`____________________________________________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________________________________________
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`
`
`ASML NETHERLANDS B.V., EXCELITAS TECHNOLOGIES CORP., AND QIOPTIQ
`PHOTONICS GMBH & CO. KG,
`Petitioners
`
`v.
`
`ENERGETIQ TECHNOLOGY, INC.
`Patent Owner
`
`Case IPR2015-01300
`
`
`
`DECLARATION OF J. GARY EDEN, PH.D.
`U.S. PATENT NO. 7,435,982
`CLAIMS 37, 42-43, 49, 55, 61-64, 67, 68, 71, 72, 74, AND 78
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`ASML 1103
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`TABLE OF CONTENTS
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`Page
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`V.(cid:3)
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`D.(cid:3)
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`BACKGROUND ............................................................................................. 1(cid:3)
`I.(cid:3)
`LEGAL PRINCIPLES ..................................................................................... 6(cid:3)
`II.(cid:3)
`PERSON OF ORDINARY SKILL IN THE ART .......................................... 7(cid:3)
`III.(cid:3)
`IV.(cid:3) OVERVIEW OF THE ’982 PATENT ............................................................ 8(cid:3)
`A.(cid:3)
`Summary of the Prosecution History .................................................... 9(cid:3)
`CLAIM CONSTRUCTION .......................................................................... 10(cid:3)
`A.(cid:3)
`“Light source” ..................................................................................... 10(cid:3)
`B.(cid:3)
`“High brightness light” ........................................................................ 12(cid:3)
`C.(cid:3)
`“A first ignition means for ionizing an ionizable medium within
`the chamber” ........................................................................................ 15(cid:3)
`1.(cid:3) Function ........................................................................................ 15(cid:3)
`2.(cid:3) Structure ....................................................................................... 15(cid:3)
`“Means for providing substantially continuous laser energy to
`the ionized medium within the chamber” ........................................... 16(cid:3)
`1.(cid:3) Function ........................................................................................ 16(cid:3)
`2.(cid:3) Structure ....................................................................................... 16(cid:3)
`VI.(cid:3) THE CHALLENGED CLAIMS ARE INVALID ......................................... 17(cid:3)
`A.(cid:3)
`Laser Sustained Plasma Light Sources Were Known Long
`Before the Priority Date of the ’982 Patent ......................................... 17(cid:3)
`VII.(cid:3) GROUNDS FOR FINDING THE CHALLENGED CLAIMS INVALID ... 19(cid:3)
`A.(cid:3) Ground 1: Claims 37, 42-43, 49, 55, 61-62, 67-68, 71, 74 and
`78 are anticipated by Gärtner .............................................................. 19(cid:3)
`1.(cid:3) Overview of Gärtner ..................................................................... 20(cid:3)
`2.(cid:3)
`Independent Claim 37 .................................................................. 23(cid:3)
`3.(cid:3)
`Independent Claim 67 .................................................................. 26(cid:3)
`4.(cid:3)
`Independent Claim 74 .................................................................. 30(cid:3)
`5.(cid:3)
`Independent Claim 78 .................................................................. 33(cid:3)
`6.(cid:3) Dependent Claims 42 and 68– Optical Element for Modifying a
`Property of the Laser Energy ........................................................ 35(cid:3)
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`i
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`B.(cid:3)
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`7.(cid:3) Dependent Claim 43 – Optical Element Is a Lens or Mirror ....... 37(cid:3)
`8.(cid:3) Dependent Claim 49 – Sealed Chamber ...................................... 37(cid:3)
`9.(cid:3) Dependent Claim 55 – Ionizable Media ....................................... 37(cid:3)
`10.(cid:3) Dependent Claim 61 –Ignition source is a pulsed laser, electrodes,
`or other types of ignition sources ................................................. 38(cid:3)
`11.(cid:3) Dependent Claim 62 – Ignition Source is External or Internal to
`the Chamber .................................................................................. 39(cid:3)
`12.(cid:3) Dependent Claim 71 – Ionizable Medium Comprises a Solid,
`Liquid, or Gas ............................................................................... 39(cid:3)
`Ground 2: Claims 63, 64, and 72 are Obvious over Gärtner .............. 40(cid:3)
`2.(cid:3) Dependent Claims 63 and 72 – Optical Element For Modifying A
`Property of the Emitted Light ....................................................... 40(cid:3)
`3.(cid:3) Dependent Claim 64 – Optical Element is Mirror or Lens .......... 44(cid:3)
`VIII.(cid:3) RESPONSE TO ARGUMENTS RAISED BY PATENT OWNER IN ITS
`PRELIMINARY INJUNCTION MOTION .................................................. 44(cid:3)
`A.(cid:3)
`Patent Owner’s Arguments Regarding the Content of the Prior
`Art ........................................................................................................ 45(cid:3)
`Patent Owner’s Arguments Regarding Objective Indicia of
`Non-Obviousness ................................................................................ 49(cid:3)
`IX.(cid:3) AVAILABILITY FOR CROSS-EXAMINATION ...................................... 50(cid:3)
`X.(cid:3)
`RIGHT TO SUPPLEMENT .......................................................................... 50(cid:3)
`XI.(cid:3)
`JURAT ........................................................................................................... 51(cid:3)
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`B.(cid:3)
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`ii
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`I, J. Gary Eden, Ph.D., declare as follows:
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`1. My name is J. Gary Eden.
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`I.
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`BACKGROUND
`2.
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`I am the Gilmore Family Professor of Electrical and Computer
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`Engineering and Director of the Laboratory for Optical Physics and Engineering at
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`the University of Illinois in Urbana, Illinois.
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`3.
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`I received a B.S. in Electrical Engineering (High Honors) from the
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`University of Maryland, College Park in 1972 and an M.S. and Ph.D. in Electrical
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`Engineering from the University of Illinois in 1973 and 1976, respectively.
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`4.
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`After receiving my doctorate, I served as a National Research Council
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`Postdoctoral Research Associate at the United States Naval Research Laboratory
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`(“NRL”), Optical Sciences Division, in Washington, DC from 1975 to 1976. As a
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`research physicist in the Laser Physics Branch (Optical Sciences Division) from
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`1976 to 1979, I made several contributions to the visible and ultraviolet lasers and
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`laser spectroscopy field, including the co-discovery of the KrCl rare gas-halide
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`excimer laser and the proton beam pumped laser (Ar-N2, XeF). In 1979, I received
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`a Research Publication Award for my work at the NRL.
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`5.
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`In 1979, I was appointed assistant professor in the Department of
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`Electrical and Computer Engineering at the University of Illinois. In 1981, I
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`became associate professor in this same department, and in 1983, I became
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`professor in this department. In 1985, I was named the Director of the Laboratory
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`for Optical Physics and Engineering, and in 2007, I was named the Gilmore Family
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`Professor of Electrical and Computer Engineering. I continue to hold both
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`positions today. In addition, I am also Research Professor in the Coordinated
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`Science Laboratory and the Micro and Nanotechnology Laboratory.
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`6.
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`Since joining the faculty of the University of Illinois in 1979, I have
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`been engaged in research in atomic, molecular and ultrafast laser spectroscopy, the
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`discovery and development of visible and ultraviolet lasers, and the science and
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`technology of microcavity plasma devices. My research has been featured in Laser
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`Focus, Photonics Spectra, Electronics Weekly (UK), the Bulletin of the Materials
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`Research Society, Microwaves, Optical Spectra, Electro-Optical Systems Design,
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`Optics and Laser Technology, Electronics, Optics News, Lasers and Optronics,
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`IEEE Potentials, IEEE Spectrum, and IEEE Circuits and Devices. My work was
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`highlighted in the National Academy of Sciences report Plasma 2010, published in
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`2007.
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`7.
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`I have made several major contributions to the field of laser physics,
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`plasma physics, and atomic and molecular physics. I co-invented a new form of
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`lighting, “light tiles”, that are thin and flat. This culminated in the formation of a
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`company called Eden Park Illumination. I discovered numerous ultraviolet, visible
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`and near-infrared atomic and molecular lasers, including the KrCl ultraviolet
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`(excimer) laser, the optically-pumped XeF, HgCl, and rare gas lasers and the CdI,
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`CdBr, ZnI, Li, Fe, and Cd visible and near-infrared lasers. I demonstrated the first
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`long pulse (> 1 μs) excimer laser and the first lasers (Ar – N2, XeF) pumped by a
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`proton beam. The excimer lasers are now used worldwide in photolithography,
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`surgical procedures (such as corneal refractive correction) and micromachining of
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`materials. I discovered the laser excitation spectroscopy of photoassociation (the
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`absorption of optical radiation by free atomic pairs) of thermal atoms as a probe of
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`the structure of transient molecules. I demonstrated with my graduate students the
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`first ultraviolet and violet glass fiber lasers. I discovered the excimer-pumped
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`atomic lasers (lasing on the D1 and D2 lines of Na, Cs, and Rb) for laser guide stars
`
`and mesosphere probing by LIDAR. I conducted the first observation (by laser
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`spectroscopy) of Rydberg series for the rare gas diatomics (Ne2, Ar2, Kr2, Xe2) and
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`the first measurement of the rotational constants for Ne2 and Ar2, as well as the
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`vibrational constants for Ne2+. I pioneered the development of microcavity plasma
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`devices and arrays in silicon, Al/Al2O3, glass, ceramics, and multilayer
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`metal/polymer structures. For this, I was the recipient of the C.E.K. Mees Award
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`from Optical Society of America, the Aaron Kressel Award from the Photonics
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`Society of the IEEE, and the Harold E. Edgerton Award from the International
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`Society for Optical Engineering. I was the Fulbright-Israel Distinguished Chair in
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`the Physical Sciences and Engineering from 2007 to 2008. I am a Fellow of the
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`American Physical Society, the Optical Society of America, the Institute of
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`Electrical and Electronics Engineers, the American Association for the
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`Advancement of Science (AAAS), and the SPIE (International Society for Optical
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`Engineering.
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`8.
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`I taught/teach courses in laser physics, electromagnetics (including
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`optics, optical waveguides, antennas), plasma physics, semiconductor electronic
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`devices, electromagnetics, and analog signal processing, among others. I have
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`directed the dissertations of 46 individuals who received the Ph.D. degree in
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`Physics, Electrical and Computer Engineering, or Materials Science and
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`Engineering.
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`9.
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`I have also served as Assistant Dean in the College of Engineering,
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`Associate Dean of the Graduate College, and Associate Vice-Chancellor for
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`Research.
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`10.
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`I have authored or co-authored over 280 peer-reviewed academic
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`publications in the fields of laser physics, plasma physics, atomic and molecular
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`physics, quantum electronics. I have served as Editor-in-Chief of the IEEE
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`Journal of Quantum Electronics and am currently Editor-in-Chief of Progress in
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`Quantum Electronics and Associate Editor of Applied Physics Reviews.
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`11.
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`I am currently a member of four honorary organizations. In 1998, I
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`served as President of the IEEE Lasers and Electro-Optics Society (LEOS),
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`following earlier service as a member of the LEOS Board of Governors, and as the
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`Vice-President for Technical Affairs.
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`12. From 1996 through 1999, I was the James F. Towey University
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`Scholar at the University of Illinois. I received the LEOS Distinguished Service
`
`Award, was awarded the IEEE Third Millennium Medal in 2000 and was named a
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`LEOS Distinguished Lecturer for 2003-2005.
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`13.
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`I am a co-founder of Eden Park Illumination (2007) and EP
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`Purification (2010).
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`14.
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`In 2014, I was elected into the National Academy of Engineering, and
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`the National Academy of Inventors.
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`15.
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`I am a named inventor on over seventy (73) United States and
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`international patents and have patent applications pending both in the United States
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`and abroad.
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`16. A copy of my curriculum vitae is attached as Appendix A.
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`17.
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`I have reviewed the specification and claims of U.S. Patent No.
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`7,435,982 (the “’982 patent”; Ex. 1101). I have been informed that the ’982 patent
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`claims priority to March 31, 2006.
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`18.
`
`I have also reviewed the following references, all of which I
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`understand to be prior art to the ’982 patent:
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`(cid:120) French Patent Publication No. FR2554302A1, published May 3,
`1985 (“Gärtner,” Ex. 1104).
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`I am being compensated ay my normal consulting rate for my work.
`
`19.
`
`My compensation is not dependent on, and in no way affects, the substance of my
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`statements in this Declaration.
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`20.
`
`I have no financial interest in Petitioner. I similarly have no financial
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`interest in the ’982 patent.
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`II. LEGAL PRINCIPLES
`21.
`I have been informed that a claim is invalid as anticipated under 35
`
`U.S.C. § 102(b) if “the invention was patented or described in a printed publication
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`in this or a foreign country or in public use or on sale in this country, more than
`
`one year prior to the date of the application for patent in the United States.” I have
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`also been informed that a claim is invalid as anticipated under 35 U.S.C. § 102(e)
`
`if “the invention was described in … an application for patent, published under
`
`section 122(b), by another filed in the United States before the invention by the
`
`applicant for patent ….” It is my understanding that for a claim to be anticipated,
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`all of the limitations must be present in a single prior art reference, either expressly
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`or inherently.
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`22.
`
`I have been informed that a claim is invalid as obvious under 35
`
`U.S.C. § 103(a):
`
`
`
`if the differences between the subject matter sought to be patented and
`the prior art are such that the subject matter as a whole would have
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`been obvious at the time the invention was made to a person having
`ordinary skill in the art to which [the] subject matter pertains.
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`35 U.S.C. § 103(a). I understand that a claimed invention would have been
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`obvious, and therefore not patentable, if the subject matter claimed would have
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`been considered obvious to a person of ordinary skill in the art at the time that the
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`invention was made. I understand that when there are known elements that perform
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`in known ways and produce predictable results, the combination of those elements
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`is likely obvious. Further, I understand that when there is a predictable variation
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`and a person would see the benefit of making that variation, implementing that
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`predictable variation is likely not patentable. I have also been informed that
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`obviousness does not require absolute predictability of success, but that what does
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`matter is whether the prior art gives direction as to what parameters are critical and
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`which of many possible choices may be successful.
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`III. PERSON OF ORDINARY SKILL IN THE ART
`23. A person of skill in the art at the time of the alleged invention of the
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`’982 patent would have had a Ph.D. in physics, electrical engineering, or an
`
`equivalent field and 2-4 years of work experience with lasers and plasma, or a
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`master’s degree in physics, electrical engineering, or an equivalent field and 4-5
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`years of work experience with lasers and plasma.
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
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`IV. OVERVIEW OF THE ’982 PATENT
`24. The ’982 patent is directed to a laser sustained plasma light source for
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`use in, for example, testing and inspection for semiconductor manufacturing. As
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`depicted in Figure 1, reproduced below, the light source includes: (1) a chamber
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`128 (green), (2) an ignition source 140 (blue) for generating a plasma 132, and (3)
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`a laser 104 (red) for providing energy to the plasma 132 to produce a high
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`brightness light 136 (’982 patent, 4:29-38 (Ex. 1101).) The ’982 patent identifies
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`several types of “ignition sources,” such as “electrodes” (shown below) and
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`“pulsed lasers” (not shown). (’982 patent, 7:7-24 (Ex. 1101).)
`
`
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`’982 Patent, Fig. 1 (Ex. 1101)
`
`25. According to the ’982 patent, prior art light sources relied upon
`
`electrodes to both generate and sustain the plasma, which resulted in wear and
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`contamination. (’982 patent, 1:20-40 (Ex. 1101).) Thus, a need allegedly arose for
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`a way to sustain plasma without relying on an electrical discharge from electrodes.
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`8
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`(Id. 1:20-40.) The alleged invention involves using a laser to provide energy to
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`sustain the plasma to produce a “high brightness” light. (See, e.g., id. 1:46-50.)
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`26. As discussed below, there was nothing new about sustaining a plasma
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`with a laser to produce high brightness light. Multiple prior art references,
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`including Gärtner, disclosed laser-sustained plasma light sources with the same
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`elements as the ’982 patent: a chamber, an ignition source, and a laser.
`
`A.
`
`Summary of the Prosecution History
`
`27. The ’982 patent issued from U.S. Patent Appl. No. 11/395,523, filed
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`on March 31, 2006. On August 25, 2008, all the claims were allowed without
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`rejection. The ’982 patent issued on October 14, 2008. (’982 Patent (Ex. 1101).)
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`28.
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`In the Notice of Allowability, the Examiner explained that prior art to
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`Hoshino disclosed “a light source which has a laser that generates a plasma[,]” and
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`prior art to Sato disclosed a “light source where a laser beam excites gas (for
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`emitting UV and EUV light) that is sealed in a bulb tube. . . ” (Notice of
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`Allowability dated Aug. 28, 2008 at 3 (Ex. 1107).) Thus, the Examiner recognized
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`that using a laser to generate a plasma light source was not inventive.
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`29. The Examiner nonetheless allowed the claims because the Examiner
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`was not aware of prior art that disclosed the combination of an ignition source that
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`generates the plasma and a laser beam that sustains the plasma. (Notice of
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`Allowability dated Aug. 28, 2008 at 3 (Ex. 1107).)
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`30. The Examiner did not consider Gärtner, which was not of record
`
`during the prosecution of the ’982 patent. Gärtner discloses an ignition source that
`
`generates the plasma and a laser beam that sustains the plasma to produce a high
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`brightness light. In fact, as discussed further below, high brightness light sources
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`with ignition sources that generate the plasma and laser beams that sustain the
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`plasma were well-known long before the priority date of the ’982 patent.
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`V. CLAIM CONSTRUCTION
`A.
` “Light source”
`31. The term “light source” appears in claims 37, 42-43, 49, 55, 61-64,
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`74, and 78. “Light source” should be construed to mean “a source of
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`electromagnetic radiation in the extreme ultraviolet (10 nm to 100 nm), vacuum
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`ultraviolet (100 nm to 200 nm), ultraviolet (200 nm to 400 nm), visible (400 to 700
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`nm), near-infrared (700 nm to 1,000 nm (1 μm)), middle infrared (1 μm to 10 μm),
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`or far infrared (10 μm to 1000 μm) regions of the spectrum.”
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`32. The ordinary and customary meaning of “light source”1 is a source of
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`electromagnetic radiation in the extreme ultraviolet (10 nm to 100 nm), vacuum
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`ultraviolet (100 nm to 200 nm), ultraviolet (200 nm to 400 nm), visible (400 to 700
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`nm), near-infrared (700 nm to 1,000 nm (1 μm)), middle infrared (1 μm to 10 μm),
`
`or far infrared (10 μm to 1000 μm) regions of the spectrum. (See, e.g., William T.
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`Silfvast, “Laser Fundamentals” at 4 (“Silfvast”) (Ex. 1109).) The Patent Owner
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`publishes a data sheet which is consistent with the ordinary and customary
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`meaning in referring to EUV wavelengths as within the meaning of “light source.”
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`(See, e.g., Energetiq EQ-10M Data Sheet at 2 (describing Energetiq’s EQ-10
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`product operating at 13.5 nm as an “EUV [Extreme Ultraviolet] Light Source”)
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`(Ex. 1108).
`
`33. The ’982 patent does not provide a definition of the term “light
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`source” and uses the term consistent with the ordinary and customary meaning of
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`the term. The ’982 patent states that parameters such as the wavelength of the light
`
`from a light source will vary depending upon the application. (’982 patent, 1:18-
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`1 The term “light” is sometimes used more narrowly to refer only to visible light.
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`However, references to “ultraviolet light” in the ’982 patent make clear that the
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`broader meaning is intended because ultraviolet light has a wavelength shorter than
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`that of visible light. (See, e.g., ’982 patent, 6:47-49; 7:65-67; 8:6-9; 8:37-39 (Ex.
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`1101).)
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`19 (Ex. 1101).) The specification describes “ultraviolet light” as an example of the
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`type of light that can be generated: “emitted light 136 (e.g., at least one or more
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`wavelengths of ultraviolet light).” (’982 patent, 7:65-67 (Ex. 1101); see also id. at
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`6:47-49 (discussing the ultraviolet light 136 generated by the plasma 132 of the
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`light source 100), 8:6-9, 8:37-39.)
`
`34. Therefore, the term “a source of electromagnetic radiation in the
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`extreme ultraviolet (10 nm to 100 nm), vacuum ultraviolet (100 nm to 200 nm),
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`ultraviolet (200 nm to 400 nm), visible (400 to 700 nm), near-infrared (700 nm to
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`1,000 nm (1μm)), middle infrared (1 μm to 10 μm), or far infrared (10 μm to 1000
`
`μm) regions of the spectrum.”
`
`B.
` “High brightness light”
`35. All the challenged claims except for claim 74 recite the term “high
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`brightness light.” For purposes of this proceeding, the term “high brightness light”
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`should be construed to include “light sufficiently bright to be useful for: inspection,
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`testing or measuring properties associated with semiconductor wafers or materials
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`used in the fabrication of wafers, or as a source of illumination in a lithography
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`system used in the fabrication of wafers, a microscopy system, a photoresist curing
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`system, or an endoscopic tool.”
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`36. The ’982 patent defines “brightness” 2 as “the power radiated by a
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`source of light per unit surface area onto a unit solid angle.” (’982 patent, 4:46-47
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`(Ex. 1101).) The brightness of the light produced by a light source determines the
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`ability of a system or operator to “see or measure things [] with adequate
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`resolution.” (Id. at 4:47-51 (Ex. 1101).) Accordingly, the brightness of a light is
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`associated with the ability to see or measure properties of a surface.
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`37. The ’982 patent recognizes that various uses for high brightness light
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`existed before the ’982 patent was filed. The patent recognizes in the Background
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`of the Invention that, “[f]or example, a high brightness light source can be used for
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`inspection, testing or measuring properties associated with semiconductor wafers
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`or materials used in the fabrication of wafers (e.g., reticles and photomasks).”
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`(’982 patent, 1:11-14 (Ex. 1101).) It also identifies light sources that can be used
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`“as a source of illumination in a lithography system used in the fabrication of
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`wafers, a microscopy system[], or a photoresist curing system[,]” as further
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`examples of high brightness light sources. (’982 patent, 1:11-17 (Ex. 1101).)
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`Additionally, it describes and claims “a wafer inspection tool, a microscope, a
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`metrology tool, a lithography tool, [and] an endoscopic tool” as tools for which the
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`2 Although the ’982 patent uses the term “brightness,” “spectral brightness” is the
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`more common term in optics and lasers. “Spectral brightness” refers to the optical
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`power radiated per unit of wavelength (nm) into a steradian.
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`high brightness light is produced. (’982 patent, 2:33-38, 10:11-14 (Ex. 1101).)
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`More generally, the patent acknowledges that the brightness and other parameters
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`of the light “vary depending upon the application.” (’982 patent, 1:18-19 (Ex.
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`1101).)
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`38. The Patent Owner has argued that the term “high brightness light”
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`should be understood as “bright enough to be used for inspection, testing, or
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`measuring properties associated with semiconductor wafers or materials used in
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`the fabrication of wafers, or in lithography systems used in the fabrication of
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`wafers, microscopy systems, or photoresist curing systems—i.e., at least as bright
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`as xenon or mercury arc lamps,” which is similar to the construction proposed
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`below but omits some of the applications for high brightness light specifically
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`described in the ’982 Patent. (See Second Declaration of Donald K. Smith, Ph.D.
`
`in Support of Energetiq’s Reply Brief in Support of its Motion for Preliminary
`
`Injunction, dated Mar. 17, 2015 (“Second Smith Decl.”) at pp. 6-7 (Ex. 1111).)
`
`39. Therefore, for the purposes of this proceeding, the term “high
`
`brightness light” should be interpreted to include “light sufficiently bright to be
`
`used for: inspection, testing or measuring properties associated with semiconductor
`
`wafers or materials used in the fabrication of wafers, or as a source of illumination
`
`in a lithography system used in the fabrication of wafers, a microscopy system, a
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`photoresist curing system, or an endoscopic tool.”
`
`14
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`
`
`C.
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`“A first ignition means for ionizing an ionizable medium within
`the chamber”
`1.
`40. The function is “ionizing an ionizable medium within the chamber.”
`
`Function
`
`Structure
`
`2.
`41. The corresponding structure for performing the function includes a
`
`pair of electrodes, ultraviolet ignition sources, capacitive discharge ignition
`
`sources, inductive ignition sources, RF ignition sources, flash lamps, continuous
`
`wave or pulsed lasers, and pulsed lamps. The ’982 patent describes an
`
`embodiment where an ignition source 140 is “a pair of electrodes located in the
`
`chamber.” (’982 Patent, 7:3-14 (Ex. 1101).) It further states, “Alternative types of
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`ignition sources 140 . . . include ultraviolet ignition sources, capacitive discharge
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`ignition sources, inductive ignition sources, RF ignition sources, … microwave
`
`ignition sources, flash lamps, pulsed lasers, and pulsed lamps.” (Id. 7:15-24.)
`
`15
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`
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`Additionally, the patent explains that “[t]he ignition source can be a continuous
`
`wave (CW) or pulsed laser. . .”3 (Id. 2:24-29.)
`
`D.
`
`“Means for providing substantially continuous laser energy to the
`ionized medium within the chamber”
`1.
`42. The function is “providing substantially continuous laser energy to the
`
`Function
`
`ionized medium within the chamber.”
`
`Structure
`
`2.
`43. The corresponding structure for performing the function includes a
`
`laser source. The ’982 patent states:
`
`The laser source can be, for example, an infrared (IR) laser source, a
`diode laser source, a fiber laser source, an ytterbium laser source, a
`CO2 laser source, a YAG laser source, or a gas discharge laser source.
`
`
`3 The ’982 patent additionally states, “In one embodiment, no ignition source 140
`
`is required and instead the laser source 104 is used to ignite the ionizable medium
`
`and to generate the plasma 132 and to sustain the plasma and the high brightness
`
`light 136 emitted by the plasma 132.” (’982 patent, 7:24-28 (Ex. 1101).) Thus, the
`
`’982 patent distinguishes between embodiments that have an ignition source (e.g.,
`
`electrodes or a laser) to generate the plasma and a separate laser to sustain the
`
`plasma, and embodiments that use the same laser to both generate and sustain the
`
`plasma.
`
`16
`
`
`
`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`In some embodiments, the laser source 104 is a pulse laser source
`(e.g., a high pulse rate laser source) or a continuous wave laser source.
`In some embodiments, multiple lasers (e.g., diode lasers) are coupled
`to one or more fiber optic elements (e.g., the fiber optic element 108).
`In some embodiments, fiber laser sources and direct semiconductor
`laser sources are desirable for use as the laser source 104 . . . .
`(’982 Patent at 5:41-52 (Ex. 1101).)
`
`VI. THE CHALLENGED CLAIMS ARE INVALID
`A. Laser Sustained Plasma Light Sources Were Known Long Before
`the Priority Date of the ’982 Patent
`44. When the application that led to the ’982 patent was filed, there was
`
`nothing new about a light source using an ignition source to generate a plasma in a
`
`chamber and a laser to sustain the plasma to produce high brightness light from the
`
`plasma. This concept had been known and widely used since at least as early as
`
`the 1980s, more than two decades before the application date. For example, in
`
`1983, Gärtner et al. filed a patent application entitled “Radiation source for optical
`
`devices, notably for photolithographic reproduction systems,” which published on
`
`May 3, 1985 as French Patent Application No. 2554302. (“Gärtner” (Ex. 1104).)
`
`Gärtner discloses a light source with the same features claimed in the ’982 patent:
`
`(1) a sealed chamber 1 (green); (2) an ignition source – pulsed laser 10 (blue),
`
`which generates a plasma 14; and (3) a laser to produce light – laser 9 (red), which
`
`provides energy to the plasma 14 and produces light 15.
`
`17
`
`
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`
`’982 patent, Fig. 1 (Ex. 1101)
`
`
`
`
`
`
`
`
`
`Gärtner, Fig. 1 (Ex. 1104)
`
`45. Similarly, Cremers et al. published a paper in 1984 entitled,
`
`“Evaluation of the continuous optical discharge for spectrochemical analysis.”
`
`(Ex. 1105.) Cremers describes a laser sustained plasma light source producing a
`
`“continuous optical discharge” (COD) that generated a “very bright white light.”
`
`(Cremers at 666 (Ex. 1105).) As shown in Figure 2, reproduced below, Cremers’s
`
`light source included the same features as the ’982 patent: (1) a sealed chamber
`
`(green); (2) an ignition source – a pair of electrodes or pulsed laser PB (both shown
`
`in blue), which ionizes a gas to generate a plasma in the chamber; and (3) a laser,
`
`the cw-CO2 laser (red), to supply energy to the plasma to produce the continuous
`
`optical discharge. (Id. Fig. 2.)
`
`18
`
`
`
`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`
`
`
`’982 patent, Fig. 1 (Ex. 1101)
`
`
`
`
`
`Cremers, Fig. 2 (Ex. 1105)
`
`46. By the late 1980’s, this concept was already being taught in textbooks.
`
`(See D. Keefer, “Laser Sustained Plasmas,” Chapter 4, from Radziemski et al.,
`
`“Laser-Induced Plasmas and Applications”, CRC Press (1989) (Ex. 1106).)
`
`47. Thus, the purportedly novel features of the ’982 patent are nothing
`
`more than the standard features of laser sustained plasma light sources across
`
`several generations of technology from the 1980’s to the early 2000’s.
`
`VII. GROUNDS FOR FINDING THE CHALLENGED CLAIMS INVALID
`A. Ground 1: Claims 37, 42-43, 49, 55, 61-62, 67-68, 71, 74 and 78 are
`anticipated by Gärtner
`48. Claims 37, 42-43, 49, 55, 61-62, 67-68, 71, 74 and 78 are anticipated
`
`by Gärtner.
`
`49.
`
`It is my understanding that Gärtner is prior art under 35 U.S.C. §
`
`102(b) because it published more than a year before the earliest claimed priority
`
`date for the ’982 patent, which is March 31, 2006. It is also my understanding that
`
`Gärtner was not considered by the Examiner during prosecution of the ’982 patent.
`
`19
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`
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`U.S. Patent 7,435,982
`Declaration of J. Gary Eden, Ph.D.
`
`Overview of Gärtner
`
`1.
`50. Gärtner describes a light source for optical devices: “The present
`
`invention relates to a radiation source for optical devices, in particular for
`
`photolithographic reproduction systems.” (Gärtner at 1:1-2 (Ex 11