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`PCT/US2010/024199
`
`realized using capacitor elements, distributed capacitance, networks, arrays, series and parallel
`
`combinations of capacitances, and the like. The capacitance maybe fixed or variable and may be
`
`uscd to vary impedance matching as well as resonant frequency opcrating conditions.
`
`[00162]
`
`Itis to be understood that the inductance and capacitance in an
`
`electromagnetic resonator 102 may be lumped,distributed, or a combination of lumped and
`
`distributed inductance and capacitance and that electromagnetic resonators may berealized by
`
`combinations of the various elements, techniques and effects described herein.
`
`[00163]
`
`Electromagnetic resonators 102 may be include inductors, inductances,
`
`capacitors, capacitances, as well as additional circuit elements such asresistors, diodes, switches,
`
`amplifiers, diodes, transistors, transformers, conductors, connectors andthe like.
`
`[00164]
`
`Resonant Frequency of an Electromagnetic Resonator
`
`[00165] An electromagnetic resonator 102 may have a characteristic, natural, or
`
`resonant frequency determinedby its physical properties. This resonant frequencyis the
`
`frequency at which the energy stored by the resonator oscillates between that stored by the
`electric field, Wz, (We=q°/2C, where gq is the charge on the capacitor, C) and that stored by the
`magnetic field, Wr, (Wp=Li’/2, wherei is the current through the inductor, Z) of the resonator.
`
`In the absence of any losses in the system, energy would continually be exchanged between the
`
`electric field in the capacitor 104 and the magnetic field in the inductor 108. The frequency at
`
`which this energy is exchanged may be called the characteristic frequency, the natural frequency,
`
`or the resonant frequency of the resonator, and is given by a,
`
`w=2nf = le’
`
`[00166]
`
`The resonant frequency of the resonator may be changed by tuning the
`
`inductance, L, and/or the capacitance, C, of the resonator. The resonator frequency may be
`
`design to operate at the so-called ISM (Industrial, Scientific and Medical) frequencies as
`
`specified by the FCC. The resonator frequency may be chosen to mect certain ficld limit
`
`specifications, specific absorption rate (SAR) limit specifications, electromagnetic compatibility
`
`(EMC) spccifications, clectromagnetic interference (EMI) specifications, componentsize, cost or
`
`performance specifications, and the like.
`
`[00167] Quality Factor of an Electromagnetic Resonator
`
`30
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`[00168]
`
`The energy in the resonators 102 shown in Fig. 6 may decay orbe lost by
`
`intrinsic losses including absorptive losses (also called ohmic orresistive losses) and/or radiative
`
`losses. The Quality Factor, or Q, of the resonator, which characterizes the energy decay, is
`
`inversely proportional to these losses. Absorptive losses may be caused by the finite conductivity
`
`of the conductor used to form the inductor as well as by losses in other elements, components,
`
`connectors, and the like, in the resonator. An inductor formed from lowloss materials may be
`
`referred to as a “high-Q inductive element’ and elements, components, connectors andthe like
`
`with low losses may be referred to as having “high resistive Q’s’’. In general, the total absorptive
`
`loss for a resonator may be calculated as the appropriate series and/or parallel combination of
`
`resistive losses for the various elements and components that make up the resonator. Thatis, in
`
`the absence of any significant radiative or component/connection losses, the Q of the resonator
`
`may be given by, Qaas,
`
`aoL
`Quns = RRabs
`
`where @, is the resonant frequcncy, LZ, is the total inductance of the resonator and the resistance
`
`for the conductor used to form the inductor, for example, may be given by R,,, =/p/A, (/is the
`
`length of the wire,
`
`is the resistivity of the conductor matcrial, and 4 is the cross-scctional arca
`
`over which current flowsin the wire). For alternating currents, the cross-sectional area over
`
`which current flows may beless than the physical cross-sectional area of the conductor owing to
`
`the skin effect. Therefore, high-O magnetic resonators may be composed of conductors with high
`
`conductivity, relatively large surface areas and/or with specially designed profiles (e.g. Litz wire)
`
`to minimize proximity effects and reduce the AC resistance.
`
`[00169]
`
`The magnetic resonator structures may include high-Q inductive elements
`
`composed of high conductivity wire, coated wire, Litz wire, ribbon, strapping or plates, tubing,
`
`paint, gels, traces, and the like. The magnetic resonators may be self-resonant, or they may
`
`include external coupled elements such as capacitors, inductors, switches, diodes, transistors,
`
`transformers, and the like. The magnetic resonators may include distributed. and lumped
`
`capacitance and inductance. In general, the QO of the resonators will be determined by the Q’s of
`
`all the individual components of the resonator.
`
`[00170]
`
`Because Q is proportional to inductance, 1, resonators may be designed to
`
`increase Z, within certain other constraints. One way to increase L, for example, is to use more
`
`31
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`than one turn of the conductor to form the inductor in the resonator. Design techniques and trade-
`
`offs may depend on the application, and a wide variety of structures, conductors, components,
`
`and resonant frequcncics may be chosen in the design of high-Q magnctic resonators.
`
`[00171]
`
`Inthe absence of significant absorption losses, the O of the resonator may be
`
`determined primarily by the radiation losses, and given by, Q.,, = @L/R,,, , where Ryaa is the
`
`radiative loss of the resonator and may dependon the size of the resonator relative to the
`
`frequency, @, or wavelength, A, of operation. For the magnetic resonators discussed above,
`
`radiative losses may scale as R,,, ~(x/4)* (characteristic of magnetic dipole radiation), where x
`
`is a characteristic dimension of the resonator, such as the radius of the inductive element shown
`
`in Fig. 6b, and where 4=c/ f , where c is the speed of light andfis as defined above. The size
`
`of the magnetic resonator may be muchless than the wavelength of operation so radiation losses
`
`may be very small. Such structures may be referred to as sub-wavelength resonators. Radiation
`
`may be a loss mechanism for non-radiative wireless energy transfer systems and designs may be
`
`chosento reduce or minimize R,<g. Note that a high-Q,aq may be desirable for non-radiative
`
`wireless energy transfer schemes.
`
`[00172]
`
`Note too that the design of resonators for non-radiative wireless energy
`
`transfer differs from antennas designed for communication or far-field energy transmission
`
`purposes. Specifically, capacitively-loaded conductive loops may be used as resonant antennas
`
`(for example in cell phones), but those operate in the far-field regime wherethe radiation Q’s are
`
`intentionally designed to be small to make the antenna efficient at radiating energy. Such designs
`
`are not appropriate for the efficient near-field wireless energy transfer technique disclosed in this
`
`application.
`
`[00173]
`
`The quality factor of a resonator including both radiative and absorption
`
`losses is Q=L/(R,,, + R,,,)- Note that there may be a maximum Q valucfor a particular
`
`resonator and that resonators may be designed with special consideration given to the size of the
`
`resonator, the materials and elements used to construct the resonator, the operating frequency,
`
`the connection mechanisms, andthe like, in order to achieve a high-Q resonator. Fig. 7 shows a
`
`plot of Q of an exemplary magnetic resonator (in this case a coil with a diameter of 60 cm made
`
`of copper pipe with an outside diameter (OD) of 4 cm) that may be used for wireless power
`
`transmission at MHz frequencies. The absorptive O (dashed line) 702 increases with frequency,
`
`32
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`Momentum Dynamics Corporation
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`while the radiative Q (dotted line) 704 decreases with frequency, thus leading the overall Q to
`
`peak 708 at a particular frequency. Note that the Q of this exemplary resonator is greater than
`
`100 over a wide frequency range. Magnetic resonators may be designed to have high-Q over a
`
`range of frequencies and system operating frequency may set to any frequency in that range.
`
`[00174]
`
`Whenthe resonator is being described in termsof loss rates, the O may be
`
`defined using the intrinsic decay rate, 27} as described previously. The intrinsic decay rate is the
`
`rate at which an uncoupled and undriven resonator loses energy. For the magnetic resonators
`abs
`
`described above, the intrinsic loss rate may be given byT =(R,,.
`
`+ R,,,)/2L, and the quality
`
`factor, Q, of the resonator is given by Q=0@/2T.
`
`[00175]
`
`Note that a quality factor related only to a specific loss mechanism may be
`
`denoted a8 Ownechanism, if the resonator is not specified, or aS Q7, mechanism, If the resonatoris
`
`specified (e.g. resonator 1). For example, Q),aq7is the quality factor for resonator 1 related to its
`
`radiation losses.
`
`[00176]
`
`Electromagnetic Resonator Near-Fields
`
`[00177]
`
`The high-Q clectromagnctic resonators used in the near-ficld wireless cnergy
`
`transfer system disclosed here may be sub-wavelength objects. That is, the physical dimensions
`
`of the resonator may be much smaller than the wavelength corresponding to the resonant
`
`frequency. Sub-wavelength magnetic resonators may have most of the energy in the region
`
`surrounding the resonator stored in their magnetic near-ficlds, and these ficlds may also be
`
`described as stationary or non-propagating because they do not radiate away from the resonator.
`
`The extent of the near-ficld in the arca surrounding the resonatoris typically sct by the
`
`wavelength, so it may extend well beyond the resonator itself for a sub-wavelength resonator.
`
`The limiting surface, where the ficld behavior changes from near-ficld behavior to far-ficld
`
`behavior may be called the “radiation caustic”.
`
`[00178]
`
`The strength of the ncar-ficld is reduced the farther one gets away from the
`
`resonator. While the field strength of the resonator near-fields decays away from the resonator,
`
`the fields may still interact with objects brought into the general vicinity of the resonator. The
`
`degree to whichthe fields interact depends on a variety of factors, some of which may be
`
`controlled and designed, and some of which may not. The wireless energy transfer schemes
`
`described herein may be realized whenthe distance between coupled resonators is such that one
`
`resonator lies within the radiation caustic of the other.
`
`33
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`[00179]
`
`The near-field profiles of the electromagnetic resonators may be similar to
`
`those commonly associated with dipole resonators or oscillators. Such field profiles may be
`
`described as omni-directional, meaning the magnitudes of the ficlds arc non-zcroin all directions
`
`away from the object.
`
`Characteristic Size of An Electromagnetic Resonator
`
`[00180]
`
`[00181]
`
`Spatially separated and/or offset magnetic resonators of sufficient Q may
`
`achieve efficient wireless energy transfer over distances that are much larger than have been seen
`
`in the prior art, even if the sizes and shapes of the resonator structures are different. Such
`
`resonators may also be operated to achieve more efficient energy transfer than was achievable
`
`with previous techniques over shorter range distances. We describe such resonators as being
`
`capable of mid-range energytransfer.
`
`[00182] Mid-range distances may be defined as distancesthat are larger than the
`
`characteristic dimension of the smallest of the resonators involved in the transfer, where the
`
`distance is measured from the center of one resonator structure to the center of a spatially
`
`separated second resonatorstructure. In this definition, two-dimensional resonators are spatially
`
`separated whenthe areas circumscribed by their inductive elements do not intersect and three-
`
`dimensional resonators are spatially separated when their volumes do not intersect. A two-
`
`dimensionalresonatoris spatially separated from a three-dimensional resonator whenthe area
`
`circumscribed by the former is outside the volumeofthe latter.
`
`[00183]
`
`Fig. 8 shows some example resonators with their characteristic dimensions
`
`labeled. It is to be understood that the characteristic sizes 802 of resonators 102 may be defined
`
`in terms ofthe size of the conductor and the area circumscribed or enclosed by the inductive
`
`element in a magnetic resonator and the length of the conductor forming the capacitive element
`
`of an electric resonator. Then, the charactcristic size 802 of a resonator 102, x44, may be equal
`
`to the radius of the smallest sphere that can fit around the inductive or capacitive element of the
`
`magnetic or electric resonator respectively, and the center of the resonator structure is the center
`
`of the sphere. The characteristic thickness 804,feza,, of a resonator 102 may be the smallest
`
`possible height of the highest point of the inductive or capacitive element in the magnetic or
`
`capacitive resonator respectively, measured from a flat surface on whichit is placed. The
`
`characteristic width 808 of a resonator 102, Werar, may be the radius of the smallest possible
`
`circle through which the inductive or capacitive element of the magnetic or electric resonator
`
`34
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`respectively, may pass while traveling in a straight line. For example, the characteristic width
`
`808 of a cylindrical resonator may be the radius of the cylinder.
`
`[00184]=In this inventive wircless cnergy transfer technique, energy may be exchanged
`
`efficiently over a wide range of distances, but the techniqueis distinguished by the ability to
`
`exchange useful energy for powering or recharging devices over mid-range distances and
`
`between resonators with different physical dimensions, components and orientations. Note that
`
`while & may be small in these circumstances, strong coupling andefficient energy transfer may
`
`be realized by using high-Q resonators to achieve a high U, U =kJ/Q,O, . Thatis, incrcascs in QO
`
`may be uscdto at Icast partially overcome decreases in A, to maintain uscful energy transfer
`
`efficiencies.
`
`[00185]=Notc too that whilc the near-field of a single resonator may be described as
`
`omni-directional, the efficiency of the energy exchange between two resonators may depend on
`
`the relative position and oricntation of the resonators. That is, the efficiency of the energy
`
`exchange may be maximized for particular relative orientations of the resonators. The sensitivity
`
`of the transfer efficiency to the relative position and orientation of two uncompensated
`
`resonators may be captured in the calculation of either & or «. While coupling may be achieved
`
`between resonators that arc offsct and/or rotated relative to cach other, the efficiency of the
`
`exchange may depend onthe details of the positioning and on any feedback, tuning, and
`
`compensation techniques implemented during operation.
`
`[00186] High-Q Magnetic Resonators
`
`[00187]
`
`In the near-field regime of a sub-wavelength capacitively-loaded loop
`
`magnetic resonator (x«A), the resistances associated with a circular conducting loop inductor
`
`composed of N turns of wire whose radiusis larger than the skin depth, are approximately
`
`Ry = u,Po/2-Nx/a and R,,, =2/6-7,N? (wx/c), wherep is the resistivity of the conductor
`
`material and 7, ~ 1202 © is the impedanceof free space. . The inductance, Z, for such a N-turn
`
`loop is approximately N’ times the inductance of a single-turn loop given previously. The quality
`factor of such a resonator, O= wl. /(R,, + Ria), is highest for a particular frequency determined
`
`by the system parameters (Fig. 4). As described previously, at lower frequencies the Q is
`
`determined primarily by absorption losses and at higher frequencies the Q is determined
`
`primarily by radiation losses.
`
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`[00188] Note that the formulas given above are approximate and intended to illustrate
`
`the functional dependenceof Rass, R-aq and L on the physical parameters of the structure. More
`
`accurate numcrical calculations of thesc paramctcrs that take into account deviations from the
`
`strict quasi-static limit, for example a non-uniform current/charge distribution along the
`
`conductor, may be useful for the precise design of a resonatorstructure.
`
`[00189] Note that the absorptive losses may be minimized by using low loss
`
`conductors to form the inductive elements. The loss of the conductors may be minimized by
`
`using large surface area conductors such as conductive tubing, strapping, strips, machined
`
`objects, plates, and the like, by using specially designed conductors such as Litz wire, braided
`
`wires, wires of any cross-section, and other conductors with low proximity losses, in which case
`
`the frequency scaled behavior described above may bedifferent, and by using low resistivity
`
`materials such as high-purity copper and silver, for example. One advantage of using conductive
`
`tubing as the conductor at higher operating frequenciesis that it may be cheaper and lighter than
`
`a similar diameter solid conductor, and may havesimilar resistance because most of the current
`
`is traveling along the outer surface of the conductor owing to the skin effect.
`
`[00190]
`
`To get a rough estimate of achievable resonator designs made from copper
`
`wire or copper tubing and appropriate for operation in the microwave regime, one may calculate
`
`the optimum Q and resonant frequency for a resonator composed of one circular inductive
`element (N=/) of copper wire (p=/.69-10° Qm) with various cross sections. Then for an
`
`inductive element with characteristic size x=/ cm and conductor diameter a2=1 mm, appropriate
`
`for a cell phone for example, the quality factor peaks at Q=1225 whenf=380 MHz. For x=30 cm
`
`and a=2 mm, an inductive element size that might be appropriate for a laptop or a houschold
`
`robot, O=//03 atf=17 MHz. For a larger source inductive element that might be located in the
`
`ceiling for cxamplc, x=1 m and a=4 mm, QO maybe as high as O=1315 atf=5 MHz. Note that a
`
`numberof practical examples yield expected quality factors of O=/000-1500 at AXx=50-80.
`
`Measurements of a wider variety of coil shapes, sizes, materials and operating frequencies than
`
`described above show that Q’s >100 maybe realized for a variety of magnetic resonator
`
`structures using commonly available materials.
`
`[00191]
`
`As described above, the rate for energy transfer between two resonators of
`
`characteristic size x; and x2, and separated by a distance D between their centers, may be given
`
`by « . To give an example of howthe defined parameters scale, consider the cell phone, laptop,
`
`36
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`Momentum Dynamics Corporation
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`and ceiling resonator examples from above,at three (3) distances; D/x=10,8, 6. In the examples
`
`considered here, the source and device resonators are the samesize, x;=x2, and shape, and are
`
`oriented as shownin Fig. 1(b). In the cell phone example, @/ 2=3033, 1553, 655 respectively.
`
`In the laptop example, @/ 24 =7131, 3651, 1540 respectively and for the ceiling resonator
`
`example, @/2« =6481, 3318, 1400. The corresponding coupling-to-loss ratios peak at the
`
`frequency wherethe inductive element Q peaks and are «/T' =0.4, 0.79, 1.97 and 0.15, 0.3, 0.72
`
`and 0.2, 0.4, 0.94 for the three inductive element sizes and distances described above. An
`
`example using different sized inductive elements is that of an x;=1 m inductor(e.g. source in the
`
`ceiling) and an x7=30 cm inductor (e.g. household robot on the floor) at a distance D=3 m apart
`
`(e.g. room height). In this example, the strong-coupling figure of merit, UV =«/./U.P, =0.88, for
`
`an efficiency of approximately 14%, at the optimal operating frequency of/=6.4 MHz. Here,the
`
`optimal system operating frequency lies between the peaks of the individual resonator Q’s.
`
`[00192]
`
`Inductive clements may be formed for usc in high-Q magnetic resonators. We
`
`have demonstrated a variety of high-O magnetic resonators based on copper conductorsthat are
`
`formed into inductive clements that enclose a surface. Inductive clements may be formed using a
`
`variety of conductors arranged in a variety of shapes, enclosing any size or shaped area, and they
`
`may be single turn or multiple turn clements. Drawings of cxcmplary inductive clements 900A-B
`
`are shown in Fig. 9. The inductive elements may be formed to enclosea circle, a rectangle, a
`
`square, a triangle, a shape with rounded corncrs, a shape that follows the contour of a particular
`
`structure or device, a shape that follows, fills, or utilizes, a dedicated space within a structure or
`
`device, and the like. The designs may be optimized for size, cost, weight, appearance,
`
`performance, and thelike.
`
`[00193]
`
`These conductors may be bent or formedinto the desired size, shape, and
`
`numberof turns. However, it may bedifficult to accurately reproduce conductor shapes andsizes
`
`using manualtechniques.In addition, it may be difficult to maintain uniform or desired center-
`
`to-center spacings between the conductor segments in adjacent turns of the inductive elements.
`
`Accurate or uniform spacing may be important in determining the self capacitance of the
`
`structure as well as any proximity effect induced increases in ACresistance, for example.
`
`[00194] Molds may be used to replicate inductor elements for high-Q resonator
`
`designs. In addition, molds may be used to accurately shape conductors into any kind of shape
`
`37
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`Momentum Dynamics Corporation
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`without creating kinks, buckles or other potentially deleterious effects in the conductor. Molds
`
`may be used to form the inductor elements and then the inductor elements may be removed from
`
`the forms. Once removed,these inductive clements may be built into cnclosurcs or devices that
`
`may house the high-Q magnetic resonator. The formed elements mayalso or instead remain in
`
`the mold used to form them.
`
`[00195]
`
`The molds may be formed using standard CNC (computer numerical control)
`
`routing or milling tools or any other known techniques for cutting or forming grooves in blocks.
`
`The molds may also or instead be formed using machining techniques, injection molding
`
`techniques, casting techniques, pouring techniques, vacuum techniques, thermoforming
`
`techniques, cut-in-place techniques, compression forming techniques andthe like.
`
`[00196]
`
`The formed element may be removed from the mold or it may remain in the
`
`mold. The mold maybe altered with the inductive element inside. The mold may be covered,
`
`machined, attached, painted and the like. The mold and conductor combination may be
`
`integrated into another housing, structure or device. The grooves cut into the molds may be any
`
`dimension and may be designed to form conducting tubing, wire, strapping, strips, blocks, and
`
`the like into the desired inductor shapes and sizes.
`
`[00197]
`
`The inductive elements used in magnetic resonators may contain more than
`
`one loop and may spiral inward or outward or up or downor in some combination ofdirections.
`
`In general, the magnetic resonators may have a variety of shapes, sizes and numberof turns and
`
`they may be composedofa variety of conducing materials.
`
`[00198]
`
`The magnetic resonators may be free standing or they may be enclosed in an
`
`enclosure, container, sleeve or housing. The magnetic resonators may include the form used to
`
`makethe inductive element. These various forms and enclosures may be composed of almost
`
`any kind of material. Low loss materials such as Teflon, REXOLITE,styrene, and the like may
`
`be preferable for some applications. These enclosures may contain fixtures that hold the
`
`inductive elements.
`
`[00199] Magnetic resonators may be composedof self-resonant coils of copper wire or
`
`coppertubing. Magnetic resonators composed of self resonant conductive wire coils may include
`
`a wire of length /, and cross section radius a, wound into a helical coil of radius x, height 4, and
`
`numberof turns N, which may for example be characterized as N=VI? —A? /22x.
`
`38
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`Momentum Dynamics Corporation
`Exhibit 1002
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`Momentum Dynamics Corporation
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`[00200]
`
`A magnetic resonator structure may be configured so that x is about 30 cm, #
`
`is about 20 cm, a is about 3 mm andNis about 5.25, and, during operation, a power source
`
`coupled to the magnetic resonator may drive the resonator at a resonant frequency, f, wherefis
`
`about 10.6 MHz. Where x is about 30 cm, / is about 20 cm, a is about | cm and N is about 4, the
`
`resonator may be driven at a frequency, /; where fis about 13.4 MHz. Where x is about 10 cm, A
`
`is about 3 cm, a is about 2 mm and Nis about 6, the resonator may be driven at a frequency,/;
`
`where fis about 21.4 MHz.
`
`[00201]
`
`High-Q inductive elements may be designed using printed circuit board traces.
`
`Printed circuit board traces may have a variety of advantages compared to mechanically formed
`
`inductive elements including that they may be accurately reproduced and easily integrated using
`
`established printed circuit board fabrication techniques, that their AC resistance may be lowered
`
`using custom designed. conductor traces, and that the cost of mass-producing them may be
`
`significantly reduced.
`
`[00202]
`
`High-Q inductive elements may be fabricated using standard PCB techniques
`
`on any PCB material such as FR-4 (epoxy E-glass), multi-functional epoxy, high performance
`
`epoxy, bismalaimide triazine/epoxy, polyimide, Cyanate Ester, polytetraflouroethylene (Teflon),
`
`FR-2, FR-3, CEM-1, CEM-2, Rogers, Resolute, and the like. The conductor traces may be
`
`formed on printed circuit board materials with lower loss tangents.
`
`[00203]
`
`The conducting traces may be composed of copper, silver, gold, aluminum,
`
`nickel and the like, and they may be composed ofpaints, inks, or other cured materials. The
`
`circuit board may be flexible and it may be a flex-circuit. The conducting traces may be formed
`
`by chemical deposition, etching, lithography, spray deposition, cutting, and the like. The
`
`conducting traces may be applied to form the desired patterns and they may be formed using
`
`crystal and. structure growth techniques.
`
`[00204]
`
`The dimensions of the conducting traces, as well as the number of layers
`
`containing conducting traces, the position, size and shape of those traces and the architecture for
`
`interconnecting them may be designed to achieve or optimize certain system specifications such
`
`as resonator QO, Oy), resonator size, resonator material and fabrication costs, U, U,), and the like.
`
`[00205]
`
`As an example, a three-turn high-Q inductive element 1001A was fabricated
`
`on a four-layer printed circuit board using the rectangular copper trace pattern as shown in Fig.
`
`10(a). The coppertrace is shown in black and the PCB in white. The width and thickness of the
`
`39
`
`Momentum Dynamics Corporation
`Exhibit 1002
`Page 1010
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`Momentum Dynamics Corporation
`Exhibit 1002
`Page 1010
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`

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`WO 2010/093997
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`PCT/US2010/024199
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`coppertraces in this cxample was approximatcly 1 cm (400 mils) and 43 y» m (1.7 mils)
`
`respectively. The edge-to-edge spacing between turns of the conducting trace on a single layer
`
`was approximately 0.75 cm (300 mils) and each board layer thickness was approximately 100
`
`m (4 mils). The pattern shownin Fig. 10(a) was repeated on each layer of the board and the
`
`conductors were connected in parallel. The outer dimensions of the 3-loop structure were
`
`approximately 30 cm by 20 cm. The measured inductance of this PCB loop was 5.3 4 H.A
`
`magnetic resonator using this inductor element and tunable capacitors had a quality factor, Q, of
`
`550 at its designed resonance frequency of 6.78 MHz. The resonant frequency could be tuned by
`
`changing the inductance and capacitance values in the magnetic resonator.
`
`[00206]
`
`As another example, a two-turn inductor 1001B wasfabricated on a four-layer
`
`printed circuit board using the rectangular coppertrace pattern shown in Fig. 10(b). The copper
`
`trace is shown in black and the PCB in white. The width and height of the coppertraces in this
`
`example were approximately 0.75 cm (300 mils) and 43 « m (1.7 mils) respectively. The edge-
`
`to-cdge spacing between turns of the conducting trace on a single layer was approximatcly 0.635
`
`cm (250 mils) and each board layer thickness was approximately 100. m (4 mils). The pattern
`
`shownin Fig. 10(b) was repeated on each layer of the board and the conductors were connected
`
`in parallel. The outer dimensions of the two-loop structure were approximately 7.62 cm by 26.7
`
`cm. The measured inductance of this PCB loop was 1.3 yu H. Stacking two boards together with
`
`a vertical separation of approximately 0.635 cm (250 mils) and connecting the two boards in
`
`series produced a PCB inductor with an inductance of approximately 3.4 4 H. A magnetic
`
`resonator using this stacked inductor loop and tunable capacitors had a quality factor, O, of 390
`
`at its designed resonance frequency of 6.78 MHz. The resonant frequency could be tuned by
`
`changing the inductance and capacitance values in the magnetic resonator.
`
`[00207]
`
`The inductive elements may be formed using magnetic materials of any size,
`
`shape thickness, and the like, and of materials with a wide range of permeability and loss values.
`
`These magnetic materials may be solid blocks, they may enclose hollow volumes, they may be
`
`formed from many smaller pieces of magnetic material tiled and or stacked together, and they
`
`may be integrated with conducting sheets or enclosures made from highly conducting materials.
`
`Wires may be wrapped around the magnetic materials to generate the magnetic near-field. These
`
`wires may be wrapped around one or more than oneaxis ofthe structure. Multiple wires may be
`
`40
`
`Momentum Dynamics Corporation
`Exhibit 1002
`Page 1011
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`Momentum Dynamics Corporation
`Exhibit 1002
`Page 1011
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`

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`WO 2010/093997
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`PCT/US2010/024199
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`wrapped around the magnetic materials and combined in parallel, or in series, or via a switch to
`
`form customized near-field patterns.
`
`[00208]
`
`The magnetic resonator may include 15 turns of Litz wire wound around a
`
`19.2 cm x 10 cm x 5 mm tiled block of 3F3 ferrite material. The Litz wire may be wound around
`
`the ferrite material in any direction or combination of directions to achieve the desire resonator
`
`performance. The numberof turns of wire, the spacing betweenthe turns, the type of wire, the
`
`size and shape of the magnetic materials and the type of magnetic material are all design
`
`parameters that may be varied or optimized for different application scenarios.
`
`[00209] High-O Magnetic resonators using magnetic material structures
`
`[00210]
`
`It may be possible to use magnetic materials assembled to form an open
`
`magnetic circuit, albeit one with an air gap on the order of the size of the whole structure, to
`
`realize a magnetic resonatorstructure. In these structures, high conductivity materials are wound
`
`arounda structure made from magnetic material to form the inductive element of the magnetic
`
`resonator. Capacitive elements may be connected to the high conductivity materials, with the
`
`resonant frequency then determined as described above. These magnetic resonators have their
`
`dipole momentin the plane of the two dimensional resonatorstructures, rather than
`
`perpendicularto it, as is the case for the capacitively-loaded inductor loop resonators.
`
`[00211]
`
`<A diagram of a single planar resonator structure is shown in Fig. 11(a). The
`
`planar resonator structure is constructed of a core of magnetic material 1121, such as ferrite with
`
`a loop or loops of conducting material 1122 wrapped around the core 1121. The structure may be
`
`used as the source resonator that transfers power and the device resonator that captures energy.
`
`Whenused as a source, the ends of the conductor may be coupled to