`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`______________________
`THE GILLETTE COMPANY, FUJITSU SEMICONDUCTOR LIMITED, and
`FUJITSU SEMICONDUCTOR AMERICA, INC.
`
`Petitioners
`
`v.
`
`ZOND, LLC
`Patent Owner
`
`______________________
`Case No. IPR2014-007261
`Patent 6,896,773 B2
`______________________
`
`
`
`
`
`
`PATENT OWNER’S NOTICE OF APPEAL
`35 U.S.C. § 142 & 37 C.F.R. § 90.2
`
`
`
`
`
`1 Case IPR 2014-01481 has been joined with the instant proceeding.
`
`
`
`Pursuant to 37 C.F.R. § 90.2(a), Patent Owner, Zond, LLC, hereby provides
`
`notice of its appeal to the United States Court of Appeals for the Federal Circuit for
`
`review of the Final Written Decision of the United States Patent and Trademark
`
`Office (“USPTO”) Patent Trial and Appeals Board (“PTAB”) in Inter Partes
`
`Review 2014-00726, concerning U.S. Patent 6,896,773 (“the ’773 patent”), entered
`
`on September 29, 2015, attached hereto as Appendix A.
`
`
`
`ISSUES TO BE ADDRESSED ON APPEAL
`
`A. Whether the PTAB erred in finding claims 21, 22, 26-33, and 40
`
`unpatentable as being obvious under 35 U.S.C. § 103(a) in view of D.V.
`
`Mozgrin, et al., High-Current Low-Pressure Quasi-Stationary Discharge
`
`in a Magnetic Field: Experimental Research, 21 PLASMA PHYSICS
`
`REPORTS 400–409 (1995) (“Mozgrin”), and Interaction of Low-
`
`Temperature Plasma With Condensed Matter, Gas, and Electromagnetic
`
`Field in (III) ENCYCLOPEDIA OF LOW-TEMPERATURE PLASMA (V.E.
`
`Fortov ed., 2000) (“Fortov”)?
`
`B. Whether the PTAB erred in finding claims 24 and 25 unpatentable as
`
`being obvious under 35 U.S.C. § 103(a) in view of Mozgrin, Fortov and
`
`U.S. Pat. 6,190,512 to Lanstman (“Lantsman”)?
`
`C. Whether the PTAB erred in finding claim 23 unpatentable as being
`
` 2
`
`
`
`obvious under 35 U.S.C. § 103(a) in view of Mozgrin, Fortov, and A. A.
`
`Kudryavtsev and V.N. Skrebov, Ionization Relaxation in a Plasma
`
`Produced by a Pulsed Inert-Gas Discharge, 28(1) SOV. PHYS. TECH.
`
`PHYS. 30–35 (1983) (“Kudryavtsev”)?
`
`
`
`Simultaneous with submission of this Notice of Appeal to the Director of the
`
`United States Patent and Trademark Office, this Notice of Appeal is being filed
`
`with the Patent Trial and Appeal Board. In addition, this Notice of Appeal, along
`
`with the required docketing fees, is being filed with the United States Court of
`
`Respectfully submitted,
`/Tarek N. Fahmi/
`
`
`
`Tarek N. Fahmi, Reg. No. 41,402
`
`Appeals for the Federal Circuit.
`
`
`
`
`
`
`
`
`
`
`Dated: November 23, 2015
`
`
`
`
`
`
`ASCENDA LAW GROUP, PC
`333 W. San Carlos St., Suite 200
`San Jose, CA 95110
`Tel: 866-877-4883
`Email: tarek.fahmi@ascendalaw.com
`
` 3
`
`
`
`APPENDIX A
`
`APPENDIX A
`
`
`
`
`
`
`
`
`
` Paper 42
`Trials@uspto.gov
`571-272-7822
`
` Entered: September 29, 2015
`
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`____________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________
`
`THE GILLETTE COMPANY, FUJITSU SEMICONDUCTOR LIMITED,
`and FUJITSU SEMICONDUCTOR AMERICA, INC.
`Petitioners,
`
`v.
`
`ZOND, LLC,
`Patent Owner.
`____________
`
`Case IPR2014-007261
`Patent 6,896,773 B2
`____________
`
`
`
`Before KEVIN F. TURNER, DEBRA K. STEPHENS, JONI Y. CHANG,
`SUSAN L.C. MITCHELL, and JENNIFER MEYER CHAGNON,
`Administrative Patent Judges.
`
`
`
`CHANG, Administrative Patent Judge.
`
`
`
`
`
`FINAL WRITTEN DECISION
`Inter Partes Review
`35 U.S.C. § 318(a) and 37 C.F.R. § 42.73
`
`
`1 Case IPR2014-01481 has been joined with the instant inter partes review.
`
`
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`
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`IPR2014-00726
`Patent 6,896,773 B2
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`I. INTRODUCTION
`
`The Gillette Company (“Gillette”) filed a Petition requesting an inter
`
`partes review of claims 21–33 and 40 of U.S. Patent No. 6,896,773 B2
`
`(Ex. 1101, “the ’773 patent”). Paper 3 (“Pet.”). Patent Owner Zond, LLC
`
`(“Zond”) filed a Preliminary Response. Paper 7 (“Prelim. Resp.”). Upon
`
`consideration of the Petition and Preliminary Response, we instituted the
`
`instant trial on October 10, 2014, pursuant to 35 U.S.C. § 314. Paper 8
`
`(“Dec.”).
`
`Subsequent to institution, we granted the Motion for Joinder filed by
`
`Taiwan Semiconductor Manufacturing Company, Ltd., TSMC North
`
`America Corp. (collectively, “TSMC”), Fujitsu Semiconductor Limited, and
`
`Fujitsu Semiconductor America, Inc. (collectively, “Fujitsu”), joining Case
`
`IPR2014-01481 with the instant trial (Paper 15), and also granted a Joint
`
`Motion to Terminate with respect to TSMC (Paper 31).2 Zond filed a
`
`Response (Paper 27 (“PO Resp.”)), and Gillette filed a Reply (Paper 33
`
`(“Reply”)). Oral hearing3 was held on June 16, 2015, and a transcript of the
`
`hearing was entered into the record. Paper 41 (“Tr.”).
`
`We have jurisdiction under 35 U.S.C. § 6(c). This Final Written
`
`Decision is entered pursuant to 35 U.S.C. § 318(a) and 37 C.F.R. § 42.73.
`
`For the reasons set forth below, we determine that Gillette has shown, by a
`
`preponderance of the evidence, that claims 21–33 and 40 of the ’773 patent
`
`are unpatentable under 35 U.S.C. § 103(a).
`
`
`2 In this Decision, we refer to The Gillette Company (the original Petitioner)
`and Fujitsu as “Gillette,” for efficiency.
`3 The oral arguments for the instant review and Case IPR2014-00580 were
`consolidated.
`
`
`
`2
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`A. Related District Court Proceedings
`
`
`
`Gillette indicates the ’773 patent was asserted in Zond, LLC v. The
`
`Gillette Co., No.1:13-CV-11567-DJC (D. Mass.), and identifies other
`
`proceedings in which Zond asserted the claims of the ’773 patent. Pet. 1.
`
`B. The ’773 Patent
`
`The ’773 patent relates to a method and an apparatus for
`
`high-deposition sputtering. Ex. 1101, Abs. At the time of the invention,
`
`sputtering was a well-known technique for depositing films on
`
`semiconductor substrates. Id. at 1:5–6. According to the ’773 patent,
`
`conventional magnetron sputtering systems deposit films with relatively low
`
`uniformity. Id. at 1:53–54. Although film uniformity can be increased by
`
`mechanically moving the substrate and/or magnetron, the ’773 patent
`
`indicates such systems are relatively complex and expensive to implement.
`
`Id. at 1:54–57. The’773 patent states that conventional magnetron sputtering
`
`systems also have relatively poor target utilization (how uniformly the target
`
`material erodes during sputtering) and a relatively low deposition rate (the
`
`amount of material deposited on the substrate per unit of time). Id. at 1:57–
`
`66. To address these issues, the ’773 patent discloses a plasma sputtering
`
`apparatus that creates a strongly-ionized plasma from a weakly-ionized
`
`plasma using a pulsed power supply. Id. at Abs. According to the ’773
`
`patent, “[t]he strongly-ionized plasma includes a first plurality of ions that
`
`impact the sputtering target to generate sufficient thermal energy in the
`
`sputtering target to cause a sputtering yield of the sputtering target to be
`
`non-linearly related to a temperature of the sputtering target.” Id.
`
`
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`3
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`
`
`C. Illustrative Claims
`
`Of the challenged claims, claims 21 and 40 are independent.
`
`Claims 22–33 depend directly from claim 21. Claims 21 and 40, reproduced
`
`below, are illustrative:
`
`21. A method for high deposition rate sputtering, the method
`comprising:
`
`ionizing a feed gas to generate a weakly-ionized plasma
`proximate to a cathode assembly that comprises a sputtering
`target; and
`
`applying a voltage pulse to the cathode assembly to generate a
`strongly-ionized plasma from the weakly-ionized plasma, an
`amplitude and a rise time of the voltage pulse being chosen so
`that ions in the strongly-ionized plasma generate sufficient
`thermal energy in the sputtering target to cause a sputtering
`yield to be non-linearly related to a temperature of the
`sputtering target, thereby increasing a deposition rate of the
`sputtering.
`
`40. A sputtering source comprising:
`
`means for ionizing a feed gas to generate a weakly-ionized
`plasma; and
`
`means for increasing the density of the weakly-ionized plasma
`to generate a strongly-ionized plasma having a density of ions
`that generate sufficient thermal energy in the sputtering target
`to cause a sputtering yield to be non-linearly related to a
`temperature of the sputtering target.
`
`Ex. 1101, 22:21–33, 24:17–25.
`
`D. Prior Art Relied Upon
`
`Gillette relies upon the following prior art references:
`
` US 6,413,382 B1
`Wang
` US 6,190,512 B1
`Lantsman
`Kawamata US 5,958,155
`
`
`July 2, 2002
`Feb. 20, 2001
`Sept. 28, 1999
`
`(Ex. 1103)
`(Ex. 1108)
`(Ex. 1109)
`
`
`
`4
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`
`
`D.V. Mozgrin, et al., High-Current Low-Pressure Quasi-Stationary
`Discharge in a Magnetic Field: Experimental Research, 21 PLASMA
`PHYSICS REPORTS 400–409 (1995) (Ex. 1102) (“Mozgrin”).
`
`Interaction of Low-Temperature Plasma With Condensed Matter, Gas, and
`Electromagnetic Field in (III) ENCYCLOPEDIA OF LOW-TEMPERATURE
`PLASMA (V.E. Fortov ed., 2000) (Ex. 1104) (“Fortov”).4
`
`A.A. Kudryavtsev and V.N. Skrebov, Ionization Relaxation in a Plasma
`Produced by a Pulsed Inert-Gas Discharge, 28 SOV. PHYS. TECH. PHYS. 30–
`35 (Jan. 1983) (Ex. 1106) (“Kudryavtsev”).
`
`W. Ehrenberg and D.J. Gibbons, ELECTRON BOMBARDMENT INDUCED
`CONDUCTIVITY AND ITS APPLICATIONS, 8–122 (1981) (Ex. 1125)
`(“Ehrenberg”).
`
`
`E. Grounds of Unpatentability
`
`We instituted the instant trial based on the following grounds of
`
`unpatentability (Dec. 39):
`
`Claim(s)
`
`Basis
`
`References
`
`21, 22, 26–33, and 40
`
`§ 103
`
`Mozgrin and Fortov
`
`24 and 25
`
`§ 103
`
`Mozgrin, Fortov, and Lantsman
`
`23
`
`§ 103
`
`Mozgrin, Fortov, and Kudryavtsev
`
`
`4 Fortov is a Russian-language reference (Ex. 1110). The citations to Fortov
`are to the certified English-language translation submitted by Gillette
`(Ex. 1104).
`
`
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`5
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`II. ANALYSIS
`
`A. Claim Construction
`
`
`
`In an inter partes review, claim terms in an unexpired patent are given
`
`their broadest reasonable construction in light of the specification of the
`
`patent in which they appear. 37 C.F.R. § 42.100(b); see also In re Cuozzo
`
`Speed Techs., LLC, 793 F.3d 1268, 1275–79 (Fed. Cir. 2015) (“Congress
`
`implicitly approved the broadest reasonable interpretation standard in
`
`enacting the AIA,”5 and “the standard was properly adopted by PTO
`
`regulation.”). Claim terms are given their ordinary and customary meaning
`
`as would be understood by one of ordinary skill in the art in the context of
`
`the entire disclosure. In re Translogic Tech., Inc., 504 F.3d 1249, 1257
`
`(Fed. Cir. 2007). An inventor may rebut that presumption by providing a
`
`definition of the term in the specification with “reasonable clarity,
`
`deliberateness, and precision.” In re Paulsen, 30 F.3d 1475, 1480 (Fed. Cir.
`
`1994). In the absence of such a definition, limitations are not to be read
`
`from the specification into the claims. In re Van Geuns, 988 F.2d 1181,
`
`1184 (Fed. Cir. 1993).
`
`
`
`“weakly-ionized plasma” and “strongly-ionized plasma”
`
`Claim 21 recites “applying a voltage pulse to the cathode assembly to
`
`generate a strongly-ionized plasma from the weakly-ionized plasma.”
`
`Ex. 1101, 22:26–28 (emphases added). During the pre-trial stage of this
`
`proceeding, Zond submitted its constructions for the claim terms “a
`
`weakly-ionized plasma” and “a strongly-ionized plasma.” Prelim. Resp. 19–
`
`
`5 The Leahy-Smith America Invents Act, Pub. L. No. 112-29, 125 Stat. 284
`(2011) (“AIA”).
`
`
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`6
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`20. In our Decision on Institution, we adopted Zond’s proposed
`
`constructions, in light of the Specification, as the broadest reasonable
`
`interpretations. Dec. 9–10; see, e.g., Ex. 1101, 13:31–33 (“strongly-ionized
`
`plasma 268 having a large ion density being formed”).
`
`Upon review of the parties’ explanations and supporting evidence
`
`before us, we discern no reason to modify our claim constructions set forth
`
`in the Decision on Institution with respect to these claim terms. Dec. 9–10.
`
`Therefore, for purposes of this Final Written Decision, we construe, in light
`
`of the Specification of the ’773 patent, the claim term “a weakly-ionized
`
`plasma” as “a plasma with a relatively low peak density of ions,” and the
`
`claim term “a strongly-ionized plasma” as “a plasma with a relatively high
`
`peak density of ions.”
`
`Means-Plus-Function Claim Elements
`
`The parties identify two claim elements recited in claim 40 as
`
`means-plus-function elements, invoking 35 U.S.C. § 112, ¶ 6.6 Pet. 5–6;
`
`Prelim. Resp. 21–24. We agree that those claim elements are written in
`
`means-plus-function form and fall under § 112 ¶ 6, because: (1) each claim
`
`element uses the term “means for”; (2) the term “means for” in each claim
`
`element is modified by functional language; and (3) the term “means for” is
`
`not modified by any structure recited in the claim to perform the claimed
`
`function. See Personalized Media Commc’ns, LLC v. Int’l Trade Comm’n,
`
`161 F.3d 696, 703–04 (Fed. Cir. 1998) (using the term “means for” in a
`
`6 Section 4(c) of the AIA re-designated 35 U.S.C. § 112, ¶ 6, as 35 U.S.C.
`§ 112(f). Pub. L. No. 112-29, 125 Stat. 284, 296 (2011). Because the ’773
`patent has a filing date before September 16, 2012 (effective date), we refer
`to the pre-AIA version of § 112 in this Decision.
`
`
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`7
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`claim creates a rebuttable presumption that the drafter intended to invoke
`
`§ 112 ¶ 6); Sage Prods., Inc. v. Devon Indus., Inc., 126 F.3d 1420, 1427–28
`
`(Fed. Cir. 1997) (the presumption is not rebutted if the term “means for” is
`
`modified by functional language and is not modified by any structure recited
`
`in the claim to perform the claimed function); see also Williamson v. Citrix
`
`Online, LLC, 792 F.3d 1339, 1349 (Fed. Cir. 2015) (confirming that “use of
`
`the word ‘means’ creates a presumption that § 112 ¶ 6, applies” (citing
`
`Personalized Media, 161 F.3d at 703)).
`
`The first step in construing a means-plus-function claim element is to
`
`identify the recited function in the claim element. Med. Instrumentation &
`
`Diagnostics Corp. v. Elekta AB, 344 F.3d 1205, 1210 (Fed. Cir. 2003). The
`
`second step is to look to the specification and identify the corresponding
`
`structure for that recited function. Id. A structure disclosed in the
`
`specification qualifies as “corresponding” structure only if the specification
`
`or prosecution history clearly links or associates that structure to the function
`
`recited in the claim. B. Braun Med., Inc. v. Abbott Labs., 124 F.3d 1419,
`
`1424 (Fed. Cir. 1997). “While corresponding structure need not include all
`
`things necessary to enable the claimed invention to work, it must include all
`
`structure that actually performs the recited function.” Default Proof Credit
`
`Card Sys., Inc. v. Home Depot U.S.A., Inc., 412 F.3d 1291, 1298 (Fed. Cir.
`
`2005).
`
`Upon review of the parties’ contentions and the Specification, we set
`
`forth our claim constructions in the Decision on Institution for the
`
`means-plus-function elements identified by the parties. Dec. 12–15. Neither
`
`party challenges any aspect of our claim constructions as to these claim
`
`elements. See PO Resp. 14–15; Reply 1–2. Based on this entire record, we
`
`
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`8
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`also discern no reason to modify our claim constructions at this juncture.
`
`For convenience, our claim constructions are reproduced in the table below:
`
`Means-Plus-Function Claim
`Elements
`
`Corresponding Structures
`
`“means for ionizing a feed gas to
`generate a weakly-ionized plasma”
`
`“means for increasing the density
`of the weakly-ionized plasma”
`
`A power supply electrically
`connected to a cathode assembly and
`an anode. See, Ex. 1101, 6:21–7:16,
`7:52–60, 10:8–42, 11:22–26, 20:10–
`25, Figs. 4–6; Dec. 12–13.
`
`A cathode assembly, an anode, and a
`pulsed power supply electrically
`coupled to the cathode assembly and
`anode. See, Ex. 1101, 6:22–52,
`10:31–41, Figs. 4–6; Dec. 13–15.
`
`
`
`B. Principles of Law
`
`A patent claim is unpatentable under 35 U.S.C. § 103(a) if the
`
`differences between the claimed subject matter and the prior art are such that
`
`the subject matter, as a whole, would have been obvious at the time the
`
`invention was made to a person having ordinary skill in the art to which said
`
`subject matter pertains. KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 406
`
`(2007). The question of obviousness is resolved on the basis of underlying
`
`factual determinations including: (1) the scope and content of the prior art;
`
`(2) any differences between the claimed subject matter and the prior art;
`
`(3) the level of ordinary skill in the art; and (4) objective evidence of
`
`nonobviousness. Graham v. John Deere Co., 383 U.S. 1, 17–18 (1966).
`
`In that regard, an obviousness analysis “need not seek out precise teachings
`
`
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`directed to the specific subject matter of the challenged claim, for a court
`
`can take account of the inferences and creative steps that a person of
`
`ordinary skill in the art would employ.” KSR, 550 U.S. at 418; Translogic,
`
`504 F.3d at 1262. The level of ordinary skill in the art is reflected by the
`
`prior art of record. See Okajima v. Bourdeau, 261 F.3d 1350, 1355 (Fed.
`
`Cir. 2001); In re GPAC Inc., 57 F.3d 1573, 1579 (Fed. Cir. 1995); In re
`
`Oelrich, 579 F.2d 86, 91 (CCPA 1978).
`
`We analyze the asserted grounds of unpatentability in accordance with
`
`the above-stated principles.
`
`
`
`C. Obviousness over Mozgrin and Fortov
`
`Gillette asserts that claims 21, 22, 26–33, and 40 are unpatentable
`
`under 35 U.S.C. § 103(a) as obvious over the combination of Mozgrin and
`
`Fortov. Pet. 23–36. In its Petition, Gillette explains how the combination of
`
`the prior art technical disclosures collectively meets each claim limitation
`
`and articulates a rationale to combining the teachings. Id. Gillette also
`
`submitted a Declaration of Mr. Richard DeVito (Ex. 1105) to support its
`
`Petition, and a Declaration of Dr. John C. Bravman (Ex. 1127) to support its
`
`Reply to Zond’s Patent Owner Response.
`
`Zond responds that the combination of Mozgrin and Fortov does not
`
`disclose every claim element. PO Resp. 37–44, 50–52. Zond also argues
`
`that there is insufficient reason to combine the technical disclosures of
`
`Mozgrin and Fortov. Id. at 26–29. To support its contentions, Zond proffers
`
`a Declaration of Dr. Larry D. Hartsough (Ex. 2005).
`
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`We have reviewed the entire record before us, including the parties’
`
`explanations and supporting evidence presented during this trial. We begin
`
`our discussion with a brief summary of Mozgrin and Fortov, and then we
`
`address the parties’ contentions in turn.
`
`Mozgrin
`
`Mozgrin discloses experimental research conducted on high-current
`
`low-pressure quasi-stationary discharge in a magnetic field. Ex. 1102, 400,
`
`Title. In Mozgrin, pulse or quasi-stationary regimes are discussed in light of
`
`the need for greater discharge power and plasma density. Id. Mozgrin
`
`discloses a planar magnetron plasma system having cathode 1, anode 2
`
`adjacent and parallel to cathode 1, and magnetic system 3, as shown in
`
`Figure 1(a) (reproduced below). Id. at 400–01. Mozgrin also discloses a
`
`power supply unit that includes a pulsed discharge supply unit and a system
`
`for pre-ionization. Id. at 401–02, Fig. 2. For pre-ionization, an initial
`
`plasma density is generated when the square voltage pulse is applied to the
`
`gas. Id.
`
`Figure 3(b) of Mozgrin is reproduced below:
`
`
`
`
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`11
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`Figure 3(b) of Mozgrin illustrates an oscillogram of voltage of the
`
`quasi-stationary discharge. Id. at 402. In Figure 3(b), Part 1 represents the
`
`voltage of the stationary discharge (pre-ionization stage); Part 2 displays the
`
`square voltage pulse application to the gap (Part 2a), where the plasma
`
`density grows and reaches its quasi-stationary value (Part 2b); and Part 3
`
`displays the discharge current growing and attaining its quasi-stationary
`
`value. Id. More specifically, the power supply generates a square voltage
`
`with rise times of 5–60 µs and durations of as much as 1.5 ms. Id. at 401.
`
`Mozgrin further discloses the current-voltage characteristic of the
`
`quasi-stationary plasma discharge that has four different stable forms or
`
`regimes: (1) pre-ionization stage (id. at 401–02); (2) high-current magnetron
`
`discharge regime, in which the plasma density exceeds 2 x 1013 cm-3,
`
`appropriate for sputtering (id. at 402–04, 409); (3) high-current diffuse
`
`discharge regime, in which the plasma density produces large-volume
`
`uniform dense plasmas η1 ≈ 1.5 x 1015 cm-3, appropriate for etching (id.); and
`
`(4) arc discharge regime (id. at 402–04). Id. at 402–409, Figs. 3–7.
`
`Fortov
`
`Fortov is a Russian-language encyclopedia of plasma physics.
`
`Ex. 1104, 1. The cited portion of Fortov is directed to interaction of plasma
`
`with condensed matter and, more particularly, to sputtering. Id. at 3–4.
`
`Fortov discloses the non-linear relationship between the target temperature
`
`and the sputtering yield Y above temperature T0. Id. at 16. According to
`
`Fortov, Y is the coefficient of sputtering, “defined as the relation of the
`
`number of sputtered atoms of a target to the number of bombarding ions
`
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`(atoms),” which “depends on the type of ions (its atomic number Zi and
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`mass Mi).” Id. at 6.
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`Figure VI.1.315 of Fortov is reproduced below.
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`Figure VI.1.315 of Fortov describes the sputtering coefficient of
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`copper (cuprum) being bombarded by ions of Ar+ with the energy of 400 eV,
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`from the temperature: 1 –– electrolytic copper, 2 –– rolled copper,
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`3 –– single crystal copper (cuprum monocrystal), facet (101). Id. at 9.
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`According to Fortov, at a temperature less than T1, coefficient Y is not
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`actually dependent on the temperature, and at T ≈ T1, Y starts to grow
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`rapidly, concurrently with growth of temperature. Id. Fortov further
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`explains temperature T1 is sometimes defined according to the empirical
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`relation T1 = .7 Tm where Tm is the melting temperature, though in some
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`cases, e.g., for tin (stannum) T1 > Tm and T1 = U/40k (k is Boltzmann
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`constant; U is the energy of sublimation correlated to one atom). Id. at 7, 9.
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`Temperature T1 depends on the type, energy, and density of ion flow.
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`Id. at 9.
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`Ionizing a feed gas
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`Zond disputes that “ionizing a feed gas to generate a weakly-ionized
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`plasma near a cathode assembly” is taught by the combination of Mozgrin
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`and Fortov. Resp. 38–40, 43–44.
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`Gillette takes the position that Mozgrin in combination with Fortov
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`discloses “ionizing a feed gas to generate a weakly-ionized plasma
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`proximate to a cathode assembly that comprises a sputtering target,” as
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`recited in claim 21, “exposing the feed gas to one of a static electric field, an
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`AC electric field, a quasi-static electric field, a pulsed electric field, [etc.],”
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`as recited in claim 28, and a “means for ionizing a feed gas to generate a
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`weakly-ionized plasma,” as recited in claim 40. Pet. 23–31, 33–34.
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`According to Gillette, Mozgrin discloses using a power supply to generate a
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`weakly-ionized plasma with density less than 1012 ions/cm3 from the feed
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`gas. Id. at 23–25 (citing Ex. 1102, 400–02, Figs. 1–6).
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`Figure 1 of Mozgrin is reproduced below.
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`Figure 1(a) of Mozgrin
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`Figure 1(b) of Mozgrin
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`Figure 1 of Mozgrin illustrates two types of systems: (1) a planar
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`magnetron system, as shown in Figure 1(a); and (2) a shaped-electrode
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`magnetron system, as shown in Figure 1(b). Ex. 1102, 401. Each system
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`comprises cathode 1, anode 2, and magnetic system 3. Id. Gillette points
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`out that Mozgrin’s magnetron systems generate a plasma from a feed gas,
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`such as argon and nitrogen, between and proximate to the anode and
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`cathode, as shown in Mozgrin’s Figure 1. Pet. 24; Ex. 1102, 400–02 (“The
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`[plasma] discharge had an annular shape and was adjacent to the cathode.”).
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`As shown in Figure 1(a) of Mozgrin, electric field E is formed between the
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`anode and cathode. Ex. 1102, 401.
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`Zond counters that Mozgrin does not disclose “ionizing a feed gas to
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`generate a weakly-ionized plasma near a cathode assembly.” PO Resp. 38–
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`40, 43–44 (emphasis added). Zond argues that Mozgrin teaches a static gas
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`and not a feed gas, as required by claims 21, 28, and 40. Id. As support,
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`Dr. Hartsough testifies that Mozgrin does not teach a feed gas because
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`Mozgrin discloses that the discharge gap was filled up with either neutral or
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`pre-ionized gas using four needle valves prior to generating plasma.
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`Ex. 2005 ¶ 133.
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`Upon review of the record before us, we are not persuaded by Zond’s
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`arguments and expert testimony. Rather, we determine that Gillette’s
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`contentions are supported by a preponderance of the evidence.
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`At the outset, Zond’s argument and expert testimony are not
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`commensurate with the scope of the claims. See In re Self, 671 F.2d 1344,
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`1348 (CCPA 1982) (stating that limitations not appearing in the claims
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`cannot be relied upon for patentability). Essentially, Zond and its expert are
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`construing the claim term “feed gas” to require a constant flow of gas. We
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`note that each of independent claims 21 and 40 recites “a feed gas,” and not
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`“a flowing feed gas,” as alleged by Zond. See Ex. 1101, 22:23–25, 24:18–
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`19. The claim term “a feed gas” does not require a constant flow of gas,
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`because the term does not imply necessarily the flow of gas. Construing the
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`claim term “a feed gas” as a constant flow of gas, as argued by Zond, would
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`import a limitation improperly from the Specification into the claims. See
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`Van Geuns, 988 F.2d at 1184.
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`In any event, even if the claims at issue here were to require such a
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`limitation, we observe that the combination of Mozgrin and Fortov would
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`render the claimed subject matter recited in the limitation obvious. As
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`Gillette points out, Mozgrin discloses generating “high-current [plasma]
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`discharge in wide ranges of discharge current (from 5 A to 1.8 kA) and
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`operating pressure (from 10-3 to 10 torr) using various gases (Ar, N2, SF6,
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`He, and H2).” Pet. 24; Ex. 1102, 402. Mr. DeVito testifies during his
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`cross-examination that Mozgrin suggests using a constant flow of gas in
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`order to maintain a constant pressure during the plasma process and to yield
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`high deposition rates. Ex. 2010, 84:13–85:1.
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`Zond’s allegation and expert testimony that using four needle valves
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`is an indication that Mozgrin’s feed gas is “a static gas” also is of no
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`moment. PO Resp. 39; Ex. 2005 ¶ 133. Dr. Bravman testifies that it was
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`well-known in the art at the time of the invention that needle valves provide
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`a continuous flow of gas. Ex. 1127 ¶ 48. As an example to support his
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`testimony, Dr. Bravman cites to Ehrenberg, a book published in 1981, which
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`states that “while still pumping, argon gas is allowed to enter the bell-jar
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`[chamber] through a needle valve. . . . This continuous flow method tends to
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`sweep away any impurities” (Ex. 1125, 81). Ex. 1127 ¶ 48.
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`We credit the testimony of Mr. DeVito (Ex. 2010, 84:13–85:2) and
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`Dr. Bravman (Ex. 1127 ¶ 48), as their explanations are consistent with the
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`prior art of record. Given the evidence before us, we are persuaded that one
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`of ordinary skill in the art at the time of the invention would have recognized
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`that Mozgrin’s system supplies a constant flow of feed gas into the chamber
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`during the plasma processing, and, therefore, Mozgrin’s feed gas need not be
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`a “static gas,” as alleged by Zond.
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`Mozgrin also discloses that the plasma discharge volume is generated
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`between the electrodes (the anode and cathode assembly), and that the gap
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`between the electrodes is about 10 mm—falling squarely within the range of
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`3–100 mm, disclosed in the ’773 patent (Ex. 1101, 10:23–24). Ex. 1102,
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`401. Moreover, Mozgrin explicitly states that the plasma discharge is
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`adjacent to the cathode. Id. Therefore, one of ordinary skill in the art would
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`have recognized that Mozgrin’s plasma is generated proximate to both the
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`anode and the cathode assembly.
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`For the foregoing reasons, we are persuaded that Gillette has
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`demonstrated, by a preponderance of the evidence, that the combination of
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`Mozgrin and Fortov discloses “ionizing a feed gas to generate a
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`weakly-ionized plasma proximate to a cathode assembly that comprises a
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`sputtering target,” as recited in claim 21, “exposing the feed gas to one of a
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`static electric field, an AC electric field, a quasi-static electric field, a pulsed
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`electric field, [etc.],” as recited in claim 28, and a “means for ionizing a feed
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`gas to generate a weakly-ionized plasma,” as recited in claim 40.
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`Voltage pulse
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`Claim 21 recites:
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`applying a voltage pulse to the cathode assembly to generate a
`strongly-ionized plasma from the weakly ionized plasma, an
`amplitude and a rise time of the voltage pulse being chosen so
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`that ions in the strongly-ionized plasma generate sufficient
`thermal energy in the sputtering target to cause a sputtering
`yield to be non-linearly related to a temperature of the
`sputtering target, thereby increasing a deposition rate of the
`sputtering
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`Ex. 1101, 22:26–33 (emphases added). Claim 40 recites a similar
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`element. Id. at 24:20–26.
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`In its Response, Zond argues that the combination of Mozgrin and
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`Fortov does not teach or suggest the aforementioned “voltage pulse”
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`limitation, as required by claims 21 and 40. PO Resp. 40–43. In particular,
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`Zond alleges that Mozgrin does not disclose “any attempt to achieve a
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`sputtering yield to be non-linearly related to a temperature of the sputtering
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`target.” Id. at 41; Ex. 2005 ¶ 137. Zond also contends that Fortov does not
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`disclose “how to generate sufficient target thermal energy to cause the
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`sputtering yield to be non-linear with target temperature.” PO Resp. 42;
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`Ex. 2005 ¶ 139.
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`We are not persuaded by Zond’s arguments. Nonobviousness cannot
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`be established by attacking references individually where, as here, the
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`ground of unpatentability is based upon the teachings of a combination of
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`references. In re Keller, 642 F.2d 413, 426 (CCPA 1981). Rather, the test
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`for obviousness is whether the combination of references, taken as a whole,
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`would have suggested the patentees’ invention to a person having ordinary
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`skill in the art. In re Merck & Co., 800 F.2d 1091, 1097 (Fed. Cir. 1986).
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`As Gillette points out (Pet. 26–27, 36), Mozgrin discloses applying a
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`voltage pulse that has a rise time 5–60 µs and duration of 1.5 ms, in between
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`the anode and cathode, to generate a strongly-ionized plasma from a weakly-
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`ionized plasma. Ex. 1102, 402 (“Part 1 in the voltage oscillogram [as shown
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`in Figure 3(b)] represents the voltage of the stationary discharge (pre-
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`ionization stage).”), 401 (“This initial density [of 109–1011 cm-3 range] was
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`sufficient for plasma density to grow when the square voltage pulse was
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`applied to the gap.”), 409 (“The implementation of the high-current
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`magnetron discharge (regime 2) in sputtering . . . plasma density (exceeding
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`2 x 1013 cm-3).”), Figs, 1, 3). Gillette directs our attention to the Declaration
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`of Mr. DeVito, who testifies that one of ordinary skill in the art reading
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`Mozgrin “would have understood that controlling discharge parameters,
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`such as the current or the characteristics of the pulse (e.g., duration,
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`amplitude and rise time), could have been performed to cause the plasma to
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`remain in the region 2 that is useful for sputtering.” Pet. 28–29; Ex. 1105
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`¶ 121 (citing Ex. 1102, 403–04, Figs. 5a, 7). Fur