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`026 454 675
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`llll Ill Ill II Ill II llll I llll I II
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`IN THE UNITED STATES DISTRICT COURT
`DISTRICT OF ARIZONA
`
`Test Advantage, Inc., an Arizona
`corporation,
`Plaintiff,
`
`vs.
`Eric Paul Tabor and Ronni Tabor, husband
`and wife; and Rizon Software, L.L.C., an
`Arizona corporation,
`
`Defendants.
`
`No.: CV2005-03392-EHC
`
`ORDER RE: CLAIM
`CONSTRUCTION
`
`Pursuant to the Stipulation of the Parties, it is ordered that that the below-
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`16 identified terms of the Tabor Patent shall be construed as follows:
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`1. The term "tester'~ shall mean equipment used to test semiconductors,
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`including but not limited to automatic test equipment (A TE) available from such
`19 suppliers as Teradyne.
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`2. The term "outlier" shall mean a test result that is within the upper and lower
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`22 limits of the product's specifications (i.e., a test result that does not indicate a "bad" or
`23 "out of spec" part) but nevertheless strays from values which are statistically similar.
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`3. The terms "identify an outlier", "identify outliers", and "identifying an
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`outlier" shall be interpreted to establish the identity of an outlier that is retained in the
`26 data for later use (including but not limited to being included in an output report) ~'l""f"'.ll"'IPl~""""'""lll
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`rather than being removed or screened from a set of data.
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`ase 2:05-cv-03392-EHC Document 93
`
`Filed 02/16/2007 Page 1 of 2
`Linear Tech. Corp. v. In-Depth Te t LLC
`Page 1
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`
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`1
`4. The term "supplemental data analysis" as used in Claims 8-14 shall mean
`2 any appropriate automated analysis of the test data to achieve any suitable objective -
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`i.e., any computerized or automated analysis of the test data beyond that provided by
`4 the tester itself in generating the test data.
`5
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`5. The term "section group of components on a wafer" in Claims 3, 10, and 17
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`7 shall mean that the test data of the wafer to be analyzed is separated into separate
`8 sections or groups of components and that the test data of each section or group is
`then analyzed separately.
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`6. The term "at run time" in Claims 6, 13, and 15-20 shall mean within a
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`11 matter of seconds or minutes following the generation of the test data.
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`It is further ordered vacating the Markman Hearing currently scheduled for
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`14 March 29, 2007.
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`DATED this 16th day of February, 2007.
`
`Earl H. Carroll
`United States District Judge
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`ase 2:05-cv-03392-EHC Document 93
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`2
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`Filed 02/16/2007 Page 2 of 2
`
`LineCilr Tech. Corp. v. In-Depth Test LLC, Page 2
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