throbber
The Microwave Transition Analyzer:
`A New Instrument Architecture for
`Component and Signal Analysis
`
`The microwave transition analyzer brings time-domain analysis to RF and
`microwave component engineers. A very wide-bandwidth, dual-channel
`front end, a precisely uniform sampling interval, and powerful digital
`signal processing provide unprecedented measurement flexibility,
`including the ability to measure magnitude and phase transitions as fast
`as 25 picoseconds.
`
`by David J. Ballo and John A. Wendler
`
`As signal.processing capabilities advance, modern micro(cid:173)
`wave and radio frequency (RF) systems are becoming more
`and more sophisticated. Pulsed-RF signals, once used only
`for radar applications, are increasingly being used in com(cid:173)
`munication systems as well. These signals routinely have
`complex modulation within the pulse, especially frequency
`and phase variations (see Fig. 1). Operating frequencies an~
`bandwidths continue to increase, placing additional demands
`on the components of the systems.
`
`Engineers responsible for the design and testing of such
`components and systems often need to measure them under
`the same dynamic conditions as those in which they are
`used. For example, it may be necessary to measure a de(cid:173)
`vice's response to phase coding or linear frequency chirp
`inside an RF pulse.
`
`Measurements with traditional frequency-domain instrumen(cid:173)
`tation are often insufficient to characterize and understand
`fully the operation of components in dynamic signal environ(cid:173)
`ments. Before the microwave transition analyzer introduced
`in this article, no single instrument could handle the diverse
`range of measurements required for dynamic tes~g at micro(cid:173)
`wave frequencies. In addition to the new measurements it
`makes, this analyzer can perform many of the measurements
`previously requiring the use of network, spectrum, dynamic
`signal, and modulation analyzers, as well as oscilloscopes,
`counters, and power meters.
`
`Importance of the 1ime Domain
`A key benefit of the microwave transition analyzer is that it
`brings time-domain analysis to RF and microwave compo(cid:173)
`nent engineers. In addition to its use in pulsed-RF testing,
`the time domain is essential to characterizing and under(cid:173)
`standing nonlinear devices because one can clearly and intu(cid:173)
`itively see the relationship between the input and output
`signals. As an example, both signals in Fig. 2 would appear
`identical if displayed on a spectrum analyzer. Even if the
`phase 9f the hannonics were known, the differences be(cid:173)
`tween the signals would not be immediately obvious. When
`viewed in the time domain, however, it is clear that signal I
`
`is clipped (the output of a limiter, say), while signal 2 has
`crossover distortion (what might be seen at the output of a
`Class-B amplifier,' for example). Without the time domain,
`engineers have had to guess at the underlying causes of ob(cid:173)
`served frequency-domain behavior. The ability to view micro(cid:173)
`wave signals in the time domain has also proved to be ex(cid:173)
`tremely valuable to designers that are using· CAE microwave
`design simulators, such as HP's MDS. Now simulations
`based on circuit models can be easily compared to actual
`measurements in both the time domain and the frequency
`domain.
`
`Historically, most measurements on high-frequency non(cid:173)
`linear devices have been performed in the frequency domain.
`Often, this has been because of inadequacies in time-domain
`instrumentation. When frequency-domain information is of
`prime concern, spectrum analyzers are superb in their abil(cid:173)
`ity to dispfay hannonic, modulation, and spurious signals ·
`with a large dynamic range. However, without the phase of
`the frequency components, the time-domain signal cannot
`be reconstructed. Network analyzers are excellent for per(cid:173)
`forming linear, small-signal, frequency-domain testing, but
`they are limited in their ability to characterize nonlinear
`devices. The addition of hannonic and offset sweep capabil(cid:173)
`ity in network analyzers has helped, but the time-domain
`perspective is still missing.
`
`For envelope analysis of pulsed-RF signals, spectrum ana(cid:173)
`lyzers off er some limited time-domain capability. Recently,
`network analyzers have been adapted for pulsed-RF time(cid:173)
`domain testing as well. Because of the architecture of these
`instruments, the intermediate frequency (IF) bandwidth
`imposes an upper limit on the measurement bap.dwidth. The
`result is rurumum measurable edge tiines of greater than
`100 ns. The microwave transition analyzer's architecture
`does not have this restriction. Edge speed is limited only by
`the RF bandwidth. Consequently, magnitude and phase mea(cid:173)
`surements on pulses with rise times as fast as 25 ps are pos(cid:173)
`sible. Fig. 3 shows an example of a microwave transition.
`analyzer measurement.
`
`48 October 1992 Hewlett-Packard Journal
`
`RPX-Farmwald Ex. 1043, p 1
`
`

`
`may be specified indirectly as magnitude and phase flatne~
`versus frequency. By transforming the input and output
`pulses to the frequency domain with the built-in fast Fourier
`transform (FFT) and computing their ratio, the transfer
`function is obtained. From this, familiar results of magni(cid:173)
`tude and group delay versus frequency can be displayed.
`Network analyzers are only able to measure the phase and
`group delay of frequency translation components relative to
`a reference or "golden" device.
`
`It is much easier to measure nonlinear devices at low fre(cid:173)
`quencies than at RF and microwave frequencies. At low fre(cid:173)
`quencies, general-purpose oscilloscopes readily show time(cid:173)
`domain behavior, and dynamic signal analyzers provide both
`magnitude and phase in the frequency domain. The only tool
`available for high-speed time-domain measurements before
`the microwave transition analyzer has been the high(cid:173)
`frequency sampling oscilloscope. Initially, sampling _oscillo(cid:173)
`scopes were purely analog instruments, and in the past few
`years have incorporated digital storage and other enhance(cid:173)
`ments such as markers. However, these instruments have
`not enjoyed widespread acceptance from RF and microwave
`engineers for several reasons. The first is the difficulties
`involved in achieving reliable external triggering at high fre(cid:173)
`quencies and small signal levels. High-speed sampling oscil(cid:173)
`loscopes have enjoyed the most success for use with digital
`signals where voltage levels are generally large and triggers
`are not difficult to obtain. Secondly, traditional sampling
`oscilloscopes are not very sensitive, especially compared to
`network and spectrum analyzers. The microwave transition
`analyzer incorporates selectable filters to decrease noise
`without limiting the signal bandwidth·. The resulting increase
`in sensitivity combined with internal triggering across the
`full RF bandwidth greatly aids in the measurement of small
`signals.
`
`Excellent sensitivity also helps overcome a limitation of
`sampling oscilloscopes for high-input-impedance measure(cid:173)
`ments (»50 ohms). Until recently, it has been very difficult
`to obtain probes with low enough parasitic capacitance to
`be useful at microwave frequencies. Companies now offer
`solutions for high-frequency passive probing, but signal at(cid:173)
`tenuation is significant. This signal attenuation is not a prob(cid:173)
`lem for the microwave transition analyzer because of its
`high sensitivity. This has been especially beneficial for prob(cid:173)
`ing monolithic microwave integrated circuits (MMICs) at the
`wafer level.
`
`Finally, the operation of high-speed oscilloscopes has not
`been optimized for RF and microwave applications, where
`terminology is often different from that used in digital design.
`The user interface of the microwave transition analyzer uses
`units and formats that are familiar to RF and microwave
`engineers. For example, log-magnitude displays of pulsed(cid:173)
`RF signals are readily available, and marker annotation can
`be in dBm or dBc as well as volts.
`
`Microwave Transition Analyzer
`The HP 71500A microwave transition analyzer (Fig. 4) is a
`two-channel, sampler-based instrument with an RF band(cid:173)
`width covering from de to 40 GHz. The instrument is called
`a transition analyzer because of its ability to measure very
`fast magnitude and phase transitions under pulsed-RF con(cid:173)
`ditions. However, this name does not encompass the full
`
`October 1992 Hewlett-Packard Journal
`
`49
`
`Tr2=Ch1
`30 mV/div
`0 V ref
`
`525 ns
`Tr3=Ch1
`90 deg/div
`-27 deg ref
`
`125 nsldiv
`
`Tr1=Ch1
`30 mVldiv
`0 V ref
`(a)
`
`Tr1=Ch1
`Y0 mV/div
`0 U ref
`
`Tr2=Ch1
`Y0 mVldiv
`0 U ref
`
`23 . 92 us
`Tr3=FM(Ch1)
`650 kHz/div
`3 GHz ref
`
`5 us/div
`
`(b)
`
`Fig. 1. Examples of complex modulation. (a) A phase coded RF
`pulse. The waveform and magnitude demodulation are shown in
`the upper half. The carrier's phase with respect to a CW reference
`is shown in the lower half. (b) Frequency modulation inside an RF
`pulse. The waveform and magnitude demodulation are shown at
`the top, the frequency demodulation is shown in the middle, and
`the magnitude spectrum of the pulse is shown at the bottom.
`
`The ability to meas"Qre narrow pulses in the time domain can
`also be used to determine the impulse response (and there(cid:173)
`fore magnitude, relative phase, and group delay) of frequency
`translation components such as mixers and receivers. By
`stimulating these devices with a narrow pulse of RF energy,
`time-domain distortion can be directly observed. Often, it is
`the time-domain distortion that is of interest, even though it
`
`RPX-Farmwald Ex. 1043, p 2
`
`

`
`Signal 1
`
`Signal2
`
`Sum=
`Fundamental
`+
`3rd Harmonic
`
`Time
`
`Time
`
`Fig. 2. The importance of phase information in nonlinear design. Signals 1 and 2 wduld appear identical on a spectrum analyzer display.
`
`range of its measurement capability. The microwave transi(cid:173)
`tion. analyzer can best be described as a cross between a
`high-frequency sampling oscilloscope, a dynamic signal
`analyzer, and a network analyzer.
`
`Like a digital sampling oscilloscope, the microwave transi(cid:173)
`tion analyzer acquires a waveform by repetitively sampling
`the input, that is, one or more cycles of the periodic input
`signal occur between consecutive sample points. However,
`unlike an oscilloscope, the sampling instant is not determined
`by an external high-frequency trigger circuit. Instead, the
`sampling frequency is synthesized, based on the frequency
`of the input signal and the desired time scale. A synth~sized
`sampling rate is an attribute that the microwave transition
`analyzer shares with dynamic signal analyzers. Also in com(cid:173)
`mon is an abundance of digital signal processing capability.
`The FFI', for example, allows simultaneous viewing of the
`time waveform and its frequency spectrum. However, unlike
`a dynamic signal analyzer, the microwave transition analyzer
`
`M1(*)
`M2(t)
`
`31.8529 ns
`31.7032 ns
`
`326 mU
`92.Y9 mU
`
`rise= 1Y9.63
`
`s
`EXT
`
`Tr1=Ch1
`125 mV/div
`0 U ref
`
`33.01 ns
`
`Tr3=Ch1
`125 mV/div
`0 V ref
`
`500 psldiv
`
`Fig. 3. The microwave transition analyzer can meac;ure edge
`speeds on modulated waveforms as fast as 25 ps.
`
`50 October 1902 Hf'wlett-Packard Journal
`
`does not have an anti-aliasing filter at its input. The sampling
`frequency is automatically adjusted to achieve a controlled
`aliasing of the ftequency components of the input signal.
`Finally, like a network analyzer, the microwave transition
`analyzer can be configured to control a synthesized signal
`source for the characterization of devices over frequency or
`power· ranges. It can also receive a frequency that is offset
`from or a harmonic of the source frequency, and it can pro(cid:173)
`vide frequency and power sweeps at a particular point within
`a pulse of RF, on pulses as narrow as 1 ns.
`
`Architecture
`Fig. 5 shows a simplified block diagram of the microwave
`transition analyzer. The analyzer has two identical signal
`processil).g channels. Each channel samples and digitizes
`signals over an input bandwidth of de to 40 GHz. The chan(cid:173)
`nels are sampled simultaneously (within 10 ps), permitting
`accurate ratioed amplitude and phase measurements. A
`single synthesized low-noise oscillator drives a step recov(cid:173)
`ery diode, the output of which is split into two pulse trains
`that drive the microwave samplers. The microwave sam(cid:173)
`plers and the analog-to-digital converters (ADCs) are run at
`the same frequency. The maximum sampling frequency is
`20 MSa/s (20 million samples per second).
`
`Tf1-e signal at the output of the samplers is processed by a
`10-MHz-bandwidth low-pass IF strip. The IF (intermediate
`frequency) circuitry includes a programmable shaping am(cid:173)
`plifier to compensate for the sampler's IF response roll-off,
`60 dB of step gain to optimize the signal level into the ADC,
`and variable low-pass filtering to remove noise and sampler
`feedthrough. The trigger circuitry is at the end of the analog
`path. Triggering on IF signals (instead of RF input signals)
`allows the microwave transition analyzer to be internally
`triggered to 40 GHz. Enhancements to the hardware trigger
`are available through the use of digital signal processing.
`
`Periodic Sampling
`The mathematical analysis of periodic functions was begun
`in the early 19th century by Jean-Baptiste-Joseph Fourier.
`Fourier's theorem introduced the techniques for decomp.osing
`
`RPX-Farmwald Ex. 1043, p 3
`
`

`
`Filtering, a convolution oppration in the time domain, is
`morP Pasily intPrpreterl as frequency-domain multiplication.
`AlternatiVPly, a mixer multiplies two signals in the time do(cid:173)
`main, but the result is exprpssed as frequency-domain
`translation, a convolution operation. Why convolution is the
`analytical mechanism for realizing frequency translation is
`explainPd in "Frequency Translation as Convolution" on
`page 61.
`
`An ideal sampler driven by a periodic sampling pulse can be
`considPred a switch that briefly connects the input port to
`the output port at a periodic rate. When the switch is closed
`the output signal is the input signal multiplied by unity.
`'
`When the switch is open, the output signal is grounded, that
`is, the input signal is multiplied by zero. Thus, the signal at
`the sampler's output is formed as the product of the input
`signal and the periodic pulse defining the switch state as a
`function of time. As in the mixer example on page 61, time(cid:173)
`domain multiplication results in frequency-domain convolu(cid:173)
`tion. The frequency spectrum of the sampler's input signal is
`convolved with the spectrum of the periodic pulse to produce
`the spectrum of the sampler's output (IF) signal.
`
`The frequency spectrum of a periodic pulse is composed of
`delta functions at the fundamental repetition frequency and
`all multiples (harmonics) of this frequency. This infinite set
`of impulses in the frequency domain, sometimes called a fre(cid:173)
`quency comb, inherits a magnitude and phase profile accord(cid:173)
`ing to the time-domain pulse shape. A narrow, rectangular
`pulse imparts a sin(f)/f roll-off characteristic to tl#equency
`comb. The first null of the response occurs at a frequency
`equal to the reciprocal of the pulse width and the 3-dB atten(cid:173)
`uation frequency occurs at 0.443 times this value. Funda(cid:173)
`mental to wide-bandwidth sampling is achieving a very nar(cid:173)
`row sampling pulse or aperture. The sampling aperture in
`the microwave transition analyzer is less than 20 ps.
`
`The sampling front end of the microwave transition analyzer
`converts the high-frequency input signal to a low-frequency
`IF signal suitable for digitization and subsequent numerical
`processing. Depending on the application, three different in(cid:173)
`terpretations of the sampling process are possible: frequency
`translation, frequency compression, and a combination of
`translation and compression.
`
`Fig. 4. Named for its ability to measure vny fast magnitmle and
`phase transitions under pulsed-RF ronditions, the HP 71500A
`micro\\'ave transition analyzer (top instrument) is part high(cid:173)
`frequen<'y sampling oscillos<'ope, part dynamic signal analyzer,
`and part network analyzer. The HP 7lfiOOA consists of the HP
`78020A microwave transition analyzer module and the HP 70004A
`mainframe. The bottom instmrnent shown herP is the HP 8:3640A
`synthesized sweeper.
`
`any periodic waveform into a sum of harmonically related
`sinusoids. The Fourier series is a frequency-domain repre(cid:173)
`sentation of the original time function and is used to sim(cid:173)
`plify the description and provide insight into thP function's
`underlying characteristics.

`
`The sampler in the microwave transition analyzer is driven
`by a constant-frequency sampling signal. BPcause the sam(cid:173)
`pler drive is periodic, Fourier analysis can be usPd to under(cid:173)
`stand the sampler's operation. Often, periodic signals or
`systems responding to periodic signals are described and
`analyzed in the frequency domain. Transformations be(cid:173)
`tween the time and frequency domains replace convolution
`operations in one domain with multiplication in thP other.
`
`Sample Rate
`Synthesizer
`
`Microwave
`Samplers
`
`· Switchable
`Low-Pass
`Filters
`
`IF
`Step Gain
`Amplifiers
`
`Sample-
`and-Hold
`Circuits
`
`Fig. 5. Simplified block diagram of the HP 71 GOOA 1nicrowm·e trm s1tion analyzer.
`
`0 C"tober 1092 Hcwlett-Pal'kard .Journal
`·t
`
`51
`
`RPX-Farmwald Ex. 1043, p 4
`
`

`
`_...__.__(] -
`
`---+! t-(cid:173)
`BW
`
`· f
`
`____..tl__.___--+-1 _
`
`(a)
`
`(b)
`
`0
`
`0
`
`Sampler Output
`
`... tJ /1 fJ (lf\ ;iltJ r1 tJ r1 tJ r1 .. : f
`
`0
`
`(c)
`
`ADC Input
`
`(d)
`
`0
`
`• f
`
`Fig. 6. Sampling used to translate a frequency band. (a) Input
`spectrum. (b) Sampling comb. (c) The sampler output spectrum
`is the convolution of the waveforms in (a) and (b). (d) Filtered
`output.
`
`Frequency Translation
`N onrepetitive or single-shot events can be captured by sam(cid:173)
`pling the input signal at a rate greater than twice the input
`bandwidth. This is known as the Nyquist criterion. However,
`maintaining this criterion does not imply that the sampling
`rate must be g:r:eater than twice the input signal's highest
`frequency. If the RF bandwidth of the sampler is adequate,
`narrowband information on a high-frequency carrier can be
`captured by low-frequency sampling, as long as a sampling
`rate of approximately twice the modulation bandwidth is
`maintained. Sampling the high-frequency signal translates
`the signal to baseband.
`
`Samplers are often used in place of mixers for frequency
`conversion-for example, in the front ends of many general(cid:173)
`purpose network analyzers. In the case of translation only, a
`given narrow frequency band is converted to baseband by
`an appropriate choice of sampling frequency. Fig. 6 diagrams
`the conversion process. The spectrum of the input signal is
`shown in Fig. 6a and the frequency comb of the sampling
`pulse is shown in Fig. 6b. The sampling frequency, that is,
`the spacing between the teeth of the frequency comb, is
`chosen such that the input spectrum lies appropriately posi(cid:173)
`tioned between adjacent comb teeth. The convolution result
`is shown in Fig. 6c.
`
`Two important considerations in the choice of sampling fre(cid:173)
`quency can be seen from these diagrams. First, the input
`signal bandwidth (Fig. 6a) must be less than one half the
`sample rate. Second, the sample rate must be chosen so the
`input spectrum is entirely contained in a frequency range
`bounded by the nearest sampling harmonic and the frequency
`halfway to the ne~ higher or lower harmonic. If these crite(cid:173)
`ria are not met, the sampler will translate or alias more than
`one component of the input spectrum to the same output
`frequency, causing uncorrectable errors. The maximum sam(cid:173)
`pling rate of the microwave transition analyzer is 20 MSa/s.
`The rate is continuously adjustable (in 1-mHz steps) down
`
`52 October 1992 Hewlett-Packard Journal
`
`to a minimum rate of 1 Sais and can be phase-locked to an
`external 10-MHz reference.
`
`The signal at the output of the sampler is amplified and low(cid:173)
`pass filtered before analog-to-digital conversion. This filter(cid:173)
`ing virtually restores the original input spectrum, but it is now
`centered in the much lower IF range (Fig. 6d). Because the
`filter transition from passband to stopband is not immedi(cid:173)
`ate, some undesired high-frequency energy may be included
`in the signal presented to the ADC. In this case, the band(cid:173)
`width of the signal at the ADC exceeds half the sample rate.
`Aliasing occurs as the highest-frequency components are
`folded back on top of the original translated spectrum by
`the sample-and-hold circuit of the ADC. However, unlike
`the aliasing problems mentioned in the previous paragraph,
`the effects of this aliasing can be predicted and corrected
`in software because the aliased components represent
`redundant information.
`
`In summary, using a sampler with a bandwidth many times
`the sample rate allows the capture of single-shot events in
`the modulation on a high-frequency carrier (see Fig. 7). The
`analysis bandwidth is limited to half the sample rate,.
`
`Frequency Compression
`A second, fundamentally different perspective of the sam(cid:173)
`pling process is useful in the measurement of periodic high(cid:173)
`frequency signals. Traditionally, these measurements have
`required trigger-based repetitive sampling techniques. In the
`microwave transition analyzer, precision RF trigger circuitry
`is not used. Periodic sampling' alone is used to convert a
`strictly periodic input with harmonic components spread
`across a very wide bandwidth to a low-frequency signal with
`harmonic components spread over the narrow IF range. This
`is accomplished by choosing a sampling frequency that con(cid:173)
`verts each component of the input signal into the IF such that
`the harmonic ordering, magnitude, and phase relationships
`of the original input are preserved in the IF signal. The sam(cid:173)
`pling process effectively compresses the Wide-bandwidth
`input signal into a low-frequency signal at the IF.
`
`Tr1=Ch1
`15 mUldiv
`0 U ref
`
`Tr3=Ch1
`15 mU/div
`0 U ref
`
`0 5.
`
`50 us/div
`
`Fig. 7. Turn-on characteristic of a synthesizer's output amplifier.
`This single-shot measurement was internally triggered on the
`signal that originated from the enabling of the RF output of the
`synthesizer. The carrier frequency is 5 GHz.
`
`RPX-Farmwald Ex. 1043, p 5
`
`

`
`Compression Factor. The signal at the IF is a replica of the
`input signal, but at a much lower fundamental frequency.
`When this signal is digitized and displayed, the waveshape
`matches that of the input. The time range indicated on the
`display is calculated by dividing the real time (sample period
`times trace points) by the compression factor (input frequency
`x l/x, where x corresponds to the fundamental frequency at
`the IF-see Fig. 8):
`
`S
`.
`rme pan=
`T
`
`(Sample Period) (Number of Trace Points)
`(Input Frequency)/x

`
`When the microwave transition analyzer is used for repeti(cid:173)
`tive sampling, the input signal must be strictly periodic, and
`the period must be lmown to high accuracy. If the frequency
`that the analyzer assumes for the input signal is near but not
`exactly equal to the frequency of the signal being measured,
`the IF will be shifted in frequency by an amount equal to the
`difference. The resulting measurement will show an erro(cid:173)
`neous time· scale, the error equal in percentage to the fre(cid:173)
`quency error of the IF signal. Thus, a small RF inaccuracy
`can result in a very large time-scale error. The ability to fre(cid:173)
`quency-lock the microwave transition analyzer's sampling
`rate to the signal being measured (by sharing a common
`reference frequency with the stimulus), removes this source
`of error. The resulting time scale accuracy is specified to 1
`ps-better than any current trigger-based oscilloscope.
`
`Triggering. To keep the display "triggered," low-frequency
`trigger circuitry is connected to the IF signal and used to
`initiate the storage of a data record relative to a rising or
`falling edge. Data samples in the buffer before the trigger
`occurrence are displayed as negative time (pretrigger view).
`Through the combination of periodic sampling and a low(cid:173)
`frequency trigger circuit, the microwave transition analyzer
`is able to trigger internally on periodic signals across the full
`40-GHz input bandwidth and offer negative-time capability
`without delay lines.
`
`IF Filtering for Noise Reduction. As mentioned earlier, the sig(cid:173)
`nal at the output of the sampler is low-pass filtered before
`analog-to-digital conversion. In Fig. 8d the bandwidth cho(cid:173)
`sen for this filtering is less than half the sampling rate. Any
`IF components above the band edge of the filter correspond
`to input harmonic components beyond the specified input
`bandwidth of 40 GHz and may be filtered off. Filtering the IF
`signal to a bandwidth narrower than half the sampling rate
`means that not all of the noise across the 40-GHz input band(cid:173)
`width is converted to noise on the IF signal. Thus, noise is
`removed from the displayed signal without affecting the
`
`Fig. 9. Periodic sampling in the time domain.
`
`October 1992 Hewlett-Packard Journal
`
`53
`
`2nf5
`
`3nf5
`
`Sampler Output
`
`nf5
`
`(c)
`
`... j ll
`
`(d)
`
`Fig. 8. Sampling used to frequency compress a periodic input
`signal. (a) Input signal spectrum. (b) Sampling comb. (c) Expand(cid:173)
`ed frequency scale showing the relationship between the input and
`the sampling signal components. ( d) The sampler output signal is
`the convolution of the waveforms in (a) and (b).
`
`Fig. 8 illustrates the concept in the frequency domain. The
`input spectrum and frequency comb of the sampling pulse
`(including the RF response roll-off) are shown in Figs. Ba
`and 8b. Fig. 8c provides a close-up view of the relative posi(cid:173)
`tioning of the comb lines with respect to the input signal.
`The sampling rate is chosen such that a given harmonic (the
`nth) is positioned x Hz below the input's fundamental fre(cid:173)
`quency. Then, the (2n)th sampling harmonic will be posi(cid:173)
`tioned 2x below the input's second harmonic, the (3n)th
`sampling harmonic will be 3x below the input's third har(cid:173)
`monic, and so on. Fig. 8d shows ~e result of the convolu(cid:173)
`tion. Each harmonic of the input is converted to a corre(cid:173)
`sponding harmonic of the low-frequency signal at the IF.
`
`The sampler does not have infinite bandwidth, and the
`sin(t)/f roll-off of the sampling comb attenuates the IF re(cid:173)
`sponses that correspond to input components at the higher
`frequencies. Small amounts of attenuation may be compen(cid:173)
`sated for in software, however, after the signal is digitized.
`The combination of a very narrow sampling aperture and
`software corrections allow the microwave transition analyzer
`to specify a flat response to 40 GHz.
`
`Viewing this process in the time domain, the sample interval
`is set to be a multiple of the input period plus a small amount
`equal to the effective time between points (Fig. 9). Since the
`sampling interval is not an exact multiple of the input period,
`the sampling instant moves with respect to the input at a
`prescribed increment as the samples are acquired. The effec(cid:173)
`tive time between points is determined by how close the sam(cid:173)
`pling frequency is to a subharmonic of the input frequency.
`
`RPX-Farmwald Ex. 1043, p 6
`
`

`
`For a given pulsed-RF input signal with an arbitrary carrier
`frequency, the values of x and y cannot be independently
`controlled by adjustments in the sampling rate alone. If the
`sampling rate is set to achieve the desired compression fac(cid:173)
`tor (PRF/x), there is no remaining degree of freedom for
`adjusting the spectral offset (y) to avoid overlap. One solu(cid:173)
`tion is to provide a mechanism for automatically adjusting
`the carrier frequency under control of the microwave transi(cid:173)
`tion analyzer. In many cases, the microwave transition ana(cid:173)
`lyzer is used in a stimulus-response configuration similar to
`that of a network analyzer. If the carrier source is under
`control, the carrier frequency control can be used to adjust
`the spectral offset independent of the sampling rate.
`
`Often, however, the microwave transition analyzer does not
`control the carrier source, or it is desired that the carrier
`frequency not be modified. In these cases, the simultaneous
`requirements on the sample rate are achieved by slight mod(cid:173)
`ifications to either the requested time span or the number of
`trace points. The parameter to be modified is determined by
`the user. Remembering that the displayed time span is equal
`
`a)
`
`b)
`
`Sampling
`Comb -
`
`c)
`
`d)
`
`e)
`
`0
`
`40GHZ
`
`1---- PRF
`i - - PRF-x = fs
`2
`-t 14- -t 14- - t 14-
`y- x
`y+x
`Y
`
`Sampler Output
`
`f--x
`
`.. f
`
`Fig. 11. Sampling used to analyze periodic wideband modulation.
`(a) Input signal spectrum. (b) Sampling comb. (c) Expanded fre(cid:173)
`quency scale showing the relationship between input and sampling
`signal components. (d) The sampler output signal is the convolution
`of the waveforms in (a) and (b). (e) The IF spectrum on an expand(cid:173)
`ed frequency scale, showing the spacing of the signal components.
`
`Tr1=Ch1
`2.03 mU/div
`-486 uU ref
`
`Tr2=Mem1
`2.03 mU!div
`-648 uU ref
`
`200 psldiv
`
`Fig. 10. Filtering the IF signal removes noise but retains the
`underlying wave shape.
`
`waveshape. The result is cleaner displays and improved
`sensitivity (by more than 20 dB) compared to conventional
`trigger-based sampling oscilloscopes (see Fig. 10).
`
`Translation and Compression
`The perspectives of translation and compression are com(cid:173)
`bined to analyze the third use of the microwave transition
`analyzer's sampling front end. The application is measuring
`signals composed of broadband, periodic modulation on a
`high-frequency carrier. Examples include pulsed-RF signals
`with narrow pulse widths or fast edge speeds. Proceeding as
`before, the spectrum of the input signal and the frequency
`comb of the sampling pulse are shown in Figs. 1 la and 1 lb,
`respectively. Fig. Ile has an expanded frequency scale show(cid:173)
`ing the relative positioning of the input's spectral lines and
`those of the sampling pulse. Two variables, x and y, are intro(cid:173)
`duced in this figure, and are related to the concepts of com(cid:173)
`pression and translation, respectively. The sampling frequen(cid:173)
`cy is chosen such that the signal's pulse repetition frequency
`(PRF) is slightly greater (x Hz) than a multiple of the sam(cid:173)
`pling rate. In other words, the t1me between sampling
`instants is slightly greater than an integral number of input
`pulse repetition periods. As can be seen from the diagram,
`the frequency separation between a given signal component
`and the nearest sampling harmonic increments by x Hz
`when considering the next-higher signal component. Conse(cid:173)
`quently, the spacing of the corresponding components in the
`sampler's output signal is x Hz, resulting in a compression
`factor of PRF/x.
`
`In Fig. 1 k, the spectral center of the input signal is shown
`to be offset by y Hz from the nearest sampling harmonic.
`Therefore, the signal at the output of the sampler is centered
`at y Hz, as shown in Fig. 1 ld. If the offset y is allowed to
`decrease by a change in the input carrier frequency, the sam(cid:173)
`pler output components are translated toward one another
`as indicated by the dashed arrows. If y becomes too small,
`the components will partially overlap and distort the spec(cid:173)
`trum. Likewise, if y is increased, the sampler's output com(cid:173)
`ponents move opposite to the dirpctions indicated and will
`overlap as y approaches half the sampling rate.
`
`54 Ortober lfl92 Hewlett -Packard Journal
`
`RPX-Farmwald Ex. 1043, p 7
`
`

`
`se c / d i v:
`
`EXT
`
`/'
`
`!'
`
`.
`
`Tr1 = Ch1
`25 rn\J/div
`r e f
`(a) 121
`\J
`
`37.Lf ns
`
`5121 121 ps / div
`
`::35.4600 ns
`
`:37 . !3600 ns
`
`40 .4 600 ns
`
`.
`
`;
`
`:•
`
`~. · .:.._ __ _ __: - -- -~-- -
`
`---::----t-~ ... -':~..__:rr-.;;......:-~-'.'T_,,_~~-~+-:--"--~-t-_,_~ ........ ~t-~--''----t-c-~ ·~:----
`,__ ....... ......,,==;;;;:j::::~~~~·-~~.-~,~~ .. ~· ~.~~/·~"
`
`1 .. : .... -
`
`....
`
`.
`
`·\,:.
`
`--·~~----!-----'----~'----·-· --,--
`
`-
`
`----+:-- - -· .. ~· -~~---~--:___
`
`(b) ~~,;,e~ase
`
`·2s . oo mv o i t s /d iv
`SOC p s /d

This document is available on Docket Alarm but you must sign up to view it.


Or .

Accessing this document will incur an additional charge of $.

After purchase, you can access this document again without charge.

Accept $ Charge
throbber

Still Working On It

This document is taking longer than usual to download. This can happen if we need to contact the court directly to obtain the document and their servers are running slowly.

Give it another minute or two to complete, and then try the refresh button.

throbber

A few More Minutes ... Still Working

It can take up to 5 minutes for us to download a document if the court servers are running slowly.

Thank you for your continued patience.

This document could not be displayed.

We could not find this document within its docket. Please go back to the docket page and check the link. If that does not work, go back to the docket and refresh it to pull the newest information.

Your account does not support viewing this document.

You need a Paid Account to view this document. Click here to change your account type.

Your account does not support viewing this document.

Set your membership status to view this document.

With a Docket Alarm membership, you'll get a whole lot more, including:

  • Up-to-date information for this case.
  • Email alerts whenever there is an update.
  • Full text search for other cases.
  • Get email alerts whenever a new case matches your search.

Become a Member

One Moment Please

The filing “” is large (MB) and is being downloaded.

Please refresh this page in a few minutes to see if the filing has been downloaded. The filing will also be emailed to you when the download completes.

Your document is on its way!

If you do not receive the document in five minutes, contact support at support@docketalarm.com.

Sealed Document

We are unable to display this document, it may be under a court ordered seal.

If you have proper credentials to access the file, you may proceed directly to the court's system using your government issued username and password.


Access Government Site

We are redirecting you
to a mobile optimized page.





Document Unreadable or Corrupt

Refresh this Document
Go to the Docket

We are unable to display this document.

Refresh this Document
Go to the Docket