`
`Title: Professor (Retired)
`Electrical and Computer Engineering - The University ofTexas at Austin
`
`Current Business Address: 1800 Brookhaven Drive, Austin TX 78704-2149
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`Phone: 512-496-6816
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`Date of Birth: December 7, 1941
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`Citizenship: United States
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`Education:
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`Massachusetts Institute of Technology, BS, Electrical Engineering, 1964
`University of Nebraska at Lincoln, MS, Electrical Engineering, 1966
`University of Nebraska at Lincoln, PhD, Electrical Engineering, 1968
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`Previous Academic Positions:
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`University of Nebraska at Lincoln, Assistant Professor, Electrical Engineering, 1968-
`1973
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`University ofNebraska at Lincoln, Associate Professor, Electrical Engineering, 1973-
`1974
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`University of Texas at Austin, Associate Professor, Electrical and Computer Engineering,
`1974-1995
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`University of Texas at Austin, Professor, Electrical and Computer Engineering, 1995-
`2009
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`Other Professional Experience:
`
`Chief Scientist, Research Applications lnc., Austin TX. May-Sept. 1990. Principal
`investigator for a Small Business Innovation & Research (SBlR) contract between RAI
`and the US. Navy to conduct proof-of-concept experiments with fiberoptic sensors based
`on novel interferometer technology. (See US. Patent 4,989,979 below).
`Scientist, Metamaterials LLC, Austin TX, June - Sept. 2009, R&D of composite
`electromagnetic materials.
`Expert witness: Patent, trade secret and other intellectual property litigation 2000 -
`present.
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`Consulting:
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`MESA instruments, Austin, TX: Semiconductor waveguide phase-shifter , 1974.
`Eagle Signal, Austin, TX: Traffic signal optical collimator, 1976.
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`Texas Research Institute, Austin, TX: Fiber-optics life testing methods; ellipsometric
`measurement of relative humidity, 1979-80.
`BEI, Inc., Little Rock, AR and Havatek, Inc., Austin, TX: Fiber-optic read-head for
`angular encoder, 1980.
`Western Electric, Inc., New York, NY: Expert witness (preliminary investigation) in
`patent litigation involving fiber-optic communications system, 1980.
`Technology Assessment Group, Inc., Schenectady, NY: Evaluation of VLSI capabilities
`ofacquired company, 1981.
`Thermon Mfg. Co., San Marcos, TX: Distributed Solid State devices for heat trace
`monitoring and control, 1981-1986.
`Technology Assessment Group, Inc., Schenectady, NY: Fiber optics technology
`assessment for General Telephone and Electronics, 1982.
`Tracor Inc., Austin, TX: Fiber optic sensors for ocean applications, 1982
`Technology Assessment Group Inc., Schenectady, NY: Evaluation of fiberoptic
`gyroscope design for venture capitalist, 1983
`Trane, Inc. Los Angeles CA,: Fiber optic gyroscope evaluation, 1984
`Prime Software Innovations, Inc., Austin, TX: Educational software development, 1983-
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`U.S. Autotech Accessories, Inc. Los Angeles, CA: Optical tests of high-mounted
`automotive taillight for compliance with DOT standards, 1985
`Tracor, Inc. Austin, TX: Technological assessment of laser ranging apparatus for height
`determination of a parachute—dropped object, 1985
`Schlumberger Well Services, Inc., Austin,TX. Evaluation of fiber optic system for down-
`hole data transmission, 1986
`High End Systems, Austin, TX, Dichroic optical coatings, 1986
`Scientific Measurement Systems, Inc., Austin, TX,. Lightpipes, 1986-1987
`Thomas-Conrad Corporation, Austin TX. Fiberoptic Local Area Network hardware
`development, 1988-89
`Microelectronics and Computer Corporation (MCC), Austin TX. Guided-wave optical
`interconnect technology, 1990.
`Kent Hance, atty., Austin, TX. Evaluation of fiber optic component company for possible
`acquisition, 1991.
`IVPR, Inc., Houston, TX, Business plan preparation and technical competition analysis
`for fiber optic sensor company, 1991.
`Research Applications Inc. Austin TX. Fiber optic chemical sensor development, 1992.
`Microelectronics and Computer Corporation (MCC), Austin TX. Parallel high speed
`optical data link, 1993-4.
`Texas Research Institute, Austin, TX: Fiber-optic interferometric sensor, 1998.
`Xidex Corporation, Austin TX. Position-sensitive detectors for Atomic Force Microscopy
`applications, 1998-9
`Vinson and Elkins LLP, Austin TX. Expert witness, patent litigation, fiber-optic
`components, 3M vs. Seiko, et.al. 2000-2001.
`Vinson and Elkins LLP, Austin TX. Expert witness with Markman hearing testimony,
`patent litigation, biomedical apparatus, Urologix vs. ProstaLund, eta]. 2002.
`Knobbe, Martens, Olson & Bear LLP, Irvine CA. Expert witness, patent litigation, light—
`emitting diode systems, JamStrait Inc. vs. American Products Co. Inc. 2003
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`McDonnell, Boehnen, Hulbert and BerghoffLLP, Chicago, Ill. Expert witness with trial
`and deposition testimony, patent litigation, optical bio—sensing apparatus. Corning, Inc.
`and Artificial Sensing Instruments AG vs. SRU Biosystems, LLC, SR U Biosystems Inc.,
`and SRU Holdings LLC, 2004.
`Ostrolenk, Faber, Gerb & Soffen, New York : Expert witness, patent litigation,
`electromagnetic radio-frequency identification tag reader instrumentation. Avid
`Identification Systems, Inc. vs. Datamars SA, eta]. 2005
`McDonnell, Boehnen, Hulbert and Berghoff LLP, Chicago, 111.: Expert witness,
`inventorship lawsuit, optical
`instrumentation for biological and chemical sensor. SRU
`Biosystems Inc. vs. Hobbs 2005
`Greenberg Traurig LLP, Dallas TX: Expert witness, patent litigation, motion detector
`cameras. IP Holdings, eta]. vs. Testa Associates, eta]. 2006
`Baker Botts LLP, Houston TX. Expert witness with deposition testimony, patent
`litigation, feedback control of power supply circuits. 02 Micro vs. Samsung Electronics
`Co. eta]. 2006-2007.
`
`Arnold LLP and Berg & Androphy LLP, Houston TX. 30-b-6 witness with deposition
`testimony, patent litigation, optical communications devices. Cheetah vs. Infinerra 2006-
`2007.
`
`Jones Day LLP, Dallas TX. Expert witness, patent, trade secret and inventorship
`litigation, optical systems for wafer and disc inspection. KLA-Tencor vs. Arun Aiyer and
`Verity, Inc. 2007.
`Locke, Liddell & Sapp LLP, Houston TX. Expert witness, patent litigation, feedback
`control for MEMS accelerometers. [/0 Inc. vs. Serce] 2007
`
`International Trade
`Locke Lord Bissell & Liddell, Dallas TX. Expert witness,
`Commission Investigation, Investigation. No. 337—TA-625, 2008: automated animal-
`activated components
`Please see Expert Witness page for expert witness engagements after 2008, as well as a
`more detailed description of the cases and work performed.
`
`Honors and Awards:
`
`Sigma Xi, 1967
`NASA Traineeship, 1966-68
`Eta Kappa Nu, I974
`Biographical Listings:
`
`American Men and Women of Science, 1969
`Who's Who in the Midwest, 1970
`Who's Who in the South & Southwest, 1975
`Outstanding Young Men of America, 1978
`Who's Who in Technology Today, 1979
`
`Best Paper Award: Vladimir Mancevski, Chellapan Narayanan, J. Kumar Pavuluri,
`Wanjun Wang, A. Bruce Buckman, and Ilene J. Busch-Vishniac, A High Precision, Six-
`Degree of Freedom, Single-Sided, Noncontact, Optical Sensor Suitable for Automated
`Assembly and Inspection, First World Automation Congress, Wailea, HI, August 1994
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`University Committee Assignments:
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`0 Administrative:
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`EE Dept. Graduate Advisor, June l977-Sept. 1981
`ECE Co-op Advisor, 1984 - 2009
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`0 Committee assignments:
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`University Parking and Traffic Panel, 1976-78
`College of Engineering Safety Committee, 1977-78
`College of Engineering Athletic Award Committee, 1985—86
`College of Engineering Cooperative Education Committee, 1984-2009
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`Professional Society and Major Governmental Committees:
`
`Optical Society ofAmerica, Technical Advisory Committee for the Far Infrared 1976—78
`Program Chairman and Digest Editor, 1976 Region V IEEE Conference
`
`Publications:
`
`A. Refereed Archival Journal Publications
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`1.
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`10.
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`AB. Buckman and N.M. Bashara, Secondary Emission from Thin Polymer Films Via
`Surface States, Phys. Rev. Lett. 17, 577, (1966).
`AB. Buckman and N.M. Bashara, Ellipsometry for Modulated-Reflection Studies of
`Surfaces, .1. Opt. Soc. Am. 58, 700, (1968).
`A. B. Buckman and N.M. Bashara, Electroreflectance Changes in Dielectric Constants of
`Au and Ag by Modulated Ellipsometry, Phys. Rev. 174, 719, (1968).
`A. B. Buckman and W.D. Bomberger, Optical Properties of Perylene Films in the Visible
`and Near UV, J. Opt. Soc. Am. 63, 1432, (1973).
`A. B. Buckman, N.H. Hong and D.W. Wilson, Large Refractive Index Change in Pblz
`Films by Photolysis at 150-180 C, J. Opt. Soc. Am. 65, 914, (1975).
`A. B. Buckman, Effective Electroopic Coefficient of Multilayer Dielectric Waveguides:
`Modulation Enhancement, .1. Opt. Soc. Am. 66, 30, (1976).
`A. B. Buckman, Theory of an Efficient Electronic Phase Shifter Employing a Multilayer
`Dielectric Waveguide Structure, IEEE Trans. Microwave Theory Tech. MTT-ZS, 480,
`(1977).
`A. B. Buckman, On the Origin ofthe Large Refractive Index Change in Photolyzed Pblz
`Films, J. Opt. Soc. Am. 67, 1123, (1977).
`A. B. Buckman, Nonlinearity of Effective Index versus Bulk Index in Multilayer
`Dielectric Waveguides: Large Incremental Index Sensitivity, J. Opt. Soc. Am. 67,
`(1977).
`A. B. Buckman and C. Kuo, Fizeau Interferometry for Measuring Refractive Index and
`Thickness ofNearly Transparent Films, Appl. Opt. 17, 3636-3640, (1978).
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`A. B. Buckman and C. Kuo, Excitation of Coupled-Surface—Plasmons in Structures
`Containing Very Thin Negative Permitivity Regions, J. Opt. Soc. Am. 69, 343, (1979).
`A. B. Buckman and S. Chao, Ellipsometric Characterization ofthe Glassy Layer at Co/Si
`Interface, Surface Science 96, 346, (1980).
`A. B. Buckman and R. Montgelas, A Waveguiding Surface Damage Layer in LizTa03,
`Applied Optics 20, 6, (1981).
`A. B. Buckman and S. Chao, Optical Evidence for an Electronic Phase Transition at the
`Co-Si Interface, J. Opt. Soc. Am. 71, 928, (1981).
`A. B. Buckman, Polarization—selective Lateral Waveguiding in Layered Dielectric
`Structures, J. Opt. Soc. Am. 72, 688, (1982).
`A. B. Buckman, Mode Selection with a Three-Layer Dielectric Waveguide, J. Opt. Soc.
`Am. 73, 33, (1983).
`A. B. Buckman, Three-layer Dielectric Stripline Filter for Guided—Wave Applications,
`SPIE Proceedings 464 , 29, (1984).
`A. B. Buckman, Analysis ofa Novel Optical Fiber Interferometer with Common-mode
`Compensation, IEEE J. Lightwave Tech. 7,151 (1989)
`A. B. Buckman and K. Park Common-mode Noise Reduction in Interferometric
`
`Fiberoptic Sensors using Electrooptic Feedback, SPIE Proceedings. 1169, 64, (1989).
`A. B. Buckman , D.G. Pritchett and K. Park, Sensitivity-Enhanced, Common-mode
`Compensated Mach-Zehnder Fiberoptic Sensor Circuit with Electrooptic Feedback,
`Optics Lett. 14, 886, (1989).
`A. B. Buckman, General Sensitivity Enhancement and Common—mode Compensation
`Principle for Interferometric Fiberoptic Sensors, IEEE J. Lightwave Tech.. 8, 1456 ,
`(1990).
`A. B. Buckman, B.H. Tyrone, Jr. and A.J. Seltzer, Enhancing Fiber Optic Interferometer
`Precision Using Electro-optic Feedback and Common Mode Compensation, Proceedings
`American Society for Precision Engineering (ASPE) Topical Meeting on Precision
`Interferometric Metrology, pp. 18—21 (1992).
`A. B. Buckman and Lisa Giullianelli, Direct Optical-to—Electrical Phase Conversion in a
`Fiber Optic Interferometer, Proceedings American Society for Precision Engineering
`(ASPE) Topical Meeting on Precision Interferometric Metrology, pp. 22—26 (1992).
`C. Narayanan, A. B. Buckman, I. Busch-Vishniac, M.F. Becker, R.W. Bene, and RM.
`Walser) Frequency-Multiplexed Multiple Beam Optical Position Detector using Phase
`Detection, Proc. SPIE 1918, 205-214 (1993) .
`R.M. Walser, Alaka Valanj u, W. Win, M.F. Becker, A.B. Buckman and R.W. Bene, New
`Smart Materials for adaptive Microwave Signature Control, Proc. SPIE 1916,128-139
`(1993).
`RM. Walser, Alaka Valanju, W. Win, M.F. Becker, A.B. Buckman and R.W. Bene,
`"New Smart Materials for adaptive Microwave Signature Control", Proc. SPIE.
`1916,128-139 (1993).
`Michael F. Becker, A. Bruce Buckman, Rodger M. Walser, Thierry Lapine, Patrick
`Georges and Alain Brun, "Femtosecond Switching ofthe Solid-State Transition in the
`Smart System Material V02", Proc. SPIE. 2189,400-408 (1994)
`Dahong Qian, Wanj un Wang, Ilene Busch-Vishniac and A. B. Buckman, A Novel
`Method To Measure Multiple Light Spots Positions on One Position-Sensitive Detector,
`IEEE Trans. Instr. Meas. 4, 14 (1993).
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`Chellapan Narayannan, A. B. Buckman, Ilene Busch-Vishniac, and Wanjun Wang,
`Position Dependence of the Transient Response of a Position-Sensitive Detector under
`Periodic Pulsed Light Modulation, IEEE Trans. Elect. Dev.. 40, 1688—1694 (1993).
`Lisa Giullianelli and A. B. Buckman, Fiber Optic Circuit for Direct Phase Conversion
`with two Outputs in Quadrature, IEEE Journal of Lightwave Technology,. 11, 1263-1265
`(1 993).
`Michael F. Becker, Rodger M. Walser, Thierry Lapine, Patrick Georges Alain Brun, and
`A. B. Buckman, Femtosecond Switching of the Solid-State Transition in the Smart
`System Material V02, Proc. SPIE 2189,400-408 (1994)
`Lisa C. Giullianelli, A. Bruce Buckman, Rodger M. Walser, and Michael F. Becker,
`Digital Demodulation Scheme for Wide Dynamic Range Measurements with a Fiber
`Optic Interferometer, Proc. SPIE. 2191, 314-323 (1994) .
`Michael F. Becker, R.M. Walser, A.B. Buckman, T. Lapine, P. Georges and A. Brun,
`Femtosecond laser excitation of the semiconductor-metal phase transition in V02,
`Applied Physics Letters, 63, 1507-1509 (1994).
`Chellapan Narayanan, A. Bruce Buckman and Ilene Busch-Vishniac, Position Detection
`of Multiple Light Beams Using Phase Detection", IEEE Transactions on. Instrumentation
`and Measurement. 43, 830—836 (I994).
`Michael F. Becker, Rodger M. Walser, A. Bruce Buckman, Thierry Lapine, Patrick
`Georges and Alain Brun, Femtosecond Switching ofthe Solid-State Transition in V02,
`Ultrafast Phenomena 94, Barbara, Knox, Mourou and Zewail, eds., Springer-Verlag, New
`York (1994).
`M.F. Becker, A.B. Buckman, R.M. Walser, T. Lepine, P. Georges, and A. Brun,
`"Femtosecond laser excitation dynamics of the semiconductor-metal phase transition in
`V02," Journal oprplied Physics, 79, 2404-2408, (1995).
`Chellapan Narayanan, A. Bruce Buckman, and Ilene J. Busch-Vishniac, Noise Analysis
`for Position—Sensitive Detectors, IEEE Transactions on Instrumentation and
`Measurement 46, 1137-1144 (1997).
`A. Bruce Buckman, A Course in Computer-Based Instrumentation: learning LabVIEWTM
`with Case Studies, Int. J. Engng. Ed., 16, 228-233 (2000).
`A. Bruce Buckman, VI-based Introductory Electrical Engineering Laboratory Course, Int.
`J. Engng. Ed., 16, 212—217 (2000).
`
`B. Editor of Conference Proceedings
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`1976 IEEE REGION V. CONFERENCE DIGEST, A.B. Buckman, Ed., IEEE Publication No.
`76CH1068-6 REGS, 1976.
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`C. Refereed Conference Proceedings
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`A. B. Buckman, Analysis ofa Novel Optical Fiber Interferometer with Common-mode
`Compensation, Optical Fiber Sensors 1988 Technical Digest Vol.2, paper ThCC-18, 1988
`M.J. Johnson, W.F. Weldon, and MD. Werst, and A. B. Buckman, Diagonstic System
`for a 20 Tesla Single Turn Coil Magnet Prototype, Proceedings 17th International
`Conference on Plasma Science, May 1990
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`Vladimir Mancevski, Chellapan Narayanan, J. Kumar Pavuluri, Wanjun Wang, A. Bruce
`Buckman, and Ilene J. Busch—Vishniac, A High Precision, Six-Degree of Freedom,
`Single-Sided, Noncontact, Optical Sensor Suitable for Automated Assembly and
`Inspection, Proc. First World Automation Congress, vol. I pp. 145-150 (1994), M.
`Jamshidi, C. Nguyen, R. Lumia and J. Yuh, eds. This paper received the Conference Best
`Paper Award.
`Anand Jog, Ilene J. Busch—Vishniac and A. B. Buckman, Non-Contact Profilometry
`Using Position-Sensitive Detectors, Proc. I998 NSF Design and Manufacturing Grantees
`Conference pp. 419-420 (1998).
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`D. Other Conference Proceedings
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`V. Mancevski, D. Qian, W. Wang, C. Narayanan, I. Busch-Vishniac and AB. Buckman,
`A High-Precision, Six Degree-of-Freedom,Single-Sided, Non-contact, Optical Sensor
`Suitable for Assembly Automation," Proc. 1993 NSF Design and Manufacturing Systems
`Conference pp.1613-l619 (1993)
`V. Mancevski, D. Qian, W. Wang, C. Narayanan, I. Busch—Vishniac and AB. Buckman,
`A High-Precision, Six Degree-of-Freedom,Single-Sided, Non-contact, Optical Sensor
`Suitable for Assembly Automation," Proc. 1994 NSF Design and Manufacturing
`Grantees Conference pp.439—440 (1994)
`Ilene J. Busch-Vishniac and A. B. Buckman, Demostration ofa Prototype Six-Degree of
`Freedom, Single—Sided, Noncontact Position Sensor, Proc. 1997 NSF Design and
`Manufacturing Grantees Conference, pp. 225—226 (1997).
`A. Bruce Buckman, An Introductory Electrical Engineering Laboratory Based on Virtual
`Instrumentation, invited paper, Proc. 1997 Conference on Virtual Instrumentation in
`Education, pp. 137—148(1997)
`A. B. Buckman, A Design Laboratory for Electrical Engineering Seniors, Proceedings
`ASEE Gulf-Southwest Section Annual Meeting, March 1988 (conference proceedings)
`A.B. Buckman, Techniques for Digitizing Controllers for Prototyping, NI Week
`Embedded Engineering and Control Design Summit (2005).
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`E. Book Chapter
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`N.M. Bashara, A.C. Hall, and A. B. Buckman, Ellipsometry, Chapter in Physical
`Methods of Chemistry, Vol. 1, Par IIC, Wiley-lnterscience Publishers, New York, A.
`Weissberger and B. Rossiter, eds., (1972).
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`F. Reviews
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`Book Review: X-Ray Optics, J.-J. Queisser, ed. Springer-Verlag, Berlin, 1977. Appeared
`in Journal ofthe Optical Society ofAmerica, 68, 1457, 1978.
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`G. Technical Reports
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`Applications of Slow Modes for Action Elements in Integrated Optics, Office of Naval
`Research Annual Report on Contract N00014-70-A-0253—0002.
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`Large Optically Induced Refractive Index Change in Pb12 Films, in Texas Biannual of
`Electronics Research, November 15, I974.
`Large Refractive Index Change in PbI Films by Photolysis at 150 T 1800 C, in Texas
`Biannual of Electronics Research, May 15, 1975.
`Large Refractive Index Change in Pbl by Photolysis: Photoconductivity Measurements,
`In Texas Biannual of Electronics Research, November 15, I975.
`. Beam Collimation for Improved Traffic Signal Directivity, report to Eagle Signal Corp.,
`October 1976.
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`Integrated Optical Beam Addresser, in Annual Report on Electronics Research at The
`University ofTexas at Austin, May I977.
`- Mechanism for Large Refractive Index Change in Photolyzed Pb12 in Annual Report on
`Electronics Research at the University of Texas at Austin, May 1977.
`- Basic Solid State Materials Research, in Annual Report on Electronics Research at the
`University ofTexas at Austin, July 1979.
`Feasibility Study of Relative Humidity Measurement by Ellipsometry, report to Texas
`Research Institute, Inc., May 1980.
`Selection ofthe Optical Geometry for Ellipsometric Measurement of Relative Humidity,
`report to Texas Research Institute, Inc., August I980.
`. Active Guided Wave Devices, Final Report, Office of Naval Research Contract N00014-
`75-0753, September 1980.
`Interface Reactions, Instabilities and Transport, in Annual Report on Electronics
`Research at the University of Texas at Austin, 1981.
`. Guided Wave Devices for the Far-Infrared-Millimeter Wave Spectrum, in Annual Report
`on Electronics Research at the University ofTexas at Austin, 198].
`. A Proposal for a Pipeline Heating Cable Incorporating Zone-by-Zone Temperature
`Monitoring Arm Control, report to Thermon Mfg. Co., 1981.
`Feasibility Study for Programmable Heat—Trace Cable, report to Thermon Mfg. Co.,
`1981.
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`. Magnetic Heating Cable, report to Thermon Mfg. Co., 1981.
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`Proposal for Utilizing Ferromagnetic Phase Transition as Control for Heat Trace Cable,
`report to Thermon Mfg. Co., 1981.
`. Tactical Low-cost Altitude Sensor, report to Tracor Inc., 1985.
`. An Evaluation of a Proposed Optical Telemetry System, report to Schlumberger
`Technology Corporation, 1986.
`Low-frequency Vibration and Acoustic Measurements: SBIR Phase I Final Report. To
`US Naval Sea Systems Command, September 1990.
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`H. Textbooks
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`. A. B. Buckman, Guided-wave Photonics, ISBN 0—03-033354-7, Saunders College
`Publishing — Division of Harcourt Brace Jovanovich, Fort Worth (1992). .
`o A. B. Buckman, Computer-Based Electronic Measurement, ISBN 0-201-36182-5,
`Prentice-Hall, Upper Saddle River, NJ (2000).
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`Oral Presentations:
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`A. Professional Society Presentations
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`Modulated Ellipsometry for Band Structure Studies of Solids and Films, International
`Conference on Recent Developments in Ellipsometry, Lincoln, Nebraska, August 1968.
`Thickness Dependence of Secondary Emission Mechanisms of Polymer Films on Gold at
`Low Primary Energies, Conference on Photoelectric and Secondary Electron Emission,
`Minneapolis, Minnesota, August 1966.
`Surface Effects in Electric Field Modulated Ellipsometry, Conference on Physical
`Electronics, New Haven, Connecticut, March 1969.
`Ellipsometric Modulation Spectroscopy, invited paper, 9th National Meeting, Society for
`Applied Spectroscopy, New Orleans, October 1970.
`Slow TM Modes on a Double-Film Waveguide, Optical Society of America, Annual Fall
`Meeting, San Francisco, October 1972.
`Photodissociation of Pbl2 Films at 150-1750 C: Optical Constants vs. Wavelength and
`Exposure, Optical Society of America Annual Meeting, Houston, October 1974.
`Refractive Index Writing in Hot Pbl2: Integrated Optics Applications, University of
`Texas Electrical Engineering Department Seminar, January 1975.
`Stratification Effects in Active Devices: Large Refractive Index Change by
`Photodissociation in Pbl2 Films, Office ofNaval Research and Defense Advanced
`Research Projects Agency Electrooptic Program Review, Washington, DC, February
`1975.
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`Photodissociation of Pbl2 Films at 150—1750 C: Optical Constants vs. Wavelength and
`Exposure, 12th Annual Electronics Research Review, Austin, March 1975.
`Optical Communications, to UT. Austin Electrical Engineering Visiting Committee,
`Houston, May 1975.
`Propagation in Multiple and/or Inhomogeneous Dielectric Layers: Integrated Optics
`Applications, Joint Services Electronics Program (J SEP.) Topical Meeting on Advances
`in Radiation Technology, MIT, Cambridge, Massachusetts, May 1975.
`Photoconductivity Spectra of Photolyzed Pbl2 Films, 13th Annual Electronics Research
`Review, Austin, March 1976.
`Theory of an Efficient Electronic Phase Shifter Employing Multilayer Dielectric
`Waveguide Structure, Second International Conference on Sub-mm Waves, San Juan,
`PR. December 7, 1976.
`Photolysis Mechanism in Pbl2 Films, 14th Annual Electronics Research Review, Austin,
`Texas, March 9, 1977.
`Ellipsometric Characterization of the Glassy Layer at Metal/Semiconductor Interfaces,
`A.B. Buckman and S. Chao, 4th International Conference on Ellipsometry, Berkeley,
`California, August 1979.
`Guided Wave Devices for the Far-Infrared—mm Wave Spectrum, Joint Services
`Electronics Program Research Review, Austin, TX, January 1981.
`Polarization-Selective Lateral Waveguiding in Layered Dielectric Structures, Optical
`Society of America Annual Meeting, Orlando, FL, October 1981.
`Mode-Selection with a Three-Layer Dielectric Waveguide, Society of Photooptical
`Instrumentation Engineers Conference on Integrated Optics and Millimeter and
`Microwave Integrated Circuits, Huntsville, AL, November 16-20, 1981.
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`Three-layer Dielectric Stripline Filter for Guided-Wave Applications, Society of
`Photooptical Instrumentation Engineers 1984 Technical Symposium, Los Angeles,
`January 26-27, 1984.
`Analysis of a Novel Optical Fiber Interferometer with Common-mode Compensation,
`IEEE/OSA Optical Fiber Sensors Conference, New Orleans LA, January 27-29, 1988
`A Design Laboratory for Electrical Engineering Seniors, ASEE Gulf-Southwest Section
`Annual Meeting, San Antonio TX, March 17—18, 1988
`Ultrasensitive, Broadband Fiberoptic Acoustic Sensor, at Texas Research Seminars,
`Phase III, sponsored by Texas Higher Education Coordinating Board and Texas
`Department of Commerce, April 24-25, 1989.
`Common—mode Noise Reduction in Interferometric Fiberoptic Sensors Using Electro-
`optic Feedback, Society of Photooptic Instrumentation Engineers Symposium: Fiber
`Optic and Laser Sensors VII, Boston, September 1989.
`Precise Measurement of Mid-IR Absorption Using Guided-Wave Interferometry: A
`Proposal, Society of Photooptical Instrumentation Engineers: Southcentral 90 Technical
`Symposium, Dallas, May 1990.
`Fiber Optic Sensors: Technology and Current Issues, Austin Chapter, IEEE Lasers and
`Electrooptics Society, Nov 12, 1991.
`Enhancing Fiber Optic Interferometer Precision Using Electro-optic Feedback and
`Comon Mode Compensation, American Society for Precision Engineering (ASPE)
`Topical Meeting on Precision Interferometric Metrology, April 8, 1992.
`Direct Optical-to-Electrical Phase Conversion in a Fiber Optic Interferometer, American
`Society for Precision Engineering (ASPE) Topical Meeting on Precision Interferometric
`Metrology, April 8, 1992.
`(with Lisa Giulianelli) Direct Phase Conversion for very Low Frequency Measurand
`Detection in a Fiberoptic Interferometric Sensor, 7th Annual Meeting, American Society
`for Precision Engineering, Grenlefe, FL. Oct. 18-23,I992.
`(with V. Mancevski, D. Qian, W. Wang, C. Narayanan, and I. Busch-Vishniac) A High-
`Precision, Six Degree—of-Freedom,Single-Sided, Non-contact, Optical Sensor Suitable for
`Assembly Automation, 1993 NSF Design and Manufacturing Systems Conference,
`Charlotte, NC, Jan. 6-8, 1993.
`(with V. Mancevski, D. Qian, W. Wang, C. Narayanan, and I. Busch-Vishniac) A High-
`Precision, Six Degree—of—Freedom,Single-Sided, Non-contact, Optical Sensor Suitable for
`Assembly Automation, 1994 NSF Design and Manufacturing Grantees Conference,
`Cambridge, MA, Jan. 5-7, 1994.
`(with Lisa C. Giullianelli, Rodger M. Walser, and Michael F. Becker) Digital
`Demodulation Scheme for Wide Dynamic Range Measurements with a Fiber Optic
`Interferometer, SPIE 1994 North American Conference on Smart Structures and
`Materials, Orlando FL., Feb 13-18, 1994.
`(with Michael F. Becker, Rodger M. Walser, Thierry Lapine, Patrick Georges and Alain
`Brun) Femtosecond Switching ofthe Solid-State Transition in the Smart System Material
`V02, SPIE 1994 North American Conference on Smart Structures and Materials,
`Orlando FL., Feb 13-18, 1994.
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`B. Other presentations
`
`Tutorial on Guided-wave Optical Interconnect Technology, at Microelectronics and
`Computer Corporation (MCC) headquarters, Austin, July 1990.
`Fiber Optic Trace Level Hazardous Substance Sensor, Gulf Coast Hazardous Substance
`Research Center Science and Industrial Advisory Committees Meeting, January 15, 1992.
`Ilene J. Busch—Vishniac and A. B. Buckman, Demonstration ofa Prototype Six-Degree of
`Freedom, Single-Sided, Noncontact Position Sensor, 1997 NSF Design and
`Manufacturing Grantees Conference, Seattle WA, January 1997
`An Introductory Electrical Engineering Laboratory Based on Virtual Instrumentation,
`invited paper, Proc. 1997 Conference on Virtual Instrumentation in Education, Berkeley
`CA. June 1997.
`
`An Introductory Electrical Engineering Laboratory Based on Virtual Instrumentation,
`poster session, NI-Week 97, Austin TX. August 1997.
`Invited Presentation: Virtual Insruments in the Introductory Electrical and Computer
`Engineering Laboratory, National Instruments NI Week, Austin TX, August 1998.
`Poster Session presentation: Non-Contact Profilometry Using Position-Sensitive
`Detectors, Proc. 1998 NSF Design and Manufacturing Grantees Conference, Monterrey
`Mexico, January 1998.
`Poster Session presentation: Non—Contact Profilometry Using Position—Sensitive
`Detectors, Proc. 1999 NSF Design and Manufacturing Grantees Conference, Los Angeles
`CA, January 1999.
`Invited Presentation: Virtual Instruments in a First Course on Automatic Control,
`
`National Instruments NI Week, Austin TX, August 1999.
`Invited Presentation: Techniques for Digitizing Controllers for Prototyping, National
`Instruments NI Week Embedded Engineering and Control Design Summit, Austin TX,
`August 2005.
`
`Patents:
`
`1.
`
`2.
`
`US. Pat. No. 4,989,979. A. B. Buckman Optical Fiber Sensor Capable of Full Common-
`Mode Compensation. Issue date Feb.5, 1991.
`UK Pat No. 2,245,359B, A.B. Buckman,”Optical Interferometric Sensors with Common-
`Mode Compensation" , Issue date February 24,1993.
`US Pat. No. 5,367,373. Ilene J. Busch—Vishniac, A. B. Buckman, Wanjun Wang, Dahong
`Qian, and Vladimir Mancevski, Noncontact Position Measurement System Using Optical
`Sensors, Issue date Nov. 22, 1994.
`US Pat. No. 5,552,883 , Ilene J. Busch-Vishniac, A.B. Buckman, J.K. Pavuluri, Wanjun
`Wang, Dahong Qian, and Vladimir Mancevski, Noncontact Position Measurement
`System Using Optical Sensors, Issue date Sept. 3, 1996.
`
`Research Grants and Contracts:
`
`(with A.L. Jain), Modulated Ellipsometric Investigations of Size Effects on the Optical
`Properties of Metal and Semi-Metals, National Science Foundation Grant, 1968-70,
`$43,000.
`
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`Research Initiation - Tuning and Modulating Optical Thin-Film Waveguides Via
`Controlled Surface State Absorption, NSF Grant GK-27882, 1971-72, $16,000. Principal
`Investigator
`Applications of Slow Modes on Double-Film Waveguides for Active Elements in
`Integrated Optics. Office of Naval Research Grant, 1973-74, $36,043. Principal
`Investigator
`Multiple and/or Inhomogeneous Layers for Integrated Optical Coupling and Modulation,
`Office ofNaval Research Contract, March 1, 1975 to August 31, 1980. $156,897.
`Principal Investigator
`(With R.W. Bene, M.F. Becker, R.M. Walser), Basic Electronics Materials Research,
`Joint Services Electronics Program, 1974 to 1982. Approximately $521,500
`(With T. Itoh), Guided Wave Devices for the Far Infrared-mm Wave Spectrum, Joint
`Services Electronics Program, 1979—1982. $196,000
`University Research Institute - Equipment grant: Argon and Dye laser system, 1974,
`$12,000
`Bureau of Engineering Research - Research grant 1975-76, $5,500
`Motorola, Inc. - Grant of equipment to start E.E. student microelectronics fabrication
`laboratory (equipment book value, $83,000). 1980
`Bell Telephone Labs - Equipment grant for fabrication laboratory, 1980
`(With B.G. Streetman, D.P. Neikirk and T. Itoh), Texas Advanced Technology Research
`Program Integrated Millimeter-wave and Optoelectronic Components for Very High
`Speed Communications Applications $400,000 , 1985-1987
`(With E.L. Hixson), Texas Advanced Technology Program, Ultrasensitive Broadband
`Fiber—optic Acoustic Sensor, 1988—1990, $107,000
`(with Ilene Busch-Vischniac and other principal investigators) National Science
`Foundation, Magnetically Levitated Micro-robots, 1988-1991, $600,000.
`(with Research Applications Incorporated, Austin TX) Small Business Innovation
`Research (SBIR) Phase 1: Low Frequency Vibration and Acoustic Measurements, Naval
`Sea Systems Command, 1990, $50,000.
`(with Ilene Busch-Vischniac and Wanjun Wang), A High—Precision, Six Degree of
`Freedom, Single-sided, Non-contact Optical Sensor Suitable for Assembly Automation,
`National Science Foundation, 1991-1994 , $209,996.
`Fiber Optic Trace Level Hazardous Substance Sensor, Gulf Coast Hazardous Substance
`Research Center, 1992-95 $95,000.
`Ilene Busch-Vishniac and A. Bruce Buckman (co-Pl's), High-Precision Position and
`Dimension Sensors Suitable for Manufacturing, National Science Foundation - Division
`ofManufacturing, 4/95 - 3/98, $300,000.
`Ilene Busch-Vishniac and A. Bruce Buckman (Co-PI's), Improved Optical Sensing for
`Microelectronics, Texas Advanced Technology Program, Jan 1998 - Dec 1999. $216,501.
`
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`A. Bruce Buckman — Expert Witness Experience
`
`3M vs. Seiko, et.al., Central District of Texas (Case No. not available) 2000-
`2001. Expert witness, patent litigation, fiber-optic communications system components.
`0 Representing: plaintiff
`o Employing firm: Vinson and Elkins LLP, Austin, Texas.
`0 Duties: Consulted with attorneys, wrote expert reports and other documents.
`0 Attorneys: Willem Schuurman, Rick Williams, Greg Porter
`Urologix vs. ProstaLund, et.al. Eastern District of Wisconsin, 02—C-
`0318, 2002. Expert witness, patent litigation, electromagnetic biomedical instrument for
`surgery
`
`0 Representing: defendant
`0 Employing firm: Vinson and Elkins LLP, Austin Texas.
`0 Duties: Consulted with attorneys, wrote expert reports and other documents,
`deposed by opposing counsel, prepared demonstratives, advised Vinson & Elkins
`team during cross-examination, gave testimony with cross-examination at
`hearings beforejudge.
`o Attorneys: Willem Schuurman, Rick Williams, Stephen Hash, Greg Porter
`JamStrait Inc. vs. American Products Co. Inc. Eastern District of Louisiana, 02-
`2036, 2003. Expert witness, patent litigation, light—emitting diode electronics
`0 Representing: defendant
`0 Employing firm: Knobbe, Martens, Olson & Bear LLP, Irvine California.
`0 Duties: Consulted with attorneys, wrote expert reports and other documents.
`0 Attorneys: Brent Babcoc