R&S®RTO
`Digital Oscilloscope
`Scope of the art
`
`Product Brochure | 21.00
`
`Test & Measurement
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`Tektronix, Exhibit 2012
`Rohde v. Tektronix, IPR2018-00643
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`

`

`R&S®RTO
`Digital Oscilloscope
`At a glance
`
`R&S®RTO oscilloscopes combine excellent signal
`fidelity, high acquisition rate and the world's first
`realtime digital trigger system with a compact
`device format in the 600 MHz to 4 GHz class.
`They offer an extensive set of measurement and
`analysis functions. The fully optimized touchscreen
`operation is amazingly simple.
`
`R&S®RTO oscilloscopes are optimized to perform precise
`measurements at a high input sensitivity and very low
`inherent noise. With an acquisition rate of one million
`waveforms per second, R&S®RTO oscilloscopes detect
`signal faults lightning fast. The world's only realtime digital
`trigger system precisely correlates the trigger event to the
`measurement signal.
`
`R&S®RTO oscilloscopes are equipped with over 90 mea-
`surement functions for debugging complex designs. Rare
`signal faults are found using the rapid mask test or the
`powerful FFT analysis function. The history function can be
`used to look back in time to identify the actual cause of a
`fault. For challenging analysis tasks, the oscilloscopes can
`be extended with options for protocol decoding, jitter and
`compliance testing and vector signal analysis.
`
`R&S®RTO oscilloscopes have been optimized for touch-
`screen operation, making them easy and intuitive to use.
`
`2
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`Tektronix, Exhibit 2012
`Rohde v. Tektronix, IPR2018-00643
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`

`

`R&S®RTO
`Digital Oscilloscope
`Benefits and
`key features
`
`Truly uncompromised performance
` ❙ Precise measurements due to very low noise level:
`1 % of full scale at 1 mV/div and 1 GHz
` ❙ High dynamic range due to single-core A/D converter
` ❙ High definition with up to 16-bit resolution and
`500 µV/div
` ❙ Full measurement bandwidth even at 1 mV/div
` ❙ Low crosstalk even with high-frequency signals due to
`60 dB channel-to-channel isolation
` ❙ Accurate highly sensitive triggering
` ❙ Find rare signal faults quickly thanks to industry-leading
`one million waveforms per second
` ❙ High measurement speed, even for complex analysis
`functions
` ▷ page 4
`
`Outstanding range of capabilities
` ❙ Wide selection of measurement functions: over
`90 automated measurements
` ❙ QuickMeas: key measurement results at the push of a
`button
` ❙ Search and navigation: finding faults fast
` ❙ History function: looking back in time
` ❙ Industry-leading mask test: quick configuration – reliable
`results with up to 600 000 tests per second
` ❙ FFT-based spectrum analysis: powerful, fast and
`user-friendly
` ▷ page 10
`
`Optimized user interface
` ❙ High-resolution touchscreen for ease of use
` ❙ Color coding for clear overview
` ❙ Fully customizable display
` ❙ Fast access to important tools
` ❙ Signal details at your fingertip
` ❙ Easy selection of instrument setup
` ❙ Documentation at the press of a button
` ▷ page 13
`
`Master sophisticated applications
` ❙ Class-leading 400 MHz logic analysis: 5 Gsample/s and
`200 Msample memory on 16 channels
` ❙ High definition: see more with up to 16-bit vertical
`resolution
` ❙ Serial protocols: easy triggering and decoding
` ❙ Analysis of power electronics with the power analysis
`option
` ❙ Jitter analysis
` ❙ Automatic compliance tests
` ❙ EMI debugging with oscilloscopes
` ▷ page 18
`
`Models
`Channels Sampling rate Acquisition memory
`Base unit
`4
`20 Gsample/s
`20 Msample per channel,
`R&S®RTO1044 (4 GHz bandwidth)
`max. 800 Msample
`4
`10 Gsample/s
`R&S®RTO1024 (2 GHz bandwidth)
`2
`R&S®RTO1022 (2 GHz bandwidth)
`4
`R&S®RTO1014 (1 GHz bandwidth)
`2
`R&S®RTO1012 (1 GHz bandwidth)
`R&S®RTO1004 (600 MHz bandwidth) 4
`R&S®RTO1002 (600 MHz bandwidth) 2
`
`Acquisition rate Mixed signal analysis (MSO)
`1 million wave-
`400 MHz bandwidth,
`forms per second
`5 Gsample/s sampling rate,
`200 Msample memory depth
`
`
`
`Rohde & Schwarz R&S®RTO Digital Oscilloscope 3
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`High dynamic range due to single-core
`A/D converter
`Rohde & Schwarz developed a monolithic A/D converter for
`the R&S®RTO oscilloscopes. This chip's single-core archi-
`tecture minimizes signal distortion and achieves more than
`seven effective bits over the entire signal range. The min-
`imized signal distortion is an excellent foundation for pre-
`cision signal analysis in the optional high definition mode.
`This unique mode further reduces noise, making acquisi-
`tions with up to 16-bit resolution possible.
`
`Full measurement bandwidth even at 1 mV/div
`With their input sensitivity of up to 1 mV/div, R&S®RTO
`oscilloscopes offer high vertical resolution. Other oscillo-
`scopes attain such high input sensitivity only by employing
`software-based zooming or by limiting the bandwidth. In
`contrast, the R&S®RTO oscilloscopes show the signal's real
`test points, even at 1 mV/div. And their full measurement
`bandwidth can be used. With the high definition option,
`the R&S®RTO is the first instrument in its class to offer ver-
`tical scaling of 500 µV/div at a bandwidth of 1 GHz.
`
`Fast acquisition even with deep memory
`Many applications require long record lengths, for instance
`for analyzing serial buses or switched-mode power sup-
`plies. The signal processing in the R&S®RTO oscilloscope
`is optimized to achieve high acquisition rates, even during
`long recordings. Users benefit from smooth operation and
`fast results.
`
`Truly
`uncompromised
`performance
`Precise
`measurements
`
` ❙ Very low inherent noise of 100 µV at 1 mV/div and
`1 GHz
` ❙ High dynamic range due to single-core
`A/D converter
` ❙ Full measurement bandwidth up to 4 GHz for
`1 mV/div
` ❙ High definition mode for up to 16-bit vertical
`resolution
` ❙ Deep memory up to 800 Msample
` ❙ Channel-to-channel isolation of > 60 dB prevents
`crosstalk from high-frequency signals
`
`Precise measurements due to very low noise level
`Minimizing noise was a key goal when designing the
`R&S®RTO. All aspects were considered, from balanced
`BNC-compatible inputs with 18 GHz bandwidth to ex-
`tremely low-noise frontends to high-precision A/D con-
`verters. The low inherent noise of the oscilloscopes en-
`ables precise measurements, even at the smallest vertical
`resolutions.
`
`10 Gsample/s single-core A/D converter from
`Rohde & Schwarz.
`
`4
`
`Excellent shielding for optimum channel-to-channel isolation.
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`Flat frequency response for accurate
`measurement results
`For accurate signal acquisition, R&S®RTO oscilloscopes
`feature a flat frequency response over the oscilloscope's
`entire specified bandwidth, ensuring accurate measure-
`ment results regardless of the signal's frequency compo-
`nents. The Gaussian falloff in frequency response leads to
`low overshoot and precise acquisition of signal edges.
`
`Low gain and offset errors
`Rohde & Schwarz oscilloscopes are known for their accu-
`rate measurements, even at different amplitude and offset
`settings and varying ambient temperatures. The amplifi-
`ers and attenuator pads in the frontend are very precisely
`matched. The sophisticated temperature control ensures
`high temperature stability within the instrument. Excel-
`lent prerequisites for continuous operation without an-
`noying interruptions caused by automatic compensation
`processes.
`
`Low crosstalk even with high-frequency signals
`The excellent channel-to-channel isolation in R&S®RTO
`oscilloscopes ensures that the measurement signal from
`one channel has the least possible influence on the signals
`from the other channels. Their characteristic of > 60 dB up
`to 2 GHz is outstanding.
`
`R&S®ProbeMeter: voltmeter with 0.1 % accuracy
`integrated into the probe
`Active probes from Rohde & Schwarz have an integrated
`voltmeter (R&S®ProbeMeter) that displays the DC value
`of a measurement signal, irrespective of the oscilloscope
`scaling. The R&S®RT-ZD10/20/30/40 differential probes ad-
`ditionally display the common mode voltage.
`
`Oscilloscope
`measurement
`range and
`bandwidth
`10 mV measurement
`range (1 mV/div),
`1 GHz bandwidth
`
`100 mV measurement
`range (10 mV/div),
`1 GHz bandwidth
`
`1 V measurement range
`(100 mV/div),
`4 GHz bandwidth
`
`RMS noise
`floor at 50 Ω
`(typ.)
`
`100 µV
`
`RMS noise floor
`at 50 Ω (typ.) in %
`of measurement
`range
`1 %
`
`200 µV
`
`0.2 %
`
`3.6 mV
`
`0.36 %
`
`Rohde & Schwarz R&S®RTO Digital Oscilloscope 5
`
`Oscilloscope performance for deep memory
`
`8 times
`faster
`
`100 times
`faster
`
`200 times
`faster
`
`500 times
`faster
`
`1
`
`10
`
`100
`
`1000
`
`10000 100000 1000000
`
`Acquisition rate in waveforms per second
`
`Typical ¸RTO
`
`10 Msample
`
`1 Msample
`
`100 ksample
`
`1 ksample
`
`Record length for 4 channels
`
`Typical frequency response of the R&S®RTO1044
`
`0
`
`1
`
`2
`
`3
`4
`Input frequency in GHz
`
`5
`
`10
`
`–2
`
`–4
`
`–6
`
`–8
`
`–10
`
`–12
`
`–14
`
`Frequency response in dB
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`Rohde v. Tektronix, IPR2018-00643
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`

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`Digital trigger:
`exceptional
`precision
`
` ❙ Minimal trigger jitter of < 1 ps without subsequent
`software correction
` ❙ High trigger sensitivity at the oscilloscope's full
`bandwidth
` ❙ User-selectable hysteresis and trigger fi lters
` ❙ Optional hardware clock data recovery for
`triggering on serial interfaces with embedded clock
`signals
`
` Accurate highly sensitive triggering
`The unique digital trigger system from Rohde & Schwarz
`uses a common path for the measurement signal and the
`trigger. The oscilloscopes determine if the trigger condi-
`tion has been met by directly analyzing the digitized signal
`independently of the current sampling rate. As a result,
`Rohde & Schwarz oscilloscopes have an extremely low
`trigger jitter and high measurement accuracy. With the
`optional R&S®RTO-B4 oven-controlled crystal oscillator
`(OCXO), time stability can be improved to up to 0.02 ppm,
`for deep memory acquisition and for acquisition with high
`trigger offset.
`
`High trigger sensitivity at full bandwidth
`The digital trigger validates every acquired sample against
`the trigger definition. For this reason, R&S®RTO oscillo-
`scopes trigger on even the smallest signal amplitudes.
`In order to achieve stable triggering regardless of signal
`noise levels, the user can set the trigger hysteresis for
`the oscilloscopes. And thanks to the low-noise frontends,
`the oscilloscopes can also trigger on signals with verti-
`cal input sensitivities of < 10 mV/div at full measurement
`bandwidth.
`
`Trigger hysteresis
`
`TA
`
`Adjustable trigger
`hysteresis
`
`The hysteresis of the digital trigger can be set automatically or manually from
`0 div to 5 div.
`
`Comparison of digital and analog triggering architecture
`
`Memory
`
`Channel input
`
`Vertical system
`
`A/D converter
`
`Acquisition
`
`Processing
`
`Display
`
`Analog trigger
`
`Digital trigger
`
`6
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`Adjustable digital filter for the trigger signal
`The digital trigger architecture used by the R&S®RTO
`oscillo scopes makes it possible to adapt the cutoff fre-
`quency of the digital lowpass filter to the signal to be mea-
`sured. The same filter settings can be used for both the
`trigger signal and the measurement signal. As a result, RF
`noise on the trigger signal can be suppressed, for instance
`while simultaneously capturing and displaying the unfil-
`tered measurement signal.
`
`Serial pattern trigger for all protocols
`The serial pattern trigger allows users to detect defined
`sequences of up to 128 bit, making it possible to acquire
`and analyze special protocol patterns, such as headers or
`protocol data from serial interfaces. Either a separate clock
`signal can be used, or the hardware clock data recovery
`option can be used for embedded clock signals.
`
`Setting the digital filter.
`
`Serial pattern trigger set for a specific bit sequence with the R&S®RTO-K13
`clock data recovery option.
`
`The unique architecture of the digital trigger permits stable triggering,
`even on signal details such as this 0.4 % overshoot (high definition option).
`
`
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`Tektronix, Exhibit 2012
`Rohde v. Tektronix, IPR2018-00643
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`

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`Find rare signal
`faults quickly
`
` ❙ One million waveforms per second make signal
`faults visible fast
` ❙ 600 000 mask tests per second
` ❙ Hardware-accelerated FFT analysis detects even
`sporadic faults
`
`One million waveforms per second: fault finding
`instead of guesswork
`A digital oscilloscope acquires signals in two steps. First,
`it samples the measurement signal for a defined period of
`time and stores the samples. It then processes the values
`and displays them graphically. During this period, the os-
`cilloscope is “blind” to the measurement signal. For con-
`ventional digital oscilloscopes, this blind time is more than
`99.5 % of the total time at a maximum sampling rate. Mea-
`surements take place in less than 0.5 % of the total time,
`while signal faults occurring during this blind time remain
`hidden to the user. The less often the faults occur, the less
`likely they are to be discovered.
`
`Compared with conventional oscilloscopes, the blind time
`of the R&S®RTO oscilloscopes is up to 500 times shorter.
`This is due to the core component of the instrument – an
`ASIC designed specifically for intensive parallel processing
`that can process the input signal in a minimum amount
`of time and quickly prepare it for display on the screen.
`R&S®RTO oscilloscopes acquire, analyze and display up to
`one million waveforms per second. As a result, these in-
`struments find faults significantly faster and more reliably.
`
`Acquisition cycle with blind time comparison (R&S®RTO versus conventional architecture)
`
`Waveform acquisition cycle
`
`99.5 % blind
`
`Conventional architecture: 2000 waveforms/s
`
`¸RTO architecture: 1 000 000 waveforms/s
`
`Active acquisition time
`
`Blind time
`
`Waveform
`acquisition cycle
`
`A digital oscilloscope is not able to acquire signal faults that occur during the blind time.
`Due to their very short blind time, the R&S®RTO oscilloscopes look at the measured signal over 500 times more often.
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`High measurement speed, even for complex
`analysis functions
`Many analysis functions are implemented in hardware:
` ❙ Histogram
` ❙ Spectrum display
` ❙ Mask test
` ❙ Cursor measurements
` ❙ Selected automatic measurement functions
` ❙ Selected mathematical operations
`
`The resulting high acquisition and processing rates ensure
`smooth operation and fast, conclusive results, even during
`complex analyses.
`
`Max. acquisition rates for analysis functions
`Analysis function
`Maximum acquisition rate
`None
`> 1 000 000
`Histogram
`> 1 000 000
`Mask test
`> 600 000
`Cursor measurements
`> 1 000 000
`
`Due to the high acquisition rate of one million waveforms per second, R&S®RTO oscilloscopes find
`rare signal faults very quickly.
`
`
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

` Outstanding range
`of capabilities
`For fast results
`
` ❙ Over 90 automated measurements
` ❙ Display of measurement results as trend, track or
`histogram
` ❙ QuickMeas for fast results
` ❙ History function for looking back in time
` ❙ Powerful FFT-based spectrum analysis
` ❙ 100 acquisitions per second, with continuous
`transfer via Ethernet
`
`Measurement display with statistics (bottom), histogram and long-term
`trend.
`
` Wide selection of measurement functions
`R&S®RTO oscilloscopes offer over 90 measurement func-
`tions. The automated measurements are organized by type
`into amplitude and time measurements, jitter, eye, histo-
`gram and spectral measurements.
`
` QuickMeas: key measurement results at the push
`of a button
`The QuickMeas function, which simultaneously displays
`the results of several measurement functions for the
`current signal, is unique for an instrument in this class.
`The set of functions can be individually defined with up
`to eight measurements and saved for later analysis. The
`QuickMeas function is quickly and easily accessed via the
`toolbar.
`
`Histogram
`
`Trend
`
`Available analysis options
`Statistics
`display of average value, minimum/maximum value
`and standard deviation
`graphic display of events as histogram; definition
`of measurement range and resolution for the histo-
`gram (manual or automatic)
`long-term trend function for analyzing slowly de-
`veloping variations in measurement results (easy
`identification of thermal dependencies within mea-
`surement results)
`analysis of rapidly changing measurement results,
`e.g. periods; display of results over the entire ac-
`quisition period
`restriction of the measurement range to a specific
`signal range (manually defined or linked to existing
`cursor or zoom ranges)
`definition of reference lines (manual, automatic or
`averaged); optional display in the waveform
`graphic display of the results on the waveform,
`e.g. for documentation purposes
`definition of the maximum number of measure-
`ments per waveform
`
`Track (optional)
`
`Gating
`
`Reference lines
`
`Waveform
`
`Multiple
`measurements
`
`Activation of QuickMeas to display key signal characteristics.
`
`10
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`Tektronix, Exhibit 2012
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Search and navigation: finding faults fast
`Comprehensive search functions simplify the analysis of
`long signal sequences. Users can search waveforms based
`on different criteria, such as signal fault, signal pattern and
`protocol contents. Depending on the specific application,
`users can search on analog or digital channels, on refer-
`ence or math waveforms and on serial, protocol-based
`buses. All events are shown in a table with timestamps.
`The user can then examine the individual events in a zoom
`window and navigate between the events. For example,
`it is possible to view the number of glitch errors in a ta-
`ble, with each individual glitch in the waveform correlated
`against other signals.
`
`History function: looking back in time
`Where does the interference pulse in the signal come
`from? What caused the loss of a data bit? Finding the real
`cause of a problem is often only possible by looking at the
`history of a signal sequence.
`
`The R&S®RTO history function provides access to previous-
`ly acquired waveforms at the press of a button. This allows
`users to analyze the measurement data stored in memory.
`They can scroll through the individual acquisitions with the
`history player or use the persistence mode to display them
`superimposed. This powerful function facilitates searches
`for signal faults over all acquisitions. One timestamp per
`waveform clearly identifies when events took place. Vari-
`ous analysis tools such as automatic measurements, FFT,
`mask tests and a search function are available for analyz-
`ing past acquisitions.
`
`Industry-leading mask test: quick configuration –
`reliable results
`Mask tests quickly reveal whether a specific signal lies
`within defined tolerance limits, providing a pass/fail eval-
`uation to assess the quality and stability of a device under
`test. Signal anomalies and unexpected results are easy to
`identify by stopping the measurement if the mask is violat-
`ed. Defining masks is easy and flexible with the R&S®RTO.
`With just a few keystrokes, the user can generate a mask
`from a reference signal or define masks consisting of up
`to eight segments. To get started quickly, the mask seg-
`ments can be generated on the screen using the mouse or
`a finger. The positions of the mask points can be optimized
`later in the mask test dialog box.
`
`Powerful search function for detailed display of events.
`
`History function for looking back in time.
`
`Fast mask test: Within ten seconds, more than six million waveforms are
`acquired, evaluated and displayed.
`
`
`
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`

`

` FFT-based spectrum analysis: powerful, fast and
`user-friendly
`The FFT in the R&S®RTO is hardware accelerated and fast.
`It conveys the impression of a live spectrum. Using the
`persistence mode, rapid signal changes, signal interferers
`and weak superimposed signals can easily be made visi-
`ble. The low-noise frontend and the A/D converter's high
`effective number of bits (> 7) provide an outstanding dy-
`
`namic range, so that even weak signal faults can be iden-
`tified without difficulty. The ability to overlap FFT frames
`enables the R&S®RTO to detect intermittent signals such
`as pulsed interferers. Like in spectrum analyzers, FFT oper-
`ation is based on entering the center frequency, span and
`resolution bandwidth. Measurements such as total har-
`monic distortion (THD) and power spectrum density (PSD)
`can also be performed.
`
`Storage options
`Contents
`waveform
`
`Evaluation
`
`Format
`
`Drivers
`
`measurement
`data
`
`graphics
`
`complete
`selection (zoom, cursor, gate, manual)
`number of acquisitions
`history memory
`histograms
`measurement results
`long-term trend
`binary, .XLS, .CSV, 1 to 4 channels
`
`.PNG, .JPG, .BMP, .TIF, .PDF
`VXi, LabView, LabWindows, .NET
`
`Up to three waveforms per channel
`
`Channel
`
`n
`
`Acquisition
`Data decimation
`Sample
`Peak detect
`High resolution
`RMS
`
`Memory
`Waveform 1
`Waveform 2
`Waveform 3
`
`Processing
`Waveform
`arithmetics
`Off
`Average
`Envelope
`
`The R&S®RTO oscilloscopes are the first to allow users to configure the type of data
`decimation and the waveform arithmetics and to display up to three waveforms
`simultaneously.
`
`The ability to perform a mask test in the FFT frequency
`spectrum is unique. This is useful for finding rare events
`such as sporadic EMI interferers and correlating them to
`the time domain signal.
`
`Save results fast
`Waveforms can be saved in various file formats or down-
`loaded via Ethernet for later analysis using MATLAB® or
`Excel, for example. The screen content can also be printed
`or saved. The download feature on the R&S®RTO is unique.
`When set to a special operating mode, the oscilloscopes
`continuously acquire 100 waveforms per second, evaluate
`the waveforms and transmit them to a PC via Ethernet.
`
`Sophisticated analysis with up to three
`waveforms per channel
`R&S®RTO oscilloscopes simultaneously provide differ-
`ent displays of up to three waveforms per measurement
`channel. The type of data decimation and the waveform
`arithmetics can be combined. Users can, for example, ef-
`fectively debug by comparing the original sample points
`directly against the averaged waveform and the envelope.
`
`12
`
`The FFT function stands out in terms of accura-
`cy, speed, functionality and usability.
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`

`

`Optimized user
`interface
`
` ❙ Touch-optimized
` ❙ High-resolution XGA screen
` ❙ Flexible split screen for waveforms and results
` ❙ New tools, including undo/redo, fingertip zoom and
`QuickMeas
`
`High-resolution touchscreen
`The high-resolution 10.4" XGA touchscreen is one of the
`highlights of the R&S®RTO. The oscilloscope is optimized
`for touchscreen operation:
` ❙ Arrange signal and measurement result windows by
`drag & drop
` ❙ Optimize the screen display by moving the window
`borders
` ❙ Define zoom and measurement ranges
` ❙ Move cursor, offset or trigger level simply by touching
`the line
` ❙ Activate and configure measurements, histograms and
`FFT analyses
` ❙ Create masks in only seconds
`
`Additional applications such as compliance tests can be
`displayed on an externally connected monitor.
`
`Color coding for clear overview
`The controls for vertical settings and the trigger are col-
`or-coded. Multicolor LEDs around the rotary knobs visual-
`ize the channel that is currently in focus. The color coding
`corresponds to the signal display on the screen. This clear
`mapping allows smooth work, even during complex tests
`and measurements.
`
`Fully customizable display
`The R&S®RTO SmartGrid function helps users keep the
`screen well organized:
` ❙ Drag & drop waveforms and event windows onto the
`main screen
` ❙ Divide the screen into different diagram, waveform and
`result windows
` ❙ Stack multiple tabs
` ❙ Display waveforms, buses and results in realtime as a
`signal icon on the edge of the screen
`
`The high-resolution touchscreen permits smooth operation. The SmartGrid
`function from Rohde & Schwarz permits the user to flexibly arrange wave-
`forms using drag & drop.
`
`
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`Dialog boxes with signal flow diagrams
`Signal flow diagrams in the dialog boxes visualize the
`signal processing, making it easier to configure measure-
`ments. Crosslinks take you directly to logically related set-
`tings. Forward/back buttons help you navigate quickly be-
`tween dialog boxes. Semi-transparent dialog boxes are an
`elegant way of keeping everything in view. The measure-
`ment diagrams always maintain their original size. The lev-
`el of transparency can be set via the intensity button. You
`can also scale the dialog boxes, minimize them to the ac-
`tive input field and position them anywhere on the screen.
`
`Fast access to important tools
`A toolbar at the upper edge of the screen provides access
`to frequently used functions such as measurements,
`zoom, FFT and the recycle bin. The toolbar can be custom-
`ized to contain your favorite tools. There are just two steps
`involved in using a function: selecting the tool and apply-
`ing it to the waveform.
`
`Signal details at your fingertip
`R&S®RTO oscilloscopes offer extended zoom functionality:
` ❙ Zoom range selection and navigation by touch in the
`zoom window
` ❙ Hardware zoom function to adjust vertical and horizontal
`scaling for analysis of signal details
` ❙ Fingertip zoom to open a horizontal zoom range in the
`signal; use a finger or the mouse to move the zoom
`window along the signal for an overview of the signal
`characteristics; use the keep function to open a standard
`zoom for detailed analysis of anomalies in the signal
`
`R&S®RTO toolbar
`undo
`
`redo
`
`show help
`
`graphical recall
`
`update reference
`waveform
`
`label
`
`preset
`
`autoset
`
`show signalbar
`
`find trigger level
`
`selection tool
`
`zoom
`
`cursor
`
`mask test
`
`histogram
`
`run single
`
`run/stop
`
`save waveform
`
`clear screen
`
`save settings
`
`measurement
`
`save settings
`
`quick meas
`
`recycle bin
`
`FFT
`
`search
`
`Dialog box for vertical settings in a signal flow diagram.
`
`The fingertip zoom simplifies detailed analysis.
`
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`

`Easy selection of instrument setup
`The R&S®RTO can save instrument setups for repetitive
`measurements. It is unique in how it helps the user select
`the correct configuration – each instrument setup is saved
`along with a screenshot of the most recent oscilloscope
`display. Users can simply scroll through the screenshots to
`find the right configuration.
`
`Remote control access, anytime
`The R&S®RTO can be remote controlled using a PC or an-
`other device via remote desktop or VNC. The user sees
`the same user interface as on the oscilloscope itself. All
`oscillo scope functions are also available remotely.
`
`Documentation at the press of a button
`R&S®RTO oscilloscopes help you document
`measurements:
` ❙ Print screenshots of the screen content, including
`waveforms and results
` ❙ Easily read signal characteristics thanks to clear grid
`annotations
` ❙ Use color-coded labels to highlight anomalies in the
`diagram
` ❙ Save waveforms, histograms and measurement results in
`binary, .XLS or .CSV format for signal analysis on a PC
`
`Selection of languages
`The R&S®RTO oscilloscope's user interface supports mul-
`tiple languages. The language can be changed in just a
`few seconds while the instrument is running, making the
`oscillo scope a true international instrument.
`
`Easy access to various instrument setups.
`
`Content is documented using the print dialog box, which offers a wide
`range of configuration options.
`
`The user interface can be set to Chinese.
`
`
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`Overview of the R&S®RTO oscilloscope
`
`Savesets for direct access to saved
`instrument setups
`
`Rise time histogram: labels facilitate
`documentation of results
`
`Views are organized into
`multiple tabs
`
`Control elements
`
`Toolbar for fast access to
`frequently used functions
`
`Preset to return to default or
` user-defined settings
`
`Clear grid annotation for easy
`reading of measured values
`
`Print or save results at the
`push of a button
`
`SmartGrid function from
`Rohde & Schwarz for fast
`positioning of waveforms
`
`Knob for setting the level of
`transparency of the dialog
`boxes or the intensity of the
`waveforms
`
`Menu bar on the bottom
`edge of the screen – even
`visible during touchscreen
`operation
`
`USB interfaces for mouse,
`keyboard, data exchange,
` documentation or firmware
`updates
`
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`

`Continuous update of displayed
`measurement results
`
`Continuous update of minimized
`signal
`
`Direct access to
` frequently required
`analysis functions
`
`Signal icons show import-
`ant settings or a miniature
`view of the real signal
`
`Multilevel undo/redo
` function to easily restore
`previous settings
`
`Color-coded controls
`indicate the currently
`selected channel
`
`Tutorials to learn how to operate
`the oscilloscope
`
`Probe interface supports all
`Rohde & Schwarz probes
`
`BNC connector, channel 1, 2, 3 or 4:
`high-precision 18 GHz BNC inputs with excellent
`impedance matching
`
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`Master
`sophisticated
`applications
`
` ❙ Logic analysis, memory expansions and hardware/
`software options can be upgraded on site
` ❙ Regular firmware updates for enhanced
`functionality are available free of charge
` ❙ Bandwidth upgrades up to 4 GHz
`
`On-site configuration of hardware options
`The R&S®RTO can be quickly adapted to new require-
`ments. The unique plug & play concept makes upgrading
`and retrofitting of options easy. All hardware options, such
`as the digital channels for logic analysis or the 10 MHz
`OCXO reference clock, can be inserted into the slots on
`the rear panel without opening the oscilloscope. This ap-
`proach has many advantages:
` ❙ Easy extensibility for future tasks
` ❙ On-site installation of options in minutes
` ❙ No need for alignment or recalibration after installation of
`options
`
`Software applications on demand
`The base unit features all functions of a state-of-the-art
`oscilloscope for general applications. For special require-
`ments, the base unit can be extended with software op-
`tions at any time:
` ❙ Triggering and decoding of serial protocols such as I2C,
`SPI or CAN
` ❙ Automatic compliance tests on fast interfaces, including
`USB or Ethernet
` ❙ Detailed options for jitter analysis, power analysis and
`RF analysis
`
`Always up-to-date
`Rohde & Schwarz continually offers regular firmware up-
`dates to add additional basic functions to the R&S®RTO
`oscilloscopes. The oscilloscope's firmware can be updated
`using a USB storage device or the LAN port. Free firmware
`updates can be simply downloaded from the Internet at
`www.rohde-schwarz.com. Your R&S®RTO oscilloscope al-
`ways remains up to date.
`
`Exchangeable hard disk or solid state disk
`The R&S®RTO hard disk can be exchanged without any
`tools. Confidential data remains protected. Depending on
`the particular application, either a conventional hard disk
`drive (HDD) or a solid state disk (SSD) can be chosen.
`
`18
`
`No tools are needed to remove the hard disk.
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`Tektronix, Exhibit 2012
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Memory upgrades to up to 800 Msample for long
`acquisition times
`In the standard configuration, R&S®RTO oscilloscopes
`permit the analysis of up to 20 Msample deep signal
`