throbber
Petition for Corporate Reorganization Claim Assessment
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`(Basic Case Number. Heisei 24 (Mi) No. 1)
`
`December 22, 2012
`
`
`To: Civil Affairs 8th Department of Tokyo District Court
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`Petitioner’s Attorney: TAKECHI Katsunori
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`
`:KIMURA Takahiro
`
`:KOMURO Taichi
`
`:SHIMIZU Masahiro
`
`The Purposes of Petition
`
`
`
`
`
`
`
`
`
`
`
`
`
`We request the judicial proceedings declaring that:
`
`1. The amount of corporate reorganization claims against Elpida Memory, Inc. in the
`
`corporate reorganization procedure, which were filed by the Petitioner, be assessed as
`
`71 million U.S. dollars; and
`
`2. The cost incurred for this petition be borne by the Petitioned Party.
`
`
`
`The Grounds for Petition
`
`
`
`Section 1: Notification of Reorganization Claims
`
`On October 31, 2012, the Petitioner filed the reorganization claims against Elpida
`
`Memory, Inc. in the corporate reorganization procedure (the “Corporate Reorganization
`
`Company”), details of which are described in the later Section 2 (Exhibit Koh No. 1:
`
`Reorganization Claim Notification)
`
`- 1 -
`
`

`
`
`
`The filing was made after the due date (i.e., May 21, 2012) of the period for filing
`
`reorganization claims determined by your Court.
`
` However,
`
`the Petitioner
`
`concurrently submitted the explanation brief detailing the special circumstances which
`
`had prevented the filing of the reorganization claims until the October 10, 2012. Your
`
`Court accepted said series of documents as the filing of reorganization claims, and set
`
`up a special period for investigation as the period starting on November 20, 2012 and
`
`ending on November 22, 2012 inclusive (Exhibit Koh No. 2: Explanation of Reasons
`
`for Late Submission of Notification of Reorganization Claims).
`
`On November 14, 2012, the trustees of the Corporate Reorganization Company
`
`notified the Petitioner that they fully disapproved the amount of the reorganization
`
`claims filed by the Petitioner (Exhibit Koh No. 3: Statement of Approval/Disapproval).
`
`There was no reorganization creditor or the like that raised opposition during the
`
`mentioned special period for investigation.
`
`
`
`Section 2: Procedures to be Selected to Fix the Reorganization Claims of this Case
`
`1. Overview of the Reorganization Claim of this Case
`
`The Petitioner claims the right to recover damages caused by the Corporate
`
`Reorganization Company, which infringed the following patent right (Exhibit Koh No.
`
`4: Patent Gazette) (hereinafter “the Patent Right”) co-owned by the Petitioner and the
`
`University of Maryland (hereinafter collectively referred to as “the Petitioners”), based
`
`upon Sections 284, 286, etc. of the United States Patent Act.
`
`Detailed Information of the Patent
`
`Country of Registration: United States of America
`
`Patent Number: 6,057,221
`
`Registration Date: May 2, 2000
`
`
`
`
`
`- 2 -
`
`

`
`Filing Date: April 3, 1997
`
`Title of Invention: Laser-induced cutting of metal interconnect
`
`The Number of Claims: 21
`
`
`
`
`
`
`
`
`
`The patentee requested ex parte re-examination to the Patent Right on March 30,
`
`2011, based upon Section 302 of the United States Patent Act. The claims of the
`
`Patent Right were re-examined without substantive change, re-examined with relatively
`
`minor changes, and added through the ex parte re-examination. After the correction
`
`through the ex parte re-examination, the number of claims of the Patent Right changed
`
`from 21 to 30 and the USPTO reconfirmed the patentability of the Patent Right (Exhibit
`
`Koh No. 5: Ex Parte Reexamination Certificate).
`
`The Corporate Reorganization Company sold, since 2006 to date, dynamic random
`
`access memories (hereinafter “DRAM”) using the invention relating to Claims 3, 14
`
`and 17 of the Patent Right within the United States of America (hereinafter referred to
`
`as “the U.S.”) and thereby infringed the Patent Right.
`
`The DRAMs dealt with by the Corporate Reorganization Company within the U.S.
`
`used the invention of the Patent Right in their production process and the Petitioners are
`
`entitled with the claims to recover damages in the amount of USD 142 million or more
`
`against the Corporate Reorganization Company, based upon Sections 284, 286 and etc.
`
`of the U.S. Patent Act.
`
`
`
`2. Governing Law of this Reorganization Claim Case
`
`The claim to recover damages caused by infringement of a patent right is categorized
`
`as one of those claims caused by tort and the Act on General Rules concerning the
`
`Application of Law provides that, as for the case in which such claims are considered,
`
`the law of the country “in which the result of the wrongful act occurred” should be
`
`- 3 -
`
`

`
`applied (Art. 17, main text of the Act on General Rules concerning the Application of
`
`Law) to a tort case.
`
`The reorganization claims in this case are those claims to recover damages incurred as
`
`a result of the Corporate Reorganization Company having sold DRAM using the
`
`invention of the Patent Right within the U.S. and thereby infringing the Patent Right.
`
`Therefore, the U.S. is “the place in which the result of the wrongful act occurred” in
`
`this case.
`
`Consequently, existence or non-existence of reorganization claims and the amount
`
`thereof shall be determined by applying the United States Patent Act and its related
`
`orders and court precedents of the U.S.
`
`
`
`3. Act Infringing the Patented Invention
`
` (1) Interpretation of Act Infringing the Patented Invention under the U.S. Patent
`
`law
`
`U.S. Patent law provides that “(w)hoever without authority imports into the United
`
`States or offers to sell, sells, or uses within the United States a product which is
`
`made by a process patented in the United States shall be liable as an infringer, if the
`importation, offer to sell, sale, or use of the product occurs during the term of such
`process patent.” 35 U.S.C. 271(g). This means that a product made outside the U.S.
`
`using a process patented in the U.S. infringes the U.S. process patent, if the product
`
`is imported into or sold, offered for sale, or used within the U.S.
`
`U.S. federal court rules, in order to decide whether the patented invention is
`
`infringed or not, that “an infringement analysis requires two separate steps. First,
`
`the court must construe the claims asserted to be infringed as a matter of law in
`
`order to establish their meaning and scope. Second, the claims as construed are
`
`compared to the allegedly infringing device. To literally infringed, the accused
`
`- 4 -
`
`

`
`device must contain every limitation of the asserted claim. Even if the accused
`
`device does not literally infringe, it may infringe under the doctrine of equivalents.”
`
`Maxwell v. J. Baker, Inc., 86 F3d, 1098, 1105 (Fed. Cir. 1996).
`
`The DRAM that the Corporate Reorganization Company sells in the U.S. fulfills
`
`all constituting elements of the claims of the Patented Invention, and thus, the
`
`Corporate Reorganization Company’s acts of importing and selling the DRAMs in
`
`the U.S. without the petitioner’s permission shall constitute the infringement of the
`
`Patent Right.
`
`
`
`(2) Constituting Elements of the Patented Invention
`
`The Patented Invention is related to a method for cutting interconnected, integrated
`
`circuits by using lasers (laser-induced cutting of metal interconnect).
`
`According to the patent claims both before and after the ex parte re-examination,
`
`the constituting elements of the Patented Invention are as follows.
`
`(i) The Patented Invention, Part 1 (Claim 3)
`
`(A) A method for cutting a link between interconnected circuits, comprising the
`
`following steps:
`
`(B) directing a laser upon an electrically-conductive cutlink pad conductively
`
`bonded between a first electrically-conductive
`
`line and a second
`
`electrically-conductive line on a substrate,
`
`(D)
`
`the cut-link pad having substantially less thermal resistance per unit length
`
`than each of the first and second lines,
`
`(E) wherein the width of the cut-link pad is at least ten percent greater than the
`
`width of each of the first and second electrically-conductive lines; and
`
`(C) maintaining the laser upon the cut-link pad until the laser infuses sufficient
`
`energy into the cut-link pad to break the conductive link across the cut-link
`
`pad between the pair of electrically-conductive lines,
`
`- 5 -
`
`

`
`(F) wherein the electrically-conductive cut-link pad has
`
`(F1) an inner surface facing the substrate and
`
`(F2) an opposing outer surface facing away from the substrate,
`
`(F3) the first and second electrically-conductive lines extending from the
`
`inner surface into the substrate.
`
`
`
`(ii) The Patented Invention, Part 2 (Claim 14)
`
`(G) A method for cutting a link between interconnected circuits comprising the
`
`following steps:
`
`(H) directing a laser upon an electrically-conductive cut-link pad conductively
`
`bonded between a first electrically-conductive
`
`line and a second
`
`electrically-conductive line on a substrate,
`
`(I)
`
`the cut-link pad having substantially less thermal resistance per unit length
`
`than each of the first and second lines,
`
`(J) wherein the cut-link pad is covered with a passivative layer that is harder
`
`than the substrate; and
`
`(K) maintaining the laser upon the cut-link pad until the laser infuses sufficient
`
`energy into the cut-link pad to break the conductive link across the cut-link
`
`pad between the pair of electrically-conductive lines.
`
`
`
` (iii) The Patented Invention, Part 3 (Claim 17)
`
`(L) A method for cutting a link between interconnected circuits, comprising the
`
`following steps:
`
`(M) directing a laser upon an electrically-conductive cut-link pad conductively
`
`bonded between a first electrically-conductive
`
`line and a second
`
`electrically-conductive line on a substrate,
`
`(N)
`
`the cut-link pad having substantially less thermal resistance per unit length
`
`- 6 -
`
`

`
`than each of the first and second lines,
`
`(O) wherein the width of the cut-link pad is at least ten percent greater than the
`
`width of each of the first and second electrically-conductive lines; and
`
`(P) maintaining the laser upon the cut-link pad until the laser infuses sufficient
`
`energy into the cut-link pad to break the conductive link across the cut-link
`
`pad between the pair of electrically-conductive lines,
`
`(Q) wherein a passivative layer covers the cut-link pad, and
`
`(R)
`
`the electrically-conductive cut-link pad has
`
`(R1) an inner surface facing the substrate and
`
`(R2) an opposing outer surface facing away from the substrate,
`
`(R3) the first and second electrically-conductive lines extending from the
`
`inner surface into the substrate.
`
`
`
`(3) The DRAM that the Corporate Reorganization Company sells Fulfills the
`
`Constituting Elements of the Patented Invention of the Present Case
`
`All of the DRAMs that the Corporate Reorganization Company sells fulfill the
`
`constituting elements of the Patented Inventions. We explain it with the B240ABB
`
`44nm DRAM fuse of DDR2 Mobile RAM (Barechip) (hereinafter referred as the
`
`“Elpida’s Product”) that is a typical DRAM sold by the Corporate Reorganization
`
`Company in the U.S.
`
`- 7 -
`
`
`
`

`
`
`
`The picture
`
`shown
`
`
`right is the picture of
`
`Elpida’s Product taken
`optical
`
`by
`microscope.
`
`
`
`
`
`
`
`
`
`
`Picture 1 Elpida’s Product
`
`
`
`
`
`The part indicated as “Fuse Windows Group” circled with blue line shown in
`
`Picture 1 is the fuse where the method for cutting integrated circuits in question of
`
`the present case is used. As this part has a function of repairing defective memory
`
`elements in Elpida’s Product, it is an essential element of Elpida’s Product to work.
`
`For example, without repair, Elpida’s defective Products do not work at all. It is
`
`believed that more than 90% (and as much as 99%) of Elpida’s individual DRAM
`
`chips require laser repair. Generally, DRAM products are tested at the end of the
`
`manufacturing process to confirm whether or not its circuits work appropriately.
`
`Usually, more than 90 % of the DRAM products include defective memory elements,
`
`and they are repaired by substituting redundant memory elements for the defective
`
`memory elements using fuses.
`
` (i) The Patented Invention, Part 1 (Claim 3 )
`
`(a) Fulfillment of the constituting element (A), “A method for cutting a link
`
`between interconnected circuits, comprising the following steps:”
`
`- 8 -
`
`
`
`
`
`
`
`

`
`
`
` As it is necessary to go through the process of cutting a link between
`
`interconnected circuits during the process to repair the defective DRAM
`
`products such as Elpida’s Product, it is obvious that the Corporate
`
`Reorganization Company uses the method for cutting a link between
`
`interconnected circuits to manufacture Elpida’s Product.
`
` The manufacturing method of Elpida’s Product, therefore, fulfills the
`
`constituting element (A).
`
`
`
`(b) Fulfillment of the constituting element (B), “directing a laser upon an
`
`electrically-conductive cut-link pad conductively bonded between a first
`
`electrically-conductive line and a second electrically-conductive line on a
`
`substrate,”
`
`
`
` Picture 2 Close-up Picture of the Fuse Picture 3 Cross-sectional Picture of Cut-link Pad
`
` Picture 2 is a picture taken by electronic microscope in close-up of the
`
`“Fuse Windows Group” of Elpida’s Product, the part circled with blue line
`
`shown in Picture 1.
`
` The part circled with red line shown in Picture 2 is the cut-link pad that is
`
`
`
`
`
`- 9 -
`
`

`
`primarily made of the electrical conducting material, aluminum. Picture 3 is
`
`a cross-sectional picture of the part circled with red line, shown in Picture 2,
`
`taken by electronic microscope. The part circled with red line shown in
`
`Picture 3 is the cut-link pad, and the part circled with orange line is the
`
`substrate.
`
`
`
` The electrical conducting lines circled with green line shown in Picture 3
`
`primarily comprise tungsten plugs and are the “first electrically-conductive
`
`line” and the “second electrically-conductive line.” The cut-link pad on the
`
`substrate is conductively bonded between the “first electrically-conductive
`
`line” and the “second electrically-conductive line.”
`
`
`
` The part circled with yellow line shown in Picture 2 is the “cut-link pad”
`
`cut by laser. As Elpida cuts the cut-link pad by laser, it is apparent that the
`
`process to manufacture Elpida’s Product includes a step of directing a laser
`
`upon an electrically-conductive cut-link pad conductively bonded between
`
`first and second electrically-conductive lines. The manufacturing method of
`
`Elpida’s Product, therefore, fulfills the constituting element (B).
`
`
`
`(c) Fulfillment of the constituting element (C), “maintaining the laser upon the
`
`cut-link pad until the laser infuses sufficient energy into the cut-link pad to
`
`break the conductive link across the cut-link pad between the pair of
`
`electrically-conductive lines,”
`
` As is shown in the part circled with yellow line in Picture 2, Elpida cuts the
`
`“conductive link” by ablating the cut-link pad with a laser. Thus, the
`
`electrically-conductive link is necessarily cut by infusing sufficient energy into
`
`the cut-link pad until the electrically-conductive link of the cut-link pad is cut.
`
`The manufacturing method of Elpida’s Product, thus, fulfills the constituting
`
`element (C).
`
`- 10 -
`
`

`
`
`
` (d) Fulfillment of the constituting element (D), “the cut-link pad having
`
`substantially less thermal resistance per unit length than each of the first
`
`and second lines,”
`
`
`
` As the ratio of (i) the cross-sectional area (i.e., the width times the
`
`height)(the width is, as shown in Picture 4 , 0.9 micrometer) of the cut-link
`
`pad circled with red line shown in Picture 3 to (ii) the cross-sectional area of
`
`the “first electrically-conductive line” and the “second electrically-conductive
`
`line” is substantially larger than the ratio of (1) the thermal conductivity of the
`
`material of the cut-link pad to (2) the thermal conductivity of the material of
`
`each of
`
`the “first electrically-conductive
`
`line” and
`
`the “second
`
`electrically-conductive line,” the thermal resistance per unit length of the
`
`cut-link pad
`
`is substantially
`
`less
`
`than
`
`that of
`
`the first and second
`
`electrically-conductive lines. The manufacturing method of Elpida’s Product,
`
`therefore, fulfills the constituting element (D).
`
`- 11 -
`
`

`
`
`
`(e) Fulfillment of the constituting element (E), “wherein the width of the
`
`cut-link pad is at least ten percent greater than the width of each of the first
`
`and second electrically-conductive lines; and”
`
` Blown Fuse
`
`
`
`
`
` 0.9μm
`
` First electrically-conductive lines
`
`Picture 2 Close-up Picture of the Fuse Second electrically-conductive lines
`
` Picture 4 Close-up of cut-link pad after
`
`cutting its electrically-conductive link
`
`Picture 5 Close-up Picture of Picture 2
`
`
`
` Picture 5 is a close-up picture of Picture 2. Picture 5 shows that the width
`
`of the cut-link pad of Elpida’s Product is 0.9 micrometer. On the other hand,
`
`the width between the “first electrically-conductive line” and the “second
`
`electrically-conductive line” is much smaller than the width of cut-link pad.
`
`However, because there are 2 conductive lines from each end of the cut-link
`
`pad to each of the underlying metal lines, the width of the “first
`
`- 12 -
`
`
`
`
`
`

`
`electrically-conductive line” and the “second electrically-conductive line”
`
`should be doubled, and even then, it is significantly smaller than the width of
`
`cut-link pad. The width of the cut-link pad of Elpida’s Product (0.9 microns) is
`
`at least 10% greater than the width of each of the first and second
`
`electrically-conductive lines, alone or taken together along one end of the fuse
`
`pad. Thus, the manufacturing method of Elpida’s Product fulfills the
`
`constituting element (E).
`
`
`
`(f) Fulfillment
`
`of
`
`the
`
`constituting
`
`element
`
`(F),
`
`“wherein
`
`the
`
`electrically-conductive cut-link pad has (F1) an inner surface facing the
`
`substrate and (F2) an opposing outer surface facing away from the substrate,
`
`(F3) the first and second electrically-conductive lines extending from the
`
`inner surface into the substrate.”
`
`0.07μm
`
`
`
`F2
`
`F1
`
`
`
`
`
`F3
`
`
`
`
`
`
`
`
`
`Picture 6 Close-up picture of Picture 3
`
`
`
`
`
`- 13 -
`
`

`
`The green line shown in Picture 6 is the inner surface of the cut-link pad and is
`
`facing the substrate, where the part boxed with orange lines, and thus, the
`
`constituting element (F1) is fulfilled.
`
` The blue line shown in Picture 6 is the outer surface of the cut-link pad and is
`
`facing away from the substrate, and thus, the constituting element (F2) is
`
`fulfilled.
`
` The first and second electrically-conductive lines are extending from the inner
`
`surface of the cut-link pad into the substrate as indicated with the white allow
`
`in Picture 6, and thus, the constituting element (F3) is fulfilled.
`
` The manufacturing method of Elpida’s Product, thus, fulfills the constituting
`
`element (F).
`
`
`
` (ii) The Patented Invention, Part 2 (Claim 14)
`
`(a) Fulfillment of the constituting elements (G) to (J)
`
`As explained in 3(3)(i)(a), (b), (d) and (e) above, the manufacturing method
`
`of Elpida’s Product fulfills the constituting element (G) to (J).
`
`
`
`
`
`(b) Fulfillment of the constituting element (K), “wherein the cut-link pad is
`
`covered with a passivative layer that is harder than the substrate”
`
`
`
`
`
`Elpida’s Product contains passivation (a protective coating) over the
`
`cut-link pad that includes a layer of silicon nitride. The passivative layer in
`
`Elpida’s Product is made of silicon nitride. The substrate of Elpida’s Product
`
`comprises a single-crystal silicon wafer. It is common knowledge in the art
`
`that silicon nitride
`
`is harder
`
`than
`
`the single-crystal silicon.
`
` The
`
`manufacturing method of Elpida’s Product, thus, fulfills the constituting
`
`element (K).
`
`
`
`- 14 -
`
`

`
`(iii) The Patented Invention 3 (Claim 17)
`
`As explained in 3(3)(i) and (ii) above, the manufacturing method of Elpida’s
`
`Product fulfills the constituting element (L) to (R).
`
`
`
`(4) Conclusion of Infringing the Patented Inventions
`
`As the manufacturing method of Elpida’s Product fulfills all of the constituting
`
`elements of the Patented Inventions and falls into the technical scope of each
`
`Patented Inventions, the Corporate Reorganization Company’s act selling the
`
`DRAM in the U.S. without the petitioner’s permission shall be the infringement of
`
`the patent.
`
`
`Section 3: Amount of the Reorganization Claims of the Present Case (Amount of
`
`Damages)
`
`1. Amount of Damages
`
`The U.S. Patent Act provides that the amount of damage accrued with the patent
`
`infringement shall be at least the amount of reasonable royalty (Section 284). The
`
`amount of reasonable royalty for using the patent of the present case by the Corporate
`
`Reorganization Company is USD 64,124,730, as shown in the “Calculation Sheet of
`
`Damages”.
`
`
`
`2. Calculation of Amount of Damages under the U.S. patent law
`
`Under the U.S. patent law and as is common practice in patent licensing in the
`
`semiconductor industry, an amount of reasonable royalty is calculated by an amount
`
`of sales in the U.S. market of products infringing the patent, multiplied by the royalty
`
`rate.
`
`
`
`3. Amount of sales in the U.S. market of the products of the Corporate
`
`- 15 -
`
`

`
`Reorganization Company
`
`The amount of sales in the U.S. market of products in the present case is calculated
`
`based on the sales amount described in the annual report that the Corporate
`
`Reorganization Company discloses in each fiscal year and/or each fiscal quarter.
`
`
`
`4. Percentage of products sold that are made using technologies that infringe the
`
`patent
`
`As the number of defective DRAM products of the Corporate Reorganization
`
`Company decreases by using the Patented Invention of the present case, the Patented
`
`Invention contributes to the sales of the DRAM products of the Corporate
`
`Reorganization Company significantly.
`
`Furthermore, infringing activity by the Corporate Reorganization Company is
`
`believed to have began when it introduced its 110 nm manufacturing technology in
`
`2004. Without question, every new manufacturing technology introduced by the
`
`Corporate Reorganization Company since its 110 nm manufacturing technology
`
`infringes the patent of the present case. On information and belief, by November 1,
`
`2006, the 110 nm manufacturing technology of the Corporate Reorganization
`
`Company and its newer manufacturing technologies were used to manufacture at least
`
`90% of the products of the Corporate Reorganization Company, and this percentage
`
`steadily increased over time (i.e., at least 92% in FY 2008) until the current level (at
`
`least 95%) was reached in FY 2009. This estimate of the percentage of products
`
`made using the Patented Invention of the present case may be understated; it is very
`
`unlikely to be overstated.
`
`
`
`5. Royalty rate
`
`As the technology of the Patented Invention of the present case is the technology
`
`of fuse repair that is important to manufacture functional DRAM products in high
`
`- 16 -
`
`

`
`yield, the royalty rate shall not be less than 1% even if it is underestimated.
`
`
`
`6. Late Payment Charge
`
`The U.S. patent law allows a patent owner to charge a licensee of the patent a late
`
`payment charge, typically well in excess of 5% per annum. It is also a common
`
`practice in U.S. patent licensing for a patent owner to include a charge for the present
`
`value of money (i.e., the expected profit that the patent owner would have made with
`
`the royalty fee had the royalty fee been paid at the time of infringement). This
`
`amount is typically between 10 and 15%. As the amount of late payment charge
`
`accrues after the ending of each fiscal year as described in the “Calculation Sheet for
`
`Damages”, the total amount of late payment charge is USD 7,390,470. Considering
`
`the late payment charge and the amount of reasonable royalty, it is obvious that the
`
`amount of damages accrued by the infringement of the patent of the present case shall
`
`be at least USD 71,000,000.
`
`
`Section 4: Conclusion
`
`As the amount of reorganization claims is not less than USD 71,000,000 under the
`
`U.S. Patent Act, we request that the amount of reorganization claims be assessed to be
`
`USD 71,000,000.
`
`-END-
`
`- 17 -
`
`

`
`List of Parties
`
`Petitioner:
`
`77 Massachusetts Avenue, Cambridge, Massachusetts, U.S.A.
`
`Massachusetts Institute of Technology
`
`Vice President and General Counsel
`
`R. Gregory Morgan
`
`
`
`Petitioner’s Attorneys:
`
`Kowa-shibakoen Bldg. 4F, 1-1-11, Shibakoen, Minato-ku,
`
`Tokyo 105-0011 TAKECHI & PARTNERS
`
`Katsunori Takechi, attorney-at-law
`
`Taichi Komuro, attorney-at-law
`
`Masahiro Shimizu, attorney-at-law
`
`
`BUREX Kojimachi, 3-5-2, Kojimachi, Chiyoda-ku
`
`Tokyo 102-0083
`
`Kimura Takushima & Yamaguchi
`
`Takahiro Kimura, attorney at-law
`
`
`
`Petitioned Party:
`
`2-2-1 Yaesu, Chuo-ku, Tokyo 104-0028
`
`Trustees of Elpida Memory, Inc. (Corporate Reorganization Company)
`
`Yukio Sakamoto and Nobuaki Kobayashi
`
`- 18 -
`
`

`
`Fiscal Year
`
`Calculation Sheet of Damages
`
`Amount of Damages
`
`Late Payment Charge
`
` (in thousand U.S. dollars)
`
`(in thousand U.S. dollars)
`
`FY 2007
`
`FY2008
`
`FY2009
`
`FY2010
`
`FY2011
`
`FY2012
`
`USD 6,425.33
`
` USD 11,228.35
`
` USD 9,711.90
`
` USD13,723.80
`
` USD14,150.92
`
` USD 1,597.53
`
` USD 2,230.29
`
` USD1,443.48
`
` USD1,353.58
`
` USD688.16
`
` USD 6,978.27
`
` USD77.43
`
`(2011/4/1~12/31)
`
`FY2012
`
`USD 1,906.16
`
` N/A
`
`(2012/1/1~3/21)
`
`
`
`
`
` USD 64,124.73
`
`
`
`USD 7,390.47
`
`USD 71,515.20
`
`- 19 -

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket