throbber
CRYSTAL RECTIFIERS
`
`By HENRY C. TORREY
`ASSOCIATE PROFESSOR OF PHYSICS
`RUTGERS UNIVERSITY
`
`And CHARLES A. WHITMER
`ASSOCIATE PROFESSOR OF PHYSICS
`RUTGERS UNIVERSITY
`
`EDITED BY
`
`8. A. GoupsmIt
`
`Leon B. Linrorp
`
`James L. Lawson
`
`Apsert M. Stone
`
`OFFICE OF SCIENTIFIC RESEARCH AND DEVELOPMENT
`
`NATIONAL DEFENSE RESEARCH COMMITTEE
`
`First Epirion
`Sreconp IMPRESSION
`
`
`
`NEW YORK AND LONDON
`
`McGRAW-HILL BOOK COMPANY,
`
`INC.
`
`1948
`
`1
`
`APPLE ET AL. EXHIBIT 1016
`
`APPLE ET AL. EXHIBIT 1016
`
`1
`
`

`

`CRYSTAL RECTIFIERS
`
`Coprricut, 1948, BY THE
`McGraw-Hitt Book Compaxy, Inc.
`PRINTED IN THE UNITED STATES OF AMERICA
`
`All rights reserved. This book, or
`parts thereof, may not be reproduced
`im any form without permission of
`the publishers.
`
`
`Ee \NST. Tey |
`
`MAR 20 195°
`Linpsey-
`
`THE MAPLE PRESS COMPANY, YORK, PA.
`
`2
`
`

`

`Foreword
`
`
`HE tremendous research and development effort that went into the
`development of radar and related techniques during World WarII
`resulted not only in hundreds of radar sets for military (and some for
`possible peacetime) use but also in a great body of information and new
`techniques in the electronics and high-frequency fields. Because this
`basic material may be of great value to science and engineering,it seemed
`most important to publish it as soon as security permitted.
`The Radiation Laboratory of MIT, which operated under the super-
`vision of the National Defense Research Committee, undertook the great
`task of preparing these volumes. The work described herein, however,is
`the collective result of work done at many laboratories, Army, Navy,
`university, and industrial, both in this country and in England, Canada,
`and other Dominions.
`The Radiation Laboratory, once its proposals were approved and
`finances provided by the Office of Scientific Research and Development,
`chose Louis N. Ridenour as Editor-in-Chief to lead and direct the entire
`project. An editorial staff was then selected of those best qualified for
`this type of task. Finally the authors for the various volumesor chapters
`or sections were chosen from among those experts who were intimately
`familiar with the variousfields, and who wereable and willing to write
`the summaries of them. This entire staff agreed to remain at work at
`MITfor six months or more after the work of the Radiation Laboratory
`was complete. These volumes stand as a monumentto this group.
`These volumes serve as a memorial to the unnamed hundreds and
`thousands of other scientists, engineers, and others who actually carried
`on the research, development, and engineering work the results of which
`are herein described. There were so manyinvolvedin this work and they
`worked so closely together even though often in widely separated labora-
`tories that it is impossible to name or even to know those who contributed
`to a particular idea or development. Only certain ones whowrote reports
`or articles have even been mentioned. But to all those who contributed
`in any way to this great cooperative developmententerprise, both in this
`country and in England, these volumesare dedicated.
`L. A. DuBrince.
`
`Ae
`Aoee\
`
`i
`
`3
`
`3
`
`

`

`
`
`
`
`MRSAMIRctasERGiLesichatgeReinkeobeattentiaccsiSRORORTEReR
`
`4
`
`
`

`

`
`
`Preface
`
`
`1TH the development of microwave radar,
`the crystal rectifier,
`WShick had been little used since the invention of the vacuum tube
`several decades ago, again became important—as important as the magne-
`tron, klystron, or other microwave components.
`In the past five years crystal rectifiers have been manufactured,
`literally by the millions, for use primarily as microwave detectors. A
`correspondingly large amount of fundamental research and engineering
`development has taken place in the commercial and governmentallabora~-
`tories in the United States and in England. As a result the crystal-
`rectifier unit that has emerged is a compact, stable device whichis superior
`in many applications to the vacuum-tube diode.
`Its most extensive use
`up to now has been as a frequency converter in microwavereception,
`where its performance has not been equaled.
`It has also been used to a
`lesser extent as a low-level microwave detector.
`The recent development of germanium rectifiers capable of withstand-
`ing relatively high inverse voltages holds great promise for applications
`as second detectors in wideband receivers and in a variety of other cir-
`cuits where vacuum-tubediodes are ordinarily used.
`The purpose of this book is to present the fund of knowledge on crystal
`rectifiers that has accumulated during the course of World War II.
`Because of the need in radar systems for high-quality microwave con-
`verters, a large fraction of the work was expended for the develop-
`ment of crystal rectifiers for this application. A correspondingly large
`fraction of the book has, therefore, been devoted to the theory and proper-
`ties of the crystal converter. Other applications are discussed in Part III
`as Special Types.
`As in every other branch of microwave work, the development of
`measuring equipment and techniques has taken place simultaneously
`with that of the crystal rectifier itself. We have,
`therefore, included
`detailed discussions of methods of measurement of crystal properties
`and a description of standard test equipment for production and routine
`testing.
`The techniques for manufacturing converter crystals are discussed in
`Chap. 10. Special
`techniques required for the manufacture of other
`types are described in the appropriate chapters. The procedures pre-
`sented in detail are drawn largely from the work done at the MIT
`vu
`
`
`
`5
`
`

`

`
`
`Vill
`
`PREFACE
`
`Radiation Laboratory and by NDRCcontractees, but no attempt has
`been madetc include the details of all of the procedures that have been
`successfully employed.
`Because of the unique nature of war research and development, it
`is impossible to acknowledge adequately individual contributions to
`this subject. Much of the workis a result of the joint efforts of many
`individuals. At the present writing most of the available literature
`is in the form of reports that, for reasons of security, have not yet been
`published in scientific journals. Much of
`the literature referred to
`will undoubtedly appear later, however, in journal articles, or will be
`declassified and made available by the United States government.
`We have therefore given references to some of the more important of
`these documents.
`In England the chief contributors to crystal research and develop-
`ment were the General Electric Company, British Thompson-Houston,
`Ltd., Telecommunications Research Establishment, and Oxford Uni-
`versity;
`in this country they were the Bell Telephone Laboratories,
`Westinghouse Research Laboratory, General Electric Company, Sylvania
`Electric Products, Inc., and E. I. duPont de Nemours and Company.
`The crystal groups at the University of Pennsylvania and Purdue Uni-
`versity, who operated under NDRCcontracts, were responsible for much
`of the fundamental research and development work reported herein.
`DuPont and the Eagle-Picher Company developed manufacturing
`processes and produced in quantity highly purified silicon and germanium
`oxide, respectively, without which much of the improvement in crystal
`rectifiers would have been impossible.
`the Radiation
`We are particularly indebted to our colleagues at
`Laboratory whose contributions and stimulating discussions have been
`invaluable in writing this book.
`The preparation of
`this manuscript would have been impossible,
`finally, without the splendid aid of the editorial staff.
`In addition to
`those names listed as editors, we wish particularly to emphasize our
`gratitude to Barbara E. Myers, Marjorie 5. Tariot, and Natalie C.
`Tucker, editorial assistants.
`
`Henry C. Torrey.
`CHaRLes A. WHITMER.
`
`CamBripGe, Mass.
`June, 1946.
`
`||
`
`6
`
`

`

`Contents
`
`
`FOREWORDsy L. A. DuBnripce .
`
`PREFACE. .....
`
`Cuar.1.
`
`INTRODUCTION .. .
`
`vii
`
`THE PHENOMENON OF RECTIFICATION... ...
`1-1. The Nonlinear Element.....
`1-2. Detection.
`fo
`1-3. Frequency Conversion ae
`Tue NaTURE OF THE CRYSTAL RECTIFIER.
`.
`.
`1-4. The Discovery and Early Use of CrystalIRectifiers.
`1-5. Recent Developments . Ce ee
`
`aononPe
`
`PART I. GENERAL PROPERTIES
`
`Cuap.
`
`2,5 FUNDAMENTAL PROPERTIES OF THE CRYSTAL RECTI-
`FIER... 2...
`
`15
`
`15
`15
`18
`
`20
`20
`23
`
`25
`25
`33
`
`40
`
`45
`
`45
`
`51
`53
`
`64
`
`THE PRESENT CrysTAL CARTRIDGES.
`Lo ee ee
`2-1. Description of the Cartridge
`2-2. Stability and Handling Precautions. .......2.2.2..
`ELECTRICAL PROPERTIES.
`.
`
`.
`
`.
`
`.
`
`.
`
`2:3. The Voltage-current Characteristic
`2-4. The Equivalent Circuit.
`.
`.
`Mixer CrysTaAlts........
`
`.
`.
`2-5. Conversion Loss, Noise, and Noise Figure.
`2-6. Optimum Local-oscillator Level
`.
`.
`. an
`2-7. The R-f Impedanceof Crystal Rectifiers Loe
`2-8. The I-f Impedanceof Crystal Rectifiers
`
`.
`
`Cuap. 3. PROPERTIES OF SEMICONDUCTORS.
`
`Lo
`.
`3-1. Band Theory...
`3-2. Electron Distribution in1 Semiconduetors Loe
`3-3. Work Functions and Contact Potentials .
`3-4. Electrical Conductivity and. Hall Coefficient for Scmiconductors
`3-5. Characteristic Constants of Silicon and Germanium .
`3-6. Effect of Impurity Additions in Silicon and Germanium.
`ix
`
`7
`
`

