Multi
`Domain
`
`Product Brochure | 08.00
`
`Test & Measurement
`
`year
`
`R&S®RTE
`Digital Oscilloscope
`Scope of the art
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`Tektronix, Exhibit 2010
`Rohde v. Tektronix, IPR2018-00643
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`

`

`R&S®RTE
`Digital Oscilloscope
`At a glance
`
`Truly uncompromised in performance and
`impressively user-friendly – that’s the R&S®RTE
`oscilloscope.
`
`With bandwidths from 200 MHz to 2 GHz and top perfor-
`mance parameters, the R&S®RTE oscilloscopes set stan-
`dards in their class:
` ❙ Highest sampling rate of 5 Gsample/s and deepest
`memory of 200 Msample for accurate acquisition of long
`signal sequences
` ❙ Acquisition rate of more than one million waveforms/s for
`finding signal faults quickly
` ❙ Extremely low-noise frontends and 16-bit vertical
`resolution in high definition mode for precise results
` ❙ Highly accurate digital trigger system with virtually no
`jitter for triggering on smallest signal details in realtime
`
`Tools such as QuickMeas, fast mask tests, powerful spec-
`trum analysis, history function and 77 automatic measure-
`ment functions are supplied as standard. Results are avail-
`able fast thanks to hardware-assisted implementation of
`the measurement tools in the Rohde & Schwarz ASIC. The
`results are based on a large number of waveforms to pro-
`vide statistically conclusive information.
`
`R&S®RTE oscilloscopes support dedicated application so-
`lutions for complex analyses, including trigger and decod-
`ing options for serial protocols and a power analysis op-
`tion. The mixed signal option provides 16 digital channels
`for analyzing logical components in embedded designs.
`
`The powerful R&S®RTE is impressively easy to use thanks
`to its high-resolution 10.4" XGA touchscreen.
`
`From embedded design development to power electronics
`analysis to general debugging, the R&S®RTE handles
` everyday T & M challenges quickly, accurately and easily.
`The R&S®RTE is a member of the Rohde & Schwarz family
`of scope-of-the-art oscilloscopes, offering time domain,
`logic, protocol and frequency analysis in a single box.
`
`2
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`

`

`R&S®RTE
`Digital Oscilloscope
`Benefits and
`key features
`
`More functions and faster results
` ❙ Automatic measurements: 77 functions available
` ❙ QuickMeas: key measurement results at the push of a
`button
` ❙ History function: looking back in time
` ❙ Mask test: settings in only seconds
` ❙ FFT function: the easy way to analyze the signal
`spectrum
` ❙ Search and navigation: focus on details
` ❙ Math functions: calculations made easy
` ❙ Reference waveforms: fast comparisons
` ▷ page 10
`
`More confidence in measurement results
` ❙ Precise measurements due to very low inherent noise
` ❙ High dynamic range due to single-core A/D converter
` ❙ Full measurement bandwidth, even at 500 µV/div
` ❙ High time resolution combined with deep memory
` ❙ Finding rare signal faults quickly thanks to
`one million waveforms/s
` ❙ Accurate triggering with a digital trigger system
` ▷ page 4
`
`Engineered for multi-domain challenges
` ❙ Logic analysis: fast and precise testing of embedded
`designs
` ❙ Serial protocols: easy triggering and decoding
` ❙ Power analysis
` ❙ Spectrum analysis
` ❙ EMI debugging: testing during development
` ❙ High definition: see more with 16-bit vertical resolution
` ▷ page 13
`
`More fun to use
` ❙ High-resolution touchscreen
` ❙ Fully customizable display
` ❙ Fast access to important tools
` ❙ Signal details at your fingertip
` ❙ Fast access to instrument setups
` ❙ Documentation at the push of a button
` ▷ page 6
`
`Powerful probes
` ▷ page 27
`
`Extensive range of accessories
` ▷ page 30
`
`Models
`Base unit
`
`R&S®RTE1022
`R&S®RTE1024
`R&S®RTE1032
`R&S®RTE1034
`R&S®RTE1052
`R&S®RTE1054
`R&S®RTE1102
`R&S®RTE1104
`R&S®RTE1152
`R&S®RTE1154
`R&S®RTE1202
`R&S®RTE1204
`
`
`
`Bandwidth
`
`Channels
`
`200 MHz
`
`350 MHz
`
`500 MHz
`
`1 GHz
`
`1.5 GHz
`
`2 GHz
`
`analog
`2
`4
`2
`4
`2
`4
`2
`4
`2
`4
`2
`4
`
`Sampling
`rate
`
`5 Gsample/s
`
`digital
`16
`
`Acquisition memory
`
`Acquisition rate Mixed signal analysis
`(MSO)
`
`10 Msample per
`channel,
`max. 200 Msample
`
`1 million
`waveforms/s
`
`400 MHz,
`5 Gsample/s,
`100 Msample,
`> 200 000 waveforms/s
`
`Rohde & Schwarz R&S®RTE Digital Oscilloscope 3
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`More confidence
`in measurement
`results
`
`Precise measurements due to very low inherent
`noise
`The R&S®RTE was developed with the objective of mini-
`mizing noise, from matched BNC-compatible inputs with
`18 GHz bandwidth to high-precision A/D converters and
`extremely low-noise frontends. At 1 GHz bandwidth and
`1 mV/div input sensitivity, the R&S®RTE oscilloscopes have
`a very low RMS noise of 100 µV, allowing precise mea-
`surements even at the smallest vertical resolutions.
`
` ❙ One million waveforms/s
` ❙ Very low inherent noise of 100 µV at 1 mV/div and
`1 GHz
` ❙ Full measurement bandwidth up to 2 GHz, even at
`500 µV/div
` ❙ High definition mode for up to 16-bit vertical
`resolution
` ❙ Memory up to 200 Msample
` ❙ Minimal trigger jitter < 1 ps
` ❙ Trigger hysteresis can be adjusted to signal quality
`
`High dynamic range due to single-core
`A/D converter
`Rohde & Schwarz developed a monolithic A/D converter for
`the R&S®RTE oscilloscopes. The chip's single-core archi-
`tecture minimizes signal distortion and achieves more than
`seven effective bits over the entire frequency range. This
`provides a solid foundation for precise analysis of slow sig-
`nals using the high definition mode (R&S®RTE-K17 option).
`In this mode, digital postprocessing enables acquisition
`with up to 16-bit vertical resolution.
`
`Full measurement bandwidth, even at 500 µV/div
`Thanks to very low-noise frontends, the R&S®RTE oscillo-
`scopes offer an input sensitivity down to 500 µV/div. This
`is unmatched on the market. Other oscilloscopes attain
`1 mV/div sensitivity only by employing software-based
`zooming or by limiting the bandwidth. R&S®RTE oscillo-
`scopes, however, show a signal's real sampling points over
`the full measurement bandwidth, even at 500 µV/div sensi-
`tivity. This high measurement accuracy is particularly ben-
`eficial when measuring small signal amplitudes.
`
`Due to the high acquisition rate of one  million waveforms per second, R&S®RTE oscilloscopes find
`rare signal faults very quickly.
`
`4
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` High time resolution combined with deep memory
`The R&S®RTE offers a combination of sampling rate and
`memory depth that is unique in this class. A sampling
`rate of 5 Gsample/s at a memory depth of 10 Msample
`is available per channel (can be optionally expanded to
`50 Msample per channel). This ensures high time resolu-
`tion and excellent signal fidelity, even for long acquisition
`sequences, e.g. when analyzing transients of switched-
`mode power supplies.
`
` Accurate triggering with a digital trigger system
`The unique Rohde & Schwarz digital trigger system is also
`used in the R&S®RTE oscilloscopes. It consists of one
`common path for acquisition signal and trigger signal. The
`instruments determine if the trigger condition has been
`met by directly analyzing the digitized signal independently
`of the current sampling rate. This is why Rohde & Schwarz
`oscilloscopes have extremely low trigger jitter, very high
`trigger sensitivity and high measurement accuracy.
`
` Precise fault detection with diverse trigger modes
`R&S®RTE oscilloscopes have 14 different trigger modes
`for precisely isolating relevant signal events. In addition to
`simple trigger conditions such as edge, pulse width and
`runt, it also supports complex conditions such as logical
`combination of channels, a bit pattern trigger and a video
`trigger (NTSC, PAL, PAL-M, SECAM, EDTV, HDTV). A wide
`range of serial protocol trigger options are also available.
`
` Finding rare signal faults quickly thanks to
`one million waveforms/s
`The acquisition cycle of a digital oscilloscope consists of
`two steps. First, the oscilloscope samples the signal and
`stores the samples. In a second step, it processes these
`samples and displays the waveform on the screen. During
`this period, the oscilloscope is “blind” to the signal. Signal
`faults that occur during this blind time remain hidden to
`the user. Fast detection of rare signal faults requires an os-
`cilloscope with short blind time and a high acquisition rate.
`The core of R&S®RTE oscilloscopes is an ASIC that was
`especially designed for parallel processing. As a result,
`the R&S®RTE can acquire, analyze and display more than
`one million waveforms per second without a special acqui-
`sition mode. The high acquisition rate makes it possible to
`find signal faults faster and more reliably, effectively short-
`ening debugging time.
`
`Comparison of digital and analog triggering architecture
`
`Memory
`
`Channel input
`
`Vertical system
`
`A/D converter
`
`Acquisition
`
`Processing
`
`Display
`
`Analog trigger
`
`Digital trigger
`
`
`
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`High-resolution touchscreen
`The high-resolution 10.4" XGA touchscreen is one of the
`highlights of the R&S®RTE. The oscilloscope is optimized
`for touchscreen operation:
` ❙ Drag & drop signals and measurement results where you
`want on the screen
` ❙ Define zoom and measurement ranges with your finger
` ❙ Scale and position dialog boxes on the screen as required
` ❙ Activate and configure measurements, histograms and
`FFT analyses by touch
` ❙ Adjust cursors, offsets and the trigger level by touching
`the lines
` ❙ Create masks in only seconds
`
`Fully customizable display
`When working with multiple signals, the screen becomes
`easily cluttered. R&S®RTE oscilloscopes are different.
`They display waveforms, buses and measurement re-
`sults in realtime in the form of signal icons on the edge
`of the screen. These miniature views can be dragged and
`dropped onto the main screen. When multiple waveforms
`need to be displayed simultaneously, the Rohde & Schwarz
`SmartGrid function helps the user to keep the screen well
`organized by flexibly dividing it into several diagrams or
`tabs. Individual waveforms can be displayed in a clear,
`well-structured manner. The A/D converter range is opti-
`mally used for highest accuracy.
`
`Fast access to important tools
`A toolbar at the upper edge of the screen provides ac-
`cess to frequently used functions such as measurements,
`zoom, FFT and the recycle bin. The toolbar can be custom-
`ized to contain the user’s favorite tools. Related tools are
`clearly organized in groups. There are just two steps in-
`volved in using a function: selecting the tool and applying
`it to the waveform.
`
`Semi-transparent dialog boxes with signal flow
`diagrams
`Signal flow diagrams in the dialog boxes visualize the
`signal processing, making it easier to configure measure-
`ments. Crosslinks take you directly to logically related
`settings. Forward/back buttons help to navigate quickly
`between dialog boxes. Semi-transparent dialog boxes are
`an elegant way of keeping everything in view. The mea-
`surement diagrams always maintain their original size. The
`level of transparency can be set via the intensity button.
`Users can scale the dialog boxes and position them any-
`where on the screen.
`
`More fun to use
`
` ❙ High-resolution 10.4" XGA touchscreen
` ❙ Optimized for touchscreen operation
` ❙ Drag & drop signals and measurement results
`flexibly on the screen
` ❙ Results are only two clicks away thanks to
`powerful toolbar
` ❙ Convenient tools such as QuickMeas,
`fingertip zoom and undo/redo
`
`R&S®RTE toolbar
`undo
`
`redo
`
`help
`
`update reference
`waveform
`
`label
`
`default settings
`
`instrument setups
`
`autoset
`
`activate/deactivate
`signalbar
`
`selection tool
`
`find trigger level
`
`run single measurement
`
`zoom
`
`cursor
`
`mask test
`
`histogram
`
`automatic
`measurements
`
`QuickMeas
`
`FFT
`
`6
`
`run/stop
`
`save waveform
`
`clear screen
`
`capture screenshot
`
`save settings
`
`recycle bin
`
`search
`
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`

`Documentation at the push of a button
`R&S®RTE oscilloscopes help you document
`measurements:
` ❙ Print or save screenshots of the waveforms and results
` ❙ Easily read signal characteristics thanks to clear grid
`annotations
` ❙ Mark and label anomalies directly in the diagram
` ❙ Save waveforms, histograms and measurement results in
`different formats (e.g. binary or csv file) for in-depth data
`analysis using PC software
`
`Selection of languages
`The R&S®RTE oscilloscopes' user interface supports multi-
`ple languages. The language can be changed in just a few
`seconds – while the instrument is running. The R&S®RTE is
`a true international instrument.
`
`Signal details at your fingertip
`Zoom is a standard digital oscilloscope tool for analyzing
`the details of a captured signal. R&S®RTE oscilloscopes
`also offer other useful features:
` ❙ Easy definition of zoom ranges with a finger
` ❙ Hardware zoom: automatic adjustment of settings for
`vertical and horizontal scaling to display a selected range
` ❙ Fingertip zoom: open a horizontal zoom range in the
`signal (view signal characteristics by using a finger or the
`mouse to drag the zoom window along the signal; click
`the keep function to open the normal zoom)
`
`Fast access to instrument setups
`Digital oscilloscopes allow users to save instrument set-
`tings and recall them at any time. R&S®RTE oscilloscopes
`make it very easy to select the right setup: just click the
`instrument setup icon on the toolbar to open a dialog
`box with all of the saved configurations. Each configura-
`tion has a screenshot that shows the screen at the time at
`which it was saved. The user can take advantage of these
`screenshots to quickly scroll through the possible choices.
`
`Remote control access
`R&S®RTE oscilloscopes can also be remote controlled us-
`ing a PC or other device via remote desktop or VNC. The
`user sees the same user interface and uses the same func-
`tions as on the oscilloscope itself.
`
`The user can drag & drop waveforms and result windows on the screen. The Rohde & Schwarz
`SmartGrid function helps users arrange multiple diagrams or tabs on the screen. The size of individu-
`al diagrams can be further optimized by dragging the edges of the windows.
`
`
`
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`Overview of the R&S®RTE oscilloscope
`
`Control elements
`
`Tools that have a similar function
`are grouped together
`
`Toolbar for fast access to
`frequently used functions
`
`Preset to return to default or
` user-defined settings
`
`Clear grid annotation for easy
`reading of measured values
`
`Print or save results at the
`push of a button
`
`Knob for setting the level of
`transparency of the dialog
`boxes or the intensity of the
`waveforms
`
`Menu bar on the bottom
`edge of the screen –
`even visible during touch
`operation
`
`8
`
`USB interfaces for mouse, keyboard,
`data exchange, documentation or
` firmware updates
`
`Fingertip zoom: move the finger along
`the signal to get a quick overview of
`signal details
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`Standard zoom for horizontal and vertical
`zooming
`
`Direct access to
` frequently required
`analysis functions
`
`Signal icons show impor-
`tant settings or a minia-
`ture view of the real signal
`
`Multilevel undo/redo
` function to easily restore
`previous settings
`
`Color-coded controls
`indicate the currently
`selected channel
`
`Tutorials to learn how to operate the
`oscilloscope
`
`Probe interface for automatic probe
`detection
`
`
`
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`

`More functions and
`faster results
`
` ❙ Even in its basic configuration, the R&S®RTE
`offers a decisive edge when performing everyday
`measurement tasks:
` ❙ 77 automatic measurement functions including
`statistical evaluation
` ❙ QuickMeas for eight results at the push of a button
` ❙ History function for looking back in time
` ❙ Powerful FFT-based spectrum analysis
` ❙ Mask test for identifying signal anomalies
`
`High measurement speed: even for complex
`analysis functions
`Many of the measurement functions in the R&S®RTE are
`hardware-implemented:
` ❙ Histogram
` ❙ Spectrum display
` ❙ Mask test
` ❙ Cursor measurements
` ❙ Select automatic measurement functions
` ❙ Select mathematical operations
`
`As a result, the acquisition and processing rate remains
`high even when analysis functions are active. The oscillo-
`scope enables smooth operation, and even complex test
`sequences are available quickly, making statistically mean-
`ingful analysis possible.
`
`Automatic measurements: 77 functions available
`A key feature of digital oscilloscopes is automatic mea-
`surements. They make it possible to rapidly characterize
`a signal of interest. This can be simple measurement of
`signal characteristics such as frequency and rise and fall
`times or complex analysis such as determining the switch-
`ing loss of a switched-mode power supply. The R&S®RTE
`displays the results of up to eight measurements simul-
`taneously. Automatic measurements are divided into four
`different categories: amplitude and time measurements,
`histogram measurements, eye diagram measurements
`and spectral measurements. A total of 77 measurement
`functions are available. The results are presented in a ta-
`ble, with optional statistical evaluation. The gating function
`can be used to limit the measurements to a specific signal
`range if required. The user can easily define this range on
`the screen using a finger or the mouse, or link it to existing
`cursor or zoom ranges.
`
`QuickMeas: key measurement results at the push
`of a button
`The QuickMeas function offered by the R&S®RTE oscillo-
`scopes is unique in this class. The results of multiple
`measurement functions for the currently active signal are
`simultaneously displayed. The set of functions can be indi-
`vidually defined with up to eight measurements and saved
`for later analysis. The QuickMeas function is quickly and
`easily accessed via the toolbar.
`
`In the R&S®RTE oscilloscopes, up to eight automatic measurements can
`be configured and activated simultaneously.
`
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`History function: looking back in time
`The R&S®RTE history function provides access to previous-
`ly acquired waveforms – for analog or digital channels, ref-
`erence or math signals and serial buses. Users can imme-
`diately analyze the measurement data stored in memory.
`They can scroll through the individual acquisitions with the
`history player or use the persistence mode to display them
`superimposed. One timestamp per waveform clearly iden-
`tifies when events took place. Various analysis tools such
`as automatic measurements, FFT, mask tests and a search
`function are available for analyzing past acquisitions.
`
`Mask test: settings in only seconds
`Mask tests quickly reveal if a signal lies within defined tol-
`erance limits. This makes it easy to identify signal anoma-
`lies and unexpected results. Defining masks is easy and
`flexible with the R&S®RTE. With just a few keystrokes, the
`user can generate a mask from a reference signal or define
`masks consisting of up to eight segments. To get started
`quickly, the mask segments can be generated on the
`screen using the mouse or a finger. The positions of the
`mask points can be optimized later in the mask test dialog
`box.
`
`The history function can also be used in ultra-segmented
`mode. The oscilloscope captures a predefined number
`of acquisitions without interruption. The waveforms are
`displayed on the screen only after the last acquisition has
`been captured. The history player can be used to analyze
`the individual acquisitions. This mode has the advantage
`of even shorter blind time (< 300 ns) between the individu-
`al acquisitions.
`
`FFT function: the easy way to analyze the signal
`spectrum
`Thanks to the hardware implementation, the FFT in the
`R&S®RTE is very fast. It conveys the impression of a
`live spectrum. Using the persistence mode, rapid signal
`changes, signal interferers and weak superimposed sig-
`nals can easily be made visible. The low-noise frontend
`and the A/D converter's high effective number of bits (> 7)
`provide an outstanding dynamic range. The ability to over-
`lap FFT frames enables the R&S®RTE to detect intermittent
`signals such as pulsed interferers.
`
`Like in spectrum analyzers, FFT operation is based on
`entering the center frequency, span and resolution band-
`width. The grid annotation is especially user-friendly. Mea-
`surements that were previously available only with spec-
`trum analyzers, such as total harmonic distortion (THD)
`and power spectrum density (PSD), are now possible with
`an oscilloscope. The ability to perform a mask test in the
`spectrum is unique. This is useful for finding rare events
`such as sporadic EMI interferers and correlating them to
`the time domain signal.
`
`R&S®RTE masks consist of up to eight segments. Hardware implementa-
`tion keeps the acquisition rate high, and mask violations are quickly found.
`
`The R&S®RTE FFT function offers accuracy, speed, functionality and ease
`of use.
`
`
`
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`Search and navigation: focus on details
`The search and navigation function helps users to main-
`tain an overview when dealing with long acquisition times.
`Available search criteria include simple signal characteris-
`tics (such as edge or pulse width), complex bit sequences
`and protocol content. Users can search on analog or
`digital channels, on reference or math waveforms and
`on serial buses. All events are summarized in a table for
`easy navigation between different events. Events can be
`zoomed for detailed analysis.
`
`Math functions: calculations made easy
`R&S®RTE oscilloscopes provide four math waveforms that
`make it easy to solve particularly challenging measure-
`ment problems. For example, with just a few keystrokes
`users can square the voltage waveform and divide it by
`the resistance in order to display power over time. In addi-
`tion to basic math functions, advanced functions such as
`derivatives, logic operations and filters are available. Math
`waveforms as well as measurement results can be used as
`arguments for other math functions.
`
`Reference waveforms: fast comparisons
`When analyzing faults, it is useful to compare the wave-
`forms with a reference. R&S®RTE oscilloscopes provide
`four reference waveforms for this purpose. The wave-
`forms are easy to generate using a dedicated key. They
`can be scaled as well as stored and reloaded internally or
`externally.
`
`Identifying errors within a serial protocol with the R&S®RTE search function. All events are summa-
`rized in a table for easy navigation between different events. Selected events can be zoomed for de-
`tailed analysis.
`
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`

`Engineered for
`multi-domain
`challenges
`
`Customer need
`New challenges often arise when testing modern embed-
`ded designs. Various functional units such as the voltage
`supply, processor, sensor technology, digital I/Os and
` radio interfaces are connected with each other at the IC or
`board level, making them susceptible to mutual interfer-
`ence. Debugging requires time correlation with various
`signals such as current, voltage, data telegrams, reference
`clock, sensor and wireless data. Until now, dedicated mea-
`suring instruments were used for measurements in the
`time domain and for spectrum, logic and protocol analysis.
`
`Rohde & Schwarz solution
`R&S®RTE oscilloscopes offer a fully integrated multi-
`domain test solution with time, frequency, protocol and
`logic analysis functions. Users appreciate the standardized
`user interface with consistent, simple operation of all func-
`tions and the fact that all analysis functions are time cor-
`related. The following example clearly demonstrates the
`benefits. Sporadic failures of embedded design functions
`are often caused by interference from the internal voltage
`supply. R&S®RTE oscilloscopes can analyze the quality of
`the voltage supply in the time and frequency domain, de-
`pending on processor and interface activity. This one-box
`solution makes it possible to quickly detect errors even in
`complex designs.
`
`R&S®RTE oscilloscopes offer a complete multi-domain test solution
`
`Analog
`❙ Debugging
`❙ Signal integrity
`❙ Power analysis
`
`Logic
`❙ Debugging
`❙ Data verification
`❙ Bus decoding
`
`Protocol
`❙ Protocol decoding
`❙ Protocol triggering
`❙ Symbol mapping
`
`Frequency
`❙ Spectrum analysis
`❙ EMI debugging
`❙ Signal analysis
`
`
`
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`Tektronix, Exhibit 2010
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Multi
`Domain
`
`Logic analysis: fast
`and precise testing
`of embedded
`designs
`
` ❙ Every R&S®RTE can be turned into a mixed signal
`oscilloscope
` ❙ 16 digital channels
` ❙ 400 MHz, 5 Gsample/s sampling rate and
`100 Msample memory
` ❙ More than 200 000 waveforms/s
` ❙ Wide range of trigger capabilities with 200 ps
`resolution
` ❙ Many analysis tools such as history function and
`bus display as analog waveform
`
`More signal details thanks to high time resolution
`over the entire memory depth
`With a sampling rate of 5 Gsample/s, the R&S®RTE-B1 op-
`tion provides a maximum time resolution of 200 ps for all
`digital channels. This sampling rate is available over the
`entire memory depth of 100 Msample per channel. As
`a result, the MSO option is capable of detecting critical
`events such as narrow or widely separated glitches.
`
`High acquisition and analysis rate for fast fault
`finding
`Signal processing of the digital waveforms is done in
`hardware. This extends from acquisition and triggering to
`analysis functions such as cursor functions and measure-
`ments, and even includes the visualization of the results.
`This enables an acquisition and analysis rate of more than
`200 000 waveforms per second, ensuring that rare events
`are detected quickly and reliably.
`
`Straightforward display of digital signals
`The R&S®RTE-B1 option supports 16 digital channels and
`simultaneous decoding of up to 4 parallel buses. Each bus
`is represented by an icon on the edge of the screen. The
`icons can be dragged and dropped onto the screen. The
`SmartGrid function is then used to place the correspond-
`ing signals in a suitable diagram. To provide a quick over-
`view of the bus activity, the icon shows the current status
`of all activated logic channels (high, low, toggle) regardless
`of the other oscilloscope settings.
`
`Upgrade to mixed signal oscilloscope using R&S®RTE-B1. The logic button provides
` direct access to the digital channels.
`
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`Tektronix, Exhibit 2010
`Rohde v. Tektronix, IPR2018-00643
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`

`

`The user configures the parallel buses according to the ac-
`tual bus topology and defines which digital channels are
`part of the bus, where the binarization decision threshold
`is placed and whether the bus is clocked or unclocked.
`The decoded buses are displayed in a bus format or as an
`analog waveform. For clocked buses, the decoded con-
`tents can also be displayed in a table.
`
`Processing and analysis functions
`For efficient analysis of measurement waveforms, the
`MSO option offers a wide selection of automatic time
`measurements, including statistical evaluation. Automatic
`measurements can be performed on all digital channels
`and their logical combinations.
`
`In addition to time measurements, the cursor also shows
`the decoded bus value at the cursor position. The history
`function enables users to access and analyze specific mea-
`surement waveforms in the acquisition memory.
`
`Analysis of serial protocols with digital channels
`The protocols of serial interfaces such as I2C, SPI and CAN
`can also be triggered and decoded using the digital chan-
`nels of the R&S®RTE-B1 option and the appropriate serial
`protocol options.
`
`The signal activity of the digital
`channels is displayed in the signal
`icon independently of the oscillo-
`scope settings.
`
`Ramp signal of a 4-bit ADC with analog and digital channels, and an SPI bus signal with digital
`channels.
`
`MSO option Digital
`channels
`16 channels
`(2 logic probes)
`
`R&S®RTE-B1
`
`Input impedance Max. signal
`frequency
`400 MHz
`
`100 kΩ || 4 pF
`
`Max. sampling
`rate
`5 Gsample/s per
`channel
`
`Max. acquisition
`memory
`100 Msample per channel
`
`
`
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`Tektronix, Exhibit 2010
`Rohde v. Tektronix, IPR2018-00643
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`

`

`Multi
`Domain
`
`Serial protocols:
`easy triggering and
`decoding
`
` ❙ Easy configuration with the app cockpit
` ❙ Hardware-assisted triggering and decoding
` ❙ Color-coded telegram data display in honeycomb
`diagram or in a table
` ❙ Support of standard CAN-dbc and FIBEX formats
` ❙ Triggering and decoding of Manchester and NRZ
`coded serial protocols
` ❙ Simultaneous decoding of up to four serial buses
` ❙ Comprehensive search functions for easy analysis
`of long signal sequences
`
`Easy configuration with the app cockpit
`R&S®RTE oscilloscopes offer a variety of tools for serial in-
`terface analysis. The configuration for any given protocol
`is accomplished in just a few steps with the app cockpit.
`Navigation between the individual dialog boxes is smooth
`thanks to crosslinks. The Find Reference Levels function
`makes it particularly easy to define the decision level for
`the logical signals.
`
`Tools for analyzing serial buses
`The software options for analyzing serial interfaces allow
`users to configure the buses according to the actual proto-
`col topology. Protocol-specific definition of the trigger con-
`ditions is important for tracking down protocol errors. The
`R&S®RTE enables triggering on specific protocol content,
`e.g. addresses or data, as well as on protocol errors.
`
`Clear presentation of protocol data
`When displaying decoded data, the individual protocol ar-
`eas within the logical signals are color-coded. Address and
`data content can be displayed in hex, bin or ASCII format.
`Label lists can be loaded to simplify the interpretation pro-
`cess. They represent IDs and addresses in the data stream
`with symbolic aliases such as “Engine Speed” instead of a
`numerical format. The decoded data is provided in a table
`as well as in the usual honeycomb diagram.
`
`Easy configuration with the app cockpit.
`
`16
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`Tektronix, Exhibit 2010
`Rohde v. Tektronix, IPR2018-00643
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`

`

`R&S®RTE oscilloscopes support simultaneous decoding
`of up to four serial buses. Each bus is represented by an
`icon on the edge of the screen. The icons can be dragged
`and dropped onto the screen. The SmartGrid function is
`then used to place the corresponding signals in a suitable
`diagram.
`
`High acquisition rate for finding errors quickly
`Data errors at serial interfaces are frequently the result of
`sporadic signal faults caused by timing of logic compo-
`nents at the limits. High acquisition rates are a key prereq-
`uisite for detecting such faults quickly. Rohde & Schwarz
`oscilloscopes are ideal for these tasks because they de-
`code protocol-specific trigger results, allowing fast and
`reliable debugging.
`
`Intuitive search and navigation
`Comprehensive search functions simplify analysis of long
`signal sequences. Specific message types, content and er-
`rors can be quickly isolated. All detected events are shown
`in a table with timestamps. The user can then examine the
`individual events in a zoom window with the proper timing
`correlation and navigate between the events.
`
`Options for triggering and decoding
`Application
`Serial standard
`Option
`Embedded
`I²C/SPI
`R&S®RTE-K1
`UART/RS-232/422/485 R&S®RTE-K2
`Ethernet
`R&S®RTE-K8
`MDIO
`R&S®RTE-K55
`USB 2.0/HSIC
`R&S®RTE-K60
`Automotive, industrial CAN/LIN
`R&S®RTE-K3
`Automotive
`CAN-FD
`R&S®RTE-K9
`R&S®RTE-K4
`FlexRayTM
`SENT
`R&S®RTE-K10
`I