United States Patent [19]
`Bendik et al.
`
`Illllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllllll
`US0055 9 1 67 8A
`5,591,678
`Patent Number:
`[11]
`Jan. 7, 1997
`[45] Date of Patent:
`
`[54]
`
`PROCESS OF MANUFACTURING A
`MICROELECTRIC DEVICE USING A
`REMOVABLE SUPPORT SUBSTRATE AND
`ETCH-STOP
`
`175]
`
`Inventors: Joseph J. Beudik, Carlsbad; Gerard T.
`Malloy, Oceanside; Ronald M. Finnila,
`Carlsbad, all of Calif.
`
`[73]
`
`[21]
`122]
`
`[63]
`
`[521
`
`158]
`
`[561
`
`Assignee: HE Holdings, Inc., Los Angeles, Calif.
`
`Appl. No.: 482,172
`Filed:
`Jun. 7, 1995
`
`Related US. Application Data
`
`Continuation of Ser. No. 6,120, Jan. 19, 1993, abandoned.
`
`Int. Cl.6 ....................... .. H01L 21/283; H01L 21/56;
`H01L 21/58; H01L 21/60
`US. Cl. ........................ .. 437/208; 437/974; 437/915;
`148/DIG. 135; 148/D1G. 150; 156/662.1;
`156/630.1
`Field of Search ................................... .. 437/208, 974,
`437/915; 148/DIG. 135, DIG. 150; 156/630,
`662, 901
`
`References Cited
`
`U.S. PATENT DOCUMENTS
`
`7/1967 Kenney ................................... .. 29/423
`3,332,137
`3,623,219 10/1969 Stoller et a1.
`.. 437/974
`4,131,909 12/1978 Matsuda et al. ..
`437/974
`
`4,169,000
`
`9/1979 Risernan . . . . . . . . . . . .
`
`. . . . . .. 156/662
`
`4,467,340
`
`8/1984 Rode et a1. ..... ..
`
`9/1986 Yasumoto et a1. . . . .
`4,612,083
`6/1987 McConkle et al.
`4,670,653
`4,783,594 11/1988 Schulte et a1. ...... ..
`
`250/370.08
`
`. . . . .. 437/208
`250/37008
`.. 257/446
`
`4,815,208
`
`3/1989 Raschke . . . . . . . .
`
`. . . . . .. 437/209
`
`. l48/DIG. 135
`5/1989 Wahlstrom
`4,829,018
`. 250/370.13
`7/1990 Norton et al.
`4,943,491
`437/974
`4,980,308 12/1990 Hayashi et a1.
`5,024,723
`6/1991 Goesele et a1. ....................... .. 156/662
`5,034,343
`6/1991 Rouse et al. .......................... .. 437/974
`5,043,582
`8/1991 Cox et al. ........................ .. 250/370.09
`
`5,179,283
`5,182,624
`5,227,656
`
`1/1993 Cockrum etal. ..................... .. 250/352
`1/1993 Tran ........................................ .. 257/40
`7/1993 Timlin ................................... .. 257/441
`
`FOREIGN PATENT DOCUMENTS
`
`0371862 6/1990 European Pat. Off..
`63-308970 12/1988 Japan.
`
`OTHER PUBLICATIONS
`
`Liu, C. N., “Matching the Thermal Coe?icients of Expan
`sion of Chips to Module Substrate”, IBM Technical Disclo
`sure Bulletin, vol. 19, No. 12, May 1977.
`Patent Abstracts of Japan, vol. 13, No. 270 (E—776), 8 Mar.
`1989 and Jap,A,0l,O6l 056 (NEC Corp).
`Hayashi, Y., et al. “CUBIC (Cumulatively Bonded 1C)
`Devices Stacking Thin Film Dual-CMOS Functional
`Blocks”, NEC Corporation, Kanagawa, Japan, in Semicon
`ductor Internationa, Dec. 1991.
`Patent Abstracts of Japan, vol. 16, No. 79 (E-1171) 26 Feb.
`1992 and JP,A,O3 266 478 (Fujitsu).
`Primary Examiner—John Niebling
`Assistant Examiner—David E. Graybill
`Attorney, Agent, or Firm—W. C. Schubert; W. K. Denson
`Low
`
`[57]
`
`ABSTRACT
`
`A microelectronic device is fabricated by furnishing a ?rst
`substrate (40) having a silicon etchable layer (42), a silicon
`dioxide etch-stop layer (44) overlying the silicon layer (42),
`and a single-crystal silicon wafer (46) overlying the etch—
`stop layer (44), the wafer (46) having a front surface (52) not
`contacting the etch stop layer (44). A microelectronic circuit
`element (50) is formed in the single-crystal silicon wafer
`(46). The method further includes attaching the front surface
`(52) of the single-crystal silicon wafer (46) to a second
`substrate (58), and etching away the silicon layer (42) of the
`?rst substrate (40) down to the etch-stop layer (44). The
`second substrate (58) may also have a microelectronic
`circuit element (58‘) therein that can be electrically inter
`connected to the microelectronic circuit element (50).
`
`18 Claims, 2 Drawing Sheets
`
`20
`
`22
`
`FURNlSH FIRST SUBSTRATE
`
`FORM MICHOELECTRONlC
`CI FlCUIT
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`ATTACH SECSOND SUBSTRATE
`1
`
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`
`HEMOVE ETCHABLE LAYER
`
`VII/{IIlI/III/IIII/l
`
`28
`FORM BACKSIDE
`71 ELECTRICAL CONNECTIONS
`5°
`61
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`
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`
`Petitioner Samsung - SAM1001
`
`

`
`US. Patent
`
`Jan. 7, 1997
`
`Sheet 1 0f 2
`
`5,591,678
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`FURNISH FIRST SUBSTRATE
`
`/ 22
`FORM MICROELECTRONIC
`
`4a
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`ATTACH SECOND SUBSTRATE
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`U.S. Patent
`
`Jan. 7, 1997
`
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`
`5,591,678
`
`1
`PROCESS OF MANUFACTURING A
`MICROELECTRIC DEVICE USING A
`REMOVABLE SUPPORT SUBSTRATE AND
`ETCH-STOP
`
`This is a continuation of application Ser. No. 006,120
`?led Jan. 19, 1993, now abandoned.
`
`BACKGROUND OF THE INVENTION
`
`10
`
`2
`wafers with circuitry already on them. The present invention
`ful?lls this need, and further provides related advantages.
`
`SUMMARY OF THE INVENTION
`
`The present invention provides an approach for fabricat
`ing microelectronic devices that permits three-dimensional
`manipulations and fabrication steps with two-dimensional
`devices already deposited upon a wafer substrate. The
`invention permits microelectronic devices to be prepared
`using well-established, inexpensive thin-?lm deposition,
`etching, and patterning techniques, and then to be further
`processed singly or in combination with other such devices,
`into more complex devices.
`In accordance with the invention, a method of fabricating
`a microelectronic device comprises the steps of furnishing a
`?rst substrate having an etchable layer, an etch-stop layer
`overlying the etchable layer, and a wafer overlying the
`etch~stop layer, and forming a microelectronic circuit ele
`ment in the wafer of the ?rst substrate. The method further
`includes attaching the wafer portion of the ?rst substrate to
`a second substrate, and etching away the etchable layer of
`the ?rst substrate down to the etch-stop layer. The second
`substrate may include a microelectronic device, and the
`procedure may include the further step of interconnecting
`the microelectronic device on the ?rst substrate with the
`microelectronic device on the second substrate.
`In a typical application, the “back side” etch-stop layer is
`patterned, and an electrical connection to the microelec
`tronic circuit element on the wafer is formed through the
`etch-stop layer. This technique permits access to the micro—
`electronic circuit element from the back side. Electronic
`connections can therefore be made directly to the back side
`of the wafer layer, and indirectly to the front side micro
`electronic circuit element by opening access to front-side
`interconnects from the back side. Such an ability to achieve
`electronic access can be valuable for some two-dimensional
`devices, and also permits multiple two-dimensional devices
`to be stacked one above the other to form three-dimensional
`devices by using techniques such as indium bumps to form
`interconnections between the stacked devices.
`In a preferred approach to practicing the invention, a
`method of fabricating a microelectronic device comprises
`the steps of furnishing a ?rst substrate having a silicon
`etchable layer, a silicon dioxide etch-stop layer overlying the
`silicon layer, and a single-crystal silicon wafer overlying the
`etch_stop layer. The wafer has a front surface not contacting
`the silicon dioxide layer. A microelectronic circuit element
`is formed in the single-crystal silicon wafer on or through
`the front surface. The method further includes attaching the
`front surface of the single-crystal silicon wafer to a ?rst side
`of a second substrate, and etching away the silicon etchable
`layer of the ?rst substrate down to the silicon dioxide
`etch-stop layer using an etchant that attacks the silicon layer
`but not the silicon dioxide layer. As discussed previously, the
`silicon dioxide layer may then be patterned and connections
`formed therethrough.
`The present approach is based upon the ability to transfer
`a thin ?lm microelectronic circuit element or device from
`one substrate structure to another substrate structure. The
`circuit element usually is fabricated with a relatively thick
`?rst substrate that provides support during initial fabrication
`and handling. However, it is dif?cult to achieve electrical
`connections through such a thick substrate, because of the
`difficulty in locating deep, through-support vias precisely at
`the required point, the difficulty in insulating the walls of
`
`This invention relates to microelectronic devices, and,
`more particularly, to a microelectronic device that is moved
`from one support to another support during fabrication.
`Microelectronic devices are normally prepared by a series
`of steps such as patterning, deposition, implantation,
`growth, and etching that build up an electronic circuit on or
`near the top surface of a thin substrate wafer. Interconnec
`tion pads are placed on the surface of the wafer to provide
`connections to external leads or to other microelectronic
`devices. Such a microelectronic device is considered a
`two-dimensional structure in the plane of the substrate
`wafer. There are usually multiple layers of deposited con
`ductors and insulators, but each layer is quite thin. Any
`height of the device in the third dimension perpendicular to
`the substrate surface is much less than the dimensions in the
`plane of the substrate wafer, and is often no more than a few
`thousand Angstroms.
`The microelectronic devices or arrays of such devices are
`usually placed inside a protective housing called a package,
`with leads or connection pads extending out of the package.
`When the microelectronic devices are used, a number of the
`packages with their contained microelectronic devices are
`normally a?ixed to a base such as a phenolic plastic board.
`Wires are run between the various devices to interconnect
`them. There may be metallic traces imprinted onto the base
`to provide common power, ground, and bus connections,
`and the base itself has external connections. Such boards
`with a number of interconnected devices are corrunonly
`found inside both consumer and military electronics equip
`ment. For example, an entire microcomputer may be
`assembled as a number of microelectronic devices such as a
`processor, memory, and peripheral device controllers
`mounted onto a single board.
`The present inventors have determined that for some
`applications it would be desirable to stack and interconnect
`a number of such two-dimensional microelectronic devices,
`fabricated on a substrate wafer, one on top of the other to
`form a three-dimensional device. The stack might also
`include other circuit elements such as interconnect layers
`and thin ?lm sensors as well. To interconnect the stacked
`wafers using leads that extend from the pads on the top of
`one wafer to the pads on the top of another wafer, around the
`sides of the wafers, or using plug interconnects or the like,
`would be clumsy, space consuming, and impossible to do for
`the case of highly complex circuitry requiring many inter
`connects.
`In considering fabrication techniques to produce such
`three-dimensional, stacked devices, the fragility of the
`devices is a concern. The individual substrate wafers and
`their microelectronic circuitry are usually made of fragile
`semiconductor materials, chosen for their electronic char
`acteristics rather than their strength or fracture resistance.
`The selected fabrication technique cannot damage the cir
`cuitry that has already been placed onto the substrate wafer.
`Thus, there is a need for a method to fabricate three
`dimensional microelectronic devices using stacked substrate
`
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`5,591,678
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`3
`deep vias, and the difficulty in ?lling a deep via with
`conducting material. The ?rst substrate cannot simply be
`removed to permit access to the bottom side of the electrical
`circuit element, as the assembly could not be handled in that
`very thin form.
`In the present approach, after initial circuit element fab
`rication on a ?rst substrate structure, the electrical circuit
`element is transferred to a second substrate structure. (If the
`second substrate itself contains another microelectronic cir
`cuit element, interconnections between the two microelec
`tronic circuit elements are made at this point, as by using an
`indium-bump technique/epoxy technique.) With the circuit
`element thus supported, the etchable portion of the ?rst
`substrate is removed by etching, down to the etch-stop layer.
`The terms “etchable” and “etch-stop” are used herein rela
`tive to a speci?c selected etchant. There is chosen an etchant
`that readily etches the etchable layer but has a much lower
`etching rate for the etch-stop layer. It is understood, how
`ever, that the etch-stop layer may be generally or selectively
`etched by yet other techniques, after the etchable layer is
`removed.
`Once the etchable layer is removed, the relatively thin
`etch-stop layer may be patterned and through-etched to
`provide access to the microelectronic circuit element,
`including its connection pads, through the etch~stop layer.
`Many alternative approaches are possible. For example, the
`two-dimensional structure may be used with direct back
`connections and indirect front connections. The additional
`surface area on the bottom of the etch-stop layer provides
`space for deposition of interconnection metallization traces.
`The two-dimensional structure may be stacked with other
`two-dimensional structures to form a three-dimensional
`structure. Further circuitry could be deposited upon the back
`side of the etch~stop layer, as needed and permitted by
`constraints imposed by the front-side circuit element struc
`ture.
`Thus, the present approach provides a highly ?exible
`approach to the fabrication of complex microelectronic
`devices using a building-block approach. Other features and
`advantages of the present invention will be apparent from
`the following more detailed description of the preferred
`embodiment, taken in conjunction with the accompanying
`drawings, which illustrate, by way of example, the prin
`ciples of the invention.
`
`BRIEF DESCRIPTION OF THE DRAWINGS
`
`FIG. 1 is a diagrammatic process ?ow diagram for the
`approach of the invention, with the structure at each stage of
`fabrication indicated schematically;
`FIG. 2 is a schematic side sectional view of a microelec
`tronic device structure prepared according to the procedure
`of FIG. 1;
`FIG. 3 is a schematic side elevational view of a three
`dimensional microelectronic device built from two-dimen
`sional devices using the present approach; and
`FIG. 4 is a schematic side elevational view of a “smart
`boar ” con?guration.
`
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`DETAILED DESCRIPTION OF THE
`INVENTION
`
`Referring to FIG. 1, the present invention is practiced by
`?rst providing a ?rst substrate 40, numeral 20. The ?rst
`substrate 40 includes an etchable layer 42, an etch~stop layer
`44 grown upon and overlying the etchable layer 42, and a
`
`65
`
`4
`wafer layer 46 bonded to and overlying the etch-stop layer
`44. Such substrates can be purchased commercially.
`In the preferred practice, the etchable layer 42 is a layer
`of bulk silicon about 500 micrometers thick and the etch
`stop layer 44 is a layer of silicon dioxide about 1 micrometer
`thick. The wafer layer 46 is normally thicker than required
`when it is bonded to the etch stop layer 44, and is thinned
`to the required ?nal thickness. A typical thinning process
`involves lapping followed by a chem-mechanical polish.
`Preferably, the wafer layer 46 is a layer of single crystal
`silicon initially about 500 micrometers thick which
`becomes, after thinning, about 30 nanometers to 50
`micrometers thick. These dimensions are not critical, and
`may be varied as necessary for particular applications. (The
`structure depictions In FIGS. 1-4 are not drawn to scale.)
`The wafer layer 45 may also be or include an interconnect
`material such as a metal or other structure as may be
`appropriate for a particular application. In the present case,
`an optional via opening 48 is provided through the wafer
`layer 46. The use of this via 48 will become apparent from
`subsequent discussions.
`The ?rst substrate 40 is prepared by applying well-known
`microelectronic techniques. The silicon dioxide etch-stop
`layer 44 is produced on a bulk silicon piece 42 by heating it
`in an oxygen~hydrogen atmosphere at a temperature of about
`1100° C. for a time su?icient to achieve the desired thick
`ness, typically about 2 hours. The wafer layer 46 is either
`deposited directly upon the etch-stop layer 44 or fabricated
`separately and bonded to the etch-stop layer 46 by direct
`interdiifusion, preferably the latter, and thinned. The via 48
`is produced by standard patterning and etching techniques.
`(All references herein to “standard” or “well known” tech
`niques, or the like, mean that individual process steps are
`known generally, not that they are known in the present
`context or combination, or to produce the present type of
`structure.)
`A microelectronic circuit element 50 is formed in the
`wafer layer 46, numeral 22, working from a front exposed
`side 52. The microelectronic circuit element 50 may be of
`any type, and may itself include multiple layers of metals,
`semiconductors, insulators, etc. Any combination of steps
`can be used, including, for example, deposition, implanta
`tion, ?lm growth, etching, and patterning steps. As used
`herein, the term “microelectronic circuit element” is to be
`interpreted broadly, and can include active devices and
`passive structure. For example, the microelectronic circuit
`element 50 can include many active devices such as tran
`sistors. Alternatively, it may be simply a patterned electrical
`conductor layer that is used as an interconnect between other
`layers of structure in a stacked three-dimensional device, or
`may be a sensor element.
`An important virtue of the present invention is that it is
`operable with a wide range of microelectronic circuit ele
`ments 50, and therefore the present invention is not limited
`to any particular circuit element 50. In the presently pre
`ferred case, the ?rst substrate 40 is silicon based, and
`therefore the microelectronic circuit element 50 is preferably
`a silicon-based device. Where the microelectronic circuit
`element 50 is based upon other material systems, it may be
`preferred for the ?rst substrate to be made of a material
`compatible to that material system. In this usage, “compat
`ible” means that the ?rst substrate permits fabrication of the
`microelectronic circuit element 50 therein.
`As it is illustrated in FIG. 1, the microelectronic circuit
`element 50 includes two types of electrical interconnects. A
`front-side electrical interconnect 54 permits direct electrical
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`5,591,678
`
`5
`interconnection to the microelectronic circuit element 50
`from "above”, and back-side electrical interconnects 55 and
`55' permit indirect front-side electrical interconnection to
`the microelectronic circuit element 50 and direct back-side
`electrical interconnection to the wafer layer 46 from
`“below”, respectively. The front~side electrical interconnect
`54 is a metallic pad, and the back-side electrical intercon
`nects 56 and 56' are each an electrical conductor such as
`polysilicon or a metal deposited into the via 48. The inter
`connect 54 is formed during the fabrication of the micro
`electronic circuit element 50, and the interconnects 56 and
`56' are formed by opening vias through the back side and
`?lling them with an electrical conductor, all well-known
`techniques.
`A second substrate 58 is attached to the structure on the
`side corresponding to the front surface 52, numeral 24. That
`is, the second substrate 58 is on the opposite side of the
`microelectronic circuit element 50 from the ?rst substrate
`40. The second substrate 58 may be any suitable material,
`such as silicon or aluminum oxide (speci?cally sapphire).
`The second substrate may optionally include a microelec
`tronic device deposited therein. (The illustration of FIG. 1
`does not show the structure of the second substrate 58 in
`detail to conserve space. That structure is presented in more
`detail in FIGS. 2 and 3, and will be discussed subsequently.)
`If the selected material of the second substrate or any
`devices therein may be attacked by the etchant used in the
`subsequent etching, it must be temporarily protected during
`etching by a base in the manner to be described.
`The second substrate 58 is attached by any appropriate
`technique, which must be chosen so that the attachment
`procedure does not damage the pre-existing structure such as
`the microelectronic circuit element 50. In one approach that
`achieves a permanent attachment, the second substrate 58 is
`attached by a layer of epoxy 60 placed between the pre
`existing structure and the second substrate 58, and thereafter
`degassed in a vacuum and cured. The epoxy is resistant to
`chemical attack in the etchant used in a subsequent step. To
`attain precise alignment, tooling may be used to position the
`structures to be joined. Interconnects such as indium bumps
`61 can be placed on the front-side electrical contacts 54 to
`achieve electrical interconnection between the microelec
`tronic circuit element 50 and any microelectronic circuit
`element in the second substrate 58.
`The etchable layer 42 of the ?rst substrate 40 is removed
`by an appropriate technique, preferably by etching, numeral
`26. To protect the structure against etch attack, it may be
`temporarily attached to a base 62 such as a piece of
`aluminum oxide, preferably sapphire, by a layer of wax 64.
`After etching, the wax 64 is melted and the etched structure
`removed from the base 62.
`The etchant is chosen so that it attacks the etchable layer
`42 relatively rapidly, but the etch-stop layer 44 relatively
`slowly or not at all. The terms "etchable” and “etch-stop”
`indicate a relative relation to each other in a particular
`etchant, as used herein. They are relative to each other and
`to the selected etchant. Thus, the preferred bulk silicon
`etchable layer 42 is attacked and etched away by a 5-10
`molar potassium hydroxide (KOH) or sodium hydroxide
`(NaOH) solution at a temperature of 60° C. The etch-stop
`silicon dioxide layer 44 is attacked by the potassium hydrox
`ide or sodium hydroxide solution at a much lower rate than
`the etchable layer 42. Waxes such as glycol phthalate are
`softened by the potassium hydroxide or sodium hydroxide
`solution only very slowly, and can be used to bond the base
`62 to the structure for protection. When the etchable layer 42
`is exposed to the etchant, bubbles evolve as the silicon reacts
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`and etches away. The end point of the bulk etching is
`deterrrrined by the end of the bubble evolution and the
`appearance of the glassy silicon dioxide etch-stop layer 44.
`At the completion of etching a back face 66 of the
`etch-stop layer 44 is exposed, as depicted in the step 26. The
`base 62 may be removed by melting the wax 64, or it may
`be left as a convenience in subsequent operations. Eventu
`ally, however, the base 62 is removed at some point in the
`process.
`Back-side electrical connections are formed through the
`etch-stop layer 44 (for direct back-side interconnects 56‘)
`and through the etch stop layer 44 and the wafer layer 45 to
`the microelectronic circuit element 50 (for indirect front
`side interconnects 96), as shown at numeral 28. To form
`such connections, the etch-stop layer 44 is patterned by
`well'known patterning techniques to precisely identify the
`location to be penetrated. Material is removed from these
`locations of the etch-stop layer 44 by any appropriate
`method. As discussed earlier, the term “etch-stop” is used
`relative to the etchant used to remove the etchable layer 42.
`There are other etches that can be used to etch openings
`through the etch-stop layer 44. In the case of the preferred
`silicon dioxide etch~stop layer 44, a hydro?uoric acid-based
`etchant such as a mixture of hydro?uoric acid and ammo
`nium ?uoride is used after patterning to etch openings 68
`and 68' through the etch-stop layer 44. Dry etching tech
`niques such as plasma etching can also be used.
`The via 68 extends through the etch-stop layer 44 and the
`wafer layer 46 to the microelectronic circuit element 50.
`When ?lled with an electrical conductor such as a metal, it
`provides an indirect back-side electrical connection to the
`microelectronic circuit element 50. Alternatively, the via
`may be extended through the etch-stop layer 44 to (but not
`through) the wafer layer 46, as shown at numeral 68'. This
`via 68', when ?lled with an electrical conductor, provides the
`direct back-side electrical connection 56' to the wafer layer
`46. In some electronic devices, It is desirable to apply a
`voltage to the either or both sides of the active element for
`biasing purposes. The direct back-side electrical connection
`56' permits biasing of one side of the active element, while
`the indirect front-side electrical connection 56 permits bias
`ing of the other side of the active element.
`An electrical conductor layer 70 may be deposited over
`lying the etch<stop layer 44 and the back~side electrical
`connections 56 and 56', and patterned. The electrical con
`ductor material is preferably a metal such as aluminum.
`Electrical interconnection to the back-side electrical con
`nections 56 and 56' is thereby accomplished.
`This ?nal structure 71, with front and back side electrical
`connections, is useful by itself, or it may be used in many
`other contexts. In one possible application, another micro
`electronic device 72 is integrally Joined to the back side of
`the structure 71. The device 72 is aligned so that it makes
`electrical contacts to the microelectronic circuit element 50
`through the electrical conductor layer 70. The three-dimen
`sional structure 71, 72 made by this approach is depicted in
`greater detail in FIG. 2.
`Referring to FIG. 2, the structure 71 is prepared as
`discussed in relation to the method of FIG. 1. It includes the
`microelectronic circuit element 50, back-side electronic
`connections 56 and 55', and indium bumps 61, as well as the
`wafer layer 46, the etch-stop layer 44, and the electrically
`conducting layer 70. The second substrate 58, previously
`shown in FIG. 1 without its detailed structure, includes a
`microelectronic circuit element 50a fabricated in a wafer
`layer 46a, which in turn overlies an etch-stop layer 44a.
`
`006
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`5,591,678
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`Back-side electrical connections 56a and 56‘a connect with
`an electrically conducting layer 70a. The layer 70a in turn is
`in electrical communication with the microelectronic device
`50 through the indium bumps 61.
`The device 72, shown in FIG. 1 without its detailed
`structure, includes a microelectronic circuit element 50b
`fabricated in a wafer layer 46b, which overlies an etch-stop
`layer 44b. As depicted in FIG. 2, an etchable layer 42b of the
`device 72 is still present to provide strength to the stack. The
`device 72 is joined to the device structure 71 with an epoxy
`layer 60b.
`The structure of FIG. 2 thus has three nricroelectronic
`circuit elements 50, 50a, and 50b interconnected in a three
`dimensional array. The process of building up a three
`dimensional stack of devices can continue inde?nitely by
`adding additional microelectronic circuit elements “below”
`the device 72. To further process the device of FIG. 2,
`process steps 26, and 28 of FIG. 1 are repeated for the device
`72. The etchable layer 42b is removed, and indirect back
`side electrical connections 56b (and optionally direct back
`side electrical connections) can be added in the manner
`discussed earlier. In electrical conduction layer 70b is depos
`ited and patterned.
`FIG. 3 depicts the results of repeating process steps 26
`and 28. At this point, yet another microelectronic device
`structure could be a?ixed with an epoxy layer below the
`device 72, and electrically interconnected through the back—
`side electrical connections. Rather than depict such a struc
`ture, FIG. 3 shows the manner of external electrical con
`nections. To achieve an external electrical interconnect, a
`lead 74 is wire bonded to a pad region of the electrical
`conduction layer 70b.
`Thus, the structures depicted in FIGS. 2 and 3 provide
`integrated three-dimensional microelectronic device struc
`tures made from two-dimensional circuit elements, with
`internal and external electrical interconnections. These
`structures are normally packaged with conventional proce
`dures.
`FIG. 4 depicts another use of the device structures pre
`pared according to the present invention, as a “smart board”
`up on which other microelectronic components can be
`attached by wire-bonding techniques. The microelectronic
`device 71, shown in FIG. 4 in the form presented in FIG. 1
`and inverted from the orientation of FIG. 1, is prepared at
`any level of complexity of three-dimensional structure as
`discussed in relation to FIGS. 2 and 3. A separately fabri
`cated device 80 is attached to the back face 66 with an epoxy
`layer 82. Electrical interconnect pads 84 on the device 80 are
`connected to pad locations of the patterned electrically
`conducting layer 70 on the device 71 by wire-bonded leads
`85. External connections are achieved through wire-bonded
`leads 88 to the patterned electrically conducting layer 70.
`By this approach and with the structure of FIG. 4, the
`device 71 fabricated according to the approach of FIG. 1 can
`be used as a “smart board” containing nricroelectronic
`functions, for attachment of other devices 80. The device 80
`is not electrically connected to the device 71 by indium
`bumps or similar technique, but instead is connected by wire
`bonding or a similar approach.
`The present invention thus provides a highly ?exible
`microelectronic fabrication technique. Three-dimensional,
`multilayer structures with arbitrarily many layers of micro
`electronic circuit elements can be fabricated with external
`connection points. These structures can be used as-is, or as
`the “smart board” for attachment of yet other devices.
`Although a particular embodiment of the invention has
`been described in detail for purposes of illustration, various
`
`8
`modi?cations may be made without departing from the spirit
`and scope of the invention. Accordingly, the invention is not
`to be limited except as by the appended claims.
`What is claimed is:
`1. A method of fabricating a microelectronic device,
`comprising the steps of:
`furnishing a ?rst substrate having an etchable layer, an
`etch-stop layer overlying the etchable layer, and a
`wafer overlying the etch-stop layer;
`forming a microelectronic circuit element in the exposed
`side of the wafer of the ?rst substrate opposite to the
`side overlying the etch-stop layer;
`attaching the wafer of the ?rst substrate to a second
`substrate; and
`etching away the etchable layer of the ?rst substrate down
`to the etch-stop layer.
`2. The method of claim 1, further including an additional
`step, after the step of etching, of
`patterning the etch-stop layer.
`3. The method of claim 2, further including an additional
`step, after the step of patterning, of
`forming an electrical connection to the microelectronic
`circuit element through the patterned etch-stop layer
`and through the wafer.
`4. The method of claim 2, further including an additional
`step, after the step of patterning, of
`forming an electrical connection to the wafer through the
`patterned etch-stop layer.
`5. The method of claim 1, wherein the etchable layer is
`silicon, the etch-stop layer is silicon dioxide, and the wafer
`is single-crystal silicon.
`6. The method of claim 1, whe