 and 415 (1997).
`Cocorullo, G. et al., “Amorphous silicon waveguides and light modu
`lators for integrated photonics realized by low-temperature plasma
`enhanced chemical-vapor deposition.” Optics Lett. 21(24): 2002
`2004 (1996).
`Masuda, H. & Kawai, S., “Wide-band and gain-flattened hybrid fiber
`amplifier consisting of an EDFA and a multiwavelength pumped
`raman amplifier.” IEEE Photonics Technology Lett. 11(6):647-649
`(1999).
`Snoeks, E. et al., “Cooperative upconversion in erbium-implanted
`Soda-lime silicate glass optical waveguides. J. Opt. Soc. Am. B
`12(8): 1468-1474 (1995).
`Response to Office Action filed on Oct. 17, 2005 in U.S. Appl. No.
`10/291,179.
`Final Office Action issued on Dec. 14, 2005 in U.S. Appl. No.
`10/291,179.
`Response to Final Office Action filed Apr. 14, 2006, in U.S. Appl. No.
`10/291,179.
`Office Action mailed Apr. 27, 2006, in U.S. Appl. No. 10/291,179.
`Response to Office Action filed Jul. 27, 2006, in U.S. Appl. No.
`10/291,179.
`Fi

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket