(12) United States Patent
`Chang et al.
`
`(10) Patent N0.:
`(45) Date of Patent:
`
`US 6,891,803 B1
`May 10, 2005
`
`US006891803B1
`
`(54) TELECOMMUNICATIONS TRANSMISSION
`TEST SET
`
`EP
`EP
`
`053 561 A2
`6/1982
`532 346 A2
`3/1993
`OTHER PUBLICATIONS
`
`(75) Inventors: Paul Chang, Fremont, CA (US); Torn
`Dang, San Jose, CA (Us); Chi Lin
`Wu, San Jose, CA (Us)
`
`( * ) Notice
`.
`
`(73) Assigneet Sunrise TeleCOm, IIIQ, San 1056, CA
`(Us)
`f h,
`h
`d, 1 _
`Sub,
`Ject to any 1sc a1mer,~t e term 0 t is
`Patent 15 extended or adlusted under 35
`U.S.C. 154(b) by 0 days.
`(21) Appl NO _ 09/215 421
`'
`"
`’
`(22) Filed:
`Dec. 18, 1998
`
`(51) Int. c1.7 .............................................. .. H04L 12/66
`
`(52) US. Cl. ..................... .. 370/252; 370/248; 370/251;
`370/247; 379/21; 379/1001; 348/192; 714/715
`
`(58) Field of Search .............................. .. 379/21, 10.01,
`379/22.04, 26.01, 26.02, 26.03; 370/245,
`248, 249, 503, 252, 251, 250, 247; 324/512,
`520, 521, 527, 528, 534, 535, 532; 348/192;
`714/715
`
`(56)
`
`.
`References Clted
`U.S. PATENT DOCUMENTS
`_
`Eff 6e: :11"
`8/1985 Jablway et aL
`3/1987 Currier’ 1L
`6/1989 Butler et a1,
`6/1989 Hagedorn
`(Continued)
`
`2
`4:536:703 A
`4,651,298 A
`4,837,811 A
`4,843,620 A
`
`DE
`DE
`DE
`DE
`DE
`DE
`
`FOREIGN PATENT DOCUMENTS
`3116079 A1 11/1982
`3743446 A1
`7/1989
`3912230 C1 10/1990
`3933222 A1
`4/1991
`4025417 A1
`2/1992
`19509690 A1
`9/1996
`
`Disclosure Statement on behalf of Assignee Sunrise Tele
`com, Inc., With attached Declaration of Robert King, Vice
`President—North American Sales, Sunrise Telecom, Inc.
`Declaration of Paul Marshall, Chief Operating Of?cer, Vice
`President of Marketing and Acting Chief Finanical Of?cer of
`Sunrise Telecom Incorporated, San Jose, CA, dated Mar. 3,
`2004, pp‘ 1_3, With Exhibits A, B and 0
`Specialized Products Company, 1994 Spring Catalog, pp.
`152, 1659169‘
`ItroniX Brochure, “T5000 EFP handheld Mobile Worksta
`tion,” undated.
`“Testing ATM Interoperability—HP Solution Note”,
`5965—9334E Jun. 1997 Rev. A, 1997 ATM/Broadband Test
`ing Seminar, Hewlett—Packard Company
`
`(Commued)
`Primary Ex?min@r—W@11ingt0n Chin
`Assistant Examiner—Chuong Ho
`(74) Attorney, Agent, or Firm—ToWnsend and Townsend
`and CreW LLP
`
`ABSTRACT
`(57)
`A test set includes at least one signal input port, a test
`circuitr , a rocessor, a user-in ut device, and a dis la . The
`test cirduitrg couples to and recIeives signals from all a§tl least
`one signal input port. The test circuitry then generates test
`data corresponding to the received signals. The processor
`couples to and receives test data from the test circuitry and
`generates test results. The processor also couples to and
`receives commands from the user-input device. The proces
`sor further operatively couples to the graphical display that
`receives and displays the test results from the processor. In
`one embodiment, the test set is capable of performing line
`quali?cation and connectivity testing. A modem module can
`be used to facilitate connectivity testing. The modem mod
`ule can be a plug-in module With a common interface to the
`test set. The modem module can also contain a ?ngerprint
`value that identi?es the module type and the softWare
`revision number to the test set.
`
`20 Claims, 17 Drawing Sheets
`
`.
`
`412
`
`/
`
`MEMORY
`
`330
`r’
`
`.
`
`DATA/ADDRESS BUS
`
`410
`"
`
`430
`”
`
`420
`I] SERIAL BUS
`
`PROCESSOR ‘
`
`436
`/
`
`TEST SET
`
`A
`
`L
`
`
`
`\ , ____ Y
`
`.92
`
`212254
`
`FINGER
`‘ Cw?”
`
`=
`
`TEST
`CIRCUIT
`
`4
`
`POWER
`SUPPLY
`
`CSCO-1012
`Cisco v. TQ Delta
`Page 1 of 28
`
`

`
`US 6,891,803 B1
`Page 2
`
`US. PATENT DOCUMENTS
`
`4,887,260 A 12/1989 Carden @191-
`4,894,829 A
`1/1990 Monie 9191-
`4,922,516 A
`5/1990 Butler et 81.
`4,996,695 A
`2/1991 Back 9191-
`5,121,342 A
`6/1992 Szymborski et al.
`5,173,896 A 12/1992 Dariano
`5,227,988 A
`7/1993 Sasaki et al.
`5,251,150 A 10/1993 Ladner et 81.
`5,331,136 A
`7/1994 Koenck
`5,363,366 A 11/1994 Wisdom et al. ........... .. 370/245
`5,377,128 A 12/1994 McBean
`5,377,196 A 12/1994 Godlew er 91-
`5377259 A 12/1994 Butler 9191-
`5,381,348 A
`1/1995 Ernst et al. ............... .. 324/533
`5,382,910 A
`1/1995 Walsh ...................... .. 324/532
`5432705 A
`7/1995 Seven 91 91-
`5,511,108 A
`4/1996 Seven 91 91-
`5,521,958 A
`5/1996 Selig et al.
`5,528,660 A
`6/1996 Heins et 81.
`5,530,367 A
`6/1996 Bottman ................... .. 324/520
`5,533,093 A
`7/1996 Horton etal.
`5,557,539 A
`9/1996 Fitch
`5,566,088 A 10/1996 Herscher et al.
`5567925 A 10/1996 Km’znckFt a1‘
`5,583,912 A 12/1996 Schillaci et al.
`5,602,750 A
`2/1997 Seven et a1‘
`5,608,644 A
`3/1997 Debacker
`5,619,489 A
`4/1997 Chang et al. ............. .. 370/241
`5,644,573 A
`7/1997 Bingham et 81.
`5,715,437 A
`2/1998 Baker et al.
`5,757,680 A
`5/1998 Boston et al.
`
`8/1998 Morys
`5,790,432 A
`9/1998 Zhan et al.
`5,805,571 A
`9/1998 SeaholtZ et 211.
`5,812,786 A
`5,847,749 A 12/1998 Proctor et 211.
`5,850,209 A 12/1998 Lemke et aL
`5,864,662 A
`1/1999 Brownmiller et 211.
`5,884,202 A
`3/1999 Aljomand
`5,892,458 A
`4/1999 Anderer et 211.
`5916287 A
`6/1999 Aljomand et a1_
`5,920,608 A
`7/1999 Minegishi
`5,946,641 A
`8/1999 MoryS
`5956385 A
`9/1999 Soto et aL
`5,982,851 A * 11/1999 Kennedy etal. ............ .. 379/21
`6,002,671 A * 12/1999 Kahkoska et al. ........ .. 348/192
`6,038,520 A
`3/2000 Schoonover et 211.
`6,064,721 A * 5/2000 Mohammadian et a1'
`6,385,300 B1
`5/2002 Mohammadian et a1_
`6,590,963 B2
`7/2003 Mohammadian et 211.
`2003/0174813 A1
`9/2003 Mohammadian et 211.
`
`379/21
`
`OTHER PUBLICATIONS
`
`“Traveling Wave Fault Location in Power Transmission
`Systems”, Application Note 1285, HeWlett—Packard Com
`pany, Feb 1977, 5965_5296E_
`“Accurate Transmission Line Fault Location Using Syn
`.
`.
`,,
`.
`.
`chromZed
`Sampling ,
`Application
`Note
`1276—1,
`HeWlett—Packard Company, 1996, 5964—6640E.
`“Time Domain Re?ectometry Theory”, Application Note
`1304—2, HeWlett—Packard Company, 1998, 5966—4855E.
`
`* cited by examiner
`
`Page 2 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 1 0f 17
`
`US 6,891,803 B1
`
`
`
`
`
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`Page 3 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 2 0f 17
`
`US 6,891,803 B1
`
`200
`
`K
`
`3
`
`212
`
`'r—_.-———
`
`—
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`
`Q FRAME Q AIS
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`O Q XDSL Q XTU-C Q XTU-R
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`Q SIGNAL Q LP 1 SYNCQ LP 2 SYNC {:1 (:1
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`Q HOLD Q RxTONE Q PAT SYNC [:3 1:,
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`DISTANCE: [E
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`
`_ 214i %/
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`\-F1-/=F2—J=F3—/~F4—J
`SUNRISE TELECOM
`
`F1
`
`I
`
`F4
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`xDSL
`TDR
`LINE
`DMM
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`35825 LIGHT HOLD ERR lNJ
`l
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`[>
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`216
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`POWER ESCAPE v ENTER
`I
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`
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`FIG. 2
`
`4
`J
`
`Page 4 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`71f03t6ehS
`
`US 6,891,803 B1
`
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`Page 5 of 28
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`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 4 0f 17
`
`US 6,891,803 B1
`
`Page 6 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 5 0f 17
`
`US 6,891,803 B1
`
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`
`Page 7 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 6 of 17
`
`US 6,891,803 B1
`
`Q8
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`mm<n_>>o._
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`
`Page 8 of 28
`
`

`
`U.S. Patent
`
`50020:1YaM
`
`Sheet 7 of 17
`
`US 6,891,803 B1
`
`3.
`
`>mo_>m__2
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`
`Page 9 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 8 0f 17
`
`US 6,891,803 B1
`
`452
`/
`
`A, B, N
`
`FIG. 4B
`
`462a 462b
`/ /
`
`462n
`/
`
`A B-“N
`
`FIG. 4C
`
`Page 10 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 9 0f 17
`
`US 6,891,803 B1
`
`xDSL
`
`,510
`[512
`,514
`
`TEST CONFIGURATION
`VIEW SPAN STATUS
`VIEW PERFORMANCE DATA
`T1 OR E1 BASIC MEASUREMENTS
`LOOP BACK CONTROL
`HD
`SL SYSTEM SETTINGS
`ADSL
`SETUP
`MODEM STATUS
`GENERAL STATUS
`BIT GRAPHICFI'ABLE
`CARRIER MASK
`CLOSE LINK
`OPEN LINK
`ATU MODULE SELF TEST
`LIN
`K MEASUREMENTS
`PING
`
`/516
`
`DMM
`DCV
`ACV
`OHM
`CAP
`LOAD COIL DETECTOR
`TDR
`LINE
`MASTER OR SLAVE
`INSERTION LOSS
`SIGNAL TO NOISE
`BACKGROUND NOISE
`LOOP RESISTANCE
`STORE/RECALL
`OTHER
`DEFAULT SETTINGS
`TEST PARAMETERS
`GENERAL CONFIG
`ERASE NV RAM
`VERSION/OPTION
`
`I520
`
`,522
`
`FIG. 5
`
`Page 11 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 10 0f 17
`
`US 6,891,803 B1
`
`PAIR UNDER TEST
`
`610
`
`FIG. 6A
`
`PAIR UNDER TEST
`
`720
`
`MASTER UNIT
`
`SLAVE UNIT
`
`FIG. 7
`
`Page 12 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 11 0f 17
`
`US 6,891,803 B1
`
`638
`\
`
`630
`\..N
`l 1234567B901234567890123456789012
`12 =30 =55 l
`2
`2 DISTANCE:
`[555%
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`
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`
`FIG. 6C
`
`Page 13 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 12 0f 17
`
`US 6,891,803 B1
`
`2 1
`
`O 3
`
`5 5
`
`810
`
`1 2 3 4 6 7 8 9 0 1 2 3 4. 5 6
`
`12345678901234567890123456789012 1234.1567890123456
`12345678901234567890123456789012 12.545670090123456
`12345678901234.56 12345678901234567890123456789012
`
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`123456789012345678901234567 89012
`
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`% 13m: 2 m m HGZOHW M S
`
`zzz T
`
`FIG. 8B
`
`Page 14 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 13 of 17
`
`US 6,891,803 B1
`
`12345678901234567890123456789012
`12:30:55
`Connected<
`>Comp1ete
`INSERTION LOSS
`Tone 1924 168 kHz..
`-30 dB
`Tone 193: 772 kHz
`-31 dB
`
`RESTART
`TABLE
`1234567890l234567890123456789012
`
`FIG. 8C
`
`830
`
`x.‘
`
`01U'|IhU)l0l-'(3$Dm\lO\lJI’|huJhJH
`
`350
`
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`
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`
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`
`1234567890l2345678901234567890l2
`12:30:55
`Connected<
`INSERTION LOSS
`I
`I
`kHz
`94
`98
`102
`106
`110
`114
`118
`122
`126
`130
`134
`
`U'IO'\U10\U"lO\U10\U"|O\U|g
`
`lOm03(X1\Imm\lO'\\I\‘lg'
`
`kHz
`10
`14
`18
`22
`26
`30
`34
`38
`40
`42
`46
`
`U10\U'IO1U'|O1U'|O\U'|U\U1
`
`>Comp1ete
`RESULTS —
`-dB kHz
`50
`54
`58
`62
`66
`70
`74
`78
`82
`86
`90
`RESTART
`GRAPH
`PG—DN
`1234567890l234567890123456789012
`
`FIG. 8D
`
`Page 15 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 14 of 17
`
`US 6,891,803 B1
`
`1 2 3 4 5 6 7 8 9 O 1 2 34 5 6
`
`12345678901234567890123456789012
`-
`12:30:55
`>Comp1ete
`Connected<
`RESULTS — SIGNAL TO NOISE
`
`FREQUENCY: 196 kHz
`SIG/NOISE:
`37 dB
`
`RESTART
`12345678901234567890123456789012
`
`FIG. 8E
`
`12:30:55
`Connected<
`DMT BACKGROUND NOISE
`Tone 192: 772 kHz
`-102 dBm/Hz
`Tone 193: 776 kHz
`-105 dBm/Hz
`
`RESTART
`TABLE
`12345678901234567890123456789012
`
`FIG. 8F
`
`860
`
`‘*4
`
`mtn¢Lum+4o\om-amchpcuurd
`
`O\LJ1IFLI-IIOI-|OlD(D\l0'\U‘|I5l-D
`
`Page 16 of 28
`
`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 15 of 17
`
`US 6,891,803 B1
`
`HDSLLOOP1
`
`HDSLLOOP2
`
`HDSLLOOP1
`
`HDSLLOOP2
`
`FIG. 9C
`
`Page 17 of 28
`
`

`
`U.S. Patent
`
`May 10,2005
`
`Sheet 16 0f 17
`
`US 6,891,803 B1
`
`200
`
`944
`
`HDSL LO0P1
`
`942
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`
`HTU-C or
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`
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`
`FIG. 9D
`
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`
`\
`960
`
`‘
`
`CSU/NIU
`
`HTU-R
`
`FIG. 9E
`
`CENTRAL
`OFFICE
`
`CUSTOMER
`PREMISES
`
`SPLITTERS
`974
`I/
`
`FIG. 9F
`
`Page 18 of 28
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`

`
`U.S. Patent
`
`May 10, 2005
`
`Sheet 17 0f 17
`
`US 6,891,803 B1
`
`110\
`
`CENTRAL
`OFFICE
`
`XDSL
`MODEM
`XDSL
`MODEM
`l
`XDSL
`MODEM
`
`XDSL
`MODEM
`____]
`
`CENTRAL
`OFFICE
`
`CUSTOMER
`PREMISES
`
`SPLITTERS
`
`150
`/
`
`FIG. 96
`
`SPLITTERS
`
`150
`/
`
`FIG. 9H
`
`CUSTOMER
`PREMISES
`
`ATU-R
`
`Page 19 of 28
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`

`
`US 6,891,803 B1
`
`1
`TELECOMMUNICATIONS TRANSMISSION
`TEST SET
`
`BACKGROUND OF THE INVENTION
`
`This invention relates generally to test instrumentation,
`and in particular to a telecommunications transmission test
`set for testing digital communications netWorks.
`The advent of digital communications networks, such as
`the Internet, has generated great demands for high-speed
`data services. Conventional telephone modems can provide
`a limited data rate (i.e., up to 56 Kbps) before reaching the
`limit of performance for that technology. Other
`technologies, such as cable modem, can offer a leap forWard
`in performance but are typically premised on changes in
`architecture that requires large investments in the commu
`nications netWork infrastructure.
`Digital subscriber line (DSL) is a technology that offers a
`solution to the demand for greater bandWidth. DSL offers
`data rates that can be substantially higher than that of a
`conventional telephone modem. Furthermore, DSL uses
`eXisting tWisted copper pair lines that are deployed and
`prevalent throughout the World. DSL delivers a basic rate
`access of 128 Kbps (i.e., the ISDN rate). High speed digital
`subscriber line (HDSL), a variant of DSL, delivers a data
`rate of 1.544 Mbps (T1) in North America and 2.048 Mbps
`(E1) elseWhere. Asymmetric digital subscriber line (ADSL),
`another variant of DSL, delivers data rates of 1.5 to 9.0
`Mbps on the doWnstream path and 16 to 640 Kbps on the
`upstream path. More advanced variants of DSL promise
`even higher data rates. Collectively, DSL and variants of
`DSL are referred to as XDSL.
`XDSL technology typically consists of a pair of modems
`connected to tWo ends of one or more tWisted Wire pairs,
`depending on the XDSL variant. One modem resides at a
`central of?ce and the other modem resides at the customer
`premises. The tWisted Wire pair(s) forms a local loop.
`Generally, the maXimum data rate is determined by the
`length of the local loop and the line conditions.
`Installation, maintenance, and repair of an XDSL connec
`tion typically require execution of tWo sets of test: (1) line
`quali?cation and (2) connectivity testing. Line quali?cation
`includes tests to determine the quality of a line transmission
`that, in turn, determines the maXimum data rate that can be
`achieved by an XDSL modem. Conventionally, a transmis
`sion impairment measurement set (TIMS) is used to qualify
`a line for XDSL service. The TIMS measures impairments
`such as frequency response, broadband noise, and signal
`poWer. One eXample of a TIMS is the OneTouch NetWork
`Assistance from Fluke Corporation that provides testing of
`patch cable and ?ber optic cable. Unfortunately, the One
`Touch NetWork Assistance does not provide the traditional
`tests normally required for line quali?cation and connectiv
`ity testing.
`Once a line has been quali?ed and an XDSL modem has
`been installed (i.e., at the central of?ce), connectivity testing
`is performed to verify data transmission over the modem. To
`perform connectivity testing, XDSL plug-in cards can be
`used. Generally, XDSL is provided by a number of
`manufacturers, many With proprietary designs. Thus, an
`XDSL plug-in card of a particular manufacturer is installed
`in the test equipment and connectivity tests (e.g., bit-error
`rate (BER) and loopback tests) are then performed. This
`scheme presents a challenge to service technicians and
`telecommunications operators Who need to maintain an
`inventory of XDSL plug-in cards from various vendors. In
`
`2
`addition, the technicians need to correctly select the appro
`priate XDSL plug-in card for the particular local loop being
`tested.
`A number of other challenges arise in testing digital
`communications netWorks. Conventionally, multiple types
`of test equipment are required to perform the various tests
`necessary to qualify a line and to test connectivity. For
`eXample, one type of test equipment is used to qualify a line
`by performing various measurements (e.g., TDR, line
`impairment, and so on). Another type of test equipment is
`then used to perform connectivity tests. The use of multiple
`types of test equipment increases the cost for installation,
`maintenance, or repair of an XDSL connection since more
`equipment must be maintained. Furthermore, test setup and
`test time are increased.
`To address the test needs of digital communications
`netWorks, some test equipment manufacturers integrate mul
`tiple tests into a single test gear. One eXample of such
`integration is the CERJAC HDSL Installer’s Assistance
`from HeWlett-Packard Company. The CERJAC HDSL
`Installer’s Assistance performs line coil detection and inser
`tion loss measurements (to qualify a line) and BER and
`transmission loopback testing (for connectivity testing).
`Another challenge in testing digital communications net
`Works arises because the line quali?cation and connectivity
`testing are often performed in a mobile environment. The
`service technicians generally move from site to site to test
`the local loop. Furthermore, access to the local loop may be
`limited in certain instances. Conventional test equipment are
`generally bulky and cumbersome, and not Well suited for a
`mobile environment. For example, although touted as being
`portable, the CERJAC HDSL Installer’s Assistance Weighs
`a hefty 15 pounds.
`Yet another challenge in testing arises because of the
`numerous amount of information that needs to be collected
`and presented for analysis. During the testing process,
`measurements are made and the test results are provided to
`a service technician Who then con?gures the XDSL connec
`tion accordingly. In some conventional test sets, the test
`results are conveyed through simple LEDs on the front
`panel. HoWever, LEDs can only display a limited amount of
`information. For some tests (i.e., poWer spectral density and
`load coil detection tests to qualify a line), large amounts of
`information are generated. Conventionally, the information
`is displayed or printed using alphanumeric characters.
`HoWever, an alphanumeric display can be dif?cult to deci
`pher and prone to mistake in interpretation.
`From the above, a telecommunications transmission test
`set that is lightWeight and portable, provides a comprehen
`sive suite of tests, and intelligently displays test results is
`needed in the art.
`
`10
`
`15
`
`20
`
`25
`
`30
`
`35
`
`40
`
`45
`
`SUMMARY OF THE INVENTION
`The present invention provides a telecommunications
`transmission test set for testing digital communications
`netWorks. In one embodiment, the test set is capable of
`performing line quali?cation testing including digital mul
`timeter (DMM) tests, time domain re?ection (TDR) test, and
`line impairment tests. The line impairment tests can include
`insertion loss, signal-to-noise, background noise, loop
`resistance, and other tests. In another embodiment, the test
`set is further capable of performing connectivity testing
`including loopback test and emulation. The test set can also
`be capable of performing bit-error-rate test (BERT). The test
`results can be graphically displayed on the test set.
`In one embodiment of the invention, the test set includes
`a modem module that facilitates connectivity testing. The
`
`55
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`60
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`65
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`Page 20 of 28
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`

`
`US 6,891,803 B1
`
`3
`modern module can be a pl11g—in module with a common
`interface. Tl1is allows one test set to be used with various
`modem modules. The modem module can also include a
`fingerprint value that identifies the modem module to the test
`set. The fingerprint value can indicate the module type, the
`software revision number, and so on. The test set
`then
`configures itself in accordance with the fingerprint value
`from the modem module.
`Aspecific embodiment of the invention provides a test set
`that includes at least one signal input port, test circuitry, a
`processor, a user input device, and a display. The test
`circuitry couples to and receives signals from the at least one
`signal input port. The test circuitry then generates test data
`corresponding to the received signals. The processor couples
`to and receives test data from the test circuitry and generates
`test results. The processor also couples to and receives
`commands from the user—input device. The processor further
`operatively couples to the display that receives and displays
`the test results from the processor. Ir1 one embodiment, the
`test set
`is capable of performing line qualification and /
`connectivity testing. The display can be a graphical display
`to show the test results in graphical forms.
`Another specific embodiment of the invention provides a
`test set for testing a communications network that includes
`a master tester unit and a r11oden1 module. The r11aster tester
`unit receives a signal from the coinmunications network and
`processes the signal to produce intermediate results. The
`modem module couples to the master tester unit, receives the
`intermediate results, processes the intermediate results, and
`provides processed results to the master tester unit. The
`master tester unit then displays the processed results. In a
`specific implementation, the modern module is a removable
`module (i.e., a plug—in module) that supports the test set in
`testing different communications networks (i.e., from dif-
`ferent manufacturers). For example, a different modem
`module can be provided for each particular communications
`network to be tested. The test set is configurable to perform
`line qualification and connectivity testing.
`The foregoing,
`together with other aspects of this
`invention, will become more apparent when referring to the
`following specification, claims, and accompanying draw-
`ings.
`
`‘-
`
`BRIEF Dl:'SCRlP'I‘ION OI-'
`
`'I‘I-II: DRAWINGS
`
`FIG. 1 shows a simplified block diagram of a digital
`communications network;
`FIG. 2 shows an embodiment of a telecommunications
`transmission test set of the invention;
`FIG. 3/\ shows a block diagram of an embodiment of the
`test set,
`FIGS. 3B—3D show block diagrams of an embodiment of
`a DMM test circuit, a TDR test circuit, and a line impairment
`test circuit, respectively;
`FIG. 4A shows a block diagram of an embodiment of the
`modem module;
`FIG. 4B shows a diagram of an embodiment for identi-
`fying a particular r11oden1 module to a test set;
`FIG. 4C shows a diagram of another embodiment for
`matching the proper software application with a particular
`modem module;
`FIG. 5 shows one embodiment of a menu tree;
`FIG. 6A shows a test set up for DMM measurements;
`FIG. 6B shows a graphical display of TDR test results,
`with “cursor” control;
`FIG. 6C shows a graphical display of TDR test results,
`with “marker” control;
`
`4
`FIG. 7 shows a test set 11p for transmission line impair-
`ment testing;
`FIG. 8A shows an embodiment of a menu for transmission
`line impairment testing;
`FIG. 8B shows a menu that lists sets of test frequencies for
`insertion loss measurement;
`FIG. 8C shows a graph of an insertion loss test result;
`FIG. 8D shows an alphanumeric display of insertion loss
`test results;
`FIG. 8E shows an alphanumeric display of a signal-to-
`noise test result;
`FIG. SF shows a graphical display of background noise
`test results;
`FIG. 9A shows a test set up for dual HTU-C and HTU-R
`emulation over two wire pairs;
`FIG. 9B shows a test set up for in—service HTU-C or
`HTU-R function;
`FIG. 9C shows a complementary test set up to that of FIG.
`913;
`FIG. 9D shows a test set up for out—of—service HTU-C and
`HTU-R function;
`FIG. 9E shows a test set up for E1 and T1 testing on a
`IIDSL span;
`FIG. 9F shows a test set up for simultaneous ATU-C and
`ATU—R emulation;
`FIG. 9G shows a test set up for testing Al‘U—C function;
`and
`
`FIG. 9H shows a test set up for testing ATU—R function.
`DETAILED DESCRIPTION OF TIIE SPECIFIC
`EMBODIMENTS
`Network Configuration
`FIG. 1 shows a simplified block diagram of a specific
`embodiment of a digital communications network 100.
`Network 100 includes a central office ll0 operatively
`coupled to a personal computer (PC) 120 through XDSL
`modems 130 and 132. XDSL modem 130 couples to central
`office 110 and to a splitter 140a through a channel 142.
`XDSL modem 132 couples to PC 120 and to another splitter
`140b through a channel 144. Splitters 140a and 14013 are
`coupled through a local loop 150 composed of one or more
`wire pairs, or other transmission media. Splitters 14011 and
`140b also couple to a public switched telephone network
`(PSTN) 152 and to a telephone 154, respectively, for pro-
`viding a plain old telephone service (POTS). At the trans-
`mitting side, splitter l40 combines the POTS and data
`service into a signal suitable for transmission over local loop
`150. At the receiving side, the other splitter 140 separates the
`received signal into the (lower frequency) voice telephone
`service and the (higher frequency) data service.
`In this
`manner, both voice and data can be transmitted over the
`same local loop concurrently without any modification to
`that loop.
`The test set of the invention can be used to test a Wide
`variety of communications networks,
`including network
`100. As used herein, “communications network” generically
`(and broadly) refers to any stmcture that supports a digital
`service carrier using any transmission technology. The trans-
`mission technologies covered by the test set of the invention
`includes plain old telephone system (POTS) modem, E1, T1,
`Integrated Services Digital Network (ISDN), Digital Sub-
`scriber Line (DSL), High data rate DSL (HDSL), Asynchro-
`nous DSL (ADSL), Very-high data rate DSL (VDSL), Rate
`Adaptive DSL (RADSL), Single line DSL (SDSL), and
`other variants of DSL. DSL and variants of DSL are col-
`
`Page 21 of 28
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`

`
`US 6,891,803 B1
`
`/
`
`5
`lectively referred to as xDSL. The test set of the invention
`can also be adopted to cover transmission technologies such
`as hybrid fiber coax (IIFC), coaxial cable, optical fiber, and
`others. In a specific application, the test set of the invention
`is especially suited for testing communications networks
`implemented using one or more twisted wire pairs.
`Test Set
`FIG. 2 shows ai1 embodiment of a telecommunications
`transmission test set 200 of the invention. Test set 200
`includes a light emitting diode (LED) display 212, a graphi-
`cal display 214, a keypad 216, and an integrated microphone
`and speaker 218. LED display 212 indicates operational
`status of test set 200 as well as the operational mode and
`signal/error conditions. Graphical display 214 displays the
`test menu, test parameters, and test results. Graphical dis-
`play 214 can display information in alphanumeric form,
`graphical form, or a cor11binatioi1 of both. Graphical display
`214 can be, for example a liquid crystal display (LCD).
`Graphical display 214 can also be substituted with an
`alphanumeric display. Keypad 216 allows a user to select a
`test mode, specify the test conditions, control the test device,
`dial a phone number, manipulate a graphical display, scroll
`an alphanumeric display, and perform other functions.
`Implementation of some of the features of test set 200 is
`described in U.S. Pat. No. 5,619,480, entitled “I-[AND-
`HELD TELECOMMUNICATION TESTER,” issued Apr. 8, K
`1997, assigned to the assignee of the present invention, and
`incorporated herein by reference.
`FIG. 3A shows a block diagram of an embodiment of test
`set 200. Within test set 200, a processor 310 controls the
`operation of the test set according to program instructions
`stored in a memory 312. A digital signal processor (DSP)
`314 can be used to assist in the processing of data samples
`(i.e., filtering, transformation, and so on). DSP 314 can be
`implemented, for example, with a digital signal processor
`from the TMS320 line of processors from Texas
`Instruments,
`Inc. An expansion card 316, which is an
`optional element, allows for easy upgrade to more advanced
`test features and more applications as they become available.
`Processor 310 couples to memory 312, DSP 314, and
`expansion card 316, and further to a bus 320 for commu-
`nication with other circuits within test set 200. DSP 314 can
`also couple to bus 320 to directly receive data sent through
`the bus.
`Processor 310 can be implemented with a microcomputer,
`a microprocessor, a signal processor, an application specific
`integrated circuit (ASIC), or the like. Memory 312 can be
`implemented as a random—access memory (RAM), a read-
`only memory (ROM), a programmable read—only—memory
`(PROM), an electronically programmable read—only-
`memory (EPROM), a FLASH memory, registers, or other
`similar devices. Memory 312 can be used to store the
`program codes or data, or both.
`LED display 212, graphical display 214, and keypad 216
`also couple to bus 320. LED display 212 and graphical
`display 214 receive commands from processor 310 and
`provide the appropriate output on their respective displays.
`Keyboard 216 provides the user input to processor 310.
`A DMM test circuit 322, a TDR test circuit 324, and a
`transmission line impairment test circuit 326 couple to bus
`320 and to the network under test. Test circuits 322, 324, and
`326 provide test signals (e.g., test tones) and perform test
`measurements for various line qualification tests that are
`discussed below. Test data generated by the test circuits is
`provided via bus 320 to processor 310 that further processes
`the data to generate the final test results which are then
`displayed. The design for these test circuits are known in the
`art and are not described.
`
`6
`A modern module interface 328 couples to bus 320 and a
`modem module 330 via a module bus 332. Modem module
`330 facilitates connectivity testing and is further described
`below. Modem module interface 328 receives data and
`control signals from bus 320,
`formats the signals, and
`forwards the formatted signals to modem module 330.
`Modem module interface 328 also receives test data from
`modern module 330 and forwards the data to processor 310.
`Modem module interface 328 further acts as a conduit for
`the supply power to modern module 330.
`Test set 200 also includes a power supply circuit 336 that
`provide power to the circuits within test set 200 and modem
`module 330. Power supply circuit 336 can receive power
`from a battery pack 338 or an external power supply source.
`Power supply circuit 336 can be a switching power supply
`circuit, or other circuits. Power source 336 can also include
`a charger, such as a battery charger, for charging battery
`pack 338 with the external power supply source.
`FIG. 3B shows a block diagram of an embodiment of
`DMM test circuit 322. In the embodiment shown in FIG. 3B,
`DMM test circuit 322 measures the line resistance,
`capacitance, DC voltage, and AC voltage. Initially, the line
`characteristics are converted into DC voltages by various
`conversion circuits. An analog—to—digital converter (ADC)
`340 then samples the DC voltages on inputs 341 through 345
`and provides the sampled values through bus 320 (i.e., to be
`received by processor 310 and/or DSP 314). The samples are
`then processed to determine the line characteristics.
`For line resistance measurement, a Voltage divider 346
`converts the line resistance into a DC voltage that is then
`provided to ADC input 341. Voltage divider 346 couples to
`input 341, the line to be tested, and a test resistor 348 that
`further couples to a DC voltage source 350.
`In an
`embodiment, DC voltage source 350 provides eighty volts
`_ DC and test resistor 348 is forty Kohms. For DC line voltage
`measurement, the line to be tested is directly coupled to
`ADC input 342. For AC line voltage measurement, a root-
`mean—square (RMS) to DC voltage converter 352 converts
`the AC voltage on the line into a DC voltage at input 343 that
`is then sampled by ADC 340. And for line capacitance
`measurement, an AC Voltage source 354 provides an AC
`voltage on the line under test. Two RMS to DC voltage
`converters 356 and 358 then convert the AC voltage on the
`line into DC voltages at inputs 344 and 345 that are then
`sampled by ADC 340. In an embodiment, AC voltage source
`354 is a generator that provide a sinusoidal at 20 Hz and
`having 20 volts peak—to—