`571-272-7822
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` Paper 9
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`Entered: October 15, 2014
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`UNITED STATES PATENT AND TRADEMARK OFFICE
`____________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________
`
`
`
`
`THE GILLETTE COMPANY,
`Petitioner,
`
`v.
`
`ZOND, LLC,
`Patent Owner.
`____________
`
`Case IPR2014-00604
`Patent 6,896,775 B2
`____________
`
`
`
`
`
`Before KEVIN F. TURNER, DEBRA K. STEPHENS, JONI Y. CHANG,
`SUSAN L.C. MITCHELL, and JENNIFER M. MEYER,
`Administrative Patent Judges.
`
`
`TURNER, Administrative Patent Judge.
`
`
`
`DECISION
`Institution of Inter Partes Review
`37 C.F.R. § 42.108
`
`
`
`
`
`
`
`IPR2014-00604
`Patent 6,896,775 B2
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`I. INTRODUCTION
`
`The Gillette Company (“Gillette”) filed a Petition requesting inter
`
`partes review of claims 30–37 of U.S. Patent No. 6,896,775 B2 (“the ’775
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`Patent”). Paper 3 (“Pet.”). Zond, LLC (“Zond”) filed a Preliminary
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`Response. Paper 7 (“Prelim. Resp.”). We have jurisdiction under 35 U.S.C.
`
`§ 314, which provides that an inter partes review may not be instituted
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`“unless . . . there is a reasonable likelihood that the petitioner would prevail
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`with respect to at least 1 of the claims challenged in the petition.”
`
`Upon consideration of Gillette’s Petition and Zond’s Preliminary
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`Response, we conclude that the information presented in the Petition
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`demonstrates that there is a reasonable likelihood that Gillette would prevail
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`in challenging claims 30–37 as unpatentable under 35 U.S.C. § 103(a).
`
`Pursuant to 35 U.S.C. § 314, we hereby authorize an inter partes review to
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`be instituted as to claims 30–37 of the ’775 Patent.
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`
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`A. Related Matters
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`
`
`Gillette indicates that the ’775 Patent was asserted in Zond, Inc. v. The
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`Gillette Co., No.1:13-cv-11567-DJC (D. Mass. 2013). Pet. 1. Gillette also
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`identifies other matters where Zond asserted the claims of the ’775 Patent
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`against third parties, as well as other Petitions for inter partes review that are
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`related to this proceeding. Id.
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`2
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`IPR2014-00604
`Patent 6,896,775 B2
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`B. The ’775 Patent
`
`The ’775 Patent relates to methods and apparatus for generating
`
`magnetically enhanced plasma. Ex. 1101, Abs. At the time of the invention,
`
`sputtering was a well-known technique for depositing films on
`
`semiconductor substrates. Id. at 1:14–25. The ’775 Patent indicates that
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`prior art magnetron sputtering systems deposit films having low uniformity
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`and poor target utilization (the target material erodes in a non-uniform
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`manner). Id. at 3:34–44. To address these problems, the ’775 Patent
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`discloses that increasing the power applied between the target and anode can
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`increase the uniformity and density in the plasma. Id. at 3:45–56. However,
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`increasing the power also “can increase the probability of generating an
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`electrical breakdown condition leading to an undesirable electrical discharge
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`(an electrical arc) in the chamber 104.” Id.
`
`According to the ’775 Patent, forming a weakly-ionized plasma
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`substantially eliminates the probability of establishing a breakdown
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`condition in the chamber when high-power pulses are applied between the
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`cathode and anode. Id. at 7:4–15. Once the weakly-ionized plasma is
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`formed, high-power pulses are applied between the cathode and anode to
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`generate a strongly-ionized plasma from the weakly-ionized plasma. Id. at
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`7:16–24. The ’775 Patent also discloses that the provision of the feed gas to
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`the plasma allows for homogeneous diffusion of the feed gas in the weakly-
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`ionized plasma and allows for the creation of a highly uniform strongly-
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`ionized plasma. Id. at 5:59–67.
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`3
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`IPR2014-00604
`Patent 6,896,775 B2
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`C. Illustrative Claims
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`Of the challenged claims, claims 30, 36, and 37 are independent
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`claims. Claims 31–35 depend from claim 30. Claims 30 and 37, reproduced
`
`below, are illustrative:
`
`30. A method of magnetically enhanced plasma processing,
`the method comprising:
`
`ionizing a volume of feed gas to form a weakly-ionized
`plasma proximate to a cathode;
`
`generating a magnetic field proximate to the weakly-ionized
`plasma, the magnetic field substantially trapping electrons in
`the weakly-ionized plasma proximate to the cathode;
`
`applying an electrical pulse across the weakly-ionized
`plasma to generate a strongly-ionized plasma comprising a first
`plurality of ions;
`
`exchanging the strongly-ionized plasma with a second
`volume of feed gas while applying the electrical pulse across
`the second volume of feed gas to generate a strongly-ionized
`plasma comprising a second plurality of ions; and
`
`applying a bias voltage to a substrate that is positioned
`proximate to the cathode, the bias voltage causing ions in the
`first and the second plurality of ions to impact a surface of the
`substrate in a manner that causes etching of the surface of the
`substrate.
`
`
`37. A magnetically enhanced plasma processing apparatus
`comprising:
`
`means for ionizing a volume of feed gas to form a weakly-
`ionized plasma proximate to a cathode;
`
`means for generating a magnetic field proximate to the
`weakly-ionized plasma,
`the magnetic
`field substantially
`trapping electrons in the weakly-ionized plasma proximate to
`the cathode;
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`4
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`IPR2014-00604
`Patent 6,896,775 B2
`
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`means for applying an electrical pulse across the weakly-
`ionized plasma
`to generate a strongly-ionized plasma
`comprising a first plurality of ions;
`
`means for exchanging the strongly-ionized plasma with a
`second volume of feed gas while applying the electrical pulse
`across the second volume of feed gas to generate a strongly-
`ionized plasma comprising a second plurality of ions; and
`
`means for applying a bias voltage to a substrate that is
`positioned proximate to the cathode, the bias voltage causing
`ions in the first and the second plurality of ions to impact a
`surface of the substrate in a manner that causes etching of the
`surface of the substrate.
`
`Ex. 1101, 23:46–67, 24:45–65.
`
`
`
`D. Prior Art Relied Upon
`
`Gillette relies upon the following prior art references:
`
`Lantsman
`Wang
`
`
`
`
`
`
`US 6,190,512 B1 Feb. 20, 2001
`US 6,413,382 B1 July 2, 2002
`
`(Ex. 1104)
`(Ex. 1108)
`
`D.V. Mozgrin et al., High-Current Low-Pressure Quasi-Stationary
`Discharge in a Magnetic Field: Experimental Research, 21 PLASMA
`PHYSICS REPORTS 400–409 (1995) (Ex. 1102) (hereinafter “Mozgrin”).
`
`
`A. A. Kudryavtsev and V.N. Skrebov, Ionization Relaxation in a
`Plasma Produced by a Pulsed Inert-Gas Discharge, 28(1) SOV. PHYS.
`TECH. PHYS. 30–35 (Jan. 1983) (Ex. 1103) (hereinafter “Kudryavtsev”).
`
`D.V. Mozgrin, High-Current Low-Pressure Quasi-Stationary
`Discharge in a Magnetic Field: Experimental Research, Thesis at
`
`5
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`IPR2014-00604
`Patent 6,896,775 B2
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`Moscow Engineering Physics Institute (1994) (Ex. 1106) (hereinafter
`“Mozgrin Thesis”).1
`
`
`E. Asserted Grounds of Unpatentability
`
`Gillette asserts the following grounds of unpatentability:
`
`Claim(s)
`
`Basis
`
`References
`
`30–34 and 37
`
`§ 103(a)
`
`Mozgrin, Mozgrin Thesis, and
`Lantsman
`Mozgrin, Mozgrin Thesis, Lantsman,
`and Kudryavtsev
`
`§ 103(a)
`
`35
`
`36
`
`§ 103(a) Mozgrin and Kudryavtsev
`
`30–34 and 372
`
`§ 103(a) Wang, Mozgrin, and Lantsman
`
`35
`
`36
`
`
`
`§ 103(a)
`
`Wang, Mozgrin, Lantsman, and
`Kudryavtsev
`
`§ 103(a) Wang and Mozgrin
`
`II. ANALYSIS
`
`A. Claim Construction
`
`In an inter partes review, claim terms in an unexpired patent are given
`
`their broadest reasonable construction in light of the specification of the
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`
`
`1 The Mozgrin Thesis is a Russian-language reference. The citations to the
`Mozgrin Thesis are to the certified English-language translation submitted
`by Gillette (Ex. 1105).
`2 Although “Ground 3” is recited in the Petition as being directed to “Claims
`30–35 and 37,” Pet. 38 (emphasis added), there is no analysis or discussion
`of claim 35 in that ground. We take the reference to claim 35 as a
`typographical error and consider the ground as being applied to claims 30–
`34 and 37.
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`6
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`Patent 6,896,775 B2
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`patent in which they appear. 37 C.F.R. § 42.100(b). Claim terms are given
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`their ordinary and customary meaning as would be understood by one of
`
`ordinary skill in the art in the context of the entire disclosure. In re
`
`Translogic Tech. Inc., 504 F.3d 1249, 1257 (Fed. Cir. 2007). An inventor
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`may rebut that presumption by providing a definition of the term in the
`
`specification with reasonable clarity, deliberateness, and precision. In re
`
`Paulsen, 30 F.3d 1475, 1480 (Fed. Cir. 1994). In the absence of such a
`
`definition, limitations are not to be read from the specification into the
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`claims. In re Van Geuns, 988 F.2d 1181, 1184 (Fed. Cir. 1993).
`
`In the instant proceeding, the parties propose claim constructions for
`
`five means-plus-function claim terms. Pet. 12–15; Prelim. Resp. 15–19. We
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`address the claim terms identified by the parties below.
`
`We agree that those claim elements are written in means-plus-function
`
`form and fall under 35 U.S.C. § 112, ¶ 6, because: (1) each claim element
`
`uses the term “means for”; (2) the term “means for” in each claim element is
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`modified by functional language; and (3) the term “means for” is not
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`modified by any structure recited in the claim to perform the claimed
`
`function. Personalized Media Commc’ns, LLC v. Int’l Trade Comm’n, 161
`
`F.3d 696, 703–04 (Fed. Cir. 1998) (A claim element using the term “means
`
`for” creates a rebuttable presumption that the drafter intended to invoke
`
`§ 112, ¶ 6) (citations omitted); Sage Prods., Inc. v. Devon Indus., Inc., 126
`
`F.3d 1420, 1427–28 (Fed. Cir. 1997) (The presumption is not rebutted if the
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`term “means for” is modified by functional language and is not modified by
`
`any structure recited in the claim to perform the claimed function.).
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`The first step in construing a means-plus-function claim element is to
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`identify the recited function in the claim element. Med. Instrumentation &
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`Diagnostics Corp. v. Elekta AB, 344 F.3d 1205, 1210 (Fed. Cir. 2003). The
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`second step is to look to the specification and identify the corresponding
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`structure for that recited function. Id. A structure disclosed in the
`
`specification qualifies as “corresponding” structure only if the specification
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`or prosecution history clearly links or associates that structure to the function
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`recited in the claim. B. Braun Med., Inc. v. Abbott Labs., 124 F.3d 1419,
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`1424 (Fed. Cir.1997). “While corresponding structure need not include all
`
`things necessary to enable the claimed invention to work, it must include all
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`structure that actually performs the recited function.” Default Proof Credit
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`Card Sys. Inc. v. Home Depot U.S.A., Inc., 412 F.3d 1291, 1298 (Fed. Cir.
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`2005) (citation omitted).
`
`
`
`“means for ionizing a [volume of] feed gas”
`
`Claim 36 recites “means for ionizing a feed gas to generate a weakly-
`
`ionized plasma proximate to a cathode,” with claim 37 reciting a similar
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`limitation of “means for ionizing a volume of feed gas to form a weakly-
`
`ionized plasma proximate to a cathode.” We first observe that the recited
`
`function for these claim elements is to ionize a feed gas to generate a
`
`weakly-ionized plasma. Gillette submits that the corresponding structure for
`
`that recited function is “a power supply that is electrically coupled to an
`
`anode and a cathode,” as shown in Figs. 2, 3, 7, 10, or 11 of the ’775 Patent
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`and described therein. Pet. 13 (citing Ex. 1101, 4:42–67, 6:1–4, 8:27–31).
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`8
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`Zond does not appear to dispute the structure identified by Gillette,
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`but argues that Gillette treats the word “feed” in “feed gas” as being
`
`superfluous. Prelim. Resp. 18–19. Zond argues that “a feed gas” is a flow
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`of gas and proposes that the function of the claim limitation requires
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`ionization of gas that is being fed while it is being ionized to form the
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`weakly-ionized plasma. Id. at 19. We do not agree.
`
`The recitation of “a feed gas” in claims 36 and 37 does not imply
`
`necessarily the flow of gas. Certainly the gas is provided, but those claims
`
`do not require “feeding a gas,” for example, to be part of its recited function.
`
`Construing the claim limitation as Zond suggests would be equivalent to
`
`adding a “means for feeding a gas” thereto, and thus, improperly changing
`
`the scope of those claims. Additionally, we can find no specific structure in
`
`the disclosure of the ’775 Patent that would perform Zond’s proscribed
`
`function requiring specifically, the flow of a gas. As such, we are not
`
`persuaded that determining the corresponding structure requires the
`
`ionization of a gas specifically being fed.
`
`Given the cited disclosure in the ’775 Patent, we identify the
`
`corresponding structure for performing the recited function—“ionizing a
`
`feed gas to generate a weakly-ionized plasma”—to be a power supply
`
`electrically connected to a cathode, an anode, and/or an electrode.
`
`
`
`“means for generating a magnetic field”
`
`Claims 36 and 37 both recite “means for generating a magnetic field
`
`proximate to the weakly-ionized plasma, the magnetic field substantially
`
`trapping electrons in the weakly-ionized plasma proximate to the cathode.”
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`9
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`We observe that the recited function for this claim element is “generating a
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`magnetic field proximate to the weakly-ionized plasma, the magnetic field
`
`substantially trapping electrons in the weakly-ionized plasma proximate to
`
`the cathode.” Gillette does not include the aspect of trapping electrons in its
`
`proposed function, but does allege that the corresponding structure is “one or
`
`more magnets arranged as shown in Figs. 2, 3, 6A–6D, 7, 10[,] or 11 and as
`
`described in the text of the [’775] Patent at 5:31–46, 8:27–40, 13:37–5:31.”
`
`Pet. 14. Zond does not propose any construction for this claim term.
`
`Upon review of the Specification of the ’775 Patent, we agree with
`
`Gillette that the corresponding structure for performing the recited
`
`function—“generating a magnetic field proximate to the weakly-ionized
`
`plasma, the magnetic field substantially trapping electrons in the weakly-
`
`ionized plasma proximate to the cathode”—to be a magnet assembly having
`
`either a permanent magnet or a current source coupled to one or more
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`electro-magnets.
`
`
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`“means for applying an electrical field [or pulse]”
`
`Claims 36 recites “means for applying an electric field across the
`
`weakly-ionized plasma that excites atoms in the weakly-ionized plasma and
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`that generates secondary electrons from the cathode, the secondary electrons
`
`ionizing the excited atoms, thereby creating a strongly-ionized plasma
`
`comprising a plurality of ions.” Similarly, claim 37 recites “means for
`
`applying an electrical pulse across the weakly-ionized plasma to generate a
`
`strongly-ionized plasma comprising a first plurality of ions.” We observe
`
`that the recited function for these claim elements is “applying an electric
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`10
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`field across the weakly-ionized plasma thereby generating secondary
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`electrons to create a strongly-ionized plasma.” Gillette argues for a slightly
`
`different function and argues that the ’775 Patent discloses a power supply,
`
`electrically coupled to an anode and a cathode, with the electrodes arranged
`
`relative to each other as shown in Figs. 2, 3, 7, 10, or 11, and described in
`
`the text of the ’775 Patent at 4:42–67, 6:1–4, 8:27–31. Pet. 14. We are
`
`persuaded by Gillette that the citations disclose the corresponding
`
`structure(s). Zond argues that more is required.
`
`Specifically, Zond argues that the disclosed structure is more than the
`
`power supply and the electrode structure, as it also includes “the geometry of
`
`the electrode structure combined with parameters of the voltage emitted by
`
`the power supply . . . that induces the type of ionization described.” Prelim.
`
`Resp. 17. We note, however, that claims 36 and 37 are apparatus claims,
`
`which recite structures of those apparatuses and not methods of using.
`
`While features of an apparatus may be recited either structurally or as
`
`structure described in functional terms, claims directed to an apparatus
`
`encompass such structure alone and must be distinguished from the prior art
`
`in terms of that structure rather than any function. In re Schreiber, 128 F.3d
`
`1473, 1477–78 (Fed. Cir. 1997) (citations omitted). As such, we are
`
`persuaded that the corresponding structure is limited to the structures
`
`disclosed and not to how those structures are made to function.
`
`Upon review of the Specification of the ’775 Patent, we are persuaded
`
`that the corresponding structure for performing the recited function—
`
`“generating an electric field across the weakly-ionized plasma thereby
`
`generating secondary electrons to create a strongly-ionized plasma”—to be a
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`11
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`pulsed power supply electrically connected to a cathode, an anode, and/or an
`
`electrode.
`
`
`
`“means for exchanging”
`
`Claim 37 recites “means for exchanging the strongly-ionized plasma
`
`with a second volume of feed gas while applying the electrical pulse across
`
`the second volume of feed gas to generate a strongly-ionized plasma
`
`comprising a second plurality of ions.” We observe that the recited function
`
`for this claim element is “providing a feed gas to the strongly-ionized
`
`plasma sufficiently to exchange a volume of that plasma with a second
`
`volume of feed gas.”
`
`Gillette argues that the ’775 Patent discloses “a gas inlet, e.g., from
`
`gas source 208, as shown in Figs. 2, 3, 7, 10[,] or 11, and described in the
`
`text of the ’775 Patent at 4:14–17” as being the equivalent structure. Pet. 15.
`
`Zond cites to gas flow control system 210 and structures for feeding the gas,
`
`“such as conduit 207 and its structural relation to the electrode configuration
`
`216, 218 shown in [’775 Patent ‘s] figures 2 and 3.” Prelim. Resp. 16. We
`
`are persuaded that the gas flow control system is necessary for the
`
`corresponding structure to perform the prescribed function.
`
`Zond also emphasizes that the gas flow is provided where the
`
`strongly-ionized plasma is formed and that it must be fast enough to
`
`exchange the discussed volumes during the duration of the pulse. Id. at 15–
`
`16. We agree that the flow must be sufficient to allow for the exchange, but
`
`we are not persuaded that the limitations of claim 37 require that the gas
`
`must be provided where the strongly-ionized plasma is formed, as opposed
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`12
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`to where the plasma exists. Also, with respect to claim 37, we are not
`
`persuaded that the function of the means for exchanging must occur during
`
`the pulse duration. We are mindful that an apparatus claim in means-plus-
`
`function format is directed to the structure of the apparatus and not how the
`
`apparatus functions. Claim 37 already recites “means for applying an
`
`electrical pulse,” such that the “means for exchanging” should not include
`
`that structure or its function.
`
`Upon review of the Specification of the ’775 Patent, we are persuaded
`
`that the corresponding structure for performing the recited function—
`
`“providing a feed gas to the strongly-ionized plasma sufficiently to exchange
`
`a volume of that plasma with a second volume of feed gas”—to be a gas
`
`flow control system and structures for supplying the gas to the strongly-
`
`ionized plasma.
`
`
`
`“means for applying a bias voltage”
`
`Claim 36 recites “means for applying a bias voltage to a substrate that
`
`is positioned proximate to the cathode, the bias voltage causing ions in the
`
`plurality of ions to impact a surface of the substrate in a manner that causes
`
`etching of the surface of the substrate,” with claim 37 reciting a similar
`
`limitation applicable to “the first and the second plurality of ions.” We
`
`observe that the recited function for these claim elements is “generating bias
`
`voltage to a substrate to cause etching of the surface of the substrate.”
`
`Gillette alleges that the corresponding structure is a “bias voltage
`
`source, electrically coupled to the substrate via a substrate support as shown
`
`in Figs. 2, 3, 7, 10[,] or 11 and as described in the text of the ’775 Patent at
`
`13
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`4:31–41, 7:66–8:8.” Pet. 15. Zond does not propose any construction for
`
`this claim term.
`
`Upon review of the specification of the ’775 Patent, we agree with
`
`Gillette that the corresponding structure for performing the recited
`
`function—“generating bias voltage to a substrate to cause etching of the
`
`surface of the substrate”—to be a bias voltage source electrically coupled to
`
`substrate.
`
`B. Principles of Law
`
`A patent claim is unpatentable under 35 U.S.C. § 103(a) if the
`
`differences between the claimed subject matter and the prior art are such that
`
`the subject matter, as a whole, would have been obvious at the time the
`
`invention was made to a person having ordinary skill in the art to which said
`
`subject matter pertains. KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 406
`
`(2007). The question of obviousness is resolved on the basis of underlying
`
`factual determinations including: (1) the scope and content of the prior art;
`
`(2) any differences between the claimed subject matter and the prior art;
`
`(3) the level of ordinary skill in the art; and (4) objective evidence of
`
`nonobviousness. Graham v. John Deere Co., 383 U.S. 1, 17–18 (1966).
`
`In that regard, an obviousness analysis “need not seek out precise
`
`teachings directed to the specific subject matter of the challenged claim, for
`
`a court can take account of the inferences and creative steps that a person of
`
`ordinary skill in the art would employ.” KSR, 550 U.S. at 418; see also
`
`Translogic, 504 F.3d at 1259. A prima facie case of obviousness is
`
`established when the prior art itself would appear to have suggested the
`
`claimed subject matter to a person of ordinary skill in the art. In re Rinehart,
`
`14
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`531 F.2d 1048, 1051 (CCPA 1976). The level of ordinary skill in the art is
`
`reflected by the prior art of record. See Okajima v. Bourdeau,
`
`261 F.3d 1350, 1355 (Fed. Cir. 2001); In re GPAC Inc., 57 F.3d 1573, 1579
`
`(Fed. Cir. 1995); In re Oelrich, 579 F.2d 86, 91 (CCPA 1978).
`
`We analyze the asserted grounds of unpatentability in accordance with
`
`the above-stated principles.
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`
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`C. Claims 30–34 and 37 – Obviousness
`
`over Wang, Mozgrin, and Lantsman
`
`Gillette asserts that claims 30–34 and 37 are unpatentable under
`
`35 U.S.C. § 103(a) as obvious over the combination of Wang, Mozgrin, and
`
`Lantsman. Pet. 38–51. As support, Gillette provides detailed explanations
`
`as to how each claim limitation is met by the references and rationales for
`
`combining the references, as well as a Declaration of Mr. DeVito (Ex.
`
`1111). Id.
`
`Zond responds that Wang and Lantsman cannot render claims 30–34
`
`and 37 obvious because differences exist between Wang, Lantsman, and
`
`those claims. Prelim. Resp. at 48–50.
`
`We have reviewed the parties’ contentions and supporting evidence.
`
`Given the evidence on this record, we determine that Gillette has
`
`demonstrated a reasonable likelihood of prevailing on its assertion that
`
`claims 30–34 and 37 would have been unpatentable as obvious over the
`
`combination of Wang, Mozgrin, and Lantsman. Our discussion focuses on
`
`the deficiencies alleged by Zond as to the claims.
`
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`15
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`Wang
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`
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`Wang discloses a power pulsed magnetron sputtering apparatus for
`
`generating a very high plasma density. Ex. 1108, Abs. Wang also discloses
`
`a sputtering method for depositing metal layers onto advanced
`
`semiconductor integrated circuit structures. Id. at 1:4–15.
`
`Figure 1 of Wang, reproduced below, illustrates a cross-sectional view
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`of a power pulsed magnetron sputtering reactor:
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`As shown in Figure 1 of Wang, magnetron sputtering apparatus 10 has
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`pedestal electrode 18 for supporting semiconductor substrate 20, anode 24,
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`cathode 14, magnet assembly 40, pulsed DC power supply 80 and bias
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`power supply 44, the latter used to apply a bias voltage to the substrate. Id.
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`at 3:57–4:55. According to Wang, the apparatus is capable of creating high
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`density plasma in region 42, from argon gas feed 32 through mass flow
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`controller 34, which ionizes a substantial fraction of the sputtered particles
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`into positively charged metal ions and also increases the sputtering rate. Id.
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`at 4:5–34. Wang further recognizes that, if a large portion of the sputtered
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`particles are ionized, the films are deposited more uniformly and
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`effectively—the sputtered ions can be accelerated towards a negatively
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`charged substrate, coating the bottom and sides of holes that are narrow and
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`deep. Id. at 1:24–29.
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`Figure 6 of Wang, reproduced below, illustrates how the apparatus
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`applies a pulsed power to the plasma:
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`As shown in Figure 6 of Wang, the target is maintained at background
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`power level PB between high power pulses 96 with peak power level PP. Id.
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`at 7:13–39. Background power level PB exceeds the minimum power
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`necessary to support a plasma in the chamber at the operational pressure
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`(e.g., 1kW). Id. Peak power PP is at least 10 times (preferably 100 or 1000
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`times) background power level PB. Id. The application of high peak power
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`PP causes the existing plasma to spread quickly, and increases the density of
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`the plasma. Id. According to Mr. DeVito, Wang’s apparatus generates a
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`low-density (weakly-ionized) plasma during the application of background
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`power PB, and a high-density plasma during the application of peak power
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`PP. Ex. 1111 ¶¶ 137–140; see also Pet. 43–45.
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`Lantsman
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`Lantsman discloses a plasma ignition system for plasma processing
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`chambers having primary and secondary power supplies, used to generate a
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`plasma current and a process initiation voltage, respectively. Ex. 1104, Abs.
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`The primary power supply provides the primary power to electrically drive
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`the cathode during the plasma process, and the secondary power supply
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`supplies an initial plasma ignition voltage to “pre-ignite” the plasma so that
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`when the primary power supply is applied, the system smoothly transitions
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`to final plasma development and deposition. Id. at 2:48–51.
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`The system is applicable to magnetron and non-magnetron sputtering
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`and RF sputtering systems. Id. at 1:6–8. Lantsman also provides that
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`“arcing which can be produced by overvoltages can cause local overheating
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`of the target, leading to evaporation or flaking of target material into the
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`processing chamber and causing substrate particle contamination and device
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`damage,” and “[t]hus, it is advantageous to avoid voltage spikes during
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`processing wherever possible.” Id. at 1:51–59.
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`Lantsman also discloses that “at the beginning of processing . . . gas is
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`introduced into the chamber” and “[w]hen the plasma process is completed,
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`the gas flow is stopped.” Id. at 3:10–13. This is illustrated in Figure 6 of
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`Lantsman reproduced below:
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`Figure 6 illustrates that the gas flow is initiated, and the gas flow and
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`pressure begin to ramp upwards toward normal processing levels for the
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`processing stage. Id. at 5:39–42.
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`Reasons to combine Wang, Mozgrin, and Lantsman
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`Gillette notes that Mozgrin provides for a similar system to that
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`described in Wang (Pet. 40), and Gillette also argues that the similarities
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`between the systems of Wang and Mozgrin would have made it obvious to
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`have used the system of Wang for etching, as taught by Mozgrin. Pet. 47–48
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`(citing Ex. 1102, 403, right col, ¶ 4, 409, left col, ¶ 5). With respect to
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`Wang and Lantsman, Gillette argues that:
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`[I]f one of ordinary skill took Lantsman’s teaching of
`continually introducing new feed gas during processing, then
`the electrical pulse of Wang would be applied across a second
`volume of feed gas, i.e., the additional volume of feed gas being
`supplied, and Mozgrin’s pulse would thus generate a second
`plurality of ions.
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`Pet. 45–46. Gillette also argues that it would have been obvious to
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`continue to add feed gas during etching, as confirmed by Lantsman.
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`Id. at 46.
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`Zond argues that Wang is very different from the apparatuses and
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`methods recited in claims 30–34 and 37. Prelim. Resp. 48–49. Zond argues
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`that Wang’s sputter target is part of its cathode and not proximate to the
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`cathode, as recited in the claims, and that Wang’s substrate is not
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`sufficiently biased to allow for etching, per claims 30 and 37. Id. at 48.
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`Zond continues that Wang does not teach the claimed exchange of the
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`strongly-ionized plasma. Id. With respect to Lantsman, Zond argues that
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`Lantsman does not disclose biasing the substrate to cause etching, and that
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`Lantsman does not teach the claimed exchange with the strongly-ionized
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`plasma. Id. at 49. Lastly, Zond argues that Gillette’s discussion of
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`combining Wang and Lantsman assumes any gas flow will exchange a
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`strongly-ionized plasma with a volume of feed gas, regardless of how faint
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`the gas flux in the region of the strongly-ionized plasma and regardless of
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`the duration of the pulse. Id. at 50.
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`Those arguments are not persuasive on the present record. “It is well-
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`established that a determination of obviousness based on teachings from
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`multiple references does not require an actual, physical substitution of
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`elements.” In re Mouttet, 686 F.3d 1322, 1332 (Fed. Cir. 2012) (citing In re
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`Etter, 756 F.2d 852, 859 (Fed. Cir. 1985) (en banc) (noting that the criterion
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`for obviousness is not whether the references can be combined physically,
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`but whether the claimed invention is rendered obvious by the teachings of
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`the prior art as a whole)). In that regard, one with ordinary skill in the art is
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`not compelled to follow blindly the teaching of one prior art reference over
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`the other without the exercise of independent judgment. Lear Siegler, Inc. v.
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`Aeroquip Corp., 733 F.2d 881, 889 (Fed. Cir. 1984); see also KSR, 550 U.S.
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`at 420-21 (A person with ordinary skill in the art is “a person of ordinary
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`creativity, not an automaton,” and “in many cases . . . will be able to fit the
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`teachings of multiple patents together like pieces of a puzzle.”).
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`On this record, Zond has not demonstrated adequately that the
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`disclosed apparatuses would have been beyond the level of ordinary skill, or
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`why one with ordinary skill in the art would not have had a reasonable
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`expectation of success in combining the teachings. Given the evidence
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`before us, we determine that the Petition and supporting evidence
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`demonstrate sufficiently that combining the technical disclosures of Wang,
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`Mozgrin, and Lantsman is merely a predicable use of prior art elements
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`according to their established functions—an obvious improvement. See
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`KSR, 550 U.S. at 417 (“[I]f a technique has been used to improve one
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`device, and a person of ordinary skill in the art would recognize that it would
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`improve similar devices in the same way, using the technique is obvious
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`unless its actual application is beyond his or her skill.”).
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`Additionally, one cannot show nonobviousness by attacking
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`references individually where the rejections are based on combinations of
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`references. In re Keller, 642 F.2d 413, 426 (CCPA 1981). The fact that
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`Wang does not disclose the claimed exchange with the strongly-ionized
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`plasma is not critical because Lantsman discusses maintaining the flow of
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`gas in the disclosed apparatus during processing. Ex. 1104, 5:30–61. Since
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`the plasma is maintained, there must be sufficient flow and to a portion
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`where the highly-ionized plasma resides. Similarly, since Mozgrin discloses
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`etching, and Gillette has shown correspondence between Mozgrin and
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`Wang, it is not necessary to show that Wang discloses the application of a
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`bias voltage sufficient for etching. In addition, as discussed above, the
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`combination would have been made by a person of ordinary creativity, n