`Iketaniet al.
`
`t15
`
`US005703510A
`[11] Patent Number:
`[45] Date of Patent:
`
`5,703,510
`Dec. 30, 1997
`
`[54] POWER ON RESET CIRCUIT FOR
`GENERATING RESET SIGNAL AT POWER
`ON
`
`7-15308
`7-24379
`
`1/1995
`3/1995
`
`Japan.
`Japan .
`
`
`
`[75] Inventors: Masayuki Iketani; Shigeki Ohbayashi,=Primary Examiner—Timothy P. Callahan
`both of Hyogo, Japan
`Assistant Examiner—Jung Ho Kim
`i
`.
`Price,
`lanc &
`
`[73] Assignee: Mitsubishi Denki Kab Attorney, Agent, or Firm—Lowe, Price, LeBlanc&Becker. .
`Tokyo, Japan
`[57]
`ABSTRACT
`
`
`
`
`
`[21] Appl. No.: 608,075
`[22] Filed:
`Feb. 28, 1996
`‘
`(51)
`Int. CL
`sreceneene
`[52] U.S. CL.senvennes
`[58] Field ofSearch..
`
`[56]
`
`. HO3L 7/00
`"327/143;327/198; 327/546
`577198
`35 nsg 143,
`“3 u 8,3 9, 544,
`545, 546
`References Cited
`
`U.S. PATENT DOCUMENTS
`9/1994 McAdams wosenccssssssscmenes, 327/143
`5,347,173
`5,374,923 12/1994 Sakamoto ......
`ee 327/143
`
`5,523,710
`6/1996 Miyake etal......
`vesans sitios
`5,528,184
`6/1996 Gola et al.
`wee
`“. 327/198
`5,612,641
`3/1997 Sali secsmesssnse
`FOREIGN PATENT DOCUMENTS
`
`A power on reset circuit includes a transistor connected
`between a power supply node and a first node, a first
`capacitor connected between a ground node anda first node,
`a resistance element connected parallel to the first capacitor,
`a first CMOSinverter circuit having an input node con-
`nectedtothe firstnodeandanoutputnode connectedtothe
`secondnode, and a second CMOSinvertercircuithaving an
`input node connected to the second node and an output node
`connected to the first node. Preferably, the power on reset
`circuit further includes a second capacitor connected
`between the power supply node and the second node.In the
`power onreset circuit, when the power is turned off, thefirst
`capacitor is fully discharged by the resistance element.
`:
`steed ee
`oe
`‘Therefore, areset signal for initializing internal circuitry can
`be surely generated even when the power is again turned on.
`
`61-222318 10/1986
`
`Japan.
`
`4 Claims, 6 Drawing Sheets
`
`ll
`
`11 POR
`NC(VC)
`
`c Vss
`
`Vss
`
`[ss
`
`XILINX EXHIBIT 1007
`Page 1
`
`XILINX EXHIBIT 1007
`Page 1
`
`
`
`US. Patent
`
`Dec. 30, 1997
`
`Sheet 1 of 6
`
`5,703,510
`
`FIG.
`
`1
`
`PRIOR ART
`
`
`
`NA(VA)
`
`
`
`NC(VC)
`
`lh
`
`Vss
`
`POR
`
`[ss
`
`XILINX EXHIBIT 1007
`Page 2
`
`XILINX EXHIBIT 1007
`Page 2
`
`
`
`U.S. Patent
`
`Dec. 30, 1997
`
`Sheet 2 of 6
`
`5,703,510
`
`
`
`XILINX EXHIBIT 1007
`Page 3
`
`XILINX EXHIBIT 1007
`Page 3
`
`
`
`US. Patent
`
`Dec. 30, 1997
`
`Sheet 3 of 6
`
`5,703,510
`
`FIG, 4
`
`PERIOD 1
`
`PERIOD 2
`
`PERIOD 3
`
`_
`
`PERIOD 4
` (a) Vdd (V)
`
`0
`
`5
`
`4.5
`
`(b) VA CV)
`
`0
`4.5
`
`(c) VBCV)
`
`(d) VC CV)
`
`TIME
`
`XILINX EXHIBIT 1007
`Page 4
`
`XILINX EXHIBIT 1007
`Page 4
`
`
`
`US. Patent
`
`Dec. 30, 1997
`
`Sheet 4 of 6
`
`5,703,510
`
`FIG. 5
`
`a
`
`ADDRESS INPUT CIRCUIT
`
`&
`
`—.|CONTROL
`CIRCUIT
`
`MEMORY CELL ARRAY
`
`cs
`
`56
`
`20~|
`
`POR
`
`SENSE AMPLIFIER/WRITE DRIVER
`57
`57
`
`57
`
`ee 53
`
`CIRCUIT+--| = . +-||
`
`57
`
`DATA INPUT/OUTPUT CIRCUIT
`
`54
`
`XILINX EXHIBIT 1007
`Page 5
`
`XILINX EXHIBIT 1007
`Page 5
`
`
`
`U.S. Patent
`
`Dec. 30, 1997
`
`Sheet 5 of 6
`
`5,703,510
`
`29
`
`
`
`dayqulSSACCY
`
`YAINNOD
`
`19
`
`TS
`
`9‘OIA
`
`sva
`
`chy
`
`Svo"TOHINO9
`gO}Linda)
`
`AXONGN
`
`
`
`PPAWUT"TYNSAINI
`
`
`
`PpArxe€9
`
`LINDaTD
`
`AlddNs
`
`
`
`LINOAIDINdLNO/LNdNI
`
` TaMOd
`VLVd AVaNVTTI)
`
`XILINX EXHIBIT 1007
`Page 6
`
`XILINX EXHIBIT 1007
`Page 6
`
`
`
`
`
`
`U.S. Patent
`
`Dec. 30, 1997
`
`Sheet 6 of 6
`
`5,703,510
`
`FIG. 7
`
`
`NB(VB)
`NC(VC)
`
`POR
`
`21.
`
`Vv
`
`SS
`
`‘
`12
`
`|
`
`c Vss
`12
`
`70
`
`FIG. 8
`
`
`
`
`11
`
`ll
`
`11
`
`11
`
`Vss
`
`POR
`
`NC(VC)
`
`%
`
`XILINX EXHIBIT 1007
`Page 7
`
`XILINX EXHIBIT 1007
`Page 7
`
`
`
`5,703,510
`
`1
`POWER ON RESET CIRCUIT FOR
`GENERATING RESET SIGNAL AT POWER
`ON
`
`BACKGROUND OF THE INVENTION
`
`1. Field of the Invention
`The present invention relates to a power on reset circuit.
`More specifically, the present invention relates to a power on
`reset circuit used in an SRAM (Static Random Access
`Memory), a DRAM (Dynamic random Access Memory) or
`the like, for initializing internal circuitry thereof when the
`power is turned on.
`2. Description of the Background Art
`In a semiconductor integrated circuit device such as the
`SRAM, DRAM orthe like, a power on reset circuit for
`resetting the internal circuitry at the time of power on has
`been used, For example, Japanese Patent Laying-Open No.
`61-222318 discloses a power on reset circuit capable of
`generating a reset signal even if rise of a power supply
`voltage is moderate. A structure of a conventional typical
`power on reset circuit similar to that disclosed in this
`application is shown in FIG. 1.
`Referring to FIG. 1, before power on, the voltage VA at a
`node NA,the voltage VB at a node NB and the voltage VC
`at anode NCareall at an L (logic low) level (ground voltage
`Vss). When the power is turned on and the power supply
`voltage Vdd at a power supply node 11 becomes higher than
`2xVth (Vth: threshold voltage of transistors 13, 14), tran-
`sistors 13 and 14 turn on, charging of capacitor 15 starts, and
`the voltage VA at node NAstarts to increase. When the
`power supply voltage Vdd rises to a voltage which allows
`operation of inverters 18 and 19, inverter 18 generates a
`signal at an H (logic high) level, and in response to the H
`level signal, inverter 19 generates a power on reset signal
`POR which is at the L level. In response to the power on
`reset signal POR at the L level, internal circuitry of the
`SRAM, DRAM or the like is initialized. When the power
`supply voltage Vdd further rises and exceeds the threshold
`value of inverter 18, inverter 18 generates an L level signal,
`and in response to the L level signal, inverter 19 generates
`a power on reset signal POR which is at the H level. Thus
`initialization of the internal circuitry is completed. Since the
`Llevel signal from inverter 18 is applied to transistor 17, the
`power supply voltage Vdd is applied to inverter 18 through
`transistor 17. Therefore, a latch circuit 16 latches the L level,
`and power on reset signal /POR is maintained at the H level.
`However, in the power on reset circuit 10, there is a
`problem that charges corresponding to the threshold voltage
`of transistor 17 are left in capacitor 15 even when the power
`is turned off. This is because the transistors 13 and 14 are
`each diode connected, and there is not a path through which
`charges of capacitor 15 are extracted, other than transistor
`17. If the power is again turned on with chargesstill left in
`capacitor 15, power on reset circuit 15 cannot activate the
`power on reset signal /POR to the L level.
`Power onreset circuit 10 is capable of keeping power on
`reset signal /PORat the H level unless power supply voltage
`Vdd fluctuates widely. However,if the power supply voltage
`Vdd fluctuates significantly, it may possibly activate the
`power on reset signal /PORto the L level again even after
`initialization.
`
`SUMMARYOF THE INVENTION
`
`Therefore, an object of the present invention is to provide
`a power on reset circuit which can surely generate a reset
`signal when the power is again turned on.
`
`2
`Another object of the present invention is to provide a
`power on reset circuit which does not erroneously generate
`areset signal even when the power supply voltage fluctuates
`significantly.
`According to the present invention, the power on reset
`circuit includes a load unit, a capacitor, a resistance element,
`and first and second CMOSinverter circuits. The load unit
`is connected between a power supply node anda first node.
`The capacitor is connected between a ground node and the
`first node. The resistance element is connected parallel to the
`capacitor. The first CMOS inverter has an input node con-
`nected to the first node, and an output node connected to the
`second node. The second CMOSinverter circuit has an input
`node connected to the second node, and an output node
`connected to the first node.
`
`5
`
`10
`
`15
`
`A main advantage of the present invention is that the
`capacitor is completely discharged when the power is turned
`off, and as a result, the reset signal is surely generated when
`the power is again turned on, since a resistance elementis
`connected parallel to the capacitor.
`The foregoing and other objects, features, aspects and
`advantages of the present
`invention will become more
`apparent from the following detailed description of the
`present
`invention when taken in conjunction with the
`accompanying drawings.
`
`BRIEF DESCRIPTION OF THE DRAWINGS
`
`FIG. 1 is a schematic diagram showing a structure of a
`conventional power on reset circuit.
`FIG.2 is a circuit diagram showing a structure of a power
`on reset circuit in accordance with a first embodimentof the
`present invention.
`FIG. 3 is a schematic diagram showing a specific structure
`of a latch circuit shown in FIG. 2.
`
`FIG. 4 is a timing chart showing the operation of the
`power on reset circuit shown in FIG. 2.
`FIG. § is a block diagram showing an example of an
`SRAM for which the power onreset circuit is used.
`FIG. 6 is a block diagram showing an example of a
`DRAM for which the power on reset circuit is used.
`FIGS.7 and 8 are schematic diagrams showing structures
`of the power on reset circuit in accordance with the second
`and third embodiments of the present invention, respec-
`tively.
`
`DESCRIPTION OF THE PREFERRED
`EMBODIMENTS
`
`Embodiments of the present invention will be described in
`detail with reference to the figures. In the figures, like
`reference characters denote like portions.
`First Embodiment
`
`Referring to FIG. 2, a power on reset circuit 20 in
`accordance with the first embodiment of the present inven-
`tion includes P channel MOS tansistors 13 and 14 con-
`nected in series, a capacitor 15, a resistance element 21
`having high resistance value, a flipflop latch circuit 22, a
`capacitor 25, and an inverter 19 for waveform shaping.
`Transistors 13 and 14 are each diode connected, and con-
`nected between power supply node 11 and a node NA.
`Capacitor 15 is connected between ground node and node
`NA.Resistance element 21 is connected parallel to capacitor
`15. Latch circuit 22 includes mutually cross coupled CMOS
`inverters 23 and 24. Inverter 23 has an input node connected
`to node NA, and an output node connected to node NB.
`
`35
`
`45
`
`55
`
`XILINX EXHIBIT 1007
`Page 8
`
`XILINX EXHIBIT 1007
`Page 8
`
`
`
`5,703,510
`
`3
`Inverter 24 has an input node connected to node NB, and an
`output node connected to node NA. Capacitor 25 is con-
`nected between power supply node 11 and node NB. Here,
`transistors 13 and 14 function as load elements for charging
`capacitor 15 when power supply voltage Vdd becomes
`higher than 2xVth (Vth: threshold voltage of transistors 13,
`14).
`Referring to FIG. 3, CMOS inverter 23 in latch circuit 22
`includes a P channel MOStransistor 31 and an N channel
`MOS transistor 32 connected in series between power
`supply node 11 and ground node 12. Another CMOSinverter
`24 in latch circuit 22 includes a P channel MOS transistor 33
`and an N channel MOStransistor 34 connected in series
`between power supply node 11 and ground node 12.
`The operation of power on reset circuit structured as
`above will be described referring to FIG. 4. In FIG.4, (a)
`shows change in power supply voltage Vdd with time, (b)
`showschange in voltage VA at node NA in FIG.2, (c) shows
`change in voltage VB at node NB,and (d) shows change in
`voltage VC at node NC.
`Referring to (a) of FIG. 4, when the power is turned on at
`time t@, power supply voltage Vddrises from ground voltage
`Vss (0 V) to a prescribed voltage (for example, 5 V). In a
`period 1 from timetO to time t1, as shown in (b) of FIG.4,
`the voltage VA at node NA is pulled down toward ground
`voltage Vss by the coupling of capacitor 15, while the
`voltage of VB at node NB is pulled up toward the power
`supply voltage Vdd by the coupling of capacitor 25, as
`shownin (c) of FIG. 4. Accordingly, while the voltage VA
`at node NAis kept at the ground voltage Vss, the voltage of
`VB at node NB rises together with the power supply voltage
`Vdd. Therefore, as shown in (d) of FIG. 4, the voltage VC
`at node NCis kept at the ground voltage Vss.
`Thereafter, when the power supply voltage Vdd has been
`increased to such a level at which a voltage exceeding the
`threshold voltage of latch circuit 22 is transmitted to node
`NAthrough transistors 13 and 14 (tl), the voltage VB at
`node NB falls to the ground voltage Vss (the power supply
`voltage at this time will be referred to as “reset voltage”).
`Therefore, the voltage VC at node NC rises to the power
`supply voltage Vdd. Here, when we assumethat the thresh-
`old value of latch circuit 22 is 2.5 V and the threshold
`voltages of transistors 13 and 14 are 1.0 V, respectively, then
`the voltage VA at node NA would reach 2.5 V, which is the
`threshold value of latch circuit 22, when the power supply
`voltage Vdd reaches 4.5 V. Thereafter, in a period 2 from
`time point tl to time point t2, the voltage VA at node NA
`follows the power supply voltage Vdd.
`In a period 3 (t2 - t3) after the power supply voltage Vdd
`has reached a prescribed level, even when the power supply
`voltage Vdd fluctuates, the voltage VB at node NB is kept
`at the ground voltage Vss, since latch circuit 22 includes
`CMOSinverters 23 and 24 cross coupled to each other.
`Therefore, erroneous activation of power on reset circuit
`/POR can be prevented.
`Whenthe power is turnedoff at time t3, the power supply
`voltage Vdd lowers toward the ground voltage Vss in the
`period 4 from 13 to t4, and as the power supply voltage Vdd
`lowers,
`the voltage VA at node NA lowers as well. If
`resistance 21 were not provided, the voltage VA at node NA
`would not be lowered to the ground voltage Vss as shown by
`the dotted line in (b) of FIG. 4. If the power supply voltage
`Vdd becomes lower than 2xVth (Vth: threshold voltage of
`transistors 13, 14), transistors 13 and 14 both turn off, and
`as a result, the voltage VA at node NA will never be lowered
`than the threshold voltage of transistor 33 in CMOSinverter
`
`4
`2A. Therefore, if the inverter 24 includes a resistance ele-
`mentin place of transistor 33, the voltage VA at node NA
`would be lowered to the ground voltage Vss. However,in
`that case, current consumption will be increased as com-
`pared with a full CMOSstructure.
`However, in power on reset circuit 20, though the invert-
`ers 23 and 24 have CMOSstructures, the voltage VA at node
`NA lowers to the ground voltage Vss as shown by the solid
`line in (b) of FIG.4, since resistance element 21 is connected
`parallel to capacitor 15. The reason for this is that the
`capacitor 15 can be fully discharged by resistance element
`21. Further, current consumption can be reduced, as invert-
`ers 23 and 24 both have the CMOSstructure.
`Now,let us assume that the capacitance of capacitor 15 is
`1 [pF], the value of resistance element 21 is 100 [GQ] and
`residual voltage at node NA is 1 [V]. Then the current I
`flowing through resistance element 21 can be calculated by
`the following simple equation (1).
`
`I=1 [VV‘100 [GQ10 [pA]
`
`(1)
`
`Therefore, the time T necessary for the residual voltage of
`1 [V] to disappear can be calculated in accordance with the
`following simple equation (2).
`
`T=1 [pF}-1 [VV10 [pA}=0.1 [Sec]
`
`@)
`
`Namely, the residual voltage of capacitor 15 disappears
`only in 0.1 second, which means that the power on reset
`signal /POR is surely activated when the power is again
`turned on, provided that the power is kept off for a period
`longer than 0.1 second.
`though
`Therefore, according to the first embodiment,
`latch circuit 22 includes CMOS inverters 23 and 24 to
`prevent erroneous generation of the power on reset signal
`associated with fluctuation of the power supply voltage Vdd
`and to reduce current consumption, the capacitor 15 can be
`fully discharged immediately after the power off, as the
`resistance element 21 is connected parallel to capacitor 15.
`Therefore, the power on reset signal can be surely activated.
`when the power is again turned on. Further, since capacitor
`25 is connected between node NB and power supply node
`11, the voltage VB at node NB can be surely pulled up
`toward the power supply voltage Vdd when the power is
`turned on.
`As described above, even when the power supply voltage
`Vdd fluctuates, erroneous activation of the power on reset
`signal can be prevented, and in addition, current consump-
`tion is reduced. Therefore, the power on reset circuit is
`especially effective when used in a device which is backed
`up by a battery.
`Power on reset circuit 20 is used, for example, in the
`SRAM shownin FIG. 5. The SRAM includes a memory cell
`array 51 including static memory cells arranged in a matrix;
`an address input circuit 52 for inputting an address for
`specifying a memory cell; a sense amplifier/write driver 53
`for amplifying data read from memory cell 51 and for
`amplifying data to be written to memory cell array 51; a data
`input/output circuit 54 for inputting/outputting data to and
`from sense amplifier/write driver 53; a control circuit 55 for
`controlling internal circuitry in response to an output enable
`signal OF, a write enable signal WE, a chip select signal
`TS or the like; a row redundant program circuit 56 for
`replacing a defective row in memory cell array 51 with a
`spare row; and a column redundant program circuit 57 for
`replacing a defective column in memory cell array 51 with
`a spare column. The power on reset signal generated by
`power on reset circuit 20 is supplied to control circuit 55,
`
`10
`
`15
`
`20
`
`30
`
`35
`
`45
`
`50
`
`55
`
`65
`
`XILINX EXHIBIT 1007
`Page 9
`
`XILINX EXHIBIT 1007
`Page 9
`
`
`
`5,703,510
`
`5
`redundant row program circuit 56, redundant column pro-
`gram circuit 57 and so on, and the circuits 55 to 57 are
`initialized in response to the power on reset signal.
`The power on reset circuit 20 is also used in a DRAM
`shown in FIG.6.
`The DRAM includes a memory cell array 51 including
`dynamic memory cells arranged in a matrix; an address
`input circuit 52; a sense amplifier/write driver 53; a data
`input/output circuit 54; a row redundant program circuit 56;
`a column redundant program circuit 57; an address counter
`61 for generating an internal address for refreshing, for
`example; a control circuit 62 for controlling internal cir-
`cuitry in response to a row address strobe signal RAS, a
`column address strobe signal TAS, an output enable signal
`OE, a write enable signal WE or the like; an internal power
`supply circuit 63 for generating an internal power supply
`voltage intVdd, a boosted voltage Vpp, a substrate voltage
`Vbbor the like based on an external power supply voltage
`extVdd; and a mode switching circuit 64 for switching
`between each of a nibble mode, a page mode, a test mode
`and the like. The power on reset signal generated by power
`on reset circuit 20 is supplied to address counter 61, control
`circuit 62, internal power supply circuit 63, mode switching
`circuit 64, redundant row program circuit 56, redundant
`column program circuit 57 and so on. Therefore, these
`circuits 61 to 64, 56, 57 are initialized in response to the
`power on reset signal.
`Second Embodiment
`In the first embodiment, MOS transistors 13 and 14 are
`used as load elements for charging capacitor 15. However,
`it is difficult to set the threshold voltages of transistors 13
`and 14 at desired values, due to variation in manufacturing
`process.
`.
`A power onreset circuit 70 in accordance with the second.
`embodiment shown in FIG. 7 uses a bipolar transistor 71
`which does not depend on variation in the manufacturing
`process. The bipolar transistor 71 is diode connected and
`connected between power supply node 11 and node NA.
`Therefore, instead of MOStransistors 13 and 14, the bipolar
`transistor 71 turns on when the power supply voltage Vdd
`becomes higher than a pn junction voltage, and starts
`charging the capacitor 15. Since the threshold voltage of
`bipolar transistor 71 is determined by the pn junction
`voltage, it does not depend on variation in the manufacturing
`process. Since bipolar transistor 71 is used as a load element
`for charging capacitor 15 in the second embodiment, tran-
`sistor 71 having a desired threshold voltage can be readily
`manufactured. Therefore, a power on reset circuit generating
`a power onreset signal for a desired period can be provided.
`Third Embodiment
`Referring to FIG. 8, a power on reset circuit 80 in
`accordance with the third embodiment includes, in addition
`to the structure of the first embodiment, a diode connected
`bipolar transistor 71, a diode connected N channel MOS
`transistor 81, a fuse element $82 connected in series with P
`channel MOStransistors 13 and 14, a fuse element 83
`connected in series with transistor 71, and a fuse element 84
`connected in series with transistor $1. Transistor 71 is
`connected between power supply node 11 and node NA,and
`may function as a load element for charging capacitor 15.
`Transistor 81 is also connected between power supply node
`11 and node NA and it may function as a load element for
`charging capacitor 15. When fuse element 82 is blown off,
`transistors 13 and 14 are inactivated. When fuse element 83
`is blownoff,transistor 71 inactivated. When fuse element 84
`is blown off, transistor 81 is inactivated.
`Assume that the threshold voltage of P channel MOS
`transistors 13 and 14 is 0.5 V, the threshold voltage of
`bipolar transistor 71 is 0.8, that of N channel MOStransistor
`81 is 0.5 V and that oflatch circuit 22 is 0.5 V. When fuse
`
`6
`elements 83 and 84 are blownoff, only the transistors 13 and
`14 are activated, and hence reset voltage (power supply
`voltage Vdd at which the voltage VA at node NA and voltage
`VB at node NB are inverted) VR can be calculated in
`accordance with the following simple equation (3).
`
`VR=threshold voltage of transistor 13+threshold voltage of tran-
`sistor 14+threshold voltage of latch circuit 22=1.5 [Y]
`(3)
`
`Whenthe fuse elements 82 and 83 are blownoff,the reset
`voltage can be calculated in accordance with the following
`equation (4).
`
`VR=threshold voltage of transistor 81+threshold voltage of latch
`circuit 22=1.0 [V]
`(4)
`
`Whenfuse elements 82 and 84 are blownoff, reset voltage
`VR can be calculated in accordance with the following
`equation (5).
`
`VR=threshold voltage of transistor 71+threshold voltage of latch
`circuit 22=1.3 [V]
`(5)
`
`In the third embodiment, a plurality of load elements
`having different threshold voltages are connected parallel to
`each other and a fuse element is connected in series with
`each of the load element. Therefore, by appropriately blow-
`ing off the fuse element, desired reset voltage can beset.
`Though three load elements are connected in parallel in
`the third embodiment, two or four or more load elements
`may be connected in parallel. The number of transistors
`constituting each load element is not limited at all.
`Although the present invention has been described and
`illustrated in detail, it is clearly understood that the sameis
`by way of illustration and example only and is not to be
`taken by wayoflimitation,the spirit and scope ofthe present
`invention being limited only by the terms of the appended
`claims.
`Whatis claimed is:
`1. A power on reset circuit, comprising:
`load means connected between a first power supply node
`and a first node;
`a first capacitor connected between a second power sup-
`ply node and said first node;
`resistance means connected parallel to said first capacitor;
`a first CMOS inverter circuit having an input node con-
`nected to said first node and an output node connected
`to a second node; and
`a second CMOS inverter circuit having an input node
`connected to said second node and an output node
`connected to said first node.
`2. The power on reset circuit according to claim 1, further
`comprising
`a second capacitor connected between said first power
`supply node and said second node.
`3. The power on reset circuit according to claim 2,
`wherein
`
`said load meansincludes a diode-connected bipolar tran-
`sistor.
`4. The power on reset circuit according to claim 2,
`wherein
`said load meansincludes
`
`a plurality of load elements connected parallel to each
`other, and
`a plurality of fuse elements correspondingto said plurality
`of load elements, each connected in series to corre-
`sponding one of said plurality of load elements.
`*
`*
`* *
`
`10
`
`15
`
`35
`
`45
`
`60
`
`65
`
`XILINX EXHIBIT 1007
`Page 10
`
`XILINX EXHIBIT 1007
`Page 10
`
`