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`PAUL, HASTINGS, JANOFSKY & WAL
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`physics and kw: symposium and yr: 1989 and
`((dt= "bks") or (dt= "ser")). Record 2 of 17.
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`Reliability physics 1989 :
`27th annual proceedings, Phoenix, Arizona, April 11, 12, 13, 1989.
`IEEE Electron devices society.; IEEE Reliability society.
`
`1989
`English
` Book V, 259 str. : ilustr. ; 28 cm.
`New York : IEEE - The Institute of Electrical and Electronics Engineers,
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`Find Items About: IEEE Electron devices society. (2)
`Title: Reliability physics 1989 :
`27th annual proceedings, Phoenix, Arizona, April 11, 12, 13,
`1989.
`Corp Author(s): IEEE Electron devices society. ; IEEE Reliability society.
`Conf Author(s): International reliability physics symposium. Annual proceedings (27 : 1989 :
`Phoenix, Arizona)
`Publication: New York : IEEE - The Institute of Electrical and Electronics Engineers,
`Year: 1989
`Description: V, 259 str. : ilustr. ; 28 cm.
`Language: English
`SUBJECT(S)
`Identifier: elektronika; fizika; dielektriki; zanesljivost; polprevodniki; metalizacija; senzorji;
`GaAs
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`http://firstsearch.oclc.org/WebZ/FSFETCH?fetchtype=fullrecord:sessionid=fsapp...
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`12/18/2015
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`SAMSUNG EXHIBIT 1064
`
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`FirstSearch: WorldCat Detailed Record
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`Page 2 of 2
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`Note(s): IEEE catalog no. 89CH2650-0.
`Class Descriptors: UDC: 621.38
`Material Type: Conference publication (cnp)
`Document Type: Book
`Entry: 19901121
`Update: 20101003
`Accession No: OCLC: 456001242
`Database: WorldCat
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`Subjects Libraries E-mail
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`WorldCat results for: kw: reliability and kw:
`physics and kw: symposium and yr: 1989 and
`((dt= "bks") or (dt= "ser")). Record 2 of 17.
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`SAMSUNG EXHIBIT 1064
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