R O N M A L T I E L
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`E mail: ron@maltiel-consulting.com
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`Web site: www.maltiel-consulting.com
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`19743 Yuba Court, Saratoga, CA 95070 – 408.446.3040
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`PROFESSIONAL SUMMARY:
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`Mr. Maltiel is a senior member of IEEE with more than 30 years experience in all phases of design and implementation of
`computer semiconductor devices. He has worked in the development and production of storage technology and
`semiconductor devices such as Dynamic Ram (DRAM), Flash (NAND, NOR), SSD, EEPROM, ROM, and Static RAM
`(SRAM) memories which were used in microprocessors, logic, digital, and analog products.
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`Mr. Maltiel studied semiconductors at Stanford University graduate school and went on to work at Intel, AMI, AMD, and
`Maxim. His teams included circuit, process, and device engineers and was responsible for integrating all of the various
`disciplines into one working product. Mr. Maltiel holds six semiconductor device, process, and measurement patents which
`have been cited more than 130 times.
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`Currently, Mr. Maltiel is an independent consultant in the areas of semiconductor design, process and manufacturing and has
`been retained as an expert witness on many patent cases. In addition, Mr. Maltiel maintains an informational website and
`database which is regularly visited by USPTO, US Department of Justice, technology departments, attorneys, and investors
`from 99 countries. He is also fluent in Hebrew.
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`EXPERTISE:
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`Circuit and Process Development:
` Analog
` DRAM
` Flash / EEPROM and ROM
` SRAM
` pMOS, nMOS, and CMOS
` High voltage BICMOS
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`Process Steps Development:
` Process flow design
` Gate and polysilicon oxidation steps
` Cleaning steps
` Etching, deposition and planarization process steps
`such as Chemical Mechanical Polishing (CMP)
` Plasma and Trench etching steps
` Wafer gettering methods
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`Devices Development:
` DRAM memory cells
` SRAM memory cells
` Flash / EEPROM and ROM memory cells
` Precision resistors and capacitors
` Transistors/ resistors/capacitors/JFET in pMOS,
`nMOS, CMOS, and BICMOS processes
` Polysilicon - polysilicon capacitors
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` PNP and NPN transistors
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`Test Chip Development:
` Created a library of test chip structures for process,
`ESD circuits, design rules, and device evaluation
`using GDS tools.
` Measured test structures and evaluated their device
`properties
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`Page 1 of 7
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`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 1
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`R O N M A L T I E L
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`PROFESSIONAL EXPERIENCE
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`INDEPENDENT CONSULTANT, 1993 - present
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` Provides consulting in various aspects of semiconductor technology and semiconductor manufacturing.
` Provides expert technical consultations and has testified at trials.
` Designs and operates a popular semiconductor technology web site which includes current developments in the digital
`and analog fields such as DRAM, Flash (NAND, NOR), SSD, EEPROM, ROM, and SRAM. The site includes tutorials
`and educational information, industry news and resources, acronym and technical word definitions, and patent search or
`patent application information, and is regularly visited by major technology companies and universities from 99
`countries.
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`MAXIM INTEGRATED PRODUCTS , 1989 - 1993
` Personally developed a high voltage BICMOS device, introduced it to production, and proved the feasibility of adding
`an EEPROM element to it.
` Established MAXIM processes in a newly purchased fab, developed the company’s newest analog process, installed
`MAXIM’s production in a new foundry, and managed the relationship.
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`ADVANCED MICRO DEVICES , 1983 -1989
` Managed consolidation of test chip development through the building of a company-wide standard test chip library. As
`a direct result of this project, the time needed to build test chips was reduced by 60%, structures were improved, and test
`program generation was accelerated.
` Contributed to development of 256k SRAM, including process flow, a backend planarization scheme, and overseeing the
`building of generic test chip library.
` Participated in defining 1M CMOS DRAM memory and proved feasibility of integrating trenches in the process.
`Coordinated the development of post groove planarization process and double poly module. The project ended
`successfully with a working first silicon.
` Developed and proved feasibility of integrating EEPROM with DRAM CMOS process and devices. Reduced cell size
`by 40%, process steps by 15%, and improved EEPROM programming operation.
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`AMERICAN MICROSYSTEMS, INC., 1982 - 1983
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`Introduced and established the EEPROM device. Directed the design of the test chip, process flow determination,
`manufacture of several working runs and measurement of the electrical parameters.
` Created a new process approach that improves poly dielectric strength and founded a new cell structure with multiple
`benefits over existing cells.
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`INTEL , 1980 - 1982
`Participated in the development of EEPROM technology with particular emphasis on the reliability aspects such as charge
`retention and cycling endurance. Work involved the study of failure mechanisms, making the necessary process changes,
`and evaluating the results. Regular interaction with fab and technology development was required. Improved operator
`utilization by 20%.
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`STANFORD UNIVERSITY , 1978 - 1980
` E.E. research group on metallic impurities and their electrical behaviors.
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`Independent research included manufacturing of Si devices and electrical measurements of their properties.
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`EDUCATION
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`Engineer Degree, Material Science Engineering, Stanford University, 1980
`MS, Material Science and Engineering, Stanford University, 1978
`BS, Material Science and Engineering, Ben-Gurion University, 1977
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`Page 2 of 7
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`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 2
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`R O N M A L T I E L
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`PATENTS
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`Mr. Maltiel’s patents have been cited more than 100 times
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` Electrical measurements of profile of semiconductor devices during their manufacturing process - #4,978,923
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` Method and apparatus for non-destructive data in a shadow memory array - #4,716,552
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` Electrical measurements of properties of semiconductor devices during their manufacturing process - # 4,956,611
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` Memory cell providing simultaneous non-destructive access to volatile and non-volatile data - #4,672,580
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` Non-volatile dynamic ram cell - #4,611,309
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` Gold-doped IC resistor region - #4,432,008
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`PROFESSIONAL AFFILIATIONS
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`IEEE Senior Member
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`IEEE Device Society
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`IEEE Circuits Society
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`IEEE Communications Society
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`IEEE-USA Consultants Database
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`Jewish High Tech
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`Page 3 of 7
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`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 3
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`

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`R O N M A L T I E L
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`LITIGATION RELATED EXPERIENCE
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`Expert Engagements
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Patent Infringement
`Fitzpatrick, Cella, Harper & Scinto
`Intellectual Ventures vs. Canon.
`Testifying expert and technical consultant on semiconductor product and device operations. Case
`was settled following my deposition.
`2015
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`Manufacturing Technologies
`Ahmad, Zavitsanos, Anaipakos, Alavi & Mensing P.C.
`PUMA (Parthenon Unified Memory Architecture) vs HTC and LG.
`Testifying expert and technical consultant on semiconductor products and devices. Case was settled.
`2015- 16
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`Date:
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`Patent Infringement
`TechKnowledge Law Group LLP
`Home Semiconductor vs. Samsung.
`Testifying expert and technical consultant on semiconductor device structures and operations.
`2014 – 15
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`Patent Infringement
`Vinson & Elkins LLP
`Round Rock Research vs. Sandisk Corp.
`Testifying expert and technical consultant on patents relating to the manufacturing and operation of
`semiconductor memory in a system. Wrote invalidity and exhaustion declarations, was deposed,
`directed prior art searches, and analyzed patent infringements and validity.
`Several of the patents were dropped from the case following my declarations. Plaintiff withdrew
`case prior to trial.
`2013 – 14
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`Patent Board Declaration
`Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P
`NXP B.V. vs. Research In Motion
`Prepared declarations for the Patent Board Patent Trial and Appeal Board of the US Patent and
`Trademark Office regarding semiconductor development and manufacturing.
`2013 - 14
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`Patent Infringement
`Undisclosed
`Undisclosed
`Technical consultant regarding semiconductor development and manufacturing. Prior art searches,
`analyze patents infringement and validity.
`2012 – 13
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Type of Matter:
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`Case Name:
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`Services Provided:
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`Date:
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`Type of Matter:
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`Case Name:
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`Services Provided:
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`Date:
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`Type of Matter:
`Law Firm:
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`Patent Infringement
`Agility IP Law, LLP
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`Page 4 of 7
`
`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 4
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`

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`R O N M A L T I E L
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`Case Name:
`Services Provided:
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`Date:
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`Keranos vs. Analog Devices
`Technical consultant regarding semiconductor non volatile memory devices, wrote declarations, was
`deposed, analyzed patents infringement and validity.
`2012 – 13
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Patent Infringement
`Undisclosed
`Undisclosed
`Technical consultant regarding semiconductor Flash and DRAM memory circuits, prior art searches,
`analyze patents infringement and validity.
`2012
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Patent Infringement
`Barnes & Thornburg LLP
`Creative Integrated Systems vs. Nintendo
`Testifying expert and technical consultant for the operation of semiconductor memory in a system.
`Wrote declarations, was deposed and testified in court.
`2010 - 13
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`Patent Infringement
`Duane Morris LLP
`e.Digital vs. Pentax
`Testifying expert and technical consultant for the operation and storage of Flash memory in a
`system. Analyzed the product and prior art searches, reviewed patent file wrapper, and was deposed.
`Patent reexamination evaluation.
`2009 - 11
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`Antitrust
`Susman Godfrey LLP
`Tessera Technologies vs. Hynix Semiconductors
`Testifying expert and technical consultant for the operation of DRAM memory system. Analyzed
`company’s methodologies of bringing new technology to the market and prior art searches, reviewed
`depositions, was deposed;
`2009 - 11
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Patent Infringement
`Undisclosed
`Undisclosed
`Computer system testifying expert, technical consulting, prior art searches, analyze patents
`infringement and validity.
`2008 - 9
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`Page 5 of 7
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Patent Infringement
`Munger, Tolles & Olson LLP
`Hynix vs. Rambus
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`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 5
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`Services Provided:
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`Date:
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`R O N M A L T I E L
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`DRAM Memory testifying Expert, technical consulting for Rambus. Was deposed and provided
`expert report. Witness testimony provided in March 2008. Rambus won the case on all claims. Jury
`stated they found Mr. Maltiel the more believable expert.
`2007 - 8
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`Patent Infringement
`White & Case LLP
`Hynix vs. Rambus - European Commission in Brussels, Belgium
`DRAM Memory testifying Expert, technical consulting, provided expert report.
`2007 - 8
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`Type of Matter: P
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Patent Infringement
`Undisclosed
`Undisclosed
`Non volatile memory expert consultant, patent infringement analysis, and preparation for expert
`witness testimony
`2006
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Wrongful Termination
`Jordan Kushner
`Undisclosed
`Evaluate quality of technical work in case where employee was fired. Was deposed and provided
`expert declarations
`2003
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`Patent Infringement Matters (3)
`Venable Baetjer
`Patent Enforcement Fund vs. NEC
`Semiconductor memory expert consultant, technical consultant, develop trade secret violation list,
`prior art searches, analyze patent’s infringement and validity. Provided several expert reports and
`declarations. Deposed for several days
`Approximately 3 separate cases various dates between 1993 and 1995
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date:
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`Consulting Engagements
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`Patent Infringement
`Fish and Richardson
`Undisclosed
`Expert consultant and prior art searches of ESD circuits
`2007
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`Patent Infringement
`Townsend and Townsend
`Undisclosed
`Expert consultant and prior art searches of EEPROM memory
`2006
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`Page 6 of 7
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`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 6
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`

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`R O N M A L T I E L
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`Patent Infringement
`Undisclosed
`Undisclosed
`Non volatile memory device expert consultant, technical consulting, and preparation for Expert
`Witness testimony
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
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`Date: 2006
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Services Provided:
`Date:
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`Theft of Trade secrets, Patent Infringements
`Paul Hasting
`Undisclosed
`Expert consultant, prior art searches, analyze patents.
`2004
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`Patent Infringement and Theft of Trade Secret Matters
`Heller Ehrman LLP
`Atmel vs. ISD
`Services Provided: EEPROM device and circuits expert consultant, technical consultant, develop
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`trade secret violation list, prior art searches, analyze patent’s infringement and validity, EEPROM
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`circuits infringement analysis, mask layers evaluation, ESD structures analysis. For several years
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`worked full time as an outside expert on various EEPROM and other cases.
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`Type of Matter:
`Law Firm:
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`Case Name:
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`Date:
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`Approximately 6 separate cases various dates 1995 to 2000
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`Page 7 of 7
`
`Petitioners SK hynix Inc., SK hynix America Inc. and SK hynix memory solutions Inc.
`Ex. 1004, p. 7