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UNITED STATES PATENT AND TRADEMARK OFFICE
`
`DEPAWIWIENT OF COMMERCE
`UNITED STAT
`United State: Ffitont and Trademark Offlnu
`Addx-nu: coM:M1s_a1oNER OF PATENTS AND TRADEMARKS
`Wanhingwn, no. 20231
`www.\nIm¢.gov
`
`APPLICATION NO.
`
`FILING DATE
`
`FIRST NAMED INVENTOR
`
`ATTORNEY I OCKET NO.
`
`CONFIRMATION NO.
`
`09/540,610
`
`03/31/2000
`09fI l/2002
`
`7590
`
`Blakely Sokoloff Taylor & Zafman
`12400 Wilshire Boulevard
`Seventh Floor
`Los Angeles, CA 90025
`
`James E. Nulty
`
`I6820.P097
`
`2l7I
`
`EXAMINER
`
`CHU’ CHRIS C
`
`2315
`DATE MAILED: 09/I I/2002
`
`I .
`$
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`Please find below and/or attached an Office communication concerning this application or proceeding.
`
`PTO-90C (Rev. 07-01)
`
`INTEL 1115
`
`

`

`Office Action Summary
`
`'
`
`
`
`
` Application No. . pplicantls)
`09/540.610
`NULTY ET AL.
`
`
`Examiner
`Art Unit
`2815
`Chris C. Chu
`
`
`-- The MAILING DA TE of this communication appears on the cover sheet with the correspondence address --
`Period for Reply
`A SHORTENED STATUTORY PERIOD FOR REPLY IS SET TO EXPIRE 1 MONTH(S) FROM
`THE MAILING DATE OF THIS COMMUNICATION.
`In no event. however. may a reply be timety filed
`Extensions of time may be available under the provisions ot 37 CFR 1.136(a).
`alter SIX (6) MONTHS from the mailing date of this communication.
`If the period for reply specified above is less than thirty (30) days, a reply within the statutory minimum of thirty (30) days will be considered timely.
`-
`it No period for reply is specified above, the maximum statutory period will apply and will expire SIX (6) MONTHS from the mailing date of this communication.
`—
`- Failure to reply within the set or extended period for reply will, by statute. cause the application to become ABANDONED (35 U.S.C. § 133).
`- Any reply received by the Office later than three months after the mailing date of this communication, even it timely filed, may reduce any
`earned patent term adjustment. See 37 CFR 1.704(b).
`Status
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`1) Responsive to communication(s) filed on 20 May 2002 .
`
`2a)El This action is FINAL.
`
`2b)lZ This action is non-final.
`
`3)l]
`
`Since this application is in condition for allowance except for formal matters, prosecution as to the merits is
`closed in accordance with the practice under Ex parte Quayle, 1935 C.D. 11, 453 O.G. 213.
`Disposition of Claims
`‘
`
`4) Claim(s) _2§-_.3‘9is/are pending in the application.
`4a) Of the above claimls) __ is/are withdrawn from consideration.
`
`5)l:l Claim(s) __ islare allowed.
`
`6) Claim(s) 2_5;39 islare rejected.
`
`7)l:I Claim(s) __ is/are objected to.
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`8)|:] Claim(s)
`Application Papers
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`are subject to restriction andlor election requirement.
`
`9)l:] The specification is objected to by the Examiner.
`
`10)l:l The drawing(s) filed on ____ is/are: a)l:l accepted or b)D objected to by the Examiner,
`Applicant may not request that any objection to the drawing(s) be held in abeyance. See 37 CFR 1.85(a).
`
`11)l:] The proposed drawing correction filed on __ is: a)l:] approved b)D disapproved by the Examiner.
`If approved. corrected drawings are required in reply to this Office action.
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`12)|:l The oath or declaration is objected to by the Examiner.
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`Priority under 35 u.s.c. §§ 119 and 120
`
`13)l:l Acknowledgment is made of a claim for foreign priority under 35 U.S.C. § 119(a)-(d) or (f).
`a)|:] All b)l:] Some ' c)l:I' None of:
`
`1.[:j Certified copies of the priority documents have been received.
`
`2.l:] Certified copies of the priority documents have been received in Application No. __
`
`3.C| Copies of the certified copies of the priority documents have been received in this National Stage
`application from the International Bureau (PCT Rule 17.2(a)).
`* See the attached detailed Office action for a list of the certified copies not received.
`
`14)[j Acknowledgment is made of a claim for domestic priority under 35 U.S.C. § 119(e) (to a provisional application).
`a) CI The translation of the foreign language provisional application has been received.
`15)® Acknowledgment is made of a claim for domestic priority under 35 U.S.C. §§ 120 and/or 121.
`Attachment(s)
`
`4) D Interview Summary (PTO-413) Paper No(s).
`5) El Notice of Informal Patentfitpplication (PTO-152)
`6) Cl Other:
`
`.
`
`.
`
`
`1) E Notice of References Cited (PTO—a92)
`2) E] Notice of Draftsparson's Patent Drawing Review (PTO-948)
`
`3) E] lnfomtalion Disclosure Statement(s) (PTO-1449) Paper No(s)
`USA Patent and Trademark Office
`PTO-325 (Rev. 04-01)
`
`Office Action Summary
`
`Part of Paper No. 13
`
`
`
`

`

`
`
`A--...-..m.«.-:‘
`
`I Application/Control Number: 09/540,610
`Art Unit: 2815
`
`Page 2
`
`DETAILED ACTION
`
`Response to Amendment
`
`1.
`
`Applicant’s amendment filed on May 20, 2002 has been received and entered in this
`
`office action.
`
`Claim Rejections — 35 USC § 103
`
`2.
`
`The following is a quotation of 35 U.S.C. 103(a) which forms the basis for all
`
`obviousness rejections set forth in this Office action:
`
`(a) A patent may not be obtained though the invention is not identically disclosed or described as set forth in
`section 102 of this title, if the differences between the subject matter sought to be patented and the prior art are
`such that the subject matter as a whole would have been obvious at the time the invention was made to a person
`having ordinary skill in the art to which said subject matter pertains.i Patentability shall not be negatived by the
`manner in which the invention was made.
`
`3.
`
`Claims 25 and 27 ~ 39 are rejected under 35 U.S.C. 103(a) as being unpatentable over
`
`' Dennison et al. in view of Figura et al.
`
`Regarding claim 25, Dennison et al. discloses in column 3, line 35 the etch stop material
`
`(20) being silicon nitride.
`
`Regarding claim 27, Dennison et al. discloses in Fig. 2 a structure (10), comprising:
`
`-
`
`-
`
`-
`
`a conductive layer (12 and column 3, lines 29 ~ 33) disposed over a substrate;
`
`a first insulating layer (18) on the conductive layer;
`
`a Contact region (the area of 34) in the first insulating layer;
`
`

`

`TM”,
`
`' Application/Control Number: 09/540,610
`Art Unit: 2815
`
`Page 3
`
`-
`
`-
`
`at least one insulating spacer (18) in the contact region adjacent to the first insulating
`
`layer (see Fig. 2); and
`
`an etch stop material (20 and column 3, line 35) over the first insulating layer and
`
`adjacent to the insulating spacer (see Fig. 2).
`
`Dennison et al. does not disclose the etch stop material being a different material from the
`
`insulating spacer. However, Figura et al. discloses in Fig. 1 an etch stop material (column 4, lines
`
`51 and 52) being a different material from the insulating spacer (column 4, lines 11 and 12).
`
`Thus, it would have been obvious to one of ordinary skill in the art at the time when the
`
`invention was made to modify Dennison et al. by using different materials for the etch stop
`
`material and the insulating spacer as taught by Figura et al. The ordinary artisan would have been
`
`motivated to modify Dennison et al. in the manner described above for at least the purpose of
`
`minimizing current leakage and short circuits (column 2, lines 36 ~ 38).
`
`Regarding claim 28, Dennison et al. discloses in Fig. 2 the insulating spacer (18) having a
`
`substantially rectangular profile in the contact region (see Fig. 2).
`
`Regarding claims 29 and 36, Dennison et al. discloses in Fig. 2 the insulating spacer (18)
`
`having a surface portion in the contact region without overlying etch stop material (see Fig. 2).
`
`Regarding claims 30 and 37, Dennison et al. discloses in Fig. 2 the insulating spacer (18)
`
`surface portion without overlying etch stop material comprising an insulating spacer surface
`
`portion most distant from the substrate (see Fig. 2).
`
`Regarding claim 31, Dennison et al. discloses in Fig. 2 the insulating spacer (18) having a
`
`surface portion in the contact region without overlying etch stop material (see Fig. 2).
`
`

`

`i Application/Control Number: O9/540,610
`Art Unit: 2815
`
`Page 4
`
`Regarding claims 32 and 38, Dennison et al. discloses in Fig. 2 a structure (10), further
`
`comprising a second insulating layer (28) on the etch stop layer and over the conductive layer
`
`(see Fig. 2).
`
`Regarding claims 33 and 39, Dennison et al. discloses in Fig. 2A a structure (10), further
`
`comprising a second conductive material (40) in the contact region (see Fig. 2A).
`
`Regarding claim 34, Dennison et al. discloses in Fig. 2 a structure, comprising the step
`
`of:
`
`a first electrically conductive material (24) formed in and/or on a surface of a
`
`substrate;
`
`a contact opening (the area of 34) in a region adjacent to a second electrically
`
`conductive material (the area of 40 in Fig. 2A) formed on the substrate;
`
`an electrically insulative spacer (18) in the contact opening adjacent to the second
`
`electrically conductive material (see Fig. 2);
`
`an etch stop material (20) over the electrically insulative spacer and the first and
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`second electrically conductive materials (see Fig. 2);
`
`a blanket layer (28) over the etch stop material; and
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`an opening through a first part of the etch stop material to the first electrically
`
`conductive material (see Fig. 2).
`
`Dennison et al. does not disclose the etch stop material being a different material from the
`
`insulating spacer. However, Figura et al. discloses in Fig. 1 an etch stop material (column 4, lines
`
`51 and 52) being a different material from the insulating spacer (column 4, lines 11 and 12).
`
`‘ Thus, it would have been obvious to one of ordinaryiskill in the art at the time when the
`
`

`

`iIc
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`
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`F .
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`s,_‘_,
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`‘ Application/Control Number: 09/540,610
`Art Unit: 2815
`
`Page 5
`
`invention was made to modify Dennison et al. by using different materials for the etch stop
`
`material and the insulating spacer as taught by Figura et al. The ordinary artisan would have been
`
`motivated to modify Dennison et al. in the manner described above for at least the purpose of
`
`minimizing current leakage and short circuits (column 2, lines 36 ~ 38).
`
`Regarding claim 35, Dennison et al. discloses in Fig. 2 the electrically insulative spacer
`
`(18) having a substantially rectangular cross-sectional shape in a plane that is substantially
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`perpendicular to the substrate surface (see Fig. 2).
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`4.
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`Claim 26 is rejected under 35 U.S.C. 103(a) as being unpatentable over Dennison et al.
`
`and Figura et al. as applied to claim 27 above, and further in view of Gonzalez.
`
`Dennison et al. and Figura et al. disclose the claimed invention except the etch stop
`
`material being silicon dioxide. However, Gonzalez discloses an etch stop material being silicon
`
`dioxide (31 in Fig. 18). Thus, it would have been obvious to one of ordinary skill in the art at the
`
`time when the invention was made to further modify Dennison et al. by using silicon dioxide for
`
`the etch stop material as taught by Gonzalez. The ordinary artisan would have been motivated to
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`further modify Dennison et al. in the manner described above for at least the purpose of
`
`preventing diffusion of element between layers.
`
`Response to Arguments
`
`5.
`
`Applicant's arguments with respect to claims 25 ~ 27 and 34 have been considered but
`
`are moot in view of the new ground(s) of rejection.
`
`

`

`Application/Control Number: 09/540,610
`Art Unit: 2815
`
`Page 6
`
`Conclusion
`
`6.
`
`The prior art made of record and not relied upon is considered pertinent to applicant's
`
`disclosure.
`
`Any inquiry concerning this communication or earlier communications from the
`
`examiner should be directed to Chris C. Chu whose telephone number is (703) 305-6194. The
`
`examiner can normally be reached on M-F (10:30 - 7:00).
`
`If attempts to reach the examiner by telephone are unsuccessful, the examiner’s
`
`supervisor, Eddie C. Lee can be reached on (703) 308-1690. The fax phone numbers for the
`
`organization where this application or proceeding is assigned are (703) 308-7382 for regular
`
`communications and (703) 308-7722 for After Final communications.
`
`Any inquiry of a general nature or relating to the status of this application or proceeding
`
`should be directed to the receptionist whose telephone number is (703) 308-0956.
`
`c.c.
`
`August 14, 2002
`
`Chris C. Chu
`Examiner
`Art Unit 2815
`
`/
`
`GEORGE c. EcKEfiT 1!
`i‘*A"!'l-i-';!\i'l' $.EmM!NEP!
`
`

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