`
`<12) Japanese Patent
`Publication (A)
`~
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`JPO Reference
`Number
`I
`’
`8019—5E
`9058—5E
`
`(11) Japan Patent
`
`Publication Number
`-
`-
`'
`JPHO4-144053
`(43) ‘Date of Publication A
`' May1_8, 1992
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`_ Identification
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`Request for Examination: Unrequested
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`Number of claims: 5 (4 pages total)
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`(54) Title of the Invention WHITE PULSED LIGHT GENERATING APPARATUS
`(21) JP Appl. No. H02—267882
`
`(72) Inventor: ITO Toshiaki,
`
`(22) Filing date: October 5, 1990
`
`c/o Hamamatsu Photonics K. K.
`1126-1, lchino-cho, Hamamatsu City, Shizuoka
`
`(72) Inventor: HIRAMATSU Mitsuo, c/o Hamamatsu Photonics K. K.
`1126-1, |chino—cho, Hamamatsu City, Shizuoka
`
`(72) Inventor: MURAKI Koji,
`
`(72) Inventor: HIRANO Isuke
`
`c/o Hamamatsu Photonics K. K.
`1126-1, lchino-cho, Hamamatsu City, Shizuoka
`
`c/o Hamamatsu Photonics K. K.
`1126-1, lchino-cho, Hamamatsu City, Shizuoka
`
`(71)AppIicant: Hamamatsu Photonics K. K.
`1126~1, lchino-cho, Hamamatsu City, Shizuoka
`
`(74) Agent: FURUSAWA Toshiaki, Patent attorney (and one other)
`
`SPECIFICATION
`
`1. Title of the Invention
`
`WHITE PULSED LIGHT GENERATING APPARATUS
`
`2. Claims
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`(1) A white pulsed light generating apparatus in which a metal which readily
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`emits electrons is provided in a transparent container, the container containing a
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`gas therein and being irradiation target means, and the electron~emitting metal is
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`irradiated with light having a high light intensity to cause predetermined white
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`pulsed light to be generated from the electron-emitting metal, wherein separating
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`means for separating the white pulsed light emitted from the electron-emitting
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`metal is provided in substantially the same direction as an incident direction of
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`the light having a high light intensity.
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`(2) The white pulsed light generating apparatus according to claim (1), wherein
`the separating means is constituted by a beam sampler which reflects the light
`
`ASML 1411
`
`
`
`Translation of JPHO4-144053A
`
`having a high lightintensity to irradiate the e|ectron—emitting metal and transmits
`the white-pulsed‘ light generated at the electron-remitting metal, .
`_
`H
`_
`(3) The white pulsed light generating apparatus according to claim ((2), wherein
`the beam sampler is formed by vapor—depositing' ZrO2, SiO2 onto ahquartz ‘
`substrate, the beam sampler reflecting approximately 100% of a laser of 1064
`
`nm, being the light having a high light intensity, and transmitting approximately
`100% of the generated white pulsed light.
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`(4) The white pulsed light generating apparatus according to claim (1), (2) or
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`(3), wherein a lens having a short focal length for focusing the light having a high
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`light intensity onto the electron-emitting metal is inserted between the separating
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`means and the irradiation target means,
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`(5) The white pulsed light generating apparatus according to claim (1), wherein
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`the separating means has a passage hole for allowing the light having a high
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`light intensity for irradiating the electron—emitting metal to pass therethrough, the
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`separating means being constituted by a reflecting mirror which reflects the
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`generated white pulsed light.
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`3. Detailed Description of the invention
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`[Technical Field of the lnvention]
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`The present invention relates to a white pulsed light generating apparatus for
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`obtaining white pulsed light with a high luminance.
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`[Prior Art]
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`It is known that irradiation of an electrode (cathode) in a xenon lamp to which
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`no voltage is applied with,
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`for example, a YAG laser of a fundamental
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`wavelength (1064 nm) causes white pulsed light with a high luminance to be
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`generated. This white pulsed light
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`is used, for example, as probe light
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`in a
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`time—resolved absorption measuring apparatus which uses a streak camera as a
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`detector.
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`In the time—resolved absorption apparatuses of this type, as shown in Fig. 5, a
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`sample (10) is irradiated with excitation light (9) of a laser pulse, and the spectra
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`and changes in the strength of excited species and reaction intermediates
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`generated in the sample (10) are tracked using white probe light (11) which is
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`white light having a continuous spectrum, where the changes in the strength of
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`the probe light (11) are detected by a streak camera (12) to observe the transient
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`absorption spectrum and changes in its strength.
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`As shown in Fig. 5, a generating apparatus for the white probe light (11): uses
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`
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`Translation of JPHO4-144053A
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`a lens (1) to focus light having a high light intensity, eg, a YAG laser of a
`_ fundamental wavelength (1064 nm), ontona front side of a cathode (4) in a xenon‘_
`lamp (3),. being irradiation target "means, to generate white light (5); extracts the
`generated white light (5); collects" the light using a lens (6); andsends the light
`via an optical fiber (7) to the sample (10).
`-
`[Problem to be Solved by the invention]
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`When the incident laser (2) is focused onto the cathode (4) in the xenon lamp
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`(3) as described above, the white pulsed light is generated from the cathode (4).
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`The white pulsed light is emitted with a high intensity particularly in a plane (13)
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`(the hatched portion in Fig. 5) in substantially the same path as the incident path
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`of the laser (2). However, since it has been structurally impossible to extract
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`the white pulsed light from the same path as the incident path of the laser (2) in
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`the related art, there has been no other way but to extract the white pulsed light
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`from a lateral side thereof, as shown in Fig. 5.
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`it is an object of the present invention to provide an apparatus capable of
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`extracting highly-efficient white pulsed light from a portion where it is emitted
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`with a high intensity in substantially the same path as the incident path of the
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`light having a high light intensity and further capable of preventing damage from
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`the incident light as a result of the above configuration.
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`[Means for Solving the Problem]
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`The present invention provides an apparatus in which a metal which readily
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`emits electrons is provided in a transparent container, the container containing a
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`gas therein and being irradiation target means, and the e|ectron—emitting metal is
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`irradiated with light having a high light intensity to cause predetermined white
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`pulsed light to be generated from the electron—emitting metal, wherein separating
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`means for separating the white pulsed light emitted from the electron-emitting
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`metal is provided in substantially the same direction as an incident direction of
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`the light having a high light intensity.
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`‘
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`{Effect}
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`If a laser is used as the light having a high light intensity, the beam diameter of
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`the incident laser should first be expanded to a maximum extent. By providing
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`a lens having a short focal length, the laser with such large beam diameter is
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`transmitted through a portion in the glass surface in the xenon lamp in such a
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`state that the beam diameter is expanded to a maximum extent to thereby
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`minimize damage to the glass surface portion. The transmitted laser is focused
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`onto the cathode in the xenon lamp and white light is generated at the cathode.
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`
`
`Translation of JPHO4-144053A
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`Only white pulsed light emitted in substantially the same path as the incident
`path of "the laser, from among the generated white pulsed light, is separated by _
`theseparating means and sent to the nextstage via an optical fiber.
`[Embodiments of the invention]
`An embodiment of the present invention will be described below with reference
`
`A
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`to the attached drawings.
`In Fig. 1, reference numeral (2) denotes light having a high light intensity, e.g.,
`a laser pulse having a fundamental wavelength of 1064 nm, 30 ps an_d 30 mJ
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`generated by an Nd:YAG laser apparatus. This laser (2)
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`is allowed to be
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`incident on a cathode (4), being an electron-emitting metal, and light emitted by
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`the cathode (4) is sent to separating means for separating it from the laser (2),
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`i.e., a beam sampler (8) such as a dichroic mirror. This beam sampler (8) is
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`formed by vapor depositing approximately 16 layers of ZrO2, SIO2 onto a quartz
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`substrate. Such beam sampler (8) is formed so as to have the property of
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`reflecting approximately 100% of light of around 1064 nm and transmitting
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`approximately 100% of the visible light range as shown in Fig. 2 and so as to
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`further have a high optical damage threshold. The laser (2) reflected by the
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`beam sampler (8) irradiates, through a lens (1), the electrode (cathode) (4) in the
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`xenon lamp (3), being irradiation target means. At this time, if a glass surface
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`(14) of the xenon lamp (3) has a large radius, the glass surface (14) will not
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`suffer from damage. However, if the glass surface (14) has a small radius, the
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`lens (1) is configured to be aspheric so as to have a short focal length and is
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`placed as close as possible to the xenon lamp (3), so that the laser (2) can be
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`transmitted through the glass surface (14) of the xenon lamp (3) in such a state
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`that its beam diameter has first be expanded, to thereby minimize damage to the
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`glass surface (14). When the laser (2) is focused onto the cathode (4) in the
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`xenon lamp (3), white pulsed light (5) is generated at substantially the whole
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`circumference of the cathode (4). Since the white pulsed light (5) in a plane
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`which is the same as the plane of incidence of the laser (2), from among the
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`generated white pulsed light (5),
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`is emitted with the highest intensity, the white
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`pulsed light (5) in the same path as the incident path is collected. The collected
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`light is allowed to pass through the lens (1) again and turned into parallel light
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`beams. The beam sampler (8) transmits approximately 100% of the visible
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`light range of the white pulsed light (5) and the transmitted white pulsed light (5)
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`is further focused by the lens (6) into an optical fiber (7) .and sent to the next
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`stage by the optical fiber (7).
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`
`
`Translation of JPH04—144053A
`
`. Although the above embodiment has described an example in which the
`cathode (4) in the xenon lamp (3) is irradiated with the laser (2) to obtain the“
`_ whitepulsed light (5), the present invention is not limited thereto.
`Specifically, a:
`sealed transparent container may be_used as‘ the glass tube, the transparent
`container being filled with an inert gas such as xenon, and as a metalwhich
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`readily emits electrons in the container, tungsten containing alkali metals or alkali
`earth metals such as, for example, barium or thoriummay be used.
`in addition,
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`the irradiation light source may not necessarily be a laser and may employ any
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`light having a high light intensity. The gas filling the tube may also be krypton
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`other than the xenon. However, the use of krypton would produce a slightly
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`reddish pulsed light.
`
`Although the above embodiment employs the beam sampler (8) as separating
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`means for refracting the light having a high light intensity so as to be incident on '
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`the electron~emitting metal (4) and for transmitting the white pulsed light (5),
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`other examples will be described with reference to Figs. 3 and 4.
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`In Fig. 3, the separating means is constituted by a planar reflecting mirror (8)
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`and a lens (6), where the light having a high light intensity is allowed to pass
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`through a passage hole (15) at the center of the planar reflecting mirror (8) to
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`irradiate the electron-emitting metal (4) in the transparent container (14). Since
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`the beam diameter at this point in time is small, this configuration should be
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`employed only when the light does not cause damage to the glass surface (14)
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`when passing through the transparent container (14). The generated white
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`pulsed light (5) is reflected by the planar reflecting mirror (8) and focused by the
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`lens (6) into the optical fiber (7).
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`Note that the separating means constituted by the planar reflecting mirror (8)
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`and the lens (6) may be replaced with that employing a concave mirror (8), as
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`shown in Fig. 4.
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`[Effect of the Invention]
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`Since the present invention has the configurations as described above, the
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`white pulsed light can be efficiently collected at the portion where it is emitted
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`with the highest intensity.
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`in addition, the provision of a lens with a short focal
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`length can allow the beam having a large diameter to be transmitted through the
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`glass surface and can thus prevent damage to the glass surface.
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`4. Brief Descriptions of the Drawings
`
`Fig.
`
`1
`
`is a diagram for illustrating a first embodiment of a white pulsed light
`
`
`
`Translation of JPHO4-144053A
`
`generating apparatus according to the present invention.
`. Fig.2 is a diagram showing wavelength (characteristics of a beam sampler.~ '
`Fig. 3 isa diagram for illustrating a second embodiment of a white pulsed light
`generating apparatus according to -the present invention.
`‘
`V
`Fig. 4 is a diagram for illustrating a third embodiment of a white pulsed light.
`
`'
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`'
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`generating apparatus according to the present invention.
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`Fig. 5 is a diagram for illustrating a related-art apparatus.
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`(1)
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`(2)
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`(3)
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`(4)
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`Lens
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`Light having a high light intensity
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`Irradiation target means
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`Electron-emitting metal
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`(5) White pulsed light
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`(6)
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`(7)
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`(8)
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`(9)
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`Lens
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`Optical fiber
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`Separating means for separating incident light and outgoing light
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`Excitation light
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`(10) Sample
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`(11) White probe light
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`(12) Streak camera
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`(14) Transparent container (glass surface)
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`(15) Passage hole
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`
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`Translation of JPH04—144053A
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`Fig. 1
`
`V1.
`
`'
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`CXJ\JCDU‘I-bCaOl\J-
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`_
`1
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`_
`Lens
`Light having a‘ high light intensity
`Irradiation target means
`Electron—emitting metal
`
`White pulsed light
`Lens
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`Optical fiber
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`Separating means of white pulsed light
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`14
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`Transparent container
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`Fig. 2
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`Y—axis: Transmissivity
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`X—axis: Visible range, Wave|ength(nm)
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`Light having a high light intensity
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`Electron—emitting metal
`Lens
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`Optical fiber
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`Separating means of white pulsed light
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`Transparent container
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`Passage hole
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`Fig. 3
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`2
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`O0\iO3~l>-
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`14
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`15
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`Fig. 4
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`4
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`Electron—emitting metal
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`Fig. 5
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`3
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`12
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`14
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`Irradiation target means
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`Streak camera
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`Glass surface
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`
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`STATEMENT OF ACCURACY »
`
`2," Hiroki Sate, c/0 ITMI ASSQCIA'I5E.S.,of23r§i»Fiéor, Roppongi. Hills Mori-Tower; '6-
`10v~1,} Roppongi, E\4iz}atc4~ku; Tdkyo 106-6123, Japan, do s§.i_emn1y and sincérely decfare thatl
`well u r1derstan‘d the Sapanese and Engiifish Ianguages and that the attached Engiish version is
`
`full, true and faithfui translation fnade by me this 30“’ day of Saptemberz-0‘1 3 Qflapanese‘
`
`Patent Publication No. »JPH04~I44051~%A.
`
`In testimony whereof, I have hereunto set my name and seal this 10”‘ day at’ December
`
`' 2015.
`
`Dacember ii C1, 2015
`
`
`
`12