R&S®RTM
`Digital Oscilloscope
`Scope of the art
`
`Product Brochure | 06.00
`
`Test & Measurement
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

`R&S®RTM
`Digital Oscilloscope
`At a glance
`
`Ease of use combined with fast and reliable results
`is precisely what users get with the R&S®RTM
`bench oscilloscope. While other oscilloscopes are
`still booting up, the R&S®RTM is already displaying
`signals that would otherwise be lost in the noise,
`and evaluating results. All on one screen with two
`displays, with lightning fast functions.
`
`The R&S®RTM models with 200 MHz, 350 MHz, 500 MHz
`or 1 GHz bandwidth offer a maximum sampling rate
`of 5 Gsample/s and a maximum memory depth of
`20 Msample. As a result, they can display signals accu-
`rately, right down to the details, as well as provide high
`time resolution, even for long sequences.
`
`Besides the common measurement and analysis tools,
`R&S®RTM oscilloscopes have special features that help
`users to achieve the desired results quickly during de-
`bugging and signal analysis. At the push of a button, the
`QuickMeas function graphically displays the key mea-
`surement values for the signal that is currently active
`and updates them continuously. Functions such as mask
`tests and video triggers are supplied as standard with the
`R&S®RTM.
`
`As a true scope of the art, the R&S®RTM meets the in-
`creased demands on bench oscilloscopes for the develop-
`ment, production and servicing of embedded hardware,
`providing time, frequency, protocol and logic analysis, plus
`a digital voltmeter in a single box:
` ❙ Time analysis: high sensitivity of 1 mV/div to detect
`signals that would otherwise be lost in the noise
` ❙ Frequency analysis: reliable fault detection with
`integrated FFT and spectrum analysis with spectrogram
`option
` ❙ Logic analysis: 20 Msample with 5 Gsample/s for detailed
`analysis of digital signals
` ❙ Protocol analysis: simple triggering and decoding of
`serial buses
` ❙ Digital voltmeter/frequency counter: key signal
`parameters at a glance
`
`2
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
`
`

`

`R&S®RTM Digital
`Oscilloscope
`Benefits and
`key features
`
`Results-oriented: fast and precise
` ❙ Fast time to results: turn on, measure and done
` ❙ Signal details at the push of a button: QuickMeas
` ❙ Settings in seconds: mask test
` ❙ Focus on details: search and navigation
` ❙ Integrated: FFT analysis
` ❙ In focus: digital voltmeter and frequency counter
` ▷ page 4
`
`Accurate: down to the mV
` ❙ 1 mV/div: full measurement bandwidth
` ❙ Frontends: low noise and low crosstalk
` ❙ Deep memory: long sequences at high resolutions
` ❙ To the point: comprehensive triggering capabilities
` ▷ page 8
`
`Usability: smart concepts
` ❙ Easy orientation: color-coded controls
` ❙ Two displays instead of one: VirtualScreen
` ❙ Error-tolerant: undo/redo function
` ❙ Remote control, data exchange: diverse interfaces
` ❙ Multilingual: choice of nine languages
`
`Extensible: more application power
` ❙ Logic analysis: fast and precise testing of embedded
`designs
` ❙ Serial protocols: easy triggering and decoding
` ❙ Segmented memory: 460 Msample with history function
` ❙ Power analysis: current and voltage in detail
` ❙ Spectrum analysis: quickly identifying interactions
`between time and frequency
` ▷ page 12
`
`Probes: excellent contacting
` ▷ page 22
`
`Accessories: for rack installation and transport
` ▷ page 25
`
`Models
`Base unit
`
`Bandwidth
`
`Channels
`
`analog
`
`digital
`(with R&S®RTM-B1)
`
`Max. sampling
`rate
`
`Max. acquisition memory Mixed signal option (MSO;
`with R&S®RTM-B1 option)
`
`16
`
`5 Gsample/s
`
`20 Msample,
`460 Msample segmented
`memory (optional)
`
`400 MHz,
`5 Gsample/s (max.),
`20 Msample (max.)
`
`R&S®RTM2022
`R&S®RTM2024
`R&S®RTM2032
`R&S®RTM2034
`R&S®RTM2052
`R&S®RTM2054
`R&S®RTM2102
`R&S®RTM2104
`
`200 MHz
`
`350 MHz
`
`500 MHz
`
`1 GHz
`
`2
`4
`2
`4
`2
`4
`2
`4
`
`
`
`Rohde & Schwarz R&S®RTM Digital Oscilloscope 3
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`Results-oriented:
`fast and precise
`
`Fast time to results: turn on, measure and done
`Optimized for fast results, the R&S®RTM starts up within
`only a few seconds. The most important measurement
`results for an active signal can be obtained at the push
`of a button (QuickMeas function), enabling fast signal
`characterization.
`
`R&S®RTM oscilloscopes provide a decisive edge
`when performing everyday measurement tasks,
`delivering more comprehensive results, faster.
`Measurement tools such as QuickMeas, mask test
`and math functions are supplied as standard.
`
`Signal details at the push of a button: QuickMeas
`The QuickMeas function offered by the R&S®RTM oscillo-
`scopes is unique. At the push of a button, it displays the
`key measurement values for a currently active signal (see
`table). The signal is also graphically displayed with contin-
`uously updated auxiliary lines and markers.
`
`In addition to the QuickMeas results, the oscilloscopes
`also provide customary automatic measurement functions
`such as measurement of peak-to-peak voltage and signal
`frequency. The results are presented in tabular form, with
`statistical evaluation if desired.
`
`QuickMeas: key results at the push of a button
`Measurement
`Display
`value
`
`Vp+
`Vp–
`tr
`tf
`Mean
`Vpp
`RMS
`T
`f
`
`positive peak voltage
`negative peak voltage
`rise time
`fall time
`mean voltage
`peak-to-peak voltage
`RMS value
`time
`frequency
`
`graphic display directly on
`the waveform
`
`tabular display on the bot-
`tom right of the screen
`
`QuickMeas: automatic measurement and graphical display at the push of a button.
`
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`Rohde v. Tektronix, IPR2018-00643
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`Measurement results in detail: cursor functions
`The R&S®RTM offers additional functions beyond the stan-
`dard horizontal and vertical cursor measurements. Users
`can easily apply measurements such as mean voltage,
`RMS value and a pulse counter to a specific section of the
`signal. At the push of a button, the “Set to Wave” function
`automatically assigns the cursors to the corresponding
`signals, eliminating the need for manual positioning.
`
` Settings in seconds: mask test
`Mask tests quickly reveal whether a specific signal lies
`within defined tolerance limits and use statistical pass/fail
`evaluation to assess the quality and stability of a device
`under test. Signal anomalies and unexpected results are
`easy to identify by stopping the measurement if the mask
`is violated.
`
`The mask test function is a standard feature in R&S®RTM
`oscilloscopes. It is easy to use and can be flexibly config-
`ured. A new mask can be created from a reference signal
`with just a few keystrokes. Existing masks can be loaded
`from the internal memory or from a USB flash drive. If an
`active mask is violated, various actions can be taken to en-
`sure the optimum response.
`
`Mask test functions
`Evaluation
`total number of acquired waveforms
`number of successful and faulty sweeps
`(absolute/percentage)
`
`Actions
`
`total test duration
`acoustic signal
`stop acquisition
`screenshot
`print
`save waveform
`output pulse
`
`Mask test: mask definition from a reference signal.
`
`Special cursor measurement: using three cursors to determine the duty cycle of a pulsed signal.
`
`
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`Rohde v. Tektronix, IPR2018-00643
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`Focus on details: search and navigation
`The sampling rate of up to 5 Gsample/s enables R&S®RTM
`oscilloscopes to achieve a high time resolution. The mem-
`ory depth of up to 20 Msample makes it possible to ac-
`quire long signal sequences, e.g. 4 ms at a sampling rate
`of 5 Gsample/s.
`
`The search and navigation function helps users to man-
`age even long records, enabling them to detect and mark
`events within seconds. Users can search for simple signal
`characteristics such as edge and pulse width, complex
`bit sequences and decoded serial buses. A table lists the
`matching events and can be used to navigate from one
`event to another. Separate from the search function, users
`can set eight event markers on the signal and easily navi-
`gate through them using the Next and Prev buttons on the
`R&S®RTM oscilloscopes. For detailed analysis, the zoom
`function can be used to enlarge the signal up to 200 000:1.
`
`Integrated: FFT analysis
`The FFT function has a dedicated button and enables us-
`ers to detect and analyze faults within a signal's spectrum.
`R&S®RTM oscilloscopes simultaneously provide a spectral
`display of the signal and a time domain window for check-
`ing the sampling interval. The Autoset button is extremely
`convenient: when it is pressed, the instrument automati-
`cally selects the amplitude and frequency scaling that opti-
`mally matches the measured signal.
`
`The R&S®RTM-K18 option (see page 20) turns the
`R&S®RTM into a spectrum analyzer with spectrogram
`function.
`
`Search and navigation
`Types
`edge
`pulse width
`peak
`rise time
`fall time
`runt
`clock data
`pattern
`protocol contents
`diagram, table
`up to 32
`marker quick-select button
`rotary knob in table
`
`Display
`Markers
`Navigation
`
`FFT analysis: fast identification of harmonics at the output voltage of a DC/
`DC converter.
`
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`In focus: digital voltmeter and frequency counter
`With the R&S®RTM-K32 option, any channel can be used
`as a three-digit digital voltmeter (DVM) and as a seven-
`digit frequency counter. The measurement is performed
`regardless of the oscilloscope status, i.e. it will update
`even if the acquisition was stopped.
`
`Easy comparisons: four reference waveforms
`When analyzing faults, it is useful to compare the wave-
`forms against a reference. The R&S®RTM provides up to
`four reference waveforms that can be generated at the
`press of a button. The waveforms can be scaled, stored in-
`ternally or externally and reloaded.
`
`More than a calculator: math functions
`Math functions tailored to everyday problems help solve
`measurement problems quickly. For example, with just a
`few keystrokes users can square the voltage waveform
`and divide it by the resistance in order to directly display
`power over time. In addition to basic arithmetic opera-
`tions, advanced functions such as derivatives and digital
`filters are available. The results can also be used as argu-
`ments for other math functions.
`
`Digital voltmeter modes
`AC RMS
`DC
`AC + DC RMS
`Crest factor
`Peak+
`Peak-
`Peak-to-peak
`
`Math functions
`Functions
`+, –, *, /
`max./min.
`square (²), square root (√)
`absolute value
`pos./neg. waveform
`inversion
`reciprocal
`log10, ln
`derivation, integration
`cycle, frequency
`pos./neg. duty cycle
`pos./neg. pulse width
`lowpass/highpass
`
`Digital filters
`
`Digital voltmeter and frequency counter.
`
`
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

` Accurate: down to
`the mV
`
`Rohde & Schwarz has many years of experience
`developing precision test and measurement
`equipment and has brought this expertise to bear in
`the R&S®RTM oscilloscopes. Users benefit from top
`accuracy and excellent analysis capabilities thanks
`to deep memory and a powerful trigger system.
`
` 1 mV/div: full measurement bandwidth
`With their input sensitivity of up to 1 mV/div, R&S®RTM
`oscilloscopes offer high vertical resolution. Other oscillo-
`scopes attain such high input sensitivity only by employ-
`ing software-based zooming or by limiting the bandwidth.
`The R&S®RTM shows a signal's real sampling points over
`the full measurement bandwidth, even at 1 mV/div. This
`high measurement accuracy is particularly beneficial when
`measuring small signal amplitudes.
`
` Frontends: low noise and low crosstalk
`The accuracy of a signal displayed on the screen greatly
`depends on the oscilloscope's inherent noise. R&S®RTM
`oscilloscopes have low-noise frontends and A/D convert-
`ers, enabling them to measure precisely, even at the small-
`est vertical resolutions.
`
`This precision is retained even when additional channels
`are used. The R&S®RTM has an excellent channel-to-
`channel isolation of > 50 dB up to 500 MHz, which en-
`sures that the signal from one channel has the lowest pos-
`sible influence on signals from the other channels.
`
`Acquisition period as a function of sampling rate and memory depth
`10 ksample
`1 Msample
`10 Msample
`20 Msample
`2 μs
`200 μs
`2000 μs
`4000 μs
`4 μs
`400 μs
`4000 μs
`8000 μs
`
`5 Gsample/s
`2.5 Gsample/s
`
`RMS: 82.46 µV
`
`Vpp: 560.00 µV
`
`Extremely low inherent noise, even for a vertical input sensitivity of 1 mV/div at full bandwidth and
`full resolution.
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`Deep memory: long sequences at high resolutions
`The more details an oscilloscope can show, the higher the
`probability of detecting signal faults and important events.
`The oscilloscope must have a high time resolution, i.e. a
`high sampling rate. In addition, many applications require
`long acquisition periods, for instance for analyzing tran-
`sients or serial protocols. This is where R&S®RTM oscillo-
`scopes excel. They offer a deep memory of 20 Msample
`at a time resolution of up to 200 ps (5 Gsample/s sampling
`rate). When combined with the R&S®RTM-K15 history and
`segmented memory option, the memory is expanded to
`460 Msample.
`
`To the point: comprehensive triggering capabilities
`Precise triggering ensures a stable signal display on the
`screen and fast isolation of signal events of interest.
`R&S®RTM oscilloscopes offer many standard trigger ca-
`pabilities, including pulse width, runt and video triggers.
`Capabilities include complex trigger conditions with logical
`linking of analog and digital channels. Serial protocol trig-
`gers are optionally available.
`
`Dedicated buttons allow fast switching between the Auto
`and Normal triggers as well as selection of the trigger
`edge and source. The rotary knob for trigger level offers
`additional operating convenience: a single press sets the
`trigger level to 50 % of the signal amplitude.
`
`Trigger types
`Edge
`
`Pulse
`
`Rise time
`
`Runt
`
`Video
`
`Logic
`
`Protocol (optional)
`
`B trigger
`
`rising, falling, both
`LF, RF suppression, lowpass
`hysteresis: automatic, small, medium, large
`time: >, <, =, ≠
`interval: inside, outside
`polarity: positive, negative
`polarity: rising, falling, both
`level: upper, lower
`time: >, <, =, ≠
`level: upper, lower
`polarity: positive, negative
`PAL, PAL-M, NTSC, SECAM, SDTV 576i,
`HDTV 720p, HDTV 1080p, HDTV 1080i
`
`signal: positive, negative
`lines
`frames: odd, even, all
`pattern over analog and digital channels
`duration: >, <, =, ≠
`interval: inside, outside, timeout
`content
`error
`edge
`
`Complex sequences are found quickly using the pattern trigger.
`
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`Overview of the R&S®RTM oscilloscope
`
`Control elements
`
`LAN interface for remote control or for accessing the instrument via a web browser
`comes as standard. A GPIB interface is available as an option.
`The DVI output controls a monitor or a data projector.
`
`Extensive cursor-based
` measurement functions
`
`All instruments
`can be extended
`to 1 GHz
`
`Preset to return to default or
` user-defined settings
`
`Brilliant 8.4" XGA color
`display
`
`One-touch documentation:
`easily save screenshots and
`measurements
`
`Help: context-sensitive and
`always available
`
`Knob for setting the
` intensity of the waveforms
`
` ❙ Menus with flat structure
`for fast access
` ❙ Fluent in different
` languages such as
` German, English, French,
`Spanish, Russian,
` simplified and traditional
` Chinese, Korean and
`Japanese
`
`10
`
`Quickly ready for use
`thanks to fast booting
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`Key measurement results
`at the push of a button
`
`Multilevel undo/redo function
`to easily restore previous
`settings
`
`Fast access to logic and
` protocol analysis
`
`Direct access to frequently
`required analysis functions
`
`Easy search and navigation
`between signal events
`
` ❙ USB port for data ex-
`change, documentation
`or firmware updates
` ❙ Additional device and
`USB host ports on the
`rear side
`
`Color-coded controls
`indicate the currently
`selected channel
`
` ❙ Scrollable screen content
` ❙ VirtualScreen extends screen
`to 20 divisions for straightfor-
`ward display of all signals
`
`History function for analysis
`of 460 Msample deep
` segmented memory
`
` ❙ Probe interface supports all Rohde & Schwarz probes
` ❙ Digital voltmeter and frequency counter can be activated
`on every channel
` ❙ Spectrum analysis and spectrogram on every channel
`
`
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`Rohde v. Tektronix, IPR2018-00643
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`

`

`Extensible: more
`application power
`
`Investments in test and measurement equipment
`are subject to one all-important rule: the equipment
`must be capable of growing with user requirements.
`Rohde & Schwarz has optimized the R&S®RTM to
`meet this demand.
`
`Availability without interruption: adaptable
`hardware
`With R&S®RTM oscilloscopes, there is no need to return
`instruments for upgrades. Hardware options can be en-
`abled with a keycode (e.g. logic analysis) or simply in-
`stalled on site (e.g. GPIB interface), yielding the following
`benefits:
` ❙ Quick and easy installation of new options
` ❙ Instrument immediately ready for continued use
` ❙ No additional installation costs
` ❙ No additional expense for alignment or recalibration after
`installation of options
`
`Adaptable: software options on demand
`The base unit includes the complete functionality of an
`advanced oscilloscope but is extensible in steps. For ex-
`ample, analysis options are available for serial buses and
`power electronics. The R&S®RTM keeps pace with the
`challenges that are sure to arise in any company.
`
`Simple and free of charge: firmware updates
`The instrument firmware is updated using a USB storage
`device. Free updates can be downloaded from the Internet
`at www.rohde-schwarz.com.
`
`Higher bandwidth: upgrade including calibration
`All R&S®RTM oscilloscope models can be upgraded to
`higher bandwidths as needed. The upgrade option in-
`cludes complete testing and calibration of the instrument
`by Rohde & Schwarz at one of its service centers.
`
`Secure erase
`The secure erase function protects sensitive data. This
`central function removes all user data and settings, includ-
`ing device setups and reference waveforms.
`
`Options
`Bandwidth upgrade
`
`200 MHz to 350 MHz
`200 MHz to 500 MHz
`200 MHz to 1 GHz
`350 MHz to 500 MHz
`350 MHz to 1 GHz
`500 MHz to 1 GHz
`
`Logic analysis (MSO)
`GPIB Interface
`Serial triggering and
`decoding
`
`I²C/SPI
`
`R&S®RTM-B201
`R&S®RTM-B202
`R&S®RTM-B203
`R&S®RTM-B200
`R&S®RTM-B204
`R&S®RTM-B205
`R&S®RTM-B1
`R&S®RTM-B10
`R&S®RTM-K1
`
`UART/RS-232/RS-422/
`RS-485
`
`R&S®RTM-K2
`
`CAN/LIN
`I²S/LJ/RJ/TDM
`MIL-STD-1553
`ARINC 429
`
`R&S®RTM-K3
`R&S®RTM-K5
`R&S®RTM-K6
`R&S®RTM-K7
`R&S®RTM-K15
`
`R&S®RTM-K18
`
`R&S®RTM-K31
`R&S®RTM-K32
`
`History and segmented
`memory
`
`Spectrum analysis and
`spectrogram
`
`Power analysis
`Digital voltmeter (DVM)
`
`R&S®RTM oscilloscopes: prepared for logic analysis. Installation is a sim-
`ple on-site process without shipping back the instrument.
`
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`

` Logic analysis: fast
`and precise testing
`of embedded
`designs
`
`The R&S®RTM-B1 option turns the R&S®RTM into an
`easy-to-use mixed signal oscilloscope (MSO) with 16
`digital channels.
`
`Logic analysis features
`Channels
`16 divided over two logic probes
`Acquisition memory
`10 Msample with two logic probes;
`20 Msample with one logic probe
`
`Sampling rate
`
`Input impedance
`
`2.5 Gsample/s with two logic probes;
`5 Gsample with one logic probe
`
`100 kΩ ± 2 % || ≈ 4 pF (meas.) at the probe
`tip
`
`Max. input frequency
`Max. input voltage
`Min. input signal
`deviation
`
`400 MHz (meas.)
`±40 V (Vp)
`500 mV (Vpp) (meas.)
`
`Precision measurement: up to 5 Gsample/s
`sampling rate
`The R&S®RTM oscilloscopes' sampling rate of up to
`5 Gsample/s makes it possible to accurately measure the
`timing of logic signals. Since the signals can be precisely
`time-referenced to one another, timing and clock errors
`can be detected with greater ease, e.g. on serial or parallel
`bus signals. R&S®RTM oscilloscopes use the high sam-
`pling rate over the entire acquisition time, ensuring high
`time resolution even for long acquisition periods.
`
`Deep memory: acquire long signal sequences
`Logic signals are stored in the R&S®RTM with up to
`20 Msample, or even up to 460 Msample when combined
`with the R&S®RTM-K15 option. This long acquisition peri-
`ods in combination with the high sampling rate makes it
`easy to detect timing errors even far from the trigger point.
`The different memory depths for the digital and analog
`channels eliminate the need to restrict the acquisition peri-
`ods for digital channels.
`
`Better overview: VirtualScreen
`Superimposed displays of logic and analog signals
`are hard to read and make analysis more difficult. The
` VirtualScreen of the R&S®RTM oscilloscopes uses a differ-
`ent approach. It doubles the usable screen area for clear
`display of the channels with no overlapping. Math, refer-
`ence and logic signals can be displayed above or below
`the analog channels.
`
`Everything at a glance: activity display
`The R&S®RTM oscilloscopes' activity display provides a
`clear overview of the current status of all logic channels
`(high, low, toggle), regardless of the trigger settings. Users
`can see the status of all logic signals at a glance.
`
`
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`Activity display: status information for the digi-
`tal signals independent of acquisition and instru-
`ment settings.
`
`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
`
`

`

`Tools for protocol analysis: triggering and
`decoding options
`Serial bus signals include control, address and clock infor-
`mation in addition to the user data. Consequently, addi-
`tional software support is typically required for debugging
`systems that use serial data buses. Isolating protocol-
`specific events becomes easier if the oscilloscope can trig-
`ger on the content of the serial protocol that is being used
`and display the decoded message.
`
`The R&S®RTM provides versatile tools for protocol- specific
`triggering and decoding of serial interfaces. Extensive
`trigger capabilities help acquire relevant events. Because
`decoding is hardware-implemented, the R&S®RTM enables
`smooth operation while quickly isolating faults.
`
`Serial protocols:
`easy triggering and
`decoding
`
` ❙ Hardware-implemented decoding for finding errors
`fast
` ❙ Direct triggering on protocol contents and error
`states
` ❙ Simultaneous decoding and display of up to four
`protocols
` ❙ Deep memory of up to 460 Msample
`(R&S®RTM-K15)
` ❙ Display as a color-coded message or in table format
`(ASCII, binary, octal, decimal, hexadecimal)
` ❙ Powerful search and navigation over the entire
`memory
` ❙ Easy configuration using adaptive wizards
`
`Decoded hexadecimal I2C message.
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Everything at a glance: clear display
`Decoded protocols can be displayed in all conventional
`formats, including hex and ASCII. The different sections of
`the message (address, data, start, etc.) are color-coded to
`make analysis easier. Label lists can be loaded to simplify
`and speed up interpretation. IDs and addresses in the data
`stream are designated with easily understood aliases such
`as “Engine Speed” instead of in hex format. A tabular list-
`ing of the decoded data is provided in addition to the usual
`honeycomb diagram.
`
`Complete communications instead of snippets:
`deep memory
`The deep memory of the R&S®RTM makes it possible to
`acquire meaningful communications segments and helps
`users quickly understand the DUT behavior in context. The
`detailed display of the decoding is adjusted automatically
`depending on the zoom factor. The decoded data can also
`be displayed in tabular form, keeping everything clear.
`
`Intuitive: search and navigation
`The different tools for protocol analysis are tightly inte-
`grated. The search function can be used to quickly find
`protocol-specific content segments, making navigation be-
`tween segments possible. For example, when a row in the
`decoding table is selected, the corresponding data is also
`highlighted on the displayed waveform.
`
`Multiple protocols in parallel: not a problem
`Errors often result from the interaction of multiple influenc-
`ing factors. The R&S®RTM decodes and displays up to four
`buses in parallel, making it possible to immediately identify
`unwanted interactions. The R&S®RTM VirtualScreen pro-
`vides a clear overview at all times.
`
`Options for triggering and decoding
`Application
`Serial standard
`I2C/SPI
`Embedded
`UART/RS-232/RS-422/RS-485
`CAN/LIN
`I2S/LJ/RJ/TDM
`MIL-STD-1553
`ARINC 429
`
`Automotive
`Audio
`Aerospace and defense
`
`Option
`R&S®RTM-K1
`R&S®RTM-K2
`R&S®RTM-K3
`R&S®RTM-K5
`R&S®RTM-K6
`R&S®RTM-K7
`
`Communicative popup windows: intuitive display of setting
`options for error states in the MIL-STD-1553 protocol.
`
`
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Segmented
`memory:
`460 Msample with
`history function
`
` ❙ 460 Msample segmented acquisition memory
` ❙ Acquisition of up to 45 000 individual segments
` ❙ Short blind time: < 5 µs
` ❙ Acquisition of both analog and digital signals as
`well as serial bus protocols in the segmented
`memory
` ❙ Access to all analysis tools (e.g. mask test or
`QuickMeas)
` ❙ Exact timestamp for all acquisitions
`
`Long acquisition periods with 460 Msample
`memory
`The deep, segmented memory provided by the
`R&S®RTM-K15 option can be used for analyzing signal se-
`quences over a long observation period with no signal-free
`gaps. For example, protocol-based signals such as I2C or
`SPI in embedded designs can be acquired over several
`seconds or minutes. Thanks to the variable segment size
`from 10 ksample to 20 Msample, the 460 Msample mem-
`ory is optimally utilized; up to 45 000 cohesive individual
`recordings are possible.
`
`This feature will be appreciated by physics researchers
`who are monitoring pulsed lasers as well as developers of
`pulsed radar systems. When combined with the mixed sig-
`nal option or serial bus analysis options, the R&S®RTM-K15
`option is ideal for debugging embedded designs.
`
`Easy selection of segment length.
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

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`Apply all oscilloscope functions to past events
`By pressing the History key, all previous acquisitions up to
`the maximum segmented memory depth of 460 Msample
`are available for further analysis.
`
`All analysis tools are available in history mode, including
`mask test, QuickMeas function and FFT analysis. The his-
`tory function can also be used with the digital channels of
`the MSO option, and be combined with all serial bus anal-
`ysis options as well as the R&S®RTM-K18 spectrum analy-
`sis and spectrogram option.
`
`No detail missed thanks to minimum blind time
`In the ultra-segmented mode, the minimum blind time is
`less than 5 µs. Serial protocol and pulse sequences can be
`recorded practically without interruptions. In history mode,
`users can easily navigate – either manually or automatical-
`ly – through all recorded segments, and reconstruct the
`history thanks to very exact timestamps.
`
`A segmented memory of 460 Msample makes it possible to record and analyze burst signals with up
`to 45 000 segments.
`
`
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Power analysis:
`current and voltage
`in detail
`
` ❙ Analysis of input and output as well as the transfer
`function of switched-mode power supplies
` ❙ Measurement wizard for fast results
` ❙ Simple and fast documentation
` ❙ Analysis of harmonic current in line with
`conventional EN, MIL and RTCA standards
`
`Specialized measurement functions for
`characterizing power electronics
`Analysis tools support verification and debugging during
`the development of current and voltage supply circuits.
`The R&S®RTM-K31 power analysis option facilitates the
`analysis of the turn on/turn off behavior, the internal trans-
`fer function of the overall circuit, the safe operating area
`(SOA), the output signal quality and any loss.
`
`Measurement functions of the R&S®RTM-K31 option
`Measurement
`Measurement functions
`Input
`current harmonics
`EN 61000-3-2
`class A, B, C, D
`MIL-STD-1399
`RTCA DO-160
`
`Power converter
`control
`
`Power path
`
`Output
`
`inrush current
`power quality
`power consumption
`modulation analysis
`
`slew rate
`dynamic on-resistance
`safe operating area (SOA mask editor)
`turn on/turn off
`switching loss
`power efficiency
`output ripple
`transient response
`output spectrum
`
`The online help facilitates quick and easy testing.
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Graphical support for error-free operation
`When users select a measurement function, graphics
`guide them through the test setup. Detailed illustrations
`show the correct contacting of probes and current probes.
`The oscilloscope configures itself automatically based on
`the selected measurement function and delivers quick
`results. For a detailed analysis or for documentation pur-
`poses, the measurement results are available in .csv file
`format.
`
`Easy, clear documentation of power analysis
`Each result can be added to the test report simply by
`pressing a button. The test report documents the current
`setup and configuration. The R&S®Oscilloscope Report
`Creator – available free of charge on the Rohde & Schwarz
`website – is used to generate a report. Users can define
`the level of detail for the report and customize the layout,
`for example, by adding a company logo. The output for-
`mat is .pdf.
`
`Standards for limiting the harmonic current
`Depending on the application, different standards for lim-
`iting the harmonic current must be met when developing
`switched-mode power supplies. The R&S®RTM-K31 option
`supports the user during testing of all conventional stan-
`dards: EN 61000-3-2 classes A, B, C, D, MIL-STD-1399 and
`RTCA DO-160.
`
`Extensive accessories for contacting and delay
`compensation
`A wide range of passive and active probes permits mea-
`surements in common voltage and current ranges. The
`R&S®RT-ZF20 deskew fixture for power measurements
`can be used to time-synchronize the measurement signals
`from the current and voltage probes. The R&S®RTM-K31
`power analysis option automatically deskews the current
`probe and voltage probe signals at the push of a button.
`
`Extensive result documentation.
`
`
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`Tektronix, Exhibit 2011
`Rohde v. Tektronix, IPR2018-00643
`
`

`

`Spectrum analysis:
`quickly identifying
`interactions
`between time and
`frequency
`
` ❙ From DC to the instrument bandwidth
` ❙ Independent, simultaneous time and frequency
`analysis
` ❙ High sensitivity and wide dynamic range for reliable
`detection of interference
` ❙ Development over time in spectrogram
` ❙ Can be combined with history function and
`460 Msample segmented memory
` ❙ Automatic and manual peak markers
` ❙ Trace types: normal, mean value, max. hold and
`min. hold
`
`Fast and independent: separate signal paths for
`time and frequency
`Difficult-to-find faults often result from the interaction
`between time and frequency signals. The R&S®RTM-K18
`spectrum analysis and spectrogram option makes it easy
`to find such errors quickly. The analysis range is from DC
`to the instrument bandwidth (max. 1 GHz). Implementa-
`tion in separate signal paths allows independent setting of
`time and frequency parameters. Like a spectrum analyzer,
`paramet