throbber
NETL.040PR
`
`PROVISIONAL PATENT
`
`NON-VOLATILE MEMORY MODULE
`
`BACKGROUND OF THE INVENTION
`
`[0001]
`
`Certain types of memory modules comprise a plurality of dynamic
`
`random-access memory (DRAM) devices mounted on a printed circuit board (PCB). These
`
`memory modules are typically mounted in a memory slot or socket of a computer system
`
`(e.g., a server system or a personal computer) and are accessed by the processor of the
`
`computer system to provide volatile memory to the computer system.
`
`BRIEF DESCRIPTION OF THE DRAWINGS
`
`[0002]
`
`Figure 1 is a block diagram of an example 512MB DDR2 (PC2-3200)
`
`memory module in accordance with certain embodiments described herein.
`
`[0003]
`
`Figure 2 is a block diagram of an example memory module with ECC
`
`(error-correcting code) having a first memory bank with nine volatile memory elements and a
`
`second memory bank with five non-volatile memory elements in accordance with certain
`
`embodiments described herein.
`
`[0004]
`
`Figure 3 is a block diagram of an example memory module with ECC and
`
`having a logic element and microcontroller unit integrated into a single device.
`
`DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
`
`[0005]
`
`Figure 1 is a block diagram of an example memory module 10 compatible
`
`with certain embodiments described herein. The memory module 10 comprises a printed-
`
`circuit card (PCB) 20, a first memory bank 30 on the PCB 20, and a second memory bank 40
`
`on the PCB 20. The first memory bank 30 comprises a first plurality of volatile memory
`
`elements 32 and the second memory bank 40 comprises a second plurality of non-volatile
`
`memory elements 42. Certain embodiments described herein advantageously provide non-
`
`volatile storage via the second memory bank 40 in addition to high-performance (e.g., high
`
`speed) storage via the first memory bank 30. Certain embodiments described herein utilize
`
`the second memory bank 40 as a flash "mirror" to provide back-up of the volatile first
`
`memory bank 30 in the event of power interruptions.
`
`[0006]
`
`In certain embodiments, the memory module 10 is configured to be in
`
`electrical communication with a host system. Examples of host systems include, but are not
`
`-1-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 1
`
`

`

`limited to, blade servers, 1U servers, personal computers (PCs), and other applications in
`
`which space is constrained or limited.
`
`[0007]
`
`In certain embodiments, the memory module 10 has a memory capacity of
`
`512-MB, 1-GB, 2-GB, 4-GB, or 8-GB. Other memory capacities are also compatible with
`
`certain embodiments described herein. In addition, memory modules 10 having widths of
`
`4 bytes, 8 bytes, 16 bytes, 32 bytes, or 32 bits, 64 bits, 128 bits, 256 bits, as well as other
`
`widths (in bytes or in bits), are compatible with embodiments described herein.
`
`[0008]
`
`In certain embodiments, the PCB 20 has an industry-standard form factor.
`
`For example, the PCB 10 can have a low profile (LP) form factor with a height of
`
`30 millimeters and a width of 133.35 millimeters. In certain other embodiments, the PCB 10
`
`has a very low profile (VLP) form factor with a height of 18.3 millimeters. Other form
`
`factors including, but not limited to, small-outline (SO-DIMM), unbuffered (UDIMM),
`
`registered (RDIMM), fully-buffered (FBDIMM), mini-DIMM, VLP mini-DIMM, and
`
`micro-DIMM are also compatible with certain embodiments described herein.
`
`[0009]
`
`The PCB 20 comprises an interface 22 that is configured to be in electrical
`
`communication with the host system (not shown). For example, the interface 22 can
`
`comprise a plurality of edge connections which fit into a corresponding slot connector of the
`
`host system. The interface 22 provides a conduit for power voltage as well as data and
`
`address signals between the memory module 10 and the host system. For example, the
`
`interface 22 can comprise a standard 240-pin DDR2 edge connector.
`
`[0010]
`
`In certain embodiments, the first plurality of volatile memory elements 32
`
`comprises two or more dynamic random-access memory (DRAM) elements. Types of
`
`DRAM elements 32 compatible with certain embodiments described herein include, but are
`
`not limited to, DDR, DDR2, DDR3, and synchronous DRAM (SDRAM). For example, in
`
`the block diagram of Figure 1, the first memory bank 30 comprises eight 64Mx8 DDR2
`
`SDRAM elements 32. In addition, volatile memory elements 32 having bit widths of 4, 8,
`
`16, 32, as well as other bit widths, are compatible with certain embodiments described herein.
`
`Volatile memory elements 32 compatible with certain embodiments described herein have
`
`packaging which include, but are not limited to, thin small-outline package (TSOP), ball-
`
`-2-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 2
`
`

`

`grid-array (BGA), fine-pitch BGA (FBGA), micro-BGA (µEGA), mini-BGA (mBGA), and
`
`chip-scale packaging (CSP).
`
`[0011]
`
`In certain embodiments, the second pluarlity of non-volatile memory
`
`elements 42 comprises two or more flash memory elements. Types of flash memory
`
`elements 42 compatible with certain embodiments described herein include, but are not
`
`limited to, NOR flash, NAND flash, and multi-level cell (MLC). For example, in the block
`
`diagram of Figure 1, the second memory bank 40 comprises 512 MB of flash memory
`
`organized as four 128Mbx8 NAND flash memory elements 42. In addition, non-volatile
`
`memory elements 42 having bit widths of 4, 8, 16, 32, as well as other bit widths, are
`
`compatible with certain embodiments described herein. Non-volatile memory elements 42
`
`compatible with certain embodiments described herein have packaging which include, but are
`
`not limited to, thin small-outline package (TSOP), ball-grid-array (BGA), fine-pitch BGA
`(FBGA), micro-BGA (µBGA), mini-BGA (mBGA), and chip-scale packaging (CSP).
`
`Figure 2 is a block diagram of an example memory module 10 with ECC
`[0012]
`(error-correcting code) having a first memory bank 30 with nine volatile memory elements 32
`and a second memory bank 40 with five non-volatile memory elements 42 in accordance with
`certain embodiments described herein. The additional memory element 32 of the first
`memory bank 30 and the additional memory element 42 of the second memory bank 40
`
`provide the ECC capability.
`
`[0013]
`
`As schematically illustrated by Figure 1, in certain embodiments, the
`
`memory module 10 further comprises a voltage monitor circuit 50, a microcontroller unit
`(MCU) 60, a logic element 70, and a capacitor module 80. In certain embodiments, the MCU
`60 provides memory management for the second memory bank 40 and controls data transfer
`
`between the first memory bank 30 and the second memory bank 40. The MCU 60 of certain
`embodiments comprises a 16-bit microcontroller, although other types of microcontrollers are
`
`also compatible with certain embodiments described herein. In certain embodiments, the
`
`capacitor module 80 comprises a step-up transformer 82, a step-down transformer 84, and a
`
`capacitor bank 86.
`
`[0014]
`
`In certain embodiments, the logic element 70 comprises a field-
`
`programmable gate array (FPGA). Other types of logic elements 70 compatible with certain
`
`-3-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 3
`
`

`

`embodiments described herein include, but are not limited to, a programmable-logic device
`
`(PLD), an application-specific integrated circuit (ASIC), a custom-designed semiconductor
`
`device, a complex programmable logic device (CPLD). In certain embodiments, the logic
`
`element 70 is a custom device. In certain embodiments, the logic element 70 comprises
`
`various discrete electrical elements, while in certain other embodiments, the logic element 70
`
`comprises one or more integrated circuits. Figure 3 is a block diagram of an example
`
`memory module 10 having a microcontroller unit 60 and logic element 70 integrated into a
`
`single device.
`
`[0015]
`
`Under normal operation in certain embodiments, the host system accesses
`
`the first memory bank 30, rather than the second memory bank 40, because the volatile
`
`memory elements 32 have superior read/write characteristics. The voltage monitor circuit 50
`
`monitors the power supplied by the host system via the interface 22. Upon detecting a low
`
`power (e.g., indicative of a powering down of the host system), the voltage monitor circuit 50
`sends a signal to the MCU 60 which responds by executing a write cycle on the second
`memory bank 40. During this write cycle, data is read from the first memory bank 30 and is
`
`transferred to the second memory bank 40 via the MCU 60.
`
`[0016]
`
`As schematically illustrated by Figure 1, the logic element 70 of certain
`
`embodiments is in electrical communication with the second memory bank 40 and the MCU
`60. The logic element 70 can provide signal level translation between the volatile memory
`elements 32 (e.g., 1.8V SSTL-2 for DDR2 SDRAM elements) and the non-volatile memory
`elements 42 (e.g., 3V TTL for NAND flash memory elements). In certain embodiments, the
`logic element 70 is also programmed to perform address decoding for the first memory bank
`
`30 and the second memory bank 40.
`
`[0017]
`
`During normal operation in certain embodiments, the step-up transformer
`
`82 keeps the capacitor bank 86 charged at a peak value. In certain embodiments, the step-
`
`down transformer 84 acts as a voltage regulator to ensure that regulated voltages are supplied
`
`to the memory elements (e.g., 1.8V to the volatile DRAM elements 32 and 3.0V to the non-
`
`volatile flash memory elements 42) during power down.
`
`In certain embodiments, the
`
`memory module 10 further comprises switch 90 (e.g., FET switch) that switches between the
`
`charged capacitor bank 86 and system power received via the interface 22. The switch 90 of
`
`-4-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 4
`
`

`

`certain embodiments advantageously ensures that the volatile memory elements 32 are
`
`powered long enough for the data to be stored in the non-volatile memory elements 42, and
`
`then switches over to the system power.
`
`[0018] When normal operation resumes, data is transferred from the non-volatile
`
`memory bank 40 to the volatile memory bank 30 via the MCU 60. The host system can then
`
`resume accessing the volatile memory bank 30 of the memory module 10.
`
`In certain
`
`embodiments, the transfer of data from the volatile memory bank 30 to the non-volatile
`
`memory bank 40, or from the non-volatile memory bank 40 to the volatile memory bank 30,
`
`takes less than one minute per GB.
`
`Various embodiments of the present invention have been described above.
`
`[0019]
`Although this invention has been described with reference to these specific embodiments, the
`descriptions are intended to be illustrative of the invention and are not intended to be
`limiting. Various modifications and applications may occur to those skilled in the art without
`departing from the true spirit and scope of the invention.
`
`3051314
`102506
`
`-5-
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 5
`
`

`

`Figure 1:
`
`1 1.
`
`42
`
`
`
`4 0
`
`1
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`NAND
`128Mx
`8
`
`(
`
`20
`
`30
`
`32
`
`1
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`DDR2
`64Mx8
`
`I
`
`-1--
`
`DATA
`
`ADDR/CONT
`
`SWITCH
`
`MCU
`
`DATA
`
`ADDR/CONT
`
`FPGA
`
`70
`
`60
`
`90
`
`POWER
`OUTPUT
`
`SWITCH
`
`4,
`
`STEP
`DOWN
`VOLTAGE
`
`CAPACITOR
`BANK
`
`STEP UP
`VOLTAGE
`
`4
`
`VOLTAGE
`MONITOR
`
`84
`
`86
`
`82
`
`DATA
`
`ADDR/CONT
`
`50
`
`22
`
`Standard DIMM interface
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 6
`
`

`

`Figure 2:
`
`1 10
`
`r 20
`
`32
`
`,
`
`40
`
`42
`
`1
`
`1— 7 — -1-- 7 — 7 --- 7 .-- --E--- 7—
`A
`
`DATA
`
`ADDR/CONT
`
`SWITCH
`
`-1- -T.
`
`70
`
`J
`
`60
`
`POWER
`OUTPUT
`
`90
`
`4
`
`DATA
`
`ADDR/CONT
`
`50
`
`DATA
`
`ADDR/CONT
`
`---84
`
`--- 8O-86
`
`82
`
`22
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 7
`
`

`

`Figure 3:
`
`1 10
`
`( 20
`
`30
`
`32
`
`42
`
`40
`
`60, 70
`
`•
`
`DATA
`
`A1ADDR/CONT
`
`V
`
`SWITCH
`
`DATA
`
`ADDR/CONT
`
`POWER
`OUTPUT
`
`DATA
`
`ADDR/CONT
`
`90
`
`50
`
`84
`
`86
`
`82
`
`22
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 8
`
`

`

`Provisional Application
`COVER SHEET
`
`Attorney Docket No.: NETL.040PR
`First Named Inventor: Jayesh R. Bhakta
`Title: NON-VOLATILE MEMORY MODULE
`
`Direct all correspondence to Customer No.: 20995
`
`Date: June 1, 2007
`Page 1 of 2
`
`Commissioner for Patents
`P.O. Box 1450
`Alexandria, VA 22313-1450
`
`The following enclosures are transmitted herewith to be filed in the Provisional Patent Application of:
`
`Inventors:
`
`First Inventor
`Residence Address :
`
`Jayesh R. Bhakta
`12220 Rose Street, Cerritos, CA 90703
`
`: Chi She Chen
`Second Inventor
`944 Crystal Water Lane, Walnut, CA 91789
`Residence Address :
`
`Third Inventor
`Residence Address :
`
`Jeffrey C. Solomon
`16 Silver Fir, Irvine, CA 92604
`
`APPLICATION ELEMENTS:
`
`(X)
`
`(X)
`
`Specification in 5 pages.
`
`Drawings in 3 pages.
`
`FILING FEES:
`
`FEE TYPE
`Basic Filing
`
`FEE CALCULATION
`LARGE FEE
`1005 ($200)
`
`37 CFR § 1.16(d)
`
`CALCULATION
`
`TOTAL
`$200
`
`TOTAL FEE DUE
`
`$200
`
`This invention WAS NOT made by an agency of the United States Government or under a contract
`with an agency of the United States Government.
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 9
`
`

`

`Provisional Application
`COVER SHEET
`
`Attorney Docket No.: NETL.040PR
`First Named Inventor: Jayesh R. Bhakta
`Title: NON-VOLATILE MEMORY MODULE
`
`Direct all correspondence to Customer No.: 20995
`
`Date: June 1, 2007
`Page 2 of 2
`
`Commissioner is hereby authorized to charge any additional fees which may be required, or credit
`any overpayment to Account No. 11-1410.
`
`Bruce Itchkawitz
`Registration No. 47,677
`Attorney of Record
`Customer No. 20,995
`(949) 760-0404
`
`3832877
`060107
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 10
`
`

`

`Electronic Patent Application Fee Transmittal
`
`Application Number:
`
`Filing Date:
`
`Title of Invention:
`
`NON-VOLATILE MEMORY MODULE
`
`First Named Inventor/Applicant Name:
`
`Jayesh R. Bhakta
`
`Filer:
`
`Bruce S. ltchkaeitz/Amy Perez
`
`Attorney Docket Number:
`
`NETL.040PR
`
`Filed as Large Entity
`
`Provisional Filing Fees
`
`Description
`
`Fee Code
`
`Quantity
`
`Amount
`
`Sub-Total in
`USD($)
`
`Provisional application filing
`
`1005
`
`1
`
`200
`
`200
`
`Basic Filing:
`
`Pages:
`
`Claims:
`
`Miscellaneous-Filing:
`
`Petition:
`
`Patent-Appeals-and-Interference:
`
`Post-Allowance-and-Post-Issuance:
`
`Extension-of-Time:
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 11
`
`

`

`Description
`
`Fee Code
`
`Quantity
`
`Amount
`
`Sub-Total in
`USD($)
`
`Miscellaneous:
`
`Total in USD ($)
`
`200
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 12
`
`

`

`Electronic Acknowledgement Receipt
`
`EFS ID:
`
`Application Number:
`
`1832654
`
`60941586
`
`International Application Number:
`
`Confirmation Number:
`
`2324
`
`Title of Invention:
`
`NON-VOLATILE MEMORY MODULE
`
`First Named Inventor/Applicant Name:
`
`Jayesh R. Bhakta
`
`Customer Number:
`
`20995
`
`Filer:
`
`Bruce S. ltchkaeitz/Brandon Hamada
`
`Filer Authorized By:
`
`Bruce S. ltchkaeitz
`
`Attorney Docket Number:
`
`NETL.040PR
`
`Receipt Date:
`
`Filing Date:
`
`Time Stamp:
`
`Application Type:
`
`01-JUN-2007
`
`18:53:16
`
`Provisional
`
`Payment information:
`
`Submitted with Payment
`
`Payment was successfully received in RAM
`RAM confirmation Number
`
`yes
`
`$200
`
`2593
`
`Deposit Account
`
`File Listing:
`
`Document
`Number
`
`Document Description
`
`File Name
`
`File Size(Bytes)
`
`Multi
`Part /.zip
`
`Pages
`(if appl.)
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 13
`
`

`

`1
`
`Specification
`
`prov.pdf
`
`256635
`
`no
`
`5
`
`Warnings:
`
`Information:
`
`2
`
`Drawings
`
`draw.pdf
`
`46305
`
`no
`
`3
`
`Warnings:
`
`Information:
`
`3
`
`Transmittal of New Application
`
`trans.pdf
`
`42954
`
`no
`
`2
`
`Warnings:
`
`Information:
`
`4
`
`Fee Worksheet (PTO-06)
`
`fee-info.pdf
`
`8114
`
`no
`
`2
`
`Warnings:
`
`Information:
`
`Total Files Size (in bytes):
`
`354008
`
`
`
`
`This Acknowledgement Receipt evidences receipt on the noted date by the USPTO of the indicated documents,
`
`characterized by the applicant, and including page counts, where applicable.
`
`It serves as evidence of receipt
`
`similar to a Post Card, as described in MPEP 503.
`
`New Applications Under 35 U.S.C. 111
`
`
`
`includes the necessary If a new application is being filed and the application components for a filing date (see
`
`
`
`(37 CFR 1.54) will be 37 CFR 1.53(b)-(d) and MPEP 506), a Filing Receipt issued in due course and the date
`
`establish the filing date of shown on this Acknowledgement Receipt will the application.
`
`
`under 35 U.S.C. 371 National Stage of an International Application
`
`
`
`is compliant If a timely submission to enter the national stage of an international application with the conditions
`
`indicating acceptance of 35 U.S.C. 371 and other applicable requirements a Form PCT/DO/EO/903 of the
`
`
`
`in addition to application as a national stage submission under 35 U.S.C. 371 will be issued the Filing Receipt,
`in due course.
`
`New International Application Filed with the USPTO as a Receiving Office
`necessary If a new international application is being filed and the international application includes the
`
`
`of the components for an international filing date (see PCT Article 11 and MPEP 1810), a Notification
`
`be issued in due International Application Number and of the International Filing Date (Form PCT/RO/105) will
`course, subject to prescriptions concerning national security, and the date shown on this Acknowledgement
`Receipt will establish the international filing date of the application.
`
`Samsung Electronics Co., Ltd.
`Ex. 1005, p. 14
`
`

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