throbber
.NOT.NED:A
`
`8.UD._,
`
`.Am,L
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 1 of 7
`
`

`
`
`
`
`
`AUGUST 22, l99WOL 42, NO. 17
`
`
`
`‘
`
`.
`
`,
`
`. . 47
`
`Ifcfilnlil-Yllgg HIGH-SPEED MODEMS: THEY'RE NOT JUST FOR DATA ANYMORE .
`Innovative modem technologies pump data, fax, and voice-mail at blazing
`speeds. Just how do they get those 114 kbits on that 3—kHz line?
`FEE?” MEMORY-CHIP STACKS SEND DENSITY SKYWARD .
`.
`. 69
`um: Vertical integration of silicon allows packaging of extre
`mely dense system
`memory_in tiny volumes.
`} j(
`flpylmgglggg BUILD A POWERFUL HOSTDSP INTERFACE .
`.
`. 77
`Dual-port memory combines the ease and cost of FlF‘0s with the datapath
`capability of custom hardware.
`
`__;__ .
`DEBUGGING SYSTEMS: GETTING THE PIECES TO WORK TOGETHER . . . 87
`Fixing errors in embedded systems calls for teamworl<—and tools.
`DEBUGGING: ENTERPRISE INSTRUMENTATION .
`.
`. 93
`Locating real-time bugs in embedded systems is especially tricky while
`integrating hardware and software.
`
`DEBUGGING FOR REAL TIME: HARD CHOICES .
`.
`. 101
`Because every tool has an effect on the system, knowing yo.ur tools is the best
`defense.
`
`
`'”"‘f""'“7' INTEGRATED CONTROLLER SUITS LASER PRINTERS .
`.
`. I53
`IMMMIW IC includes DRAM/ROM control, DMA, parallel port, interrupt controller,
`counter—timer, configurable I/O bus, and programmable I/O lines.
` ?.
`
`
`rzuzcrxoxic IJEIGN (IJSPS 172-080; ISSN 0013-4972) is published twice monthly except for 3 issues in lltayonnd 3 issues in October by
`Penton Publisliin Inc., 1100 Su zerior Ave.. Cleveland, OH :l4l M-2513 l‘nid rutcs for a one year substripl. n areas follows: $105 U.S.
`$185Canada,5214?Mexico.5255 niernntional.S-econd~c|n.-.3R‘iosbige paid atcleveland. OH and additional mailin offices. Editorial and
`:td\'erlisin addresses: B1.l.‘(.'l'll0.\'lC DESIGN. 611 Route #46 ’m~:t. Hiuzhmueln Heights, NJ 0760-1. ‘Pele hone
`)39.'Hi060. Pacsirmle
`(20l)1§)3-4) 04. Prlnwd in [l.S.A. 1‘itlt-registered in U.S. lhlenl 0l‘l'it_:e.Cnp_\'rl
`lit
`l994 by Penlon Pubgishin Inc. All ri
`lits rmen/ed.
`he contents ofthis publication may notlx; reproduced in whole orIn_ art wit outthe consentof the copyrig il oirpcr. orsubscriber
`chun e of address and subscription in: umes. call (2!!!) 69(‘»'l0(l0, Mm your subscription requests to: Ponton Publishmg Subscription
`Ilxltfiox, P1). Box 96732, Chicago, IL6 G93.
`POSTM ASTER: Please send ch
`zmrze oiuddrt-as IOHLHTRONICDISIGN, l-‘enum l‘ublisliiug Inc... 1100 Supt.-n'orI\ve.. Claw,-land, Oll Ml l4—2."yl.'l.
`,-
`ELECTRONIC ursicnlal
`:\lJ(iU$.-'l' 22. I904
`
`
`SAMSUNG ET AL. EXHIBIT‘ 1058
`
`Page 2 of 7
`
`

`
`
`
`COVER FEATURE
`
`
`
`VERTICAL INTEGRATION OF SILICON
`ALLOWS PACKAGING OF EXTREMELY DENSE
`SYSTEM MEMORY IN TINY VOLUMES.
`MEMORY-CHIP STACKS
`
` Stacking memory ICs vertically has other
`benefits besides the density gains. The close
`
`physical proximity of the chips significantly
`
`reduces the system delay associated with in-
`
`terconnect capacitance and pc—board trace
`
`length. Speed is increased while power re-
`
`quirements and operating temperatures are
`
`reduced compared with horizontal layouts.
`
`CMI has leveraged its chip-stacking tech-
`
`nology into an initial pair of pror.lu<:t families.
`
`ELEC1‘!!0NIlI[)ESlGlvl[jEl
`A U(}US’l‘ 22, 199-1
`
`
`
`
`
`
`
`
`
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 3 of 7
`
`
`
`
`
`
`
`SEND DENSITY S
`
`DAVID MALINIAK
`
`any aspects of board de-
`sign, such as timing, ther-
`mal issues, and manufac-
`turability, require innova-
`tive thinking. But
`if
`there’s one aspect of board
`design that’s relatively predictable, it's the
`layout, which is done in the X and Y dimen-
`sions. Chips are, almost without exception,
`placed side by side in some arrangement,
`even if the board is double-sided or flexible.
`This constant of board design, however, is
`the great limiter of a board’s packaging den-
`sity. And nowhere is this limitation more glar-
`ing than in the layout of system memory,
`where row upon row of DRAMs sprawl
`across vast expanses of pc board like some
`silicon suburban development.
`But the push is on to shrink systems, and
`the traditional layout concepts are becoming
`an extravagance. Over the years, there have
`been a number of attempts at exploiting the
`third dimension in board layout. Chips have
`been stood on their edges and sandwiched to-
`gether and there have been attempts atstack-
`ing them vertically. But until now, such
`schemes have been either too expensive or
`the yields have been poor. In some cases, the
`density achieved wasn't worth the effort.
`With the development of its technology for
`vertical integration of memory wafers, wafer
`segments, and individual die, Cubic Memory
`Inc. (CMI), Scotts Valley, Calif., has shot-
`tered the density barrier (Fig. 1). Instead of
`the 40-to—80-Mbyl.e/in.“ storage densities pos-
`sible with conventional packaging—-using 16-
`Mbit memories in smaltoutline J-lead pack-
`ages (SOJS) or two-sided thin s1nall~outline
`packages (TSOPs)—CMI claims the ability to
`achieve densities of a gigabyte or more per
`cubic inch.
`
`

`
`
`
`l
`
`I
`‘
`i
`
`'
`
`I
`
`I
`
`I
`
`I
`
`'
`
`l
`
`.7“ _ .
`
`_..... 4._>-__¢____:._ _?_j.
`flaunt
`MEMORY-CHIP STACKS
`
`'
`
`
`
`interconnection
`provide horizontal
`of the die on a single layer or seg-
`ment, and the gold pads provide a
`
`
`
`'
`
`
`
`
`non-oxidizing metal surface for the
`the
`takes advantage of
`One
`layer-to-layer interconnections.
`PCMCIA-card format for adding
`Whole wafers, segments of wa-
`workstation-quantity memory to
`‘
`fers, or individual die can be
`Pentium-based portables,
`'
`'
`J! stacked. In addition, multi-
`while the other works with-
`.
`ple silicon technologies can
`in the DRAM SIMM format.
`; be mixed in the same stack
`Both merely hint at the tech-
`(Fig. 3). Other components
`nology's potential, which is
`I can be placed on top of the
`not necessarily limited to "
`silicon stack as well.
`stacking of memory alone.
`For the small—hole and
`There are actually three ‘,
`VIP processes, standard
`separate technologies for .
`wafers can be used without
`vertical integration, each of
`need for any custom silicon.
`which is suitable for differ-
`Individual chips can be se-
`ent applications. The three
`lected by the control circuit-
`processes are referred to as
`ry. The vertical chip-to-chip
`the large-hole process, the -'
`distance is variable from
`small-hole process, and the
`0.003 to 0.010 in., depending
`Vertical
`Interconnect Pro-
`on the application and densi-
`cess (VIP). Common to each '
`ty required.
`process is a vertical silicon -,
`The vertically integrated
`interconnect and a patented '-
`stacks are attached directly
`compliant
`interconnect
`scheme.
`to pc boards. Tests on whole
`wafers and wafer segments
`The first two processes,
`have shown a 15% reduction
`known as the large- and
`in power consumption and a
`small-hole processes, use a v
`20°C lower continuous oper-
`patented, pyramid-shaped :
`ating temperature when
`via through the silicon (Fig.
`:
`compared to identical cir-
`2). The small opening on the ~
`cuits operating in conven-
`top of the pyramid pene-
`tional plastic packages.
`trntes on the circuit side and
`Originally, the large-hole
`the large opening comes
`process was developed to al-
`through the back side of the
`low stacking of complete 6-
`silicon, where the intercon-
`in. DRAM wafers. The pyra-
`nect makes contact with a
`mid-shaped holes are filled
`number of circuit elements
`with a mesh of fine gold-
`on the silicon immediately
`plated wire. The wires form
`below. This interconnect
`a mushroom shape on the
`method takes up no space,
`circuit side of the wafer, and
`as all pins fan out under the
`the other ends of the wire
`silicon stack instead of tak-
`are compressed and con-
`ing up large areas around
`tained in the pyramid base.
`the perimeter of the active
`When the wire-filled base of
`silicon, as is done with con-
`the pyramid of one wafer is
`ventional packaging. In ad-
`brought into contact with
`dition,
`this method allows
`the top of another wafer, the
`the individual circuit ele-
`mushroom-shaped “fuzz
`ments to be easily isolated
`button” is captured by the
`for testing up until the final
`base of the pyramid. All of
`stack assembly.
`the wires are then contained
`The VIP process is a less
`and a compressive gold-to-
`expensive extension of the
`gold contact is formed be-
`small-hole process and does
`.4 tween the circuit elements
`not require the pyramid—
`2. BOTH THE small- and lugc-hole processes use:pyrarniui-
`of both wafers. The result is
`v
`shaped via through the sili-
`f shaped via through the silicon to make the vertical
`a very reliable, fully compli—
`'
`-’
`con. Instead, gold intercon-
`neet traces and vertical-in— ‘_._3
`interconnections. The small opening on the top of the pyramid
`ant, reworkable intercon-
`terconnect pads are deposit-
`;_;‘
`penetrates on the circuitsidc and the large opening comes through
`nect that supports intercon-
`ed over insulating layers of ‘
`the back side of the silk-.on,where the interconnect makes contact
`nections in both the horizon-
`polyimide. The gold traces
`witlinnnmberofcircuitelementson thesilicouimmediatelybelow.
`tal and vertical directions.
`ELECTRONIC DESIGN
`AUGUST 22, 1994
`.
`
`.
`
`‘
`
`~
`
`.,~
`-»
`-
`-
`v
`I. INSTEAD OF THE 4040-80-Mbyte/in.’storIgedeI1sities
`possible with conventional packaging (Ming I6-Mhlt memories in
`S0.ls or two-sided 'I‘SOPs), Cubic Memory Inc. (CM!) claims the
`ability to achieve densities of a gigabyte or more per cubic inch.
`
`
`
`
`
`I
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 4 of 7
`
`

`
`
`
`'l‘he “1'uzz-button" inter-
`connect does, however, re-
`quire a custom mask set.
`And the holes are large by
`semiconductor standards:
`150 pm at the top and 1000
`pm at the base. This inter-
`connect technology is still
`used in some applications.
`The small-hole process
`was developed as a refine-
`ment of
`the large-hole,
`“fuzz—hutt.on” technology to I
`allow interconnects on stan-
`dard
`semiconductor-die
`bonding pads without the
`need for a specialized struc-
`tu re. In this method, off-the
`shelf memory wafers can be
`used without the need for the semi-
`conductor manufacturer to run a
`custom mask set.
`In this case, the hole-making pro-
`
` on bottom) so that the verti-
`
`interconnect is accom-
`cal
`plished within a bond-pad
`area and on conventional
`bond-pad pitches.
`The small-hole process in-
`corporates one level of dis-
`cretionary wiring for every
`layer of silicon in the stack.
`Each die also has the neces-
`sary
`control
`signals
`brought out so that the con-
`trol circuitry can address
`each chip uniquely.
`Silver—filled epoxies are
`used for the compliant con-
`ductive material. These
`
`segments of waters, or individual
`3.
`die can he suckul. In addition. multiple silicon technologies can be
`mixed in the same stack. Other components can he placed on top of
`the silicon stack as well.
`
`cess is similar to the fuzz-button pro-
`cess, but the dimensions change. The
`wafers are thinned and the holes are
`small enough (25 pm on top, 120 pm
`
`proven materials are the
`same ones that have been
`used for years by semiconductor
`manufacturers as a die-attach medi-
`um. CMI has developed a proprietary
`application method for the dispens-
`
`
`
`
`_,
`
`anufacturers of lap-
`top/notebook comput-
`ers are forever facing
`the
`challenge
`of
`squeezing desktop performance
`into an easy—to-transport pack-
`age. In the RISC-workstation are-
`na,
`the problem intensifies, be
`cause many of the Unix-based ap-
`plications demand tremendous
`amounts of memory to execute
`quickly.
`Just such a problem was faced
`by designers of the SPARCbook
`III at Tadpole Technology plc,
`Cambridge, U.K.,
`explains
`George Grey, the group chief/ ex-
`ecutive officer. The need for an al-
`ternative to the standard DRAM
`single-in-line memory module
`(SIMM), which peaks in capacity
`at 32 Mhy tes, led Tadpole to team
`with Cubic Memory Inc. (CMI) to
`develop higher—density SlMMs.
`By taking advantage of CMI's
`vertical
`interconnect process
`(VIP), designers at Tadpole and
`CMI defined an extension to the
`standard DRAM SIMM that will
`initially provide 64 Mbytes of stor-
`age (organized as 16 Mwords by
`36 bits, which includes byte-parity
`hits). F'urthermore, CMI expects
`to double the capacity to 128
`
`Mbytes per SIMM by late 1994,
`and still keep the SlMlV[ lieight: to
`just 1 in.
`One of the first steps designers
`had to take to enhance the SIMMs
`was to expand the address range.
`They added one more address line
`and two additional row-address-
`strobe (RAS) lines by using sever-
`al pins that were previously no-
`connect pins on the SIMM. Some
`of the key issues that designers
`had to deal with, explains Dave
`Pedersen, V.P. of engineering at
`CMI, included the banking archi-
`tecture and capacitive loading ef-
`fects in highly-configured sys-
`tems. Fortunately, because the
`memory chips are mounted on top
`of each other, there are no pack-
`age loading effects. Also, typical-
`ly, only one bank of memory is
`turned on at a time, which mini-
`mizes thermal problems.
`Once the interface was defined,
`the memory structure was imple-
`mented using “stacks” of memo-
`ry layers. The memory stacks con-
`sist of eightrsegment layers (each
`segment can be thought of as a 2-
`Mword bank of-DRAM). The VIP
`scheme employs pyramid-shaped
`recesses on the outer edge of the
`chips. Then, when the chips are
`
`stacked, the contact edges are ex-
`posed so that (ZOI1(.ll1('1'.lV(‘. epoxy
`easily fills the recesses and real-
`izes the connections.
`Each segment layer in the mem-
`ory stack consists of a monolithic
`piece of silicon that contains four
`2-Mword-by-8-bit DRAMs, thus
`forming a 32-bit-wide memory
`block. Complementing the 32-bit-
`wide stack is a second stack that
`
`provides the four parity bits for
`each word.
`After the stacks are assembled,
`they are mounted in the SIMM
`substrate. The substrate actually
`has a hole the size of a stack cut
`into it and the stack is then insert-
`ed into the substrate. The stack
`protrudes out of one side of the
`substrate by the amount of the
`difference in their thicknesses. In
`the case of the 128-Mbyte stacks,
`which stand 0.160 in. tall, they pro-
`trude 0.098 in. from the 0.062-in:
`thick substrate. That's less than
`the height of a thin small-outline
`package. When coated with the
`sealing epoxy, the mechanical (lu-
`rability of the SIMMS is as good as
`previous-generation SlMMs that
`were populated with surface-
`mounted components.
`B Y DA VE‘ B URSKY
`
`mELECTRONlC
`AUGUST 22, 199-1
`
`D E S
`
`l
`
`(ZN
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 5 of 7
`
`

`
`ing and application of these epoxies
`for connection in both the hori‘/.ontal
`and vertical dimensions.
`Taking the process a step further,
`the VIP process makes
`high—volume automation a
`part of the manufacturing
`cycle. It’s also the lowest-
`eostmethod, because ituses
`asubset of the steps used in
`the small-hole process and
`does not require the pyra-
`mid-shaped hole through
`the silicon. The VIP process
`is suitable for stacking die
`and wafer segments that do
`not have a large number of
`interconnects to outside log-
`ic. It is not suitable, howev-
`er, for stacking whole wa-
`fers.
`In the VIP process, gold
`traces and vertical-intercom
`nect pads are deposited over
`insulating layers of polyi-
`mide. Then, the wafers are
`thinned and sawed into seg-
`ments. The segments’ edges
`M
`are beveled to allow vertical
`interconnection (Fig. 4). The "
`gold traces provide horizon-
`tal interconnection of the din _
`on a single layer or segment
`‘*-
`and provide layer- or seg-
`;
`ment-specific memory-ad
`'.
`dress decoding capability.
`Pins that are parallelable -
`are connected that way,
`which results in a reduction
`of pin count per layer of
`about 4:1. If the resulting ..,‘
`stack has ten layers,
`the 3
`overall reduction in pin ?_‘_-'
`countis about40:1. The gold
`bonding pads are exposed at
`the sides of the segments
`thanks to the 45° bevel cut
`
`.,
`--
`
`'
`
`_
`
`3 -'
`; "
`
`'
`
`ductivity to enhance dissipation of - today, CM I is offering two forms of
`heat from the stack.
`memory modules for expansion of
`To leverage its chip-stacking tech-
`portable-system memory. One is the
`nology into products that are usable
`3DMemory family of 88-pin JEDEC
`memory modules in capaci-
`ties of 16, 32, 64, and 128
`Mbytes. These are targeted
`for use in portables with a
`Type I PCMCIA slot, and
`are especially meant for
`Pentium—based portables
`that are expected to be able
`to address 64 Mbytes of sys-
`tem memory or more by this
`fall’s Comdex show.
`In this implementation of
`the technology, a glimmer
`ofitspotcntialimpactcomes
`into focus. For manufactur-
`ers using conventional tech-
`nologies, volumetric space
`requirements limit portable
`add-in memory cards to one
`double-sided pc board using
`’l‘SOP packages. Typically,
`only 16 to '18 ICs will fit into
`the available space, so to re-
`ulizc
`the maximum 16
`_ Mbytes of storage, the man-
`ufacturer must use costly
`j 16-Mbit DRAMS. Here’s
`where the vertical—intep;ra-
`tion technology comes in.
`‘
`‘ With it, memory cards are
`built using the most cost-ef-
`:gl fective DRAMS available.
`4 The 16-Mbyte card conta.ins
`two stacks of four layers
`_ -' each. Each 2-Mbyte layer is
`' made up of four 4-Mbit
`DRAM die. The 32-Mbyte
`card increases the two
`» stacks to eight layers each.
`i This produces a 16-Mbit
`module with a 32-bit word.
`
`4. IN THE VIP PROCESS, gold traces and bonding pads
`are deposited over insulating layers of polyimide. Then, the wafers
`are thinned and their edges beveled to allow vertical
`interconnection. The gold traces provide horizontal
`interconnecfion of dieon a single layer or segment and provide
`layer or segmentspecifc niernory-mldrusu decoilc capability.
`
`V
`
`'
`
`-
`
`I
`
`-
`
`'
`
`.
`
`
`
`.
`
`.
`
`,
`
`‘
`
`a
`
`.
`
`'
`
`\
`
`.\€~
`
`__._
`
`_.
`
`.
`
`__ _.
`
`.__
`
`___._______-___,._..-______ ,,
`
`..
`
`.
`
`.
`
`..
`
`.
`
`-__________
`
`MEMORNIHIP STACKS
`
`
`
`si|,,e,.r,“mp,,,y
`
`dd mm
`
`Pc board
`
`cm nmmmmsammu
`5".
`ha
`I
`I
`"°" "*9"
`
`-_
`Gold
`
`Pcmmh
`
`Up to 128 Mbytes is easily
`accommodated within the
`
`PCMCIA Type I form fac-
`tor.
`
`: It
`
`'
`
`-‘
`
`and are used for the layer-
`to—layer connections.
`A conductive silver-fillet]
`
`
`
`For memory-card manu-
`epoxy is used for both physi-
`facturers using convention-
`cal and electrical connection
`al packaging technologies,
`the volumetric space re-
`of the layers.'l‘hc same eon—
`quirements limit the cards
`ductive epoxy is used to con-
`toonedouble-sided pc board
`nect
`the stack to the pc
`using TSOPS. Only 16 to 18
`‘L 5. [N BOTH THE 88-pin JEDECmodnle and the Slims, the
`board. The stack is then on 1],
`capsulated with a casting .3 _i, memory stacks are not mounted to the curd'sinia-oaipcboardoa memory chips fit into the
`resin to provide protection ‘‘
`such. Rather, they are"flonted" inside holes that go through the
`available space, so to realize
`and mechanical durability.
`board and Attached at their pcriplirry by means of beam-style lends
`the maximum 16 Mbytes of
`The resin also provides
`consisting of ronductiveenory. They are then glolrtorr
`storage, the manufacturer
`some degree of thermal con» .42‘. ./ encapsulated on the reverse side to provide stability.
`must use cost] y 16-Mbit
`flflstiicriroraic ossicr:
`AUGUST 22, 199.4
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 6 of 7
`
`

`
`MEMORY-CHIP STACKS
`
`
`
`DRAMs. In contrast, CMI's vertical
`integration technique offers its in-
`herent density advantages and en-
`ables cards with capacities of 16
`Mbytes and more to be built using 4-
`or 16-Mbit DRAMs.
`An interesting note on the con-
`struction of the cards is that the
`memory stacks are not mounted to
`the card’s internal pc board as such.
`Rather,
`they are “floated" inside
`holes that go through the board and
`attached at their periphery by means
`of beam-style leads consisting of
`conductive epoxy. (Fig. 5).
`For adding system memory to
`workstations and servers, CMI is of-
`fering a line of 3DMemory 64- and
`128-Mbyto DRAM SIMMS. Previous-
`ly, the maximum density of standard
`72~piII SlMMs has been 32 Mbytes
`(see “Putting memory stacks to
`work, "p. 57).
`The 64-Mbyte SIMMs are made
`from eight layers of 8—Mbyte wafer
`segments (each made from four 16-
`Mbit DRAM die) plus a four-layer
`stack of 16-Mbit die for parity. The
`128-Mbyte SIMMS will use 16 8-
`MByte layers, plus an eight-layer
`stack of 16-Mbit die for parity. The
`memory organization is 16 Mbytes
`by 36 bits for the 64-Mbyte SIMM
`and 32 Mbytes by 36 bits for the 128-
`Mbyte version. D
`~
`
`PRICE AND AVAILABILITY
`The .?DMemory 88-pin JEDEC memory
`modules will be sold to 0EMs as well as
`llmougll. llw reseller chmmel to end users.
`The llz‘-Mlvyle modules are Scll(»Kl'Il.l(.’tl to
`sIi1'.piu.S‘eplcmbe1', mid at torla_I/‘s memory
`prices will leave (1 .mg_ csled price of8.995.
`The 32-, 84-, and I28-ll! 3/lo versions will be
`available during the fourth quarter and
`pricing is projected at 51.9.95, 53.9.95, and
`37.995 each, mspizctrucly.
`The .?DMem.or_:/ ?2-pin SlMMs will ini-
`tially be sold only to ()E'Ms. At lodays
`memory prices, the 6'4-Mbyle SlMM.c will
`cost .\‘3.<l9.V in sample lots a.~n.d 33.5.9.9 in
`qua1z.lit'I'4:s of 1000. The 128-Mbytc SlMMs
`will scllfo r 37.9.9.9 (samples) and $71.99 (pro-
`duction quanlitics). Samples are avail-
`able wow and production quantities will
`be available dm-ing thefourth qua.rtrrr.
`Cubic Mcmory lm:., 27’Ja.nis Way, Sculls
`Valley, CA 950663‘ (408) 4-98-188?? fax (403)
`4o5'z9-I890.
`CIRCLE 512
`
`How VALUABLE?
`HIGHLY
`MODBRATELY
`
`534 SLIGHTLY
`
`CIRCLE
`533
`
`535
`
`eedy LMOS
`Our
`logic ls Bi News.
`But Welre eeping
`It Quiet.
`
`It’s hard to keep the noise down on a
`development this big.
`But that’s exactly what we’ve done.
`Our new VHS (V'HC comparable) series of
`LMOS logic not only offers high speed switching,
`but super-low noise besides.
`AC speed at HC levels, you might say.
`What’s more, its single-gate formal makes for
`more board space. Along with increased design
`flexibility.
`So call us at 1-800-879-4963 to get in on
`
`a timely idea.
`Lightning-fast LMOS.
`Without the thunder.
`
`In Touch with Tomorrow
`TOSHIBA
`TDIHIBA AMERICA ILECTHDNIC CDMDUNENTE, INC.
`
`@1933 Toshiba Ann.-rica Electronic CunIpoIieIIls, lnr.
`
`Sl’I)~€i3 U37.-‘x
`
`READER SERWCE152 CALL ME
`READER SERVICE 183 FOR INFORMATION
`
`.
`
`
`
`ELECTRONIC DESIGNER
`AUGUST 22.1994
`
`SAMSUNG ET AL. EXHIBIT 1058
`
`Page 7 of 7

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket