`Grosskopf
`
`USOO6525828B1
`(10) Patent No.:
`US 6,525,828 B1
`(45) Date of Patent:
`*Feb. 25, 2003
`
`(54) CONFOCAL COLOR
`
`(*) Notice:
`
`(76) Inventor: Rudolf Grosskopf, Eschenweg 11,
`D-89551 Konigsbronn (DE)
`Subject to any disclaimer, the term of this
`patent is extended or adjusted under 35
`U.S.C. 154(b) by 0 days.
`This patent is Subject to a terminal dis
`claimer.
`
`(21) Appl. No.: 09/539,037
`(22) Filed:
`Mar. 30, 2000
`(30)
`Foreign Application Priority Data
`Apr. 23, 1999
`(DE) ......................................... 19918689
`(51) Int. Cl." ................................................ G01B 11/24
`(52) U.S. Cl. ....................... 356/613; 359/397; 359/619;
`359/626; 250/234
`(58) Field of Search ................................. 357/368, 385,
`357/397; 356/376, 371,445, 446, 448,
`616, 622, 601, 603, 604, 606, 613, 600;
`250/2013, 234
`
`(56)
`
`References Cited
`U.S. PATENT DOCUMENTS
`5,239,178 A 8/1993 Derndinger et al.
`5,587,832 A 12/1996 Krause ....................... 359/385
`5,877,807 A
`3/1999 Lenz
`
`
`
`5,978,095 A 11/1999 Tanaami ..................... 356/445
`6,031,661. A
`2/2000 Tanaami ..................... 359/368
`6,111,690 A 8/2000 Tanaami ..................... 359/368
`6,226,036 B1
`5/2001 Grosskopf
`6.252.717 B1
`6/2001 Grosskopf
`FOREIGN PATENT DOCUMENTS
`
`3/1990
`8/1996
`4/1998
`
`3837O63 C1
`DE
`4113279 C2
`DE
`1964.8316 C1
`DE
`* cited by examiner
`Primary Examiner Hoa Q. Pham
`(74) Attorney, Agent, or Firm-Hale and Dorr LLP
`(57)
`ABSTRACT
`An apparatus for examining an object in three dimensions
`including an optical System having an illumination Side and
`an observation Side; an illumination grid located in an
`illumination plane on the illumination Side of the optical
`System and which during use generates an array of illumi
`nation points that is projected by the optical System onto a
`focus plane at a Site at which the object is located, the optical
`System in turn directing light from that site into an obser
`Vation plane on the observation side of the optical System,
`the illumination grid being a first aperture plate having a first
`passive array of pinholes, a detector array of light-sensitive
`regions located on the observation side of the optical System;
`and a Second aperture plate located between the detector
`array and the optical System, Said Second aperture plate
`having a Second passive array of pinholes.
`
`13 Claims, 3 Drawing Sheets
`
`3SHAPE EXHIBIT 1017
`3Shape v. Align
`IPR2019-00154
`
`
`
`U.S. Patent
`
`Feb. 25, 2003
`
`Sheet 1 of 3
`
`US 6,525,828 B1
`
`11 C
`/\ 1
`s
`
`18
`
`s
`12Ob
`
`/
`
`lu-N
`- N-1
`1751 |
`\\
`1.
`N
`13O
`121
`\\\-13t
`M
`
`13U
`
`16
`
`Fi
`9.
`
`1
`
`180
`
`18V
`
`
`
`
`
`U.S. Patent
`US. Patent
`
`Feb. 25, 2003
`Feb. 25, 2003
`
`Sheet 2 of 3
`Sheet 2 0f3
`
`US 6,525,828 B1
`US 6,525,828 B1
`
`
`
`
`
`
`
`U.S. Patent
`US. Patent
`
`Feb. 25, 2003
`Feb. 25, 2003
`
`Sheet 3 of 3
`Sheet 3 0f3
`
`US 6,525,828 B1
`US 6,525,828 B1
`
`
`
`
`
`
`
`US 6,525,828 B1
`
`1
`CONFOCAL COLOR
`
`FIELD OF THE INVENTION
`This invention relates to a device for examining an object
`in three dimensions.
`
`15
`
`25
`
`BACKGROUND
`In confocal microScopy, an object is illuminated in known
`fashion through an aperture diaphragm and the illuminated
`point is observed by a radiation detector for which the
`light-sensitive Surface is just as Small as the illuminated
`point (Minsky, M., U.S. Pat. No. 3,013,467 and Minsky, M.,
`Memoir on inventing the confocal Scanning microScope.
`Scanning 10, p. 128-138). Compared to conventional
`microScopy, confocal microScopy has the advantage of
`delivering resolution in depth (measurement of the Z axis)
`and of creating little Scattered light during imaging. Only the
`plane of the object in focus is brightly illuminated. Object
`planes above or below the focus plane receive much leSS
`light. The image is built up through a Scanning process. One
`or more points may be illuminated and observed Simulta
`neously.
`Three Scanning methods are well known: mirror Scanning,
`Nipkow disk, and electronic Scanning using a matrix detec
`tor. Additional details on prior art relating to Scanning with
`a mirror or Nipkow disk may be found in the Handbook of
`Biological Confocal Microscopy, Plenum Press, New York
`(James D. Pawley, Editor).
`A confocal imaging System with confocal illumination
`through an aperture plate and electronic Scanning by a
`matrix detector was first proposed in DE 4035799. A matrix
`detector is employed here in which the pixels are light
`sensitive only one a portion (30%) of the Surface assigned to as
`the pixel, and on the illumination Side, an aperture plate is
`typically used which has the same number of holes as the
`imaging Sensor has light-sensitive pixels. The information in
`depth is gained by recording multiple images from different
`focus planes and individually evaluating the brightness 40
`maximum for the different pixels in a computer.
`Document DE 196 48 316 describes an arrangement
`which is typically provided with one illumination hole on
`the aperture plate for every four detector pixels assigned to
`it, and with a prism array immediately in front of the matrix 45
`detector. The prism array acts as a beam-forming element
`which splits the light of each illumination point Such that
`two crescent images are formed outside the focus. Document
`DE 196 51 667 A1 describes an arrangement in which
`likewise typically one illumination hole on the aperture plate 50
`is assigned to four detector pixels each and which contains
`an array of anamorphote lenses immediately in front of the
`detector array. One lens is assigned to each illumination
`hole. Here the anamorphote lenses also act as beam-forming
`elements producing an image of the illumination point, the 55
`image being circular in focus and oval outside of focus. In
`these last two arrangements, the information in depth is
`gained by evaluating the difference between light signals of
`adjacent pixels.
`Arrangements DE 40.35799, DE 19648316 and DE 196 60
`51 667 A1 have the advantage, among others, that many
`measurement points in depth may be recorded
`Simultaneously, yet have the disadvantage that color images
`cannot be recorded. The object of the present invention is
`therefore to disclose an approach by which images may be 65
`recorded confocally using available color-capable matrix
`detectors. This requirement is found for example, in genetic
`
`2
`technology, cancer research and cancer Screening where
`there is a need within a short period to Scan many tissue cells
`for Small (e.g. 200 nm) fluorescing or dyed sites in three
`dimensions.
`
`SUMMARY
`The invention provides for arranging one aperture plate
`each, both on the illumination side and on the observation
`Side, in those planes which are optically conjugate with the
`focus plane of the object and arranging at a Suitable distance
`a color-capable matrix detector behind the aperture plate on
`the observation Side, i.e. outside of focus.
`The diagrams show examples of possible practical
`embodiments of the invention.
`
`BRIEF DESCRIPTION OF THE DRAWINGS
`FIG. 1 shows a complete arrangement of an imaging
`device according to the invention.
`FIGS. 2, 2b and 2c show a compact assembly with two
`aperture plates, beam splitter cube and color-capable matrix
`radiation detector which are employed according to the
`invention.
`FIGS. 3a, 3b and 3c show the beam path within the beam
`Splitter cube at various focus positions.
`FIGS. 4a and 5a show two color cell embodiments for the
`matrix detector.
`FIGS. 4b and 5b show the spectral light transmission
`curves assigned to the color cells for the light filter elements
`arranged in front of the pixels.
`FIG. 6 shows an example of an arrangement for a matrix
`detector (17) at a Suitable distance from the plane of the
`confocal observation diaphragms.
`FIG. 7 shows a top view of the three sensor cells of the
`matrix detector in FIG. 6.
`
`DESCRIPTION
`In FIG. 1, (11) indicates a light Source, e.g. a halogen lamp
`which with the aid of condenser (11k) illuminates holes in a
`layer. This layer may be fabricated in the familiar fashion,
`e.g. from chromium on a glass plate (12g). The holes are
`arranged in the layer in a grid pattern. For example, the layer
`contains 256x256 holes spaced 22 um apart with the holes
`measuring, e.g., 4 limx4 um. The holes are, in other words,
`considerably Smaller than their spacing. The Spacing of the
`holes or the distances from center to center are designated as
`the grid dimension.
`The illumination grid generated through the illuminated
`holes in the layer lies in observation plane (120b). Said plane
`is projected through lenses (130, 13u) onto focus plane (13f)
`such that within this plane, object (14) is illuminated with
`light points arranged in a grid pattern. In the case of
`nontransparent objects, only Surface (14O) can be
`illuminated, whereas with transparent objects, internal lay
`ers (14s) may be illuminated by light points. The light beams
`reflected from the object in focus plane (13?) are focused by
`lenses (13u, 13O) via a beam splitter (16) in diaphragm plane
`(121b).
`The above-mentioned beam splitter (16) is designed as a
`Semitransparent mirror and used for incident-light applica
`tions. For fluorescence applications, a dichroic mirror is
`employed in the known fashion.
`Object (14) may be moved in all 3 spatial axes by
`adjustment device (15) so that different layers (14s) and
`different areas of object (14) may be scanned. The distance
`
`
`
`3
`for motion in the X and y axes may be Selected to be Smaller
`than that for the grid dimension of the light points. Of
`course, movement of object (14) in the Z axis may also be
`achieved by moving lenses (130, 13u) in the direction of
`optical axis (10); similarly, instead of moving the object in
`the X and y axes, the layer with the holes and detector array
`(17) may also be moved in the appropriate manner.
`The signals from detector array (17) are transmitted
`through connector line (17v) to computer (18) which effects
`the evaluation in the familiar manner and displays the results
`of evaluation on Screen (18b), e.g. in the form of graphical
`representations. Via connector line (18v), computer (18) can
`also control the displacement of focus plane (13f) in the
`object as well as Scanning in the X and y axes. This control
`may be present in the computer in the form of a fixed
`program or may proceed in response to the results of the
`evaluation.
`FIG. 2 shows how two aperture plates (120), (121)
`according to the invention and matrix detector (17) may be
`combined with beam splitter cube (20) in one compact
`assembly. In the example shown, the aperture plate patterns
`are placed directly onto the Surfaces of the beam Splitter
`cube. Beam splitter layer (16) within the beam splitter may
`have an identical beam-splitting factor of e.g. 50% for all
`wavelengths of light, or the layer may be designed as a
`dichroic layer, e.g. for fluorescence applications.
`FIG.2b shows the beam splitter cube from View B, i.e.
`reproduces the aperture plate pattern of the illumination
`plane. It is of course obvious that there are in reality many
`more holes than shown in the example grid with 6x6 holes.
`Typically, 512x512 holes are used. In practice, the hole
`pattern is adapted to the matrix of the radiation detector on
`the detector employed.
`FIG.2c shows the beam splitter cube from View C where
`the matrix detector itself is omitted here to reveal the
`aperture plate pattern of the observation plane. This pattern
`is designed with the same grid dimension and Same number
`of holes as the aperture plate pattern of the illumination Side.
`This results in a confocal beam path for each of the parallel
`beam paths. In other words, e.g., 512x512=262144 image
`points are simultaneously recorded in color and confocally.
`This parallel arrangement of a large number of beam paths
`enables the rapid recording of large Sample Volumes. For
`example, it allows many Suspected cancerous cells, in which
`the genes have been provided with Specific markers, to be
`rapidly examined for the presence or absence of the markers
`within individual cells.
`Methods for the Specific marking of cancer genes have
`been developed recently. See, e.g., the inaugural dissertation
`“Spectral Karyotypization and Comparative Genomic
`Hybridization-New Methods for the Comprehensive
`Analysis of Chromosomal Aberrations in Clinical Genetic
`Diagnostics and Tumor Genetics” by E. Schrock, Humboldt
`University, Berlin.
`FIGS. 3a, b and c illustrate the confocal effect. FIG. 3a
`shows the beam path within the beam splitter cube for one
`of the parallel beam paths, the assumption being made that
`the associated object point is located in the focus. All light
`emitted from illumination plane (120b) and reflected from
`the object point passes through the associated hole within
`observation plane (121b). The sensor located left of plane
`(121) and not shown here thus receives considerable light
`for this picture element.
`FIG. 3b similarly shows the beam path within the beam
`Splitter cube for one of the parallel beam paths, the assump
`tion made here being that the associated object point lies
`
`15
`
`25
`
`35
`
`40
`
`45
`
`50
`
`55
`
`60
`
`65
`
`US 6,525,828 B1
`
`4
`outside of focus. Only a portion of the light emitted from
`illumination plane (120b) and reflected from the object point
`can pass through the associated hole in observation plane
`(121b). The image of the object point created in plane (121)
`is shown diagrammatically at left. The hatched area indi
`cates which portion of the light has been dimmed. The
`sensor located left of plane (121) and not shown thus
`receives leSS light for this picture element than was the case
`in focus.
`Whereas in FIG.3b the assumption is made that the object
`point lies closer to the objective than would be appropriate
`for the focus position, in FIG.3c the assumption is made that
`the object point lies further away from the objective than the
`focus plane. The dimming effect is, as shown at the left of
`the diagram, the same as for the deviation shown in FIG. 3b.
`FIG. 4a shows sensor cell (17a) to which various and
`independently Selectable light-sensitive regions of the
`matrix detector are assigned and in front of which are
`positioned light filters A, B, C, D. Light filters A, B, C, D
`have different Spectral light transmission curves which are
`shown in FIG. 4b.
`FIG. 5a shows another design for sensor cell (17a)),
`again to which various and independently Selectable light
`Sensitive regions of the matrix detector are assigned, The
`arrangement of the light filters shown here is taken from the
`datasheet for the matrix detector ICX084AK manufactured
`by Sony. Here the partial surfaces designated as Gb and Gr
`have a spectral detector characteristic designated as G in
`FIG. 5b. Gb and Gr belong to different lines of the matrix
`detector. The light-sensitive regions of the matrix detector
`designated as B (blue) and R (red) have the associated
`transmission curves B and R shown in FIG. 5b.
`FIG. 6 illustrates a practical arrangement for the Spacing
`of the matrix detectors behind the detector-side hole pattern.
`This spacing is a function of the aperture angle C. of the
`imaging optics and the hole spacing on the aperture plates.
`In one practical arrangement of the invention-as
`mentioned-the hole Spacing on the aperture plates is the
`Same as the Spacing used for the detector cells on the matrix
`array. To ensure that a complete color evaluation is possible
`when recording the color for each Sample Site illuminated,
`the light passing through the associated observation hole
`must be distributed to all partial Surfaces of the sensor cell.
`The diverging lines (22a, 22b) show that the light to the left
`of the aperture plate plane is distributed onto a Surface which
`becomes larger with distance. According to the invention, it
`is useful to arrange the matrix detector at Such a distance S
`from aperture plate plane (121b) that detector plane (17b)
`coincides with the interSecting points of the diverging mar
`ginal rays (22a, 22b) of the adjacent holes. In this way, the
`detector cells are fully illuminated and the color character
`istic of the Sample points may be measured completely.
`The component of color detector array (17) belonging to
`the arrangement shown in FIG. 6 is reproduced (view rotated
`by 90 degrees) for purposes of further illustration.
`The arrangement is not limited to the use of color-capable
`matrix Sensors. In place of the cells to record four different
`Spectral ranges, individual correspondingly larger pixels of
`a black-and-white Sensitive matrix Sensor may be employed,
`the pixels being light-sensitive over their entire Surface. In
`this embodiment, the invention is employed for confocal
`imaging with matrix Sensors in which the pixels are light
`Sensitive over the entire Surface allocated to them.
`It is also not necessary, although it is practical, that the
`grid dimension of the matrix Sensors be the same as, or
`integer multiples of, the grid dimension of the aperture
`
`
`
`S
`plates. The confocal effect is produced by the two aperture
`plates. The grid dimension of the matrix Sensors may thus in
`principle deviate as desired from the grid dimension of the
`aperture plates. However, the result of this may be aliasing
`effects and other image artifacts which could cause distor
`tions under certain circumstances.
`What is claimed is:
`1. An apparatus for examining an object in three
`dimensions, Said apparatus comprising:
`a illumination Source; and
`an optical System having an illumination side and an
`observation side, Said optical System including:
`an illumination grid located in an illumination plane on
`the illumination side of the optical System and which
`when illuminated by the illumination Source gener
`ates an array of illumination points that is projected
`by Said optical System onto an object focus plane
`where the object is located, said optical System in
`turn directing light from that object focus plane into
`an observation focus plane on the observation side of
`the optical System, Said illumination grid comprising
`a first aperture plate having a first passive array of
`pinholes,
`an array of detector cells located on the observation
`Side of the optical System, each of the cells of the
`detector array having n independently Selectable
`light-sensitive regions, wherein n is an integer
`greater than 1; and
`a Second aperture plate located between the detector array
`and the optical System, Said Second aperture plate
`having a Second passive array of pinholes, wherein
`each of the pinholes of the Second aperture plate is
`asSociated with a corresponding different detector cell
`of the detector array.
`2. The apparatus of claim 1, wherein the Second aperture
`plate is located in the observation focus plane.
`3. The apparatus of claim 2, wherein the n light-sensitive
`regions of each cell include n different spectral filters, each
`of the n Spectral filters being associated with a different one
`of the n light-sensitive regions.
`4. The apparatus of claim 3, wherein n=4.
`5. The apparatus of claim 2, wherein the detector array is
`positioned a Specified distance from the Second aperture
`plate So that an unfocused image of an illumination point for
`each pinhole of the Second aperture plate fully illuminates
`the corresponding cell.
`
`1O
`
`15
`
`25
`
`35
`
`40
`
`45
`
`US 6,525,828 B1
`
`6
`6. The apparatus of claim 2, wherein the first passive array
`of pinholes has the same dimensions as the Second passive
`array of pinholes.
`7. The apparatus of claim 2, wherein the n light-sensitive
`regions of each cell are characterized by n different spectral
`Sensitivity curves.
`8. An optical System for examining an object in three
`dimensions, Said optical System having an illumination side
`and an observation side and comprising:
`a transparent block that includes a beam Splitter embodied
`therein;
`an illumination Source grid located in an illumination
`plane on the illumination Side of the optical System and
`which during use generates an array of illumination
`points that is projected by Said optical System onto an
`object focus plane where the object is to be located,
`Said optical System in turn directing light from that
`object focus plane into an observation focus plane on
`the observation side of the optical System, said illumi
`nation grid comprising a first aperture plate having a
`first passive array of pinholes,
`an array of detector cells located on the observation Side
`of the optical System; and
`a Second aperture plate located between the detector array
`and the optical System, Said Second aperture plate
`having a Second passive array of pinholes, wherein
`both the first aperture plate and the Second aperture
`plate are attached to corresponding Surfaces of the
`transparent block.
`9. The optical system of claim 8 wherein each of the cells
`of the detector array have n independently Selectable light
`Sensitive regions, wherein n is an integer, and wherein each
`of the pinholes is associated with a corresponding different
`detector cell of the detector array.
`10. The optical system of claim 9 wherein n=1.
`11. The optical system of claim 8, wherein the n is greater
`than 1 and the n light-sensitive regions of each cell are
`characterized by n different spectral Sensitivity curves.
`12. The apparatus of claim 8, wherein the Second aperture
`plate is located in the observation focus plane.
`13. The optical system of claim 8, wherein the first
`aperture plate and the Second aperture plate are formed on
`corresponding Surfaces of the transparent block.
`
`