throbber
DIGITAL
`INTEGRATED
`CIRCUITS
`A DESIGN PERSPECTIVE
`SECOND EDITION
`
`JAN M. RABAEY
`ANANTHA CHANDRAKASAN
`BORIVOJE NIKOLIC
`
`PRENTICE HALL ELECTRONICS AND VLSI SERIES
`CHARLES G. SODINI, SERIES EDITOR
`
`-Pearson Education, Inc.
`
`Upper Saddle River, New Jersey 07458
`
`Qualcomm, Ex. 1014, Page 1
`
`

`

`Library of Congress Cataloging-in-Publication Data on file.
`
`Vice President and Editorial Director, ECS: Marcia J. Horton
`Publisher: Tom Robbins
`Editorial Assistant: Eric Van Ostenbridge
`Vice President and Director of Production and Manufacturing, ESM: David W. Riccardi
`Executive Managing Editor: Vince O'Brien
`Managing Editor: David A. George
`Production Editor: Daniel Sandin
`Director of Creative Services: Paul Belfanti
`Creative Director: Carole Anson
`Art and Cover Director: Jayne Conte
`Art Editor: Greg Dulles
`Manufacturing Manager: Trudy Pisciotti
`Manufacturing Buyer: Lisa McDowell
`Marketing Manager: Holly Stark
`
`About the Cover: Detail of "Wet Orange," by Joan Mitchell (American, 1925-1992). Oil on canvas, 112 x 245 in.
`( 284.5 X 622.3 cm). Carnegie Museum of Art, Pittsburgh, PA. Gift of Kaufmann's Department Store and the
`National Endowment for the Arts, 74.11. Photograph by Peter Harholdt, 1995.
`
`© 2003, 1996 by Pearson Education, Inc.
`Pearson Education, Inc.
`Upper Saddle River, NJ 07458
`
`-
`The author and publisher of this book have used their best efforts in preparing this book. These efforts include the devel(cid:173)
`opment, research, and testing of the theories and progra)IIS to determine their effectiveness. The author and publisher
`shall not be liable in any event for incidental and consequential damages in connection with, or arising out of, the fur(cid:173)
`nishing, performance, or use of these programs.
`
`All rights reserved. No part of this book may be reproduced, in any form or by any means,
`without permission in writing from the publisher.
`
`Printed in the United States of America
`
`1 0 9 8 7 6
`
`ISBN 0-13-090996-3
`
`Pearson Education Ltd., London
`Pearson Education Australia Pty, Ltd., Sydney
`Pearson Education Singapore, Pte. Ltd.
`Pearson Education North Asia Ltd., Hong Kong
`Pearson Education Canada Inc., Toronto
`Pearson Educaci6n de Mexico, S.A. de C.V.
`Pearson Education-Japan, Tokyo
`Pearson Education Malaysia, Pte. Ltd.
`Pearson Education Inc., Upper Saddle River, New Jersey
`
`Qualcomm, Ex. 1014, Page 2
`
`

`

`604
`
`Chapter 11 • Designing Arithmetic Building Blocks
`
`This approach, however requires the use of more than one supply voltage. Multiple supply volt(cid:173)
`ages are aiready employed frequently in today's ICs. A separate supply voltage is provided for
`the 1/0 for compatibility reasons, where the 1/0 ring is designed with transistors with thicker
`gate oxides to sustain higher voltages. The logic core is powered from lower voltage supplies
`and uses transistors with thinner oxides. This approach can be extended to lower the power dis(cid:173)
`sipation of a circuit. For instance, every module could select the most appropriate voltage from
`two (or more) supply options. Even more extreme, multiple voltages can be assigned on a gate(cid:173)
`by-gate basis.
`in
`the digital system shown
`instance,
`Me>dule-Level Voltage Selection Consider, for
`Figure 11-45, which consists of a datapath block with a critical path of 10 ns and a control block
`with a much shorter critical path of 4 ns, operating from the same supply voltage of 2.5 V. Also.
`assume that the datapath block has a fixed latency and throughput and that no architectural trans(cid:173)
`formation can be applied to lower its supply. Since the control block finishes early (in other
`wotds, it has timing slack), its supply voltage can be lowered. A reduction to VDDL = 1 V
`increases its critical path delay to 10 ns, and lowers its power dissipation by more than five
`times.6 We effectively exploit the discrepancy in the critical-path length of the various modules
`(called the slack) to selectively lower the power consumption of the modules with the larger
`slack.
`When combining multiple supply voltages on a die, level converters are required when-:
`ever a module at the lower supply has to drive a gate at the higher voltage. If a gate supplied b
`VDDL drives a gate at VDDH• the PM0S transistor never turns off, resulting in static current
`reduced output swing as illustrates in Figure 11 °46. A level conversion performed at the boun ,
`aries of supply voltage domains prevents these problems. Ail asynchronous level conve
`based on the DVSL template (Chapter 6) and similar to the lo~-swing signalling gate
`Figure 9-32, is shown in Figure 11-46. The cross-coupled P:rvi:0S transistors perform the le
`conversion by using positive feedback. The delay of this level converter is quite sensitive to
`sistor-sizing and supply-voltage issues. The NM0S transistors operate with a reduced overdri
`VvvcVTh• compared with the PM0S devices. They have to be made large to be able to ov
`power the positive feedback. For a low value of V DDL> the delay can become very long. Due
`
`data path
`tP = 10 ns
`Vdd= 2.5V
`
`control path
`tP = 4 ns
`Vdd = 2.5V
`
`Figure 11-45 Design with diverging critical-path lengths.
`
`6This uses the ,simplifying assumption_ that the propagation delay is inversely proportional to the supply voltage.
`
`Qualcomm, Ex. 1014, Page 3
`
`I
`
`(
`
`f
`
`C
`a
`
`

`

`11.7 Power and Speed Trade-Offs in Datapath Structures*
`
`605
`
`Figure 11-46 Level converter.
`
`the reduced overdrive, the circuit is also very sensitive to variations in the supply voltage. Note
`that level converters are not needed for a step-down change in voltage.
`The overhead of the level conversion can be somewhat mitigated by observing that most
`conversions are performed at a register boundary. For instance, the control inputs to the datapath
`block of Figure 11-45 are commonly sampled in a register. A practical way to perform the level
`conversion is, then, to embed it inside the register. A level-converting register is shown in
`Figure 11-47. It is a conventional transmission gate implementation of a master-slave latch pair,
`where a cross-coupled PMOS pair is embedded in the slave latch to perform level conversion.
`Multiple Supplies Inside a Block The same approach can be applied at much smaller. granu(cid:173)
`larity by individually setting the supply voltage for each cell inside a block [Usami.95,
`Hamada0l]. Examining the histogram of the critical-path delays for a typical digital block
`reveals that only a few paths are critical or near critical and that many paths have much shorter
`delays. The shorter paths essentially waste energy, as there is no reward for finishing early. For
`each of these paths, the supply voltage could be lowered to the optimum level. Minimum energy
`consumption would be achieved if all paths become critical. However, this is not easily achiev(cid:173)
`able, as many logic gates are shared between different paths, and it is impractical to generate and
`
`D
`
`Q
`
`ck
`ckb
`elk ~
`
`Figure 11-47 Level-converting register. Shaded gates are
`supplied from V00L [Usami95].
`
`Qualcomm, Ex. 1014, Page 4
`
`

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket