`
`John Nieto - May 28, 2009
`
`Applications demanding higher system bandwidth and lower power, such as converged notebooks,
`desktop PCs, and servers, continue to drive the evolution of industry standards, including DDR3
`(double-data-rate 3), as the JEDEC (Joint Electron Device Engineering Council) Solid State
`Technology Association defines it. The latest DDR3-memory standard, JEDEC JESD79-3A, supports
`these needs and the requirements of emerging dual-core- and multicore-processor systems. DDR3,
`the latest DDR-memory-interface technology, differs from the well-established DDR2 standard in
`several areas, including data rate, operating voltage, and logic (Table 1).
`
`DDR2-memory-interface technology addresses and supports current system requirements. As
`memory requirements and technology continue to evolve, however, the standards must adapt to
`enable approaches that deliver even more functions. DDR3 offers significant advantages over
`previous DDR generations. It supports data rates as high as 1600 Mbps per pin with an operating
`voltage of 1.5V, a 17% reduction from the previous generation of DDR2, which operates at 1.8V.
`DDR3’s built-in power-conservation features, such as partial refresh, can be important in mobile-
`system applications in which battery power is not necessary just to refresh a portion of the DRAM
`not in active use. DDR3 also has a specification for an optional thermal sensor that could allow
`mobile-system engineers to save further power by providing minimum refresh cycles when the
`system is not in high-performance mode.
`
`DDR3 uses eight internal banks compared with DDR2’s four to further speed systems by allowing
`advance prefetch, which reduces access latency. This speed should become more apparent as the
`size of the DRAM increases in the future. The I/Os for DDR3 use the JEDEC standard SSTL (stub-
`series-terminated logic) 15, which employs 1.5V logic, whereas DDR2 uses JEDEC standard SSTL18,
`which uses 1.8V logic. The DDR3 architecture fully uses ODT (on-die termination), ZQ (zero-
`quotient) calibration, and a fly-by topology for improved signal integrity. With such a high demand
`for lower-power memory and cost-saving technologies, JEDEC is now defining a DDR3L (DDR3-lo-
`-voltage) node.
`Improving SI
`Because DDR3 runs at higher memory speeds, the signal integrity of signals traveling through the
`memory module becomes more important. DDR3 uses a fly-by topology instead of the T branches
`that DDR2-module designs use. Thus, the address and control lines are in a single path chaining
`from one DRAM to another, whereas DDR2’s T topology branches on the modules. Fly-by topology
`eliminates the mechanical line-balancing requirement and uses an automatic signal-time delay that
`the controller generates during memory-system training. Each DDR3 DRAM chip has an automatic
`leveling circuit for calibration and to memorize the calibration data.
`
`DDR3 implements several impedance-calibration sequences to improve signal integrity. It uses long-
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`ZQ calibration after power-up and periodically uses short-ZQ calibration during normal operation to
`compensate for voltage and temperature drift. These calibration sequences vastly improve the
`connectivity between the output driver of the DRAM and the PCB (printed-circuit-board) trace. A ZQ
`pin on the DRAM connects to an external precision resistor that adjusts the output-driver impedance
`as well as the ODT to match the trace impedance, thus reducing impedance discontinuity and
`minimizing reflection on the signals. The use of external precision resistors reduces the effect of
`variations due to process, voltage, and temperature and maintains a tight tolerance for better-
`controlled impedance values. DDR2, on the other hand, employs on-chip resistors, which can exhibit
`larger variations. The system and DRAMs also use dynamic ODT for improved signaling, especially
`for higher speeds.
`
`You can switch the ODT on and off at the DRAM and select the effective value through a network of
`pullup and pulldown resistors (Figure 1). The dynamic nature of the circuit provides optimal
`command-, address-, control-, data-, and strobe-bus termination for better signal control and
`improved margins than those that DDR2 achieves using static termination on the motherboard. To
`further improve signal integrity, DDR3 also uses its fly-by topology for command/address and clock
`signals (Figure 2). It routes the signals to the DRAMs linearly and to the edge of the card at its bus
`termination. For registered DIMMs (dual-inline-memory modules), an IC component buffers the
`command, address, control, and clocks. This approach helps reduce the number of stubs and stub
`lengths that normally would be in DDR2’s T topology; however, this approach also introduces flight-
`time skew between the clocks and data strobes at the DRAMs. You can compensate for this flight-
`time skew from the controller side on the motherboard by performing a leveling technique for
`deskew, which puts the DRAMs through a training sequence for tuning the DRAM clock.
`
`The internal core speed of the DRAM basically remains unchanged in the transition from DDR2 to
`DDR3. DDR2 currently has a maximum bandwidth of 800 Mbps per pin but can extend to 1066
`Mbps. To meet bandwidths as high as 1600 Mbps, DDR3 uses an 8-bit prefetch rather than the 4-bit
`prefetch that DDR2 uses. As a result, for every read or write operation, the technology accesses 8
`bits in the DRAM core.
`
`Registered DIMMs from previous generations, DDR and DDR2, exhibit excellent performance for
`systems that require higher bandwidths and better throughput efficiency. DDR2 employs at least one
`register and a PLL instead of two separate components; DDR3 employs a single monolithic-IC chip,
`which integrates the register and PLL. This integrated part features programmable-drive strength,
`input-bus termination, and output inversion, effectively reducing SSO (simultaneous-switchin-
`-output) noise. For power savings, the device includes output inversion, the ability to float the
`outputs, and the ability to power down the chips using input logic states. Another power-saving
`technique comes from programming the output drivers’ impedance. Enhanced termination
`techniques and impedance matching vastly improve the signal integrity of the data eye using an
`integrated device, which in turn increases the margin in the timing budget.
`
`Using the optimal termination value, driver impedance, and output inversion, the postregister data
`eye exhibits a wider opening with minimal ring-back (Figure 3). The preregister also exhibits similar
`data-eye quality if it receives sufficient setup-and-hold time from the controller to prevent any bit
`errors. The register-PLL component uses on-die termination to maximize throughput efficiency and
`achieve higher speeds without redesigning or doing any extensive modifications to the system.
`Programming capability
`The memory controller sends commands to the memory that force it into a mode of operation. The
`states of CS (chip-select), RAS (row-address select), CAS (column-address select), and WE (write
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`enable) define the commands. The MRS (mode-register-set) command is one of the first in system
`initialization. It allows programming of the configuration registers in the DRAM for various
`functions, features, and modes, making the memory module flexible for applications. The
`configuration registers are at their default values at power-up and programmed accordingly for
`proper operation.
`
`The MRS command is present in both DDR2- and DDR3-DIMM applications. In DDR3-registered
`DIMMs, however, the register-IC chip, or register, which you can also program, can decode the
`command and switch to a different timing mode by driving the received data for three clock cycles
`instead of the conventional one. In normal operation, the system intentionally inverts half of the
`address bus on the postregister to prevent SSO noise (Figure 4).
`
`An MRS command disables address inversion to allow correct access to the DRAMs, consequently
`increasing the propagation delay due to SSO noise. To account for SSO effects, the timing through
`the register automatically switches to driving the data for three clock cycles (Figure 5). This mode
`was not present in DDR2-registered-DIMM applications because the registers for DDR2 are strictly
`buffers without any programmability and decoding logic. You can program the register and the
`DRAMs for various functions, features, and modes. The JEDEC DDR3 register-specification
`document provides register mapping.
`Increasing memory capacity
`With data centers needing more capacity, space is at a premium. Few options are available for
`maximizing space. One is the usage of more blade servers, which would require internal peripherals
`to change to perhaps a smaller form factor, such as hard disks, memory, or I/O cards. JEDEC in 2005
`established a VLP (very-low-profile) standard for smaller-form-factor DIMMs. As blade servers
`become more common, so will the VLP DIMMs, and the technology promises to become more of a
`presence as users begin to adopt DDR3-memory technology. The VLP DIMMs are essentially the
`same as the standard DIMMs but at 60% of the height (Figure 6). The height reduction improves
`airflow in the system, thus improving cooling. Other applications needing VLP DIMMs are ATCA
`(Advanced Telecommunications Computing Architecture), Micro ATCA for the telecommunications
`market, and embedded single-board computers. Other small form factors for DIMMs are SODIMM
`(small-outline DIMM) and mini-DIMM.
`
`Standard and VLP DIMMs have various densities and ranks. DIMMs are typically 64- or 72-bit-wide
`words. A rank is an identical arrangement of memory banks on a module. The following equation
`shows how to determine the DIMM’s total memory density: DRAM density/8×bus width/DRAM
`width×no. of ranks=total density. The configuration and density of the component determine the
`number of ranks on a module. For example, two ranks of 512-Mbit DRAMs with 4-bit-wide data on a
`module with a 64-bit-wide bus would be 512 Mbits/8×64/4×2=2 Gbytes.
`
`Read more In-Depth
`Technical Features
`
`The most common ranks are single and double, but the total number of possible ranks is four. The
`quad-rank module is relatively new to DDR DIMMS, and until recently, memory controllers did not
`support it. Due to the ever-increasing demand for higher-density DIMMs, however, today’s CPUs
`support quad-rank modules. In a relatively mature DDR2-memory market, JEDEC has defined and
`standardized only two quad-rank DIMMs, and two more are in development. In contrast, in an
`emerging DDR3-memory market, six quad-rank modules are in development.
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`A JEDEC-standard memory module in a planarity configuration has a maximum of 36 DRAM chips.
`DRAM and module vendors have developed several stacking technologies to further increase
`memory capacity on any memory module, however. One stacking technology is the use of a PCB or
`flex-circuit interposer to stack BGA (ball-grid-array) or TSOP (thin small-outline package) DRAM
`(Figure 7). For improved manufacturing reliability, die-stack packages are other alternatives to
`stacking DRAMs. This technology allows you to place two or four die in one chip package. A couple
`of die-stack-packaging technologies use a window chip-scaled package with an interposer (Figure 8).
`In this approach, both die face in opposite directions, or you wire-bond both die in the same
`direction. In theory, a quad-die chip would maximize the number of DRAM die from 36 to 144 on a
`DIMM. However, due to electrical limitations, the maximum number achievable is now 72.
`
`Two registered DIMMs implement dual- and quad-rank modules with dual-die stacked DRAMs
`(Figure 9). The dual-rank module requires only two chip-select signals, whereas the quad-rank
`module requires four, one for each rank. The implementation of quad-die-stacked DRAMs on
`modules will be commonplace as higher-density modules and smaller-form-factor modules, such as
`VLP-registered DIMMs, SO-DIMMs, and mini-DIMMs, become more mainstream.
`Low-power DDR technology
`As data centers and server farms increase their capacity to meet higher bandwidth demand and
`increasing DDR-memory-interface data rates—and as companies grapple with rising energy
`costs—overall power consumption becomes more of a concern. The importance of energy saving is
`beginning to take precedence. The DDR market is currently addressing the need for low-power, cost-
`saving approaches. The DDR2 technology operates at 1.8V, which is approximately a 17% increase
`from DDR3, but companies are pushing for reducing that node to 1.55V. A similar trend is beginning
`to develop in DDR3 in which the original standard operating voltage is 1.5V but is decreasing to the
`1.35V operating-voltage node, which is another 10% reduction.
`
`Figure 10 shows a linear downward trend of the operating voltage for the DDR technology. Going
`from 1.8 to 1.35V yields a 25% reduction in power per DIMM alone, with some servers supporting as
`many as 18 DIMMs. This reduction is significant not only in the core of the memory and logic chips
`of the DIMMs, but also in the I/Os of both, which consume most of the power. As the operating
`voltage scales down, so will the memory-interface technology. Manufacturers are studying other
`areas of memory-interface technology for power reduction. These areas include implementing
`special power-down features and modes when the system is idling.
`
`From mobile-system applications to notebooks to enterprise servers, a constant demand exists for
`higher bandwidth, lower power, and improved throughput efficiency. The industry is examining all
`aspects of the DDR-memory-interface technology to meet the needs and demands. The onus is on the
`DDR-chip vendors to adapt and provide IC chips for DDR DRAMs, registers, and PLLs with improved
`signal performance. JEDEC has defined innovative methods to improve signal integrity from one
`generation of DDR to the next to facilitate memory-driven-application requirements. It is clear that
`DDR3 memory is addressing the need for higher-density modules with lower power and more
`efficient throughput.
`
`References
`
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`1. DDR2 SDRAM Specification, JEDEC JESD79-2E, JEDEC Solid State Technology Association, April
`2008.
`2. DDR3 SDRAM Specification, JEDEC JESD79-3B, JEDEC Solid State Technology Association,
`September 2007.
`3. DDR3 Register Specification, JEDEC Standard, October 2008.
`4. Hao, Liu, Lim Beng Kuan, Desmond YR Chong, Palei Win, and Tan Hien Boon, “Stacked Die
`Technology Solutions for wCSP Memory Packages,” European Microelectronics Packaging
`Conference, June 12 through 15, 2005.
`5. Mahajan, Raj, “Memory Design Considerations when Migrating to DDR3 Interfaces from DDR2,”
`DesignCon 2007.
`6. “Very Low Profile (VLP) DDR2: Reviewing the Design Overview and Examining Applications,”
`Super Talent Technology Inc.
`7. “Stakpak BGA & TSOP DRAM Stacking,” Entorian Technologies.
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`Table 1 DDR3 veRsus DDR2
`DDR2
`400 to 800
`
`DDR3/DDR3l
`800 to 1600
`
`Rated speed
`(Mbps)
`Drain-to-drain
`voltage/supply
`voltage (V)
`Internal banks
`
`Termination
`
`Topology
`
`Driver
`
`Thermal
`
`1.860.1
`
`Four
`
`Limited
`
`1.560.075 (DDR3)/
`1.3510.1/10.7 (DDR3L)
`
`Eight
`
`All DQ signals
`
`Conventional T
`
`Fly-by
`
`OCD calibration
`
`Self-calibration with ZQ
`
`No
`
`Optional
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`CIRCUITRY
`
`S1
`
`RTT
`
`RTT
`
`S1
`
`VDD
`
`VSS
`
`Figure 1 You can switch the on-die termination and select the
`effective value through a pullup/pulldown-resistor network.
`
`EDN090514MS4317FIG1 MIKE
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`Figure 2 The DDR3 fly-by topology finds use in command/
`address and clock signals to improve signal integrity.
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`Figure 3 With the optimal termination value, driver impedance,
`and output inversion enabled, the postregister DDR3 data-eye
`plot exhibits a wider opening with minimal ring-back.
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`Figure 4 Normal operation inverts half of the address bus on the postregister to prevent simulta-
`neous-switching-output noise.
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`Figure 5 During an MRS command, the timing through the register automatically switches to
`driving the data for three clock cycles to account for the simultaneous-switching-output effect.
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`Figure 6 The very-low-profile DIMMs are essentially the same as
`the standard DIMMs but at 60% of the height.
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`(a)
`
`(b)
`
`Figure 7 You can use a flex circuit and a PCB interposer to stack
`BGA (a) or TSOP (b) DRAM.
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`(a)
`
`(b)
`Figure 8 One version of die-stack-packaging technology has an interposer (a); another
`version does not (b).
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`(a)
`
`(b)
`
`Figure 9 The dual-rank module requires only two chip-select signals (a), whereas quad-rank-
`registered DIMMs with stacked dual-die DRAM require four (b).
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`
`VDD
`(V)
`
`1.9
`1.8
`1.7
`1.6
`1.5
`1.4
`1.3
`1.2
`1.1
`1
`
`DDR2
`
`DDR3
`DDR2
` TECHNOLOGY
`
`DDR3
`
`Figure 10 DDR3 uses 25% less power per DIMM than does
`DDR2.
`
`EDN090514MS4317FIG10 MIKE
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