`

`x
`
`CONTENTS
`
`Cuap. 4. THE SEMICONDUCTOR—METAL CONTACT ........ 68
`
`toe eee ee 68
`. 2. 2...
`4:1. Barrier-layer Rectification.
`4-2. Formation and Structure of the Barrier Layer. toe ee ee
`70
`4-3. Diffusion and Diode Theories of Rectification .
`. 2... .. ..
`WZ
`4.4. The D-c Characteristic.
`. 2. 2...) ee. 82
`4.5. Depletion Layers.
`.
`.
`. 0)
`4-6. Rectification at High Frequencies Poe ee ee ee OF
`
`PART II. THE CRYSTAL CONVERTER
`
`Cuap. 5. FREQUENCY CONVERSION. ................ 211
`5-1. Discussion of the General Problem.
`.
`. 2... ... 2.2... ‘114
`5-2. The Admittance Matrix. ....... coe ee ee ee ey TNE
`
`THe PHENOMENOLOGICAL THEORY OF CONVERSION... ....... . 119
`5:3. The Admittance Matrix in Terms of Measurable Parameters .
`. 119
`5-4, Transformation of the Matrix to New Variables...
`.
`.
`.
`.
`. 121
`5-5. Reciprocity. ....... Coe ee ee 184
`Conversion Loss anD MIXER ADMITTANCES.......... 2...
`. 128
`
`. 2... 128
`. 2.
`5-6. General Definition of Loss; Special Cases...
`5-7. Conversion Loss in the Broadband Case...
`.... . ... . 130
`5-8. General Expression for Conversion Loss.
`.
`2. ee. 186
`.
`.
`5-9. Effect of the Image Termination on Conversion Loss.
`. ew. 140
`5-10. Effect of Image Termination on I-f Impedance. ....... . 148
`Tue Puysican THEORY oF CONVERSION. ............... 152
`5-11. Matrix of a Nonlinear Resistance .
`.
`.
`woe ee. 158
`5-12. Effect of Parasitic Impedances on Conversion Loss. 2. ew.
`. 157
`5-13, Effect of a Variable Barrier Capacitance... ......... 168
`5-14. Harmonie Reinforcement... .. .
`. eee ee. 167
`5-15. Conversion with a Subharmonic Local Oscillator. wee ee ee 170
`5-16. Harmonic Generation...
`. 2... 2. ee ee ee 18
`5-17. Modulation. ©... 1 ee ee TS
`
`Cuar.6. NOISEGENERATION....................179
`THEoRY.......
`.
`See eee ee 19
`
`6-1. Shot and Thermal Noise inna CrystalRectifiers... 2... .. . 179
`6-2. Other Sources of Noise... 2... .
`to ee ee ee 186
`INTERMEDIATE-PREQUENCY AND Vipgeo NOISE. ............ . 187
`6-3. Dependence of Noise Temperature on Frequency. ....... 188
`6-4. Dependence on Temperature. ...........2.2.2. =. 104
`
`MicrowavE NoIsE..... 2... ee ee ee ew we 195
`6-5. The Crystal as a Microwave Noise Generator. ...... .
`. 195
`Cuar. 7. LOSS AND NOISE MEASUREMENTS. ..... we ew ee . 198
`Loss MEASUREMENTS .... . Ce ee ee ee we 198
`7-1, General Considerations.
`. 5...) 1 1 et ee ewe 198
`‘
`
`
`
`&
`:
`z
`i
`:
`c
`&
`i
`b
`:
`,
`e
`:
`
`i
`:
`
`:
`i
`
`:
`t
`‘
`
`
`
`pepeseparmemRef
`
`&
`‘
`4
`‘
`i
`|
`i
`4
`:
`
`:
`4
`:
`:
`
`:
`:

`
`MERRIESAR,NITRBEIESI
`
`
`
`
`
`8
`
`

`

`. 200
`. Ce ee ee
`.
`7-2. The Heterodyne Method .
`202
`
`7-3. .2.....-....0-0080-2 204Impedance Methods...
`
`. 213
`7-4, The Incremental and Amplitude-modulation Mcthods .
`
`CONTENTS
`
`Xi
`
`NOISE-TEMPBRATURE MEASUREMENTS .
`7-5. General Considerations.
`.
`Loe
`7-6. The Roberts Coupling Cireuit.
`.
`.
`. 2...
`7-7. Narrow-band Coupling Circuit.
`7-8. Use of the Noise Diode in Noise-temperature Measurements.
`
`. 2...
`
`MEASUREMENT OF Loss, NoIsE, AND RECEIVER NOISE FIGURE .
`7-9. The Measurement of Receiver Noise Figure.
`7-10. The Measurement of Mixer-crystal Properties.
`7-11. Loss and Noise Temperature as a Function of R-f Tuning.
`
`Cuap.8. BURNOUT. .......
`
`8-1. General Considerations.
`8-2. Burnout Theory.
`Loe
`8-3. Burnout Theory.
`Lone
`8-4. Experiments on BurnoutLoe
`8-5. Burnout Limitations of Standard Crystal Units Lae
`
`Cuap. 9, TEST EQUIPMENT.....
`Stranparp Loss Tsst Sets.
`9-1. The Conversion-loss Set for the 39cm Band ......
`9-2. The Conversion-loss Set for the 10-cem Band. .... .
`9-3. The Conversion-loss Set for the l-cm Band .
`.
`9-4, The Mechanical Modulator. .......
`
`Stanparp Notss Test Sets .....
`
`9-5. The Noise Measuring Set for the 3-cm Band. ....... .
`9-6. The Noise Measuring Set for the 10-em Band. .......
`9-7. Noise-temperature Measurement of l-cm Rectifiers.
`.
`.
`
`BuRNovUr
`.
`. Loe
`9-8. Bpike Test
`9-9. Microsecond Pulse Test
`
`1 ee ee ee ee
`2 1.

`Frevp TESTING.
`9-10. D-c Tests. 2. 6. we ee ee ee
`
`. 218
`. 218
`. 223
`. 225
`. 226
`
`. 227
`- 227
`. 230
`. 232
`
`. 236
`
`. 236
`. 239
`. 248
`. 256
`. 260
`
`. 264
`
`. 264
`. 265
`. 272
`. 276
`. 280
`
`. 283
`. 283
`. 289
`. 292
`
`. 293
`. 293
`. 296
`
`. 297
`. 297
`
`Cuap. 10. MANUFACTURING TECHNIQUES .....
`PREPARATION: OF SEMICONDUCTOR.
`.
`.
`.
`. 0-1)
`+ et ee ee
`10-1. Purification of the Semiconductor .
`.
`.
`10-2. Addition Agents.
`. :
`soe
`10-3. Preparation of the Ingot -Le
`10-4. Polishing, Heat-treatment, and Etchingre
`
`
`
`
`
`9
`
`

`

`xii
`
`CONTENTS
`
`Tue Cat WHISKER. ....
`Lone ae
`.
`10-5. Whisker Materials.
`10-6. Fabrication of the Whisker Coe
`ASSEMBLY AND ADJUSTMENT OF THE CARTRIDGE. .... .
`
`.
`
`10-7. The Ceramic Cartridge.
`10-8. The Coaxial Cartridge...
`
`.
`
`Some Design ConsiIpERATIONS AFFECTING ELECTRICAL PERFORMANCE.
`
`.
`
`10-9. R-fImpedance........ Coe ee
`10-10. Conversion Loss and Burnout. ...... .
`
`PART III. SPECIAL TYPES
`
`Cuar. 11. LOW-LEVEL DETECTION. .......
`
`PRoPERTIES OF CRYSTAL ReEcTIFIERS AT Low LEVELS .
`11-1. Reetification at Low Levels... 2...
`11-2. Equivalent-circuit Theory.
`.
`11-3. Effect of Bias on Low-level Properties
`11-4. Variation of Low-level Properties with Temperature...
`
`.
`
`.
`
`.
`
`. 316
`. 316
`. 318
`
`» 323
`. 323
`. 326
`
`. 328
`. 328
`. 329
`
`. 333
`
`. 333
`. 333
`. 385
`. 340
`. 342
`
`THeory OF LOW-LEVEL DETECTION...
`
`. 344
`. B44
`a
`11:5. The Figure of Merit of a Video Crystal.
`. 347
`11-6. Effect of D-c Bias on Figure of Merit. .. ... .
`11-7. The Effect of Temperature Variation on Crystal-video Receiver
`Performance. .....
`. 348
`
`.
`
`.
`
`MEASUREMENTS,
`
`11-8. R-f Equipment and Measurements.
`11-9. Equipment and Methods for Measuring Current Sensitivity, Video
`2... . 855
`Resistance, and Figure of Merit. ......
`
`. 349
`350
`
`seemnang
`
`SrrecIAL MANUFACTURING TECHNIQUES. .......
`
`.
`.
`.
`11-10, Stability Considerations.
`. Lo
`.
`.
`11-11. Processing the Silicon.
`.
`.:
`.
`.
`.
`11-12. Fabrication of the Whisker
`11:13. Adjustment of the Rectifying ContactLoe
`
`Cuap. 12, HIGH-INVERSE-VOLTAGE RECTIFIERS ..... .
`
`Tur HIGH-INVERSE-VOLTAGE RECTIFIER AND ITS APPLICATIONS .
`
`.
`
`.
`
`12:1. Preparation of the Ingot.........
`12-2. Etching and Surface Treatment ..... .
`12-3. Assembly and Adjustment of the Cartridge .
`12-4. Low-frequency Properties.
`Lo
`12-5. High-frequency Properties .
`Lo
`.
`Lo
`.
`12-6.
`Silicon High-inverse-voltage Rectifiers Lo
`12-7. Theory of the Negative-resistance Characteristics Lo
`12:8. Photoelectric Effects in Silicon and Germanium .
`
`.
`
`. 357
`. 358
`. 358,
`. 359
`. 359
`
`. 361
`
`. 361
`. 364
`. 369
`. 369
`. 372
`378
`. 389
`. 391
`. 392
`
`LSTET,
`
`10
`
`10
`
`

`

`CONTENTS
`
`xill
`
`Cuap. 13. WELDED-CONTACT GERMANIUM CRYSTALS. .... .
`
`. 398
`
`. 898
`. 2...
`13-1. Construction of Welded-contact Rectifiers... 2...
`13-2, General Properties.
`.
`2. 2... 0... ee ee e400
`13:3. Negative I-f Conductance. .. .
`. Soe ee ee ee ee 401
`13-4. Loss and Noise Measurements... .......2....,.. . 403
`13-5. Theory of Negative I-f Conductance and Conversion Amplification 406
`13-6. Applications... 2... ee 48
`
`APPENDIX A The Reciprocity Theorem of Dicke .
`
`.
`
`. ....... .
`
`. A417
`
`APPENDIX B Skin Effect at a Metal-semiconductor Contact... .. .
`
`APPENDIX C_ Spreading Resistance of an Elliptical Contact.
`
`APPENDIX D Crystal-rectifier Types and Specifications.
`
`.
`
`.
`
`.
`
`.
`
`.
`
`.
`
`. 421
`
`. 427
`
`.
`
`.
`
`.
`
`.
`
`. woe ee 429
`
`:
`
`j
`
`)
`
`
`
`INDEX... 2. ee. 485
`
`
`
`11
`
`11
`
`

`

`12
`
`12
`
`
`

`

`
`
`CHAPTER 1
`
`INTRODUCTION
`
`THE PHENOMENON OF RECTIFICATION
`
`The process of rectification and its applications are well known and
`extensively treated in the literature. However, within the last five
`years a wealth of new information on the crystal rectifier has accumulated
`as a result of its superior performance in microwavereceivers.
`In fact,
`the use of crystal rectifiers for frequency conversion occurredforthefirst
`time during World War II. The purpose of this book is to give an
`account of the present state of our knowledgeof the crystal rectifier and
`its applications. The applications with which weare chiefly concerned
`have to do with the use of the rectifier as a nonlinear device in the detec-
`tion and frequency conversion of r-f signals. As a background for the
`analysis of the crystal rectifier we shall begin with a brief review of the
`process of detection and frequency conversion.
`1-1. The Nonlinear Element.—Rectification may be defined as an
`operation on an a-c voltage to produce a unidirectional component. The
`vacuum-tube diode is a familiar example of a device that performs this
`function. The unidirectional component arises from the fact that the
`average resistance to current flow is less in one direction than in the other.
`In addition to the d-c component in the rectifier output there are also
`present harmonics of the input signal which arise because of the nonlinear
`character of the rectifying element. The relative amplitudes of
`the
`harmonics depend on the shape of the current-voltage characteristic
`curve in the operating region. The magnitude of the d-c component
`also depends on the shapeof the characteristic. For example, it is clear
`that a nonlinear element having the characteristic curve of Fig. 1-la,
`which is an odd function of the voltage about the origin, will have no
`output d-c component at all when operated at zero bias. However,if a
`d-c bias voltage is applied so that the operating point is at A, the applica-
`tion of a small a-c signal will result in a net increase in the direct current
`over that produced by the bias alone. This occurs because the average
`current will be greater for the positive swings of the a-c signal than for
`the negative ones.
`Rectifiers that are useful for detection purposes have characteristics
`similar to that shown in Fig. 1:1b. The shape of the characteristic will
`of course depend on the physical nature of the rectifier.
`In general, the
`
` | | | | ||\ |
`
`
`
`13
`
`13
`
`

`

`2
`
`INTRODUCTION
`
`[Skc. 1-2
`
`important features are a high back resistance and a relatively lowfor-
`ward resistance. At high frequencies other physical characteristics, such
`as capacitance of the rectifying element, transit time, etc., are important
`factors.
`In the vacuum-tube diode, for example, the resistance in the
`back direction is very high.
`In the forward direction the current is
`proportional to the three-halves power of the
`applied voltage when the voltages are small.
`For larger voltages there is a region that is ap-
`proximately linear. As we shall sce later, the
`shapeof the crystal-rectifier charactcristic may
`vary widely depending on the nature of the
`crystal and the wayin which it is constructed.
`Weshall postpone the discussion of the crystal-
`rectifier characteristic and the consideration of
`the other properties that are of importance in
`the microwaveregion.
`t
`
`
`
`Shaenactcesistrate
`
`
`hommeagempnntngenrts9:
`
`Sena
`
`(6)
`Fic. 1:1.—Nonlinear ele-
`ments.
`(a) Nonrectifying
`element
`at
`zero
`bias;
`(6)
`rectifying element.
`
`Fic.
`
`1-2,—Ideal
`characteristic,
`
`e
`rectifier
`
`1-2. Detection.—In the use of the rectifier for detection there are two
`classifications that are of particular interest to us:
`(1) linear and (2)
`square-law detection.
`Linear Detection.—In linear detection, the rectifier functions essen-
`tially asa switch. Let us assumethat therectifier characteristic is ideal—
`that is, that the resistance in the back direction is infinite, and in the for-
`ward direction is small and constant (see Fig. 1-2).
`It is well known
`that when a sinusoidal waveis impressed on the ideal rectifier the average
`current through this rectifier will be proportional to the amplitude of
`the input wave. The voltage across the rectifier load resistance will
`then be composed of a d-c component proportional to the amplitude of
`the input signal plus components of the input frequency and its even
`harmonics.
`Mostrectifiers will approximate this ideal performance if the input
`signal is large enough to make the region of curvature near the origin
`small compared with the substantially straight part of the characteristic
`over which the voltage varies. Furthermore, the load resistance is usu-
`
`
`
`14
`
`14
`
`

`

`
`
`Src. 1-2]
`
`DETECTION
`
`3
`
`ally chosen large compared with the rectifier resistance so that the effect
`on the output voltage of variation of the forward resistanceof therectifier
`is small.
`Theefficiency of rectification is defined as the ratio of the d-c voltage
`across the output load resistance to the peak amplitude of the input
`signal.
`It depends on the ratio of load resistance to the internal resis-
`ance of the rectifier and the amplitude of the input signal as noted above.
`In the detection of amplitude-modulated waves in radio reception a
`load consisting of a parallel RC combination is commonly used. With
`proper choice of the values of R and C the output voltage will, to a very
`close approximation, vary like the envelope of the amplitude-modulated
`wave. Under these conditions, the rectification efficiency of vacuum-
`tube diode rectifiers is normally about 70 to 90 per cent. A detailed
`analysis of linear detectors used in radio receivers may be found in stand-
`ard textbooks on radio engineering! and will not be given here. We will
`return to a discussion of the use of one of the crystal rectifier types as a
`linear detector in Chap. 12.
`‘Square-law Detectton.—The term square-law is applied to a detector
`in which the d-c, or rectified, output is proportional to the square of the
`amplitude of the input signal.
`It can readily be seen that such a response
`depends on the nonlinearity of the characteristic at the operating point,
`Over a limited range the current-voltage characteristic of a rectifier can
`be represented by a Taylor expansion terminating in the squared term
`2
`a)
`i= $0) = flee) + OF sert 5 5(60),
`where é, is the bias voltage determining the operating point, and 8¢ is the
`small input signal voltage. The derivatives are evaluated at the operat-
`ing point
`é@. Any rectifier will,
`therefore, function as a square-law
`rectifier when the applied signal is sufficiently small, provided that the
`second derivative of the characteristic does not vanish at the operating
`point. The linear term is, of course, of no importance asfar as rectifica-
`tion is concerned, since it is symmetrical about the operating point.
`By meansof Eq. (1) we can determine analytically the output of the
`rectifier for a given input signal. The analvsis can be summarized briefly
`as follows. Let us consider a signal consisting of a single sinusoidal wave,
`E sin wt.
`In addition to the frequency of the signal, the cutput will
`contain d-c and second-harmonic components with amplitudes propor-
`tional to E?.
`In general, if the signal is composed of a numberof sinu-
`soida] components the output will contain, in addition to the frequency
`components of the signal, the d-c component, second harmonics of each
`
`For example see F. . Terman, Radio Engineer's Handbook, McGraw-Hill, New
`York, 1943.
`
`
`
`15
`
`15
`
`

`

`4
`
`INTRODUCTION
`
`[Sxc. 1-3
`
`frequency component, and sum and difference frequencies formed by
`every possible combination of frequencies contained in the input signal.
`The amplituce of the d-c componentwill be proportional to the sum of the
`squares of the amplitudes of the signal components. The amplitude of
`each second-harmonic component will be proportional to the square of
`the amplitude of
`the corresponding signal component; the amplitude
`of the sum anddifference frequencies will be proportional to the product
`of the amplitude of the input components involved in the combination.
`As an example, let us consider the square-lawdetection of an ampli-
`tude-modulated wave given by the expression
`
`e = E,(1 + msin Bo) sin at.
`
`Se
`32
`age
`~ a
`3°43
`(a)
`
`E.
`53
`32
`3°
`
`faa
`

`
`18atoeeesoe
`aNOMENINESCH
`
`
`
`«uRETSSRCRRpRNEgTOaieororieeemameers
`
`
`
`soeenmeatanysrtamgEe
`
`For purposesof analysis this wave may be represented bythree frequency
`components,
`the carrier and two sidebands, with angular frequencies
`w, (w — 8), and (w + 8), respectively.
`These are represented graphically in
`Fig. 1:3a. The relative amplitudes of
`the additional components in the out-
`put of the detector are shown in Fig.
`1-3b for the case where m = 0.5.
`The square-law detectoris a useful
`device for
`the measurement of
`the
`powerof an a-c signal because therec-
`tified output
`is proportional
`to the
`square of the input amplitude. As we
`shall see later, the crystal rectifier is
`often employed as a square-law de-
`tector in monitoring microwave power.
`&a 32 8 In fact, such a device is serviceable
`323 3 outside the square-lawregion provided
`Frequency
`it is calibrated.
`1)
`It is clear that the magnitude of
`Fic, 13.—Frequencies involved in
`the various components arising from
`(a) Frequencies in detector
`.
`detection.
`input.
`(modulation percentage = 50);
`the square term of Eq. (1) will be pro-
`(6) additional
`frequencies
`in the de-
`portional to the magnitudeof the sec-
`tector output.
`:
`:
`«ae
`ond derivative of the characteristic at
`the operating point. Maximum sensitivity will then be obtained by
`adjusting the d-c bias so that the operating point is also the point of max-
`imum curvature on the characteristic. Other factors of importancein the
`microwave region, such as capacitance, noise generation, etc., will be dis-
`cussed in Chap. 11.
`1.3. Frequency Conversion.—Heterodyne reception provides a means
`of converting the carrier frequency of a signal to a new value. This is
`
`epeprasempsognRecapPASTmeIRNSTere
`
`
`
`16
`
`16
`
`

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket