a2) United States Patent
`US 7,129,935 B2
`(0) Patent No.:
`Mackey
`(45) Date of Patent:
`Oct. 31, 2006
`
`
`US007129935B2
`
`(54) SENSOR PATTERNS FOR A CAPACITIVE
`SENSING APPARATUS
`
`(75)
`Inventor: Bob Lee Mackey, San Jose, CA (US)
`:
`.
`:
`(73) Assignee: Synaptics Incorporated, San Jose, CA
`(US)
`:
`:
`:
`:
`Subjectto any disclaimer,the term ofthis
`patent is extended or adjusted under 35
`U.S.C. 154(b) by 232 days.
`
`:
`(*) Notice:
`
`(21) Appl. No.: 10/453,223
`
`(22)
`
`Filed:
`
`Jun. 2, 2003
`
`(65)
`
`Prior Publication Data
`US 2004/0239650 Al
`Dec. 2, 2004
`
`(51)
`
`Int. Cl.
`(2006.01)
`G09G 5/00
`(52) U.S. Ch wees 345/174; 345/173; 345/175;
`178/18.06; 178/19.03
`(58) Field of Classification Search ................ 345/174,
`345/173, 175; 178/18.01—18.03, 18.05, 18.06,
`.
`178/19.03
`See application file for complete search history.
`References Cited
`
`(56)
`
`U.S. PATENT DOCUMENTS
`4,550,221 A
`10/1985 Mabusth
`4,550,310 A
`10/1985 ‘Yamaguchietal.
`4,733,222 A
`3/1988 Evans
`
`........... 257/776
`
`10/1995 Boie etal.
`5,463,388 A
`5/1996 Buchanan etal.
`5,521,336 A
`7/1996 DeBrosse et al.
`5,534,732 A *
`7/1996 Jacksonet al.
`5,541,652 A
`8/1999 Miller et al.
`5,933,102 A
`10/2000 Cohen
`6,140,975 A
`11/2000 ‘Tareev
`6.147.680 A
`7/2001 Manaresi et al.
`6,256,022 Bl
`10/2001 Kentet al.
`6,297,811 Bl
`6,480,007 BL* 11/2002 Beck et al.
`csececcsssssseees 324/662
`4/2003 Hikida et al. esses 345/173
`6,549,195 Bl*
`
`7/2003 Karnes .....cccccce 361/119
`6,600,642 BL*
`
`6,657,616 BL* 12/2003 Sims... eee 345/173
`6,784,028 BL*
`8/2004 Rueckes et al. oo... 438/128
`2003/0156065 Al*
`8/2003 Joetal. we, 343/700 MS
`
`FOREIGN PATENT DOCUMENTS
`WO02/100074
`12/2002
`
`wo
`
`* cited by examiner
`.
`.
`.
`.
`dsisnantExaminer-—Leonid Shapiro
`P
`(57)
`ABSTRACT
`
`One embodiment in accordance with the present invention
`includes a capacitive sensing apparatus. The capacitive
`sensing apparatus comprises a first set of interdigitated
`conductive traces. Additionally, the capacitive sensing appa-
`ratus comprises a second set of interdigitated conductive
`traces that are intertwined with the first set of interdigitated
`conductive traces.
`
`42 Claims, 18 Drawing Sheets
`
`Y. Mj. Ci. V(VN
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`600
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`312a
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`PETITIONERS
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`Exhibit 1017, Page 1
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`

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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 1 of 18
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`US 7,129,935 B2
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`100
`
`SensingCircuitry
`
`FIG._1 Sensing
`
`Region108
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`PETITIONERS
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 2 of 18
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`US 7,129,935 B2
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`PETITIONERS
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`Exhibit 1017, Page 3
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 3 of 18
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`PETITIONERS
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`Exhibit 1017, Page 4
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 4 of 18
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`US 7,129,935 B2
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`310
`
`312
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`eT
`FIG._4
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`Exhibit 1017, Page 5
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 5 of 18
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`US 7,129,935 B2
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`502
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`502
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`310a
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`502
`
`502
`
`504
`
`504
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`312a
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`504
`
`504
`
`KN
`FIG._5
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`PETITIONERS
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`Exhibit 1017, Page 6
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 6 of 18
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`3S©
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`FIG._6
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`PETITIONERS
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 7 of 18
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`US 7,129,935 B2
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`702
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`702
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`306a
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`702
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`702
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`704
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`704
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`704
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`704
`
`308a
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`SSEY
`FIG._7
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`PETITIONERS
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`Exhibit 1017, Page 8
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 8 of 18
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`NYY<
`
`FIG._8
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`PETITIONERS
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 9 of 18
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`US 7,129,935 B2
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`702a
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`702a
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`306b
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`702a
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`702a
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`704a
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`704a
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`704a
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`704a
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`308b
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`KW
`FIG._9
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 10 of 18
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`US 7,129,935 B2
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`PETITIONERS
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`Sheet 11 of 18
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`US 7,129,935 B2
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`1102
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`eta
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`Aa
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`Sheet 13 of 18
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`US 7,129,935 B2
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`1300——
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`DENNER VEE
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`308d
`
`FIG._13
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`Sheet 14 of 18
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`Oct. 31, 2006
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`Sheet 15 of 18
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`US 7,129,935 B2
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`“Ladder” PATTERN 1500
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`FIG._15
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 16 of 18
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`US 7,129,935 B2
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`“Brickwork” PATTERN 7)
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`U.S. Patent
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`Oct. 31, 2006
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`Sheet 17 of 18
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`US 7,129,935 B2
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`306f
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`FIG._17
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`U.S. Patent
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`Sheet 18 of 18
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`US 7,129,935 B2
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`1800
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`US 7,129,935 B2
`
`1
`SENSOR PATTERNS FOR A CAPACITIVE
`SENSING APPARATUS
`
`BACKGROUND
`
`Computing devices have become integral tools used in a
`wide variety of different applications, such as in finance and
`commercial transactions, computer-aided design and manu-
`facturing, health care, telecommunication, education, etc.
`Computing devices are finding new applications as a result
`of advances in hardware technology and rapid development
`in software technology. Furthermore, the functionality of a
`computing device is dramatically enhanced by coupling
`these types of stand-alone devices together to form a net-
`working environment. Within a networking environment,
`computing device users may readily exchangefiles, share
`information stored on a common database, pool resources,
`and communicate via electronic mail (e-mail) and video
`teleconferencing.
`Conventional computing devices provide several ways for
`enabling a user to input a choiceor a selection. For example,
`a user can use one or more keys of an alphanumeric
`keyboard communicatively connected to the computing
`device in order to indicate a choice or selection. Addition-
`
`ally, a user can use a cursor control device communicatively
`connected to the computing device to indicate a choice.
`Also, a user can use a microphone communicatively con-
`nected to the computing device to audibly indicate a par-
`ticular selection. Moreover, touch sensing technology can be
`used to provide an input selection to a computing device or
`other electronic device.
`
`Within the broad category of touch sensing technology
`there exist capacitive sensing devices such as touch screens
`and touch pads. When a capacitive sensing device is con-
`ventionally manufactured with conductive wires or traces,
`local open-circuit defects can occur within one or more of
`these conductive traces (e.g., a speck of dust in a photoli-
`thography process, a scratch, or the like). If the conductive
`sensor trace has an open-circuit defect, it is typically non-
`functional or everything to one side of the break is discon-
`nected from circuitry that drives it. As such, the yield of a
`capacitive sensor device manufacturing process is dimin-
`ished by open circuit defects.
`The present invention may address one or more of the
`aboveissues.
`
`SUMMARY
`
`One embodiment in accordancewith the present invention
`includes a capacitive sensing apparatus. The capacitive
`sensing apparatus comprises a first set of interdigitated
`conductive traces. Additionally, the capacitive sensing appa-
`ratus comprises a second set of interdigitated conductive
`traces that are intertwined with thefirst set of interdigitated
`conductive traces.
`
`BRIEF DESCRIPTION OF THE DRAWINGS
`
`FIG. 1 is an exemplary capacitive touch screen device that
`can be implementedto include one or more embodiments of
`the present invention.
`FIG. 2 is an exemplary sensor pattern for illustrating
`terminology in accordance with embodimentsof the present
`invention.
`
`FIG.3 illustrates a portion of an exemplary sensor pattern
`that provides improved uniform optical density in accor-
`dance with an embodimentof the present invention.
`
`40
`
`45
`
`55
`
`2
`FIG.4 illustrates exemplary conductive traces that may be
`utilized to create a sensor pattern having improved uniform
`optical density in accordance with embodiments of the
`present invention.
`FIG. 5 illustrates exemplary conductive traces that each
`include extensions in accordance with an embodimentof the
`present invention.
`FIG.6 is a sensor pattern in accordance with an embodi-
`ment of the present invention.
`FIG.7 illustrates exemplary conductive traces that each
`include extensions in accordance with an embodimentof the
`present invention.
`FIG.8 is a sensor pattern in accordance with an embodi-
`ment of the present invention.
`FIG.9 illustrates exemplary conductive traces that each
`include extensions in accordance with an embodimentof the
`
`present invention.
`FIG. 10 is a sensor pattern in accordance with an embodi-
`ment of the present invention.
`FIG.11 illustrates an exemplary sensor pattern including
`edge traces in accordance with an embodimentof the present
`invention.
`FIG.12illustrates an exemplary sensor pattern with traces
`that include extensions in accordance with an embodiment
`
`of the present invention.
`FIG. 13 illustrates an exemplary sensor pattern formed
`from traces having varying width in accordance with an
`embodiment of the present invention.
`FIG.14 illustrates an exemplary sensor pattern including
`dummy elements in accordance with an embodimentof the
`present invention.
`FIG. 15 illustrates an exemplary redundant pattern in
`accordance with an embodiment of the present invention.
`FIG.16 illustrates other exemplary redundantpatterns in
`accordance with embodiments of the present invention.
`FIG. 17 illustrates an exemplary multiple intertwined
`sensor pattern in accordance with embodiments of the
`present invention.
`FIG. 18 illustrates an exemplary sensing apparatus that
`includes guard traces in accordance with embodiments of
`the present invention.
`The drawingsreferred to in this description should not be
`understood as being drawn to scale.
`
`DESCRIPTION OF PREFERRED
`EMBODIMENTS
`
`Reference will now be madein detail to embodiments of
`the invention, examples of which are illustrated in the
`accompanying drawings. While the invention will be
`described in conjunction with embodiments,it will be under-
`stood that they are not intended to limit the invention to
`these embodiments. On the contrary,
`the invention is
`intended to cover alternatives, modifications and equiva-
`lents, which may be included within the spirit and scope of
`the invention as defined by the appended claims. Further-
`more, in the following detailed description of the present
`invention, numerousspecific details are set forth in order to
`provide a thorough understanding of the present invention.
`However, it will be obviousto one of ordinary skill in theart
`that the present invention may be practiced without these
`specific details. In other instances, well known methods,
`procedures,
`components,
`and circuits have not been
`described in detail as not to unnecessarily obscure aspects of
`the present invention.
`FIG. 1 is a plan view of an exemplary capacitive touch
`screen device 100 that can be implementedto include one or
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`US 7,129,935 B2
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`3
`more embodiments of the present invention. The capacitive
`touch screen device 100 can be utilized to communicate user
`
`input (e.g., using a user’s finger or a probe) to a computing
`device or other electronic device. For example, capacitive
`touch screen device 100 can be placed over an underlying
`image or an information display device (not shown). In this
`manner, a user would view the underlying imageor infor-
`mation display by looking through sensing region 108 of
`capacitive touch screen device 100 as shown.It is noted that
`one or more embodiments in accordance with the present
`invention can be incorporated with a capacitive touch screen
`device similar to touch screen device 100.
`
`The capacitive touch screen device 100 can include a
`substantially transparent substrate 102 havinga first set of
`conductive traces 104 patterned thereon., Additionally, the
`substantially transparent substrate 102 can have a secondset
`of conductive traces 106 patterned thereon. As such, the
`combination of the sets of conductive traces 104 and 106
`define a sensing region 108 of capacitive touch screen
`device 100. Furthermore, the sets of conductive traces 104
`and 106 are each coupled to sensing circuitry 110 that
`enables the operation of capacitive touch screen device 100.
`FIG. 2 is an exemplary sensor pattern 200 for illustrating
`terminology in accordance with embodimentsof the present
`invention. Sensor pattern 200 includes an exemplary con-
`ductive trace 202 that can include a continuous conductive
`material which extends in a first direction such as a sub-
`stantially horizontal direction. However,it is understood that
`conductive trace 202 may be implemented to extend in a
`substantially vertical direction or in any other direction.
`Furthermore, conductive trace 202 can be implemented as a
`straight segment or as any other type of pattern, design, or
`configuration. An exemplary conductive element 206 is
`shown as a portion of conductive trace 202. Conductive
`trace 202 can be understood to include one or more con-
`ductive elements similar to conductive element 206.
`
`Additionally, sensor pattern 200 includesa set of conduc-
`tive traces 204 that comprises exemplary conductive traces
`210 and 212 that are each similar to conductive trace 202.
`Theset of conductive traces 204 extend in a seconddirection
`
`it is
`such as a substantially vertical direction. However,
`appreciated that the set of conductive traces 204 may extend
`in a substantially horizontal direction or in any other direc-
`tion. The set of conductive traces 204 can include two or
`more conductive traces. The general direction of conductive
`trace 202 is also substantially orthogonal to the general
`direction of the set of conductive traces 204. However,
`conductive trace 202 and conductive trace 210 can be
`oriented in any manner with respect to each other.
`Within FIG. 2, sensor pattern 200 also includes a sensor
`pattern cell 208. A sensor pattern cell (e.g., 208) may refer
`to a pattern unit of one or more traces that can be repeated
`to produceall or a portion of a sensorpattern (e.g., 200). For
`example, a repetitious array of sensor pattern cells similar to
`cell 208 produces the sensor pattern shown within the
`sensing region 108 (FIG. 1) of the capacitive touch screen
`device 100.
`It is noted that conductive traces 210 and 212 are each
`“intertwined” with conductive trace 202. Specifically, a
`conductive trace (e.g., 202) can be intertwined with another
`conductive trace (e.g., 210) when each trace extends in a
`different direction and their respective trace patterns look as
`if they were “twisted” together. Furthermore, it is appreci-
`ated that the location where two conductive traces (e.g., 202
`and 210) cross can be referred to as an intersection.
`FIG.3 illustrates an exemplary capacitive sensor pattern
`cell 304 that provides improved uniform optical density in
`
`20
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`25
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`35
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`40
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`45
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`55
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`65
`
`4
`accordance with an embodimentof the present invention. By
`comparison, sensor pattern cell 302 that can be used as part
`of a capacitive touch screen has nearly uniform optical
`density, exceptat its center, where traces 306 and 308 cross.
`That area locally has twice the optical density of the other
`areas of sensor pattern cell 302. This is visible from a
`distance as a small dark spot. As such, a repetitious array of
`sensor pattern cells (not shown) similar to cell 302 produces
`a sensor pattern having the appearance of a grid of small
`dark spots. However, a sensor pattern comprising a repeti-
`tious array of sensor pattern cells (not shown) similar to cell
`304 of the present embodiment reduces this effect so that the
`eye notices an underlying image or display instead of the
`sensor pattern which can be part of a capacitive touch screen
`(e.g., 100). Specifically, sensor pattern cell 304 has been
`implemented with a lower optical density in the area sur-
`rounding where traces 310 and 312 cross such that the
`pattern is more optically uniform. As such, the effect is to
`reduce the visibility of a sensor pattern of cells 304 to a user.
`It is noted that a uniform optical density design such as
`sensor pattern 304 can be beneficial to a capacitive touch
`screen sensor device (e.g., 100). A capacitive touch screen
`device can be a user input device for a computing device or
`electronic device. Typically such a capacitive touch screen
`device resides in front of a display device or image that is
`viewed through by its user. Therefore,
`it is beneficial to
`reducethe uservisibility of the sensor pattern 304. There are
`other methods of modifying sensor pattern optical density in
`accordance with the present embodiment. For example, the
`width of traces 310 and 312 may be adjusted in order to
`provide a more constant optical density. Furthermore,
`dummy elements or additional material, such as opaque
`material, may be added to pattern areas having a lower
`optical density. It is appreciated that the modification of
`sensor pattern optical density is not in any way limited to
`these embodiments.
`
`FIG. 4 illustrates exemplary conductive traces 310 and
`312 that may be utilized to create a capacitive sensor pattern
`having improved uniform optical density in accordance with
`embodiments of the present invention. Specifically,a first set
`of conductive traces similar to trace 310 and a secondset of
`conductive traces similar to trace 312 can be combined to
`
`form a repetitious array of sensorcells similar to cell 304. As
`such, the array is a larger sensor pattern that may be utilized
`as part of a capacitive sensor apparatus.
`FIG. 5 illustrates exemplary conductive traces 310a and
`312a that each include extensions in accordance with an
`
`embodimentof the present invention. It is understood that
`conductive traces 310a and 312a@ may be combined to
`generate a sensor pattern. Furthermore, a first set of con-
`ductive traces similar to conductive trace 310a may be
`combined with a second set of conductive traces similar to
`
`conductive trace 312a to create a sensor pattern (e.g., 600 of
`FIG.6).
`Specifically, conductive trace 310a includes trace exten-
`sions (e.g., 502) while conductive trace 312a also includes
`trace extensions (e.g., 504). It is appreciated that extensions
`502 and 504 mayalso bereferred to as stubs, dendrites or
`branches. Extensions 502 and 504 enable conductive traces
`
`310a and 312a, respectively, to sense a user’s finger and/or
`a probe in a wider vicinity. Additionally, dendrites 502 and
`504 enable conductive traces 310a and 312a, respectively, to
`have better detection resolution. Furthermore, by including
`extensions 502 and 504 as part of conductive traces 310a
`and 312a, respectively, a fewer numberoftraces can be used
`to cover a sensing area of a capacitive sensing apparatus or
`its detection resolution can be improved. As such, an inte-
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`US 7,129,935 B2
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`6
`5
`similar to trace 306a or 308a resulting in more ability to
`grated circuit (IC) having a smaller number of channels for
`interpolate a set of signals as a position. It is appreciated that
`traces may be implementedaspart of the capacitive sensing
`extensions 702 and 704 can be implemented in any con-
`apparatus, thereby reducing the cost of the product.
`figuration, design, layout, length and/or width in accordance
`Within FIG. 5, extensions 502 and 504 are each config-
`with the present embodiment.
`ured as a segmented spiral, which can also be referred to as
`FIG. 8 is a capacitive sensor pattern 800 in accordance
`a counter spiral. It is noted that these counter spirals provide
`with an embodiment of the present invention. Specifically,
`greatereffective sensor width for each conductivetrace(e.g.,
`capacitive sensor pattern 800 is generated from a first set of
`310a and 312a). As such, there can be more overlap between
`conductive traces similar to conductive trace 306a in com-
`the sensing regions of adjacent conductive traces similar to
`bination with a second set of conductive traces similar to
`trace 310a or 312a resulting in more ability to interpolate a
`conductive trace 308a. It is understood that the extensions
`set of signals as a position. It is understood that extensions
`(e.g., 702) of the first set of conductive traces similar to
`502 and 504 can be implemented in any configuration,
`conductive trace 306a are interdigitated with the extensions
`design, layout, length and/or width in accordance with the
`of adjacent parallel conductive traces. Furthermore,
`the
`present embodiment.
`extensions (e.g., 704) of the second set of conductive traces
`FIG. 6 is a capacitive sensor pattern 600 in accordance
`with an embodiment of the present invention. Specifically,
`similar to conductive trace 308q are interdigitated with the
`
`capacitive sensor pattern 600 is implemented fromafirst set extensions of adjacent parallel conductive traces. Within
`of conductive traces similar to conductive trace 310a in
`sensor pattern 800, the first set of conductive traces similar
`combination with a second set of conductive traces similar
`to conductive trace 306a are intertwined with the second set
`of conductive traces similar to conductive trace 308a. As
`such, interdigitation occurs with traces that are substantially
`parallel while intertwining occurs between substantially
`nonparallel
`traces, such as orthogonal or perpendicular
`traces. Sensor pattern 800 has a substantially uniform dis-
`tribution of conductive traces.
`FIG.9 illustrates exemplary conductive traces 3065 and
`308 that each includes extensions in accordance with an
`embodiment of the present invention. It is appreciated that
`conductive traces 306b and 3085 may be combined to
`generate a sensor pattern. Furthermore, a first set of con-
`ductive traces similar to conductive trace 306b may be
`combined with a second set of conductive traces similar to
`conductive trace 308d to create a sensor pattern (e.g., 1000
`of FIG. 10).
`Specifically, conductive trace 3065 includes trace exten-
`sions (e.g., 702a) while conductive trace 3085 also includes
`trace extensions(e.g., 704a). It is appreciated that extensions
`702a and 704a mayalso bereferred to as stubs, dendrites or
`branches. Extensions 702a and 704a enable conductive
`traces 3065 and 3088, respectively, to sense a user’s finger
`and/or a probe in a wider vicinity. Furthermore, branches
`702a and 704a enable conductive traces 306b and 30854,
`respectively,
`to have improved detection resolution. By
`including extensions 702a and 704a as part of conductive
`traces 3065 and 308, respectively, a fewer number of
`conductive traces can be used to cover a sensing area of a
`capacitive sensing apparatus while improving its detection
`resolution.
`Within FIG. 9, extensions 702a are each configured as a
`linear “u’”’ shape that is squared while extensions 704a are
`each configured as a modified linear “u’” shape that
`is
`squared. These squared shapes provide greater effective
`sensor width for each conductive trace (e.g., 3066 and
`3084). As such, there can be overlap between the sensing
`regions of adjacent conductive traces similar to trace 306or
`3085 resulting in more ability to interpolate a set of signals
`as a position.It is understood that extensions 702a and 704a
`can be implemented in any configuration, design, layout,
`length and/or width in accordance with the present embodi-
`ment.
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`to conductive trace 312a resulting in a more uniform optical
`density sensor pattern. It is noted that the extensions(e.g.,
`502) of the first set of conductive traces similar to conduc-
`tive trace 310a are “interdigitated” with the extensions of
`adjacent parallel conductive traces. The extensions (e.g.,
`504) of the second set of conductive traces similar to
`conductive trace 312a are interdigitated with the extensions
`of adjacent parallel conductive traces. Interdigitation can
`occur when one or more extensions of a first conductive
`
`trace extends beyond one or more extensions of a second
`conductive trace that is substantially parallel to the first
`trace. Furthermore, within sensor pattern 600, thefirst set of
`conductive traces similar to conductive trace 310a are
`intertwined with the second set of conductive traces similar
`
`to conductive trace 312a. Therefore, interdigitation occurs
`with traces that are substantially parallel while intertwining
`occurs between substantially nonparallel
`traces, such as
`orthogonal or perpendicular traces. Sensor pattern 600 has a
`substantially uniform distribution of conductive traces
`thereby providing a more uniform optical density sensor
`pattern.
`FIG.7 illustrates exemplary conductive traces 306a and
`308a that each includes extensions in accordance with an
`
`embodiment of the present invention. It is appreciated that
`conductive traces 306a and 308a may be combined to
`generate a sensor pattern. Additionally, a first set of con-
`ductive traces similar to conductive trace 306a may be
`combined with a second set of conductive traces similar to
`
`conductive trace 308a to create a sensor pattern (e.g., 800 of
`FIG.8).
`Specifically, conductive trace 306a includes trace exten-
`sions (e.g., 702) while conductive trace 308a also includes
`trace extensions (e.g., 704). It is appreciated that extensions
`702 and 704 mayalso be referred to as stubs, dendrites or
`branches. Extensions 702 and 704 enable conductive traces
`
`306a and 308a, respectively, to sense a user’s finger and/or
`a probe in a wider vicinity. Furthermore, branches 702 and
`704 enable conductive traces 306a and 308a, respectively, to
`have better detection resolution. By including extensions
`702 and 704 as part of conductive traces 306a and 308a,
`respectively, a fewer number of conductive traces can be
`FIG. 10 is a capacitive sensor pattern 1000 in accordance
`used to cover a sensing area of a capacitive sensing appa-
`with an embodiment of the present invention. Specifically,
`ratus while increasing its detection resolution.
`Within FIG. 7, extensions 702 and 704 are each config- capacitive sensor pattern 1000 is created fromafirst set of
`
`conductive traces similar to conductive trace 3065 combined
`ured as a counter spiral. These counter spirals provide
`with a second set of conductive traces similar to conductive
`greatereffective sensor width for each conductivetrace(e.g.,
`306a and 308a). Therefore,
`there can be more overlap
`trace 3085. The extensions (e.g., 702a) of the first set of
`conductive traces similar to conductive trace 3065 are
`between the sensing regions of adjacent conductive traces
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`PETITIONERS
`
`Exhibit 1017, Page 22
`
`PETITIONERS
`Exhibit 1017, Page 22
`
`

`

`US 7,129,935 B2
`
`7
`interdigitated with the extensions of adjacent parallel con-
`ductive traces. Additionally, the extensions (e.g., 704a) of
`the second set of conductive traces similar to conductive
`
`trace 3080 are interdigitated with the extensions of adjacent
`parallel conductive traces. Within sensor pattern 1000, the
`first set of conductive traces similar to conductivetrace 3065
`are intertwined with the second set of conductive traces
`
`similar to conductive trace 308d. Sensor pattern 1000 has a
`substantially uniform distribution of conductive traces.
`FIG.11 illustrates an exemplary conductive sensorpattern
`1100 including edge traces (e.g., 1104, 1106 and 1110) in
`accordance with an embodimentof the present invention.
`Within the present embodiment, edge traces (e.g., 1104,
`1106 and 1110) couple traces (e.g., 1108 and 1109) that are
`truncated or “cut off’ at the edge of sensor pattern 1100 to
`a conductive sensing trace similar to conductive sensing
`trace 306a or 308a. In this manner, substantial electrical
`symmetry is provided to a conductive sensing trace (e.g.,
`306a or 308a) about its center axis while also providing
`electrical uniformity along its length. This is desirable for
`each conductive sensing trace similar to conductive trace
`306a or 308a of sensor pattern 1100.
`For example, edge trace 1106 couples truncated conduc-
`tive traces 1108 to a conductive trace similar to conductive
`
`the uniform region of the
`In this manner,
`trace 306a.
`electrical field of the conductive trace similar to trace 306a
`
`is extended to the edge of the sensing area of sensor pattern
`1100. Furthermore, the coupled truncated traces (e.g., 1108
`and 1109) also provide optical uniformity to sensor pattern
`1100. It is noted that sensor pattern 1100 also includes
`truncated traces 1112 that remain uncoupled to a conductive
`sensing trace similar to trace 306a or 308a. However, these
`uncoupled remaining truncated traces (e.g., 1112) can pro-
`vide optical uniformity to sensor pattern 1100. It is under-
`stood that the uncoupled truncated traces (e.g., 1112) can be
`referred to as dummy elements of sensor pattern 1100.
`Within FIG. 11, it is appreciated that a group of conduc-
`tive traces 1102 can be coupled to sensing circuitry (e.g., 110
`of FIG. 1) that enables the operation of capacitive sensor
`pattern 1100.
`FIG.12 illustrates an exemplary capacitive sensor pattern
`1200 with traces that include extensions in accordance with
`
`8
`their capacitive
`adjust their optical density or to adjust
`sensitivity at a given location. For example, conductive
`traces 306d and/or 308d can be implemented such that the
`trace width tapers as it extends farther from a trace crossing
`thereby enabling an interpolation function to operate more
`smoothly. It is understood that conductive traces 306d and
`308d can each be implemented in a wide variety of varying
`widths in accordance with the present embodiment. Further-
`more, conductive traces 306d and 308dare not limited to the
`configuration shown. As such, conductive traces 306d and
`308d can each be implemented in any configuration and
`width in accordance with the present embodiment.It is noted
`that any portion of any conductive trace (along with its one
`or more extensions if applicable) shown and/or described
`herein can be implemented with varying width in accor-
`dance with embodiments of the present invention.
`FIG. 14 illustrates an exemplary sensor pattern 1400
`including dummy elements 1402 in accordance with an
`embodiment of the present invention. Specifically, dummy
`elements 1402 (which may comprise, for example, addi-
`tional material that may be opaque material) have been
`included as part of sensor pattern 1400 for optical density
`purposes. Additionally, capacitive sensor pattern 1400
`includesa first set of conductive traces similar to conductive
`trace 306d in combination with a second set of conductive
`traces similar to conductive trace 308d.
`It
`is noted that
`
`dummy elements 1402 may be implemented as any shape,
`opacity, material, width and/or size. Furthermore, dummy
`elements 1402 may be implemented in any manner to
`provide a desired optical density. An uncoupledorelectri-
`cally unconnected trace, element, or material of a sensor
`pattern (e.g., 1400) can be referred to as a dummy element
`(e.g., 1402).
`It is appreciated that one or more dummyelements(e.g.,
`1402) maybe included aspart of or with any sensing pattern
`described herein for any reason, such as, optical density
`purposes. For example, a short stub of a dummy element
`maybe disposed in a gap within a set of conductive sensor
`traces.
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`FIG. 15 illustrates an exemplary “ladder” redundant con-
`ductive pattern 1500 for a capacitive sensing apparatus in
`accordance with an embodiment of the present invention.
`invention. Specifically,
`an embodiment of the present
`Ladder redundant pattern 1500 is generated from a set of
`redundant conductive traces similar to ladder redundant
`capacitive sensor pattern 1200 is created fromafirst set of
`45
`conductive traces similar to conductive trace 306c combined
`conductive trace 1502. The redundant trace 1502 provides a
`with a second set of conductive traces similar to conductive
`tolerance to local open-circuit defects that can occur with a
`trace 308c. The extensions (e.g., 7025) of the first set of
`conventional conductive trace (e.g., a speck of dust in a
`conductive traces similar to conductive trace 306c cross
`photolithography process, a scratch, or the like). Specifi-
`traces of the second set of conductive traces