throbber
\
`
`The #1, easy-to-read, math-free introduction to
`semiconductor processing
`
`Perfect for training, teaching, & vo-tech
`programs
`
`Updated with new cleaning techniques, packing
`technologies, & fabrication methods
`
`PETER VAN ZANT
`
`§|Eml‘|@@[fl@@8m PROCESSING
`
`
`
`Cree Ex. 1005
`
`Cree Ex. 1005
`
`Page 1
`
`

`

`
`
`Microchip
`Fabficafion
`
`A Practical Guide to Semiconductor Processing
`
`Peter Van Zant
`
`Fourth Edition
`
`McGraw-Hill
`New York San Francisco Washington,D.C. Auckland Bogoté
`Caracas Lisbon London Madrid Mexico City Milan
`Montreal New Delhi San Juan Singapore
`Sydney Tokyo Toronto
`
`
`
`Cree Ex. 1005
`
`Page 2
`
`Cree Ex. 1005
`
`Page 2
`
`

`

`on : a practical guide to semicond
`
`uctor processing / Peter Van
`
`Library of Congress Cataloging-in-Publication Data
`Van Zant, Peter.
`Microchip fabricati
`Zant.——4th ed.
`p.
`cm.
`Includes bibliographical r
`ISBN 0-07-135636-3
`Design and construction.
`1. Semiconductors—
`TK7871.85.V36 2000
`621.3815'2‘dc21
`
`eferences and index.
`
`I. Title.
`
`00-02317
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`McGraw-Hill
`A Division ofTheMcGraw-Hiu Companies
`
`\
`
`The McGraw-Hill Companies, inc. All
`Copyright c 20:10, 1997, 1934 by
`United States of America. Except as
`rights reserved. Printed in the
`right Act of .1976. no pm'L of
`permitted under the United States Copy
`uted to any form or by any
`Lhis publication may be reproduced or distrib
`system. without the prior
`means. or stored in a data base or retrieval
`written permission of the publisher.
`1234567890 DOC/DOC 09876543210
`
`ISBN 0-07—135636-3
`
`The sponsoring editor for this book was Stephen Chapman and the
`production supervisor was Sherri Souffrancc. It was set in Century
`Schoolbook by Pro-Image Corporation.
`Printed and bound by R. R. Donnelley & Sons Company.
`
`
`
`
`nted on recycled, acid—free paper containing
`This book is pri
`a minimum of 50% recycled, de-inked fiber.
`
`
`
`
`thin work lies been obtained by The N10
`information contained in
`l“Mc-Graw-flill"i from sources he-
`Grow—Hill Uompnniea. Inc.
`lievud to be reliable. However, neither 'McGrnw-ifiil nor its nu-
`thorn guarantee the accuracy or completeness of any information
`published herein, nnd nciLher McGraw-Hiil nor its authnra shall
`be respnnnibln for any errors, omissions, or damages arising out
`of use of this influx-nation. This work in published with the un'
`(lm‘smnding that MuG-mw-Hill and its authors are supplying in-
`formation but me not attempting to render engineering or other
`professional services. if such surviccfl are required. the assistance
`of an appropriate profesninnnl should be sought.
`
`
`
`
`Cree Ex. 1005
`
`Page 3
`
`Cree Ex. 1005
`
`Page 3
`
`

`

`Metallization
`
`
`Overview
`
`
`
`
`two major segments. First the
`Fabrication of circuits is divided into
`
`
`(:1 in and on the wafer surface.
`active and passive parts are fabricate
`
`
`These is called the Front End Of the Line or FEOL. In the Back End
`
`
`of the Line (or BEOL), the metal systems necessary to connect the
`
`
`devices and different layers are added to the chip. In this chapter the
`
`
`.Ilmterials, specificationS, and methods used to complete the metalli-
`
`
`zation segment is presented along with other uses of metals in chip
`manufacturing. Vacuum pumps, used in CVD, evaporation, ion im-
`
`
`plant, and sputtering systems are explained at the end of the chapter.
`
` obiectives
`U
`.
`pon COmpletion of this chapter, you should be able to:
`
`
`‘
`.
`.
`.
`Llst the requirements of a material for use as a chip surface con-
`
`
`ductor.
`.
`.
`D1 aw cross sections of single and multilayer metal schemes.
`
`
`' DeSCribe the purpose and operation of a thin-film fuse.
`
`
`3A
`ation of semiconductor
`Edalfe a list of materials used in the metalliz
`
`
`eVICBS. Identify their Specific use(s).
`
`
`Draw and identify the parts of a vacuum evaporator
`00.4'02_Cn
`
`
`Describe the principle of sputtering.
`
`
`Draw and identify the parts of a sputtering system.
`
`' DeSCI‘ibe the principle and operation of oil diffusion, turbo and cry-
`Ogenjc high-vacuum pumps.
`
`1.
`
`2.
`
`Cree Ex. 1005
`
`P
`
`age
`
`4
`
`Cree Ex. 1005
`
`Page 4
`
`

`

`Chapter Thirteen Introduction
`
`396
`
`The most common and familiar use of metal films in semiconduCtOr
`technology is for surface wiring. The materials, methods, and Dl‘o~
`ceases of "wiring” the component parts together is generally I'elbl‘red
`to as metallization or the metallization process. Metallizasttiou includsq
`all of the steps in the inetallizatlon sequence described in Chapter 5
`
`l
`
`’
`
`Conductors-Single Level Metal
`In the MSI era metallization was relatively straight forward (Fig
`13.1), requiring only a single level metal process. Small holes, Called
`contact holes or contacts, are etched through the surface layers. to the
`device/circuit component parts. Following contact masking, a thin
`layer (10,000 to 15,000 A) of the conducting metal (mostly aIUmimIm
`or aluminum alloys) was deposited by vacuum evaporation, sputter.
`ing, or CVD techniques over the entire wafer. The unwanted portions
`of this layer are removed by a conventional photomasking and etch
`procedure or by lift-off. This step leaves the surface covered with thin
`lines of the metal that are called leads, metal lines, or interconnects.
`Generally a heat-treatment step, called alloying, is performed afiel-
`metal patterning to ensure good electrical contact between the metal
`and the wafer surface.
`Regardless of the structure, a metal system must meet the following
`criteria:
`
`l
`I
`
`
`
`I G00
`I Gool‘
`l;
`' Eas‘.‘
`I Goor
`I Higti'
`I Corr!
`I Long-
`I Capaf:
`I Unifcl:
`l—
`
`Conduc
`Increasi
`face wh
`The, an‘
`schemes-
`it is expu':
`two-met"
`layer for,-
`
`Water with
`Doped RegIons
`
`2.
`Patterning:
`Mask
`Contact
`
` 1.
`
`3‘
`Layering: Conducting
`Layer
`
`4.
`Patternlng: Metal
`Mask
`
`Figure 13.1 Metallization sequence.
`
`Cree Ex. 1005
`
`Page 5
`
`Cree Ex. 1005
`
`Page 5
`
`

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket