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`Reg. No. 42,557
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`Mail Stop: PATENT BOARD
`Patent Trial and Appeal Board
`U.S. Patent & Trademark Office
`P.O. Box 1450
`Alexandria, VA 22313-1450
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`UNITED STATES PATENT AND TRADEMARK OFFICE
`_______________
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`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`_____________
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`INTEL CORPORATION, GLOBALFOUNDRIES U.S., INC.,
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`AND MICRON TECHNOLOGY, INC.
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`Petitioners
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`v.
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`DANIEL L. FLAMM,
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`Patent Owner
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`CASE IPR2017-0281
`U.S. Patent No. RE40,264 E
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`PATENT OWNER’S PRELIMINARY RESPONSE
`UNDER 37 C.F.R. § 42.107
`Claims 37-50 & 67
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`Inter Partes Review of U.S. Patent No. RE40,264
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`TABLE OF CONTENTS
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`Page(s)
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`TABLE OF CONTENTS ...................................................................................... i
`TABLE OF AUTHORITIES ................................................................................ iii
`I.
`Introduction ........................................................................................... 1
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`II. Overview of the ‘264 Patent .................................................................. 2
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`III. The Prior Art .......................................................................................... 2
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`A. Kadomura .................................................................................... 2
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`B. Matsumura ................................................................................... 5
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`IV. Ground 1 ................................................................................................ 6
`A. Neither Kadomura Nor
`Matsumura Teaches Element 37[b] ............................................ 6
`B. Neither Kadomura Nor
`Matsumura Teaches Element 37[f] ............................................. 7
`V. Grounds 2 and 3 ..................................................................................... 10
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`VI. Ground 4 ................................................................................................ 10
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`VII. Ground 5 ................................................................................................ 12
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`VIII. Ground 6 ................................................................................................ 13
`A. Preamble ...................................................................................... 13
`B. Claim Element 37[a] ................................................................... 13
`C. Claim Element 37[b] ................................................................... 14
`D. Claim Elements 37[c], 37[d], 37[e], and 37[f] ............................ 14
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`IX. There Would Be No Motivation to Combine
`Kadomura and Matsumura or Kikuchi and Matsumura ........................ 15
`A. There Would Be No Benefit
`from Such a Combination ........................................................... 15
`B. Matsumura Could Only Come
`Into Play Through Hindsight ....................................................... 16
`X. Dependent Claims ................................................................................. 17
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`XI. Conclusion ............................................................................................. 18
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`TABLE OF AUTHORITIES
`Cases Page(s)
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`Hartness Int’l Inc. v. Simplimatic Eng. Co.,
`819 F.2d 1100 (Fed. Cir. 1987)......................................................................... 17
`
`Kimberly Clark Corp. v. Johnson & Johnson,
`745 F.2d 1437 (Fed. Cir. 1984)......................................................................... 18
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`KSR Int’l Co. v. Teleflex, Inc.,
`550 U.S. 398, 418 (2007) .................................................................................. 16
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`Statutes Page(s)
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`37 C.F.R. § 42.107 .............................................................................................. 1
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`MPEP § 2142 .................................................................................................... 17
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`MPEP § 2143.03 ............................................................................................... 18
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`Inter Partes Review of U.S. Patent No. RE40,264
`IPR2017-00281
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`Daniel L. Flamm, Sc.D., the sole inventor and owner of the U.S. Patent No.
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`RE40,264 (“the ‘264 patent”), through his counsel, submits this preliminary
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`response pursuant to 37 C.F.R. § 42.107 and asks that the Patent Trial and Appeals
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`Board decline to institute inter partes review on the instant petition because the
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`petition fails to show a reasonable likelihood that any challenged claim is
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`unpatentable.
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`I.
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`Introduction
`This is not the first challenge to the validity of the ‘264 patent through inter
`partes
`review. Lam Research Corp. sells tools used in semiconductor
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`manufacturing to entities such as the Petitioners and Samsung Electronics Co., Ltd.
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`Lam filed seven IPRs directed toward the ‘264 patent.1 Lam also commenced an
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`action in the Northern District of California seeking a declaration that neither it nor
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`its products infringe the ‘264 patent. For its part, Samsung Electronics Co., Ltd.
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`filed two more petitions for inter partes review2 and Petitioners have now filed a
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`total of four more petitions directed toward the ‘264 patent. That makes a total of
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`thirteen petitions for inter partes review directed toward one patent, invented and
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`owned by an individual, Dr. Daniel Flamm.
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`The Board either declined to institute or instituted and then terminated, on a
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`1 IPR2015-01759; IPR2015-01764; IPR2015-01766; IPR2015-01768; IPR2016-
`0468; IPR2016-0469; and IPR2016-0470
`2 IPR2016-01510 and IPR2016-0512.
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`1
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`joint motion, each of the petitions for inter partes review filed by Lam. The Board
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`instituted one petition filed by Samsung, IPR2016-1512, but declined to institute
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`on the other, IPR2016-1510.
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`The instant petition is directed toward independent claim 37 and all of the
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`claims that depend from that claims. As demonstrated below, Petitioners fail to
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`identify any combination of prior art that teaches all of the elements of claim 37
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`and fail to demonstrate a motivation to combine the cited prior art references. For
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`that reason, the Board should not institute inter partes review with respect to that
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`claim or any claim that depends from that claim.
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`II. Overview of the ‘264 Patent
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`The invention set forth in the ‘264 patent provides a method “for etching a
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`substrate,” including “a chamber and a substrate holder.” (Ex. 1001 at Abstract.)
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`Multiple etching temperatures are employed; the change being “from a first
`temperature to a second temperature within a characteristic time period.” (Id.)
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`While methods involving the use of various temperatures for manufacturing
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`semiconductors were known in the art prior to the ‘264 patent, none of the prior art
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`discloses a predetermined temperature change within a specific interval of time.
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`III. The Prior Art
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`A. Kadomura
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`Kadomura teaches a cryogenic two-step etching treatment, wherein the
`2
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`etching is suspended between the first and second etches. During the suspension,
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`the first etching gas is discharged and is replaced by a second etching gas for the
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`second etching step. (Ex. 1005 at 6:36-44, 8:24-32, 10:4-6.) One of the benefits of
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`this approach, according to Kadomura, is that the time required to discharge the
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`first gas and replace and stabilize the second gas can be sufficient to allow
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`simultaneously changing the substrate temperature for the second etching step:
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`In this case, since the series of operations described above, that, [sic]
`is a series of operations of interrupting discharge, exhausting
`remaining gases in the diffusion chamber 2 and, further, introducing
`and stabilizing a fresh etching gas take a time equal with or more than
`the time required for rapid cooling, the time required for the rapid
`cooling does not constitute a factor of delaying the time required for
`the etching treatment of the specimen W.
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`(Ex. 1005. at 6:55-62 (emphasis added); see also id. at 7:22-30.)
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`Kadomura teaches nothing about changing temperature within a preselected
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`time period to process the film. The minimum time interval for the temperature
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`change in Kadomura is wholly a function of the time it takes to evacuate the first
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`gases and to introduce another feed gas after carrying out one etching process on a
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`film and before commencing another. There would be no benefit from attempting
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`to shorten the time for changnign the temperature, since gas changing dictated the
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`required interval between etching steps.
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`The objects of Kadomura cryogenic etching process were to attain “high
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`accuracy and fine fabrication simultaneously, as well as . . . actually putting the
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`low temperature etching technique into practical use.” (Ex. 1005 at 2:60-64.) By
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`contrast, one of Dr. Flamm’s primary objectives was to increase throughput: “[the
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`invention] overcomes serious disadvantages of prior art methods in which
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`throughput and etching rate were lowered in order to avoid excessive device
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`damage to a workpiece.” (Ex. 1001 at 2:11-14.) Kadomura’s technique—
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`exhausting and replacing
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`the gas between etches and using very cold
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`temperature—resulted in relatively long intervals between etches, “about 30 sec.”
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`(Ex. 1005 at 6:54, 8:42.) Dr. Flamm’s ‘264 patent, which is explicitly concerned
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`with increasing throughput, teaches a time interval of “several seconds” (Ex. 1001
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`at 19:8-12 & Fig. 10), a time reduction of multiple orders of magnitude. Here
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`again, Kadomura teaches away from the ‘264 patent.
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`The fact is, as petitioners essentially concede, that Kadomura does not teach
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`changing substrate temperature “within a preselected time period to process the
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`film.” (Pet. at 29.) The time period in Kadomura is not selected at all; it is
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`minimally dictated by the time period required to evacuate the first gas from the
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`vacuum chamber and introduce and stabilize the flow of the second gas:
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`In this case, since the series of operations described above, that, [sic]
`is a series of operations of interrupting discharge, exhausting
`remaining gases in the diffusion chamber 2 and, further, introducing
`and stabilizing a fresh etching gas take a time equal with or more than
`the time required for rapid cooling, the time required for the rapid
`cooling does not constitute a factor of delaying the time required for
`the etching treatment of the specimen W.
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`(Ex. 1005 at 6:55-62; see also id. at 7:19-30 and 8:43-50.)
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`B. Matsumura
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`Matsumura’s focus is the preliminary processing steps that are taken to
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`apply a uniform film of resist onto a wafer prior to illuminating the resist to form a
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`latent image, and developing the resist to create a pattern mask for further
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`processing. It addressed the problem of controlling the heating and cooling during
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`the “adhesion and baking processes” for applying the resist to semiconductor
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`wafers; it does not teach anything about etching.3 (Ex. 1003 at 1:15-20, 4:56-59,
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`Figs. 1 & 4.) Matsumura’s “resist processing system,” is depicted in the block
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`diagram Fig. 4 as the box 40. (Id. at 4:56-59 and Fig. 4.) Specifically, it comprises
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`a “Sender,” 41, for transporting the wafer to the “Adhesion Unit,” 42, which
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`applies HMDS to the wafer to enhance the adhesion of the resist, the resist is
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`applied by the “Coating unit,” 43, and then it is baked in the “Baking Unit,” 44.
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`(Id.) The “Receiver unit,” 45, then forwards the wafer to an “interface (not shown)”
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`which transfers the wafer to an external “exposure unit (not shown).” (Id. at 5:5-
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`12 and Fig. 4.) The crux of the solution was to heat the wafer “by means of a
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`conductive thin film in accordance with the information” in a stored recipe. (Id. at
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`3 While Matsumura mentions etching in the list of other possible applications for
`his invention, he teaches nothing about etching and strongly suggests that he has
`not used his invention with any type of etching, let alone plasma etching. (Ex.
`1003 at 10:3-7.)
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`3:10-11, 2:66-3:16, 3:17-51.)
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`IV. Ground 1
`A. Neither Kadomura Nor Matsumura Teaches Element 37[b]
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`The claim element denominated by Petitioners as 37[b] reads:
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`the plasma discharge apparatus comprising: a substrate temperature
`control system comprising a substrate temperature sensor and a
`substrate temperature control circuit operable to adjust the substrate
`temperature to a predetermined substrate temperature value with a
`first heat transfer process; and a substrate holder temperature control
`system comprising a substrate holder temperature sensor and a
`substrate holder temperature control circuit operable to adjust the
`substrate holder temperature to a predetermined substrate holder
`temperature value with a second heat transfer process;
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`(Pet. at 26.)
`The entirety of the second portion of 37[b]—i.e., “the plasma discharge
`apparatus comprising . . . and a substrate holder temperature control system
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`comprising a substrate holder temperature sensor and a substrate holder
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`temperature control circuit operable to adjust the substrate holder temperature to a
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`predetermined substrate holder temperature value with a second heat transfer
`process”—is “interdependent.” As such, it cannot be treated as a separate element
`for prior art purposes. The Board held, in another context, “The claim language
`requires that these phrases are interdependent, and cannot be parsed into separate
`elements met
`individually.”
` (Lam Research Corp. v. Flamm, IPR2015-01759,
`Paper No. 7, at 17 (Feb. 24, 2016).)
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`In that case, the Board denied inter parties review directed toward claim 13
`of this very ‘264 patent after criticizing Lam for attempting to improperly split the
`elements of claim 13 into unreasonably small phrases to justify its patchwork of
`prior art references, stating:
`In particular, we note that claim 13 requires that the thermal mass of
`the substrate holder is selected for a predetermined temperature
`change within a specific interval of time. The claim language requires
`that these phrases are interdependent, and cannot be parsed into
`separate elements met individually. In other words, the thermal mass
`must be selected in order to undergo a predetermined temperature
`change within a specific interval of time (for example, a change of
`10°C per minute).
`
`(Id.)
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`While Petitioners do not explicitly parse the language, they do so silently, by
`necessary implication, when they rely on two disparate prior art references to teach
`this limitation. They concede that neither Kadomura nor Matsumura “individually”
`teaches the quoted element. The Petition argues that “Kadomura in view of
`Matsumura disclosed” this limitation. (Pet. at 27.) Puzzlingly, this combination is
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`said to be supported by the expert’s declaration (Ex 1006 ¶¶ 141-147), which
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`largely discusses a third, here unmentioned, prior art reference of Kikuchi.
`B. Neither Kadomura Nor Matsumura Teaches Element 37[f]
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`The claim element denominated by Petitioners as 37[f], along with the
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`preamble of claim 37, reads:
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`A method of processing a substrate in the manufacture of a device, the
`method comprising:
`. . .
`wherein the substrate holder is heated above room temperature during
`at least one of the first or the second film treatments, and the substrate
`temperature control circuit is operable to change the substrate
`temperature from the selected first substrate temperature to the
`selected second substrate temperature within a preselected time period
`to process the film.
`(Pet. at 25, 35.)
`Petitioners, here again, are silently parsing the last seven words of this
`element—i.e., “within a preselected time period to process the film”—from the
`preceding words after the word “and”—i.e., “the substrate temperature from the
`selected first substrate temperature to the selected second substrate temperature.”
`This is impermissible as the entire clause is “interdependent.” As such, they
`cannot be treated as separate elements for prior art purposes.
`Neither Kadomura nor Matsumura, “individually,” teach the quoted claim
`limitation: “the substrate temperature control circuit is operable to change the
`substrate temperature from the selected first substrate temperature to the selected
`second substrate temperature within a preselected time period to process the film.”
`Kadomura does not teach changing the temperature “within a preselected time
`period to process the film.” The time interval between etching is wholly dictated
`by the time it takes exhaust the first gas, introduce the second gas and stabilize the
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`second gas. (Ex. 1005 at 6:36-44, 6:55-62,7:22-30, 8:24-32,10:4-6.) Thus, there is
`no preselected time period to process the film in Kadomura.
`Matsumura also does not teach “within a preselected time period to process
`the film,” or for that matter, even a time period to process the film. Ignored
`throughout petitioner’s discussion of 37[f] are these last four words, “to process the
`film.” Matsumura does not even have any film extant in the adhesion and coating
`units. The adhesion step precedes dispensing the constituents necessary to form a
`film and the baking step is the second part of a process for producing the nascent
`photoresist. There is no photoresist film until after the baking step.
`Although Petitioners do not mention the sole reference to etching in
`Matsumura in the five pages it directs to 37[f], perhaps they would contend that the
`reference to etching in Matsumura (Ex. 1003 at 10:3-7) papers over the absence in
`Matsumura of a teaching of “for processing.”
`Still further, the present invention has been applied to the adhesion
`and baking processes for semiconductor wafers in the above-
`described embodiments, but it can also be applied to any of the ion
`implantation, CVD, etching and ashing processes.
`(Id. (emphasis added).) This reference to etching is contained in what is often
`referred to as a “throw in the kitchen sink” assertion, suggesting, without any real
`data, that one’s invention may have all sorts of applications. Here, Matsumura, all
`but concedes he had no etching data, and thus had nothing to teach about etching,
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`let alone plasma etching.
`Matsumura essentially confirms that the invention has not been applied to
`etching. The statement that the invention can be applied to etching is pure
`speculation; there is no enabling data and no teaching of etching.
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`V. Grounds 2 and 3
`Petitioners rely on the same analysis for independent claim 37 as in Ground
`1. (Pet. at 49, 56.) Those Grounds must also fail for the same reasons.
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`VI. Ground 4
`In this ground, petitioners combine a patent on ashing, Kikuchi, with a
`patent on adhesion and baking (Matsumura) to argue that a claim on etching (claim
`37) would have been obvious. There is no teaching of claim elements 37[a] or
`37[b].
`Kikuchi is tackling problems associated with removing, via ashing, the resist
`after the etching step is completed. He lays out his four objectives, the primary of
`which is to avoid explosions of the resist, for which he teaches using a low
`temperature. (Ex. 1004 at 3:16-30.) He then teaches using a higher temperature to
`remove the remaining resist.
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`The claim element denominated by Petitioners as 37[a] reads:
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`placing a substrate having a film thereon on a substrate holder within
`a chamber of a plasma discharge apparatus
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`(Pet. at 58.)
`Petitioners essentially concede that neither Kikuchi nor Matsumura teach
`this element of claim 37. First, in their petition in IPR2017-0280 (filed the same
`day as this Petition), Petitioners basically admitted that Kikuchi does not teach this
`element:
`To the extent Kikuchi’s hot plate embodiment did not expressly teach
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`heating the hot plate to heat the wafer to an initial etch temperature, it
`would have been obvious to a skilled person to do so.
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`(Intel Corp. v. Flamm, IPR2017-0280, Paper No. 2, at 60 (Dec. 2, 2016) (emphasis
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`added).)
`During ashing using the “initial etch temperature,” the “hot plate” is not used.
`Rather, the substrate is supported by multiple pins, as Kikuchi described: “a
`plurality of pins are provided inside the vacuum treatment chamber to support the
`substrate at a distance from the heating means by supporting the rear surface of the
`substrate.” (Ex 1004 at 3:56-59.) That actually teaches away from a heated
`substrate holder.
`For the same reason that prior art cannot be combined—interdependent
`claim language—as discussed above, the two portions of 37[b] separated by the
`word “and” are each individually interdependent. Accordingly, Petitioners must
`show that each portion of the conjunctive is taught by a single prior art reference.
`This, Petitioners do not attempt to do.
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`Not only are they forced to argue that two references, Kikuchi and
`Matsumura, must be combined, but in confronting the fact that this combination is
`still deficient, they resort to unsupported conclusory contentions that the missing
`aspects of the combination would have been obvious to the skilled artisan, for
`example:
`• “Kikuchi in view of Matsumura disclosed wafer and substrate control
`systems . . . .” (Pet. at 62.)
`• “It would have been obvious to a skilled person to use Matsumura’s
`wafer stage 12 to improve Kikuchi’s tool.” (Id.)
`• “A skilled person would have included Matsumura’s stage 12 in
`Kikuchi’s tool for tighter temperature control . . . .” (Id.)
`• “It would have been obvious to a skilled person to use Matsumura’s
`programmable control circuit to control both the stage and the wafer
`temperature.” (Id. 63.)
`• “It would have been obvious to a skilled person to use Matsumura’s
`predetermined recipes and programmable control circuit in Kikuchi’s
`tool to adjust the wafer and stage to predetermined temperatures.” (Id.
`64.)
`In short, neither Kikuchi, Matsumura, nor any combination thereof teach
`each claim element 37[b].
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`VII. Ground 5
`Grounds 5 relies on the same analysis for independent claim 37 as in Ground
`4 (Pet. at 76), and should be denied for the same reasons.
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`
`VIII. Ground 6
`Preamble
`A.
`For Ground 6, Petitioners rely primarily on Moslehi to attack indepdent
`claim 37 and claims 47-48, which depend from claim 37. Moslehi, however, fails
`to make it past the preamble of claim 37, which reads: “A method of processing a
`substrate during the manufacture of a device, the method comprising.” (Pet. at 81.)
`Moslehi does not teach a method, it teaches an apparatus, specifically, as its
`informs:
`“LAMP-HEATED CHUCK FOR UNIFORM WAFER
`title
`PROCESSING.” Petitioner cites Moslehi at 1:9-15 to meet the preamble of claim
`37 (Pet. at 81), but it offers no explanation. The reason for the lack of explanation
`is clear; the cited portion of Moslehi does not teach the preamble of claim 37. The
`cited portion of Moslehi states:
`The present invention relates to microelectronic device processing and
`more particularly to a lamp-heated chuck with the ability to provide
`radio-frequency (RF) plasma enhancement for uniform semiconductor
`wafer processing that is useful in a wide range of single-wafer lamp-
`heated and RF plasma device processing applications.
`(Ex. 1010 at 1:9-15.) That is plainly not a method for processing a substrate during
`the manufacture of a device.
`B. Claim Element 37[a]
`Nor does Moslehi teach the claim element denominated by Petitioners as
`37[a], which reads: Placing a substrate having a film thereon on a substrate holder
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`within a chamber of a plasma discharge apparatus. (Pet. at 81.)
`Petitioners again cite to the above quotation from Moslehi, but it does not
`say anything about placing a substrate on a substrate holder. For that, Petitioners
`turn to Oka which, like Moslehi, teaches nothing about a process for etching,
`instead it addresses the upstream process of applying an improved resist film on a
`substrate. According to Petitioners, “[i]t would have been obvious to a skilled
`person to process Oka’s wafer using Oka’s recipe in Moslehi ‘824’s tool.” (Pet. at
`82.) This makes no sense. Claim element 37[a] calls for a wafer with a film on it,
`so either Oka does not supply this element—because it is teaching a process of
`applying the film, not a post application process—or, if petitioners are referring
`Oka’s film after processing, then it is far from obvious why anyone would use
`Oka’s recipes on a processed wafer.
`C. Claim Element 37[b]
`This element requires, inter alia, “a substrate holder temperature sensor.”
`(Pet. at 83.) The Petition cites to three passages in Moslehi—4:40-45, 6:44-50 and
`10:1-9—none of which teach a substrate holder temperature sensor.
`D. Claim Element 37[c], 37[d], 37[e], and 37[f]
`Claim element 37[c] reads: “performing a first film treatment of a first
`portion of the film at a selected first substrate temperature.” (Pet. at 87.)
`Petitioners again invoke the use of Oka’s recipe on Moslehi ‘824’s tool as
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`obvious, but offer no explanation as to why it would be obvious or what would
`motivate a skilled artisan to combine these disparate arts. It is not obvious why
`this would be obvious. Similar flaws can be found in Petitioners’ arguments with
`respect to claim elements 37[d], 37[e], and 37[f]. There is, simply, no basis to
`combine those prior art references.
`IX. There Would Be No Motivation to Combine
`Kadomura and Matsumura or Kikuchi and Matsumura
`As stated above, petitioners simply ignore their burden of proving
`motivation to combine the cited references. There are at least two good reasons
`why no motivation can be shown.
`A. There Would Be No Benefit from Such a Combination
`The primary object of Kadomura was to attain high selectivity and accuracy
`while “actually putting the low temperature etching technique into practical use.”
`(Ex. 1005 at 2:58-64.) “[T]he foregoing object can be attained,” according to
`Kadomura, by using his two step etching process, wherein the temperature of the
`specimen is changed between “the one step and the succeeding step.” (Id. at 2:65-
`3:5.) After the first step the first gas is exhausted and replaced by a second gas, in
`“a time equal with or more than the time required” to change the temperature. (Id.
`at 6:55-62.) As the skilled artisan would recognize, this is the essence of
`Kadomura’s invention. (See Ex. 1005 at 12:53-67.)
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`
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`What motivation would there be to try to incorporate Matsumura’s baking
`recipes in Kadomura? No time would be saved between the two etching steps, as
`Kadomura repeatedly teaches. (Ex. 1005 at 6:55-62, 8:43-50, 10:11-16.)
`Petitioners’ discussion of motivation (Pet. at 28-30, 39) contains a lot of words, but
`no “articulated reasoning.” The fact is, given Kadomura’s principal object and his
`solution, a skilled artisan would learn nothing from Matsumura that would be of
`any practical benefit to Kadomura.
`B. Matsumura Could Only Come Into Play Through Hindsight
`As the Board held in denying Lam Research Corp.’s petition in IPR2015-
`01766:
`A showing of obviousness must be supported by an articulated
`reasoning with rational underpinning to support a motivation to
`combine the prior art teachings. KSR Int’l Co. v. Teleflex, Inc., 550
`U.S. 398, 418 (2007) (citing In re Kahn, 441 F.3d 977, 988 (Fed. Cir.
`2006) (“[R]ejections on obviousness grounds cannot be sustained by
`mere conclusory statements; instead, there must be some articulated
`reasoning with some rational underpinning to support the legal
`conclusion of obviousness.”)). As explained in KSR, “a patent
`composed of several elements is not proved obvious merely by
`demonstrating that each of its elements was, independently, known in
`the prior art.” Id.
`(Lam Research Corp. v. Flamm, IPR2015-01766, Paper No. 7 (Feb. 24, 2016).)
`Petitioners’ attempt to rely on the solution to the problem rather than the
`problem itself, as discussed above, is impermissible hindsight. As expounded in
`the MPEP: “the examiner must step backward in time and into the shoes worn by
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`the hypothetical ‘person of ordinary skill in the art’ when the invention was
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`unknown and just before it was made.” MPEP § 2142. Obviously, at that point,
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`before the invention was made, the skilled artisan would know only the problem,
`not the solution. Therefore, Petitioners’ reliance on Matsumura’s temperature
`recipes for use in the adhesion unit and the baking unit for applying a uniform
`resist on a substrate is impermissible hindsight. The MPEP further admonishes:
`“Knowledge of applicant’s disclosure must be put aside in reaching this
`determination,” and “impermissible hindsight must be avoided and the legal
`conclusion must be reached on the basis of the facts gleaned from the prior art.”
`MPEP § 2142.
`This is precisely what petitioners are not doing. Again, the problem—just
`before the invention was made—was how to increase etching throughput while
`maintaining selectivity. The only way that adhesion and baking temperature
`recipes enter the fray is by having “[k]nowledge of applicant’s disclosure,” which
`“must be put aside in reaching this determination.”
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`X. Dependent Claims
`As shown above, Petitioners fail to show any basis to invalidate claim 37,
`which is the only independent claim challenged in this Petition. As a matter of law,
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`the petition should also be denied as to all of the claims that depend from that
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`claims. Hartness Int’l Inc. v. Simplimatic Eng. Co., 819 F.2d 1100, 1108 (Fed. Cir.
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`1987) (“A fortiori, dependent claim 3 was nonobvious (and novel) because it
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`contained all of the limitations of claim 1 plus a further limitation.”); Kimberly
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`Clark Corp. v. Johnson & Johnson, 745 F.2d 1437, 1448-49 (Fed. Cir. 1984) (“We
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`need consider no other claim because if the invention of claim 1 would not have
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`been obvious the same is true as to the remaining dependent claims.”); see also
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`MPEP § 2143.03 (“If an independent claim is nonobvious under § 103, then any
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`claim depending therefrom is nonobvious.” (citing In re Fine, 837 F.2d 1071 (Fed.
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`Cir. 1988))).
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`XI. CONCLUSION
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`For the foregoing reasons, the instant Petition should be denied.
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`Date: March 14, 2017
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`Respectfully Submitted,
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`By: /Christopher Frerking, reg. no. 42,557/
` Christopher Frerking, reg. no. 42,557
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`174 Rumford Street
`Concord, New Hampshire 03301
`Telephone: (603) 706-3127
`Email: chris@ntknet.com
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`Counsel for Daniel L. Flamm
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`CERTIFICATION OF WORD COUNT UNDER 37 C.F.R. § 42.24(d)
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`Pursuant to 37 C.F.R. 42.24(d), the undersigned hereby certifies that the
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`word count for the foregoing PATENT OWNER’S PRELIMINARY RESPONSE
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`totals 4,120, excluding the cover page, signature block, and parts exempted by 37
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`C.F.R. § 42.24(d).
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`This word count was made by using the word count function tool in
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`Microsoft Word software Version 2