Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 1 of 68 PageID #: 1592
`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 1 of 68 PageID #: 1592
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`EXHIBIT A
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`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 2 of 68 PageID #: 1593
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`Ari Rafilson
`Bank of America Plaza
`901 Main Street, Suite 3300
`Dallas, TX, 75202
`214-593-9114 Telephone
`214-593-9111 Facsimile
`arafilson@shorechan.com
`
`
`
`
`January 30, 2018
`
`Via Email
`Edward G. Poplawski
`Erik J. Carlson
`WILSON SONSINI GOODRICH & ROSATI
`Professional Corporation
`633 West Fifth Street, Suite 1550
`Los Angeles, CA 90071
`epoplawski@wsgr.com
`ecarlson@wsgr.com
`
`Bindu Palapura
`David E. Moore
`Stephanie O'Byrne
`POTTER ANDERSON & CORROON LLP
`Hercules Plaza, 6th Floor
`1313 N. Market Street
`Wilmington, DE 19801
`bpalapura@potteranderson.com
`dmoore@potteranderson.com
`sobyrne@potteranderson.com
`
`
`
`
`Via Email
`James C. Yoon
`WILSON SONSINI GOODRICH & ROSATI
`Professional Corporation
`650 Page Mill Road
`Palo Alto, CA 94304-1050
`jyoon@wsgr.com
`
`Jose C. Villarreal
`Henry Pan
`WILSON SONSINI GOODRICH & ROSATI
`Professional Corporation
`900 South Capital of Texas Highway
`Las Cimas, Fifth Floor
`Austin, TX 78746
`jvillarreal@wsgr.com
`hpan@wsgr.com
`
`
`Re: Godo Kaisha IP Bridge 1 v. Omnivision Technologies, Inc.
`Civil Action No. 1:16-cv-00290-JFB-SRF
`
`
`Dear Counsel,
`
`Pursuant to ¶ 7.4 of the Protective Order (Dkt. No. 52), Plaintiff Godo Kaisha IP Bridge 1 (“IP
`Bridge”) discloses Albert Joseph Pierre Theuwissen, PhD as an expert and consultant in the
`above-referenced case. A signed copy of the Exhibit A to the Protective Order is attached as
`Exhibit A.
`
`Dr. Theuwissen is expected to review technical materials related to the design and layout of
`OmniVision Technologies, Inc.’s (“OmniVision”) products. Such materials include, but are not
`limited to, design layout files such as GDS, GDSII, DEF, and LEF files. Dr. Theuwissen is also
`
`

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`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 3 of 68 PageID #: 1594
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`
`Disclosure of Dr. Albert Theuwissen
`January 30, 2018
`Page 2
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`expected to review additional documents related to infringement, validity, marketing, sales, and
`valuations, including but not limited to PRD files, MRD files, and New Product Signoff
`documents. Dr. Theuwissen’s primary residence is in Bree, Belgium. Regarding current
`employment, Dr. Theuwissen is the founder and CEO of Harvest Imaging BVBA in Bree,
`Belgium. He is also currently employed, part time, at Delft University of Technology in the
`Netherlands. His C.V. is attached as Exhibit B. Additional information about Dr. Theuwissen
`and Harvest Imaging is available at http://www.harvestimaging.com/bio.php and
`http://www.harvestimaging.com/. A list of companies and entities for whom Dr. Theuwissen has
`received compensation or funding during the last five years is attached as Exhibit C. As can be
`seen from that list, much of Dr. Theuwissen’s work relates to providing courses and training.
`
`In addition, Dr. Theuwissen is performing technical consulting work for five other entities, but
`his work for those entities is covered by an NDA. Dr. Theuwissen’s work in these matters does
`not involve BSI (backside illuminated) image sensors or stacked die image sensors, and instead
`relates to FSI (frontside illuminated) image sensors.
`
`During the last five years, Dr. Theuwissen is currently serving or has served as a testifying expert
`in the following matters:
`
`
`1. Intellectual Ventures I, LLC v. Canon Inc., No. 1-11-cv-792-SLR (D. Del.), filed
`September 9, 2011; and
`2. Godo Kaisha IP Bridge 1 v. OmniVision Technologies, Inc., No. 1:16-cv-00290 (D. Del.),
`filed April 22, 2016.
`
`
`The only case Dr. Theuwissen has provided testimony in over the last five years is I.V. v. Canon,
`which is listed above.
`
`Dr. Theuwissen has no currently-pending patent applications. A list of his issued patents is
`included in his C.V.
`
`
`
`
`Best regards,
`
`
`
`
`Ari Rafilson
`
`
`
`

`

`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 4 of 68 PageID #: 1595
`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 4 of 68 PageID #: 1595
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`EXHIBIT A
`EXHIBIT A
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`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 5 of 68 PageID #: 1596
`Case 1_:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 5 of 68 PagelD #: 1596
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`Case 1:16—cv-00290-JFB-SRF Document 52 Filed 01/23/18 Page 27 of 27 PauelD #: 1563
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`EXHIBIT f
`
`ACKNOWTFDGMFNT ANT) AGREEMENT TO RF, ROI NO
`
`
`[print or type fiill name], of
`I, Albert Theuwissen
`[print or type full address]. declare
`Kleine Schoolstraat 9, 3960 BREE, Belgium
`under penalty of perjury that I have read in its entirety and understand the Protective Order that
`was issued by the United States District Court for the District of Delaware on January 24, 2018
`[date] in the case of Godo Kai's/1a 1P Bridge I v. Omni Vision Technologies. Inc, Civil Action
`No. 1:16—cv-00290-SLR. I agree to comply with and to be bound by all the terms of this
`Protective Order. and I understand and acknowledge that failure to so complv could expose me
`to sanctions and punishment in the nature of contempt. I solemnly promise that I will not
`disclose in any manner any information or item that is subject to this Protective Order to any
`person or entity except in strict compliance with the provisions of this Order.
`
`I further agree to submit to the jurisdiction of the United States District Court for the
`District of Delaware for the purpose of enforcing the terms of this Protective Order, even if such
`enforcement proceedings occur after termination of this action.
`
`Valerie M. Wagner of GCA Law
`I hereby appoint Partners LLP
`
`[print or type full name] of
`ég‘rint or type full address and telephone
`_
`WWW .19550 237-7202
`elaware agent for semce o . process 1 co
`ecuon mm [[115 acuon or any
`number] as my
`proceedings related to enforcement of this Protective Order-
`
`Date: Jan. 28th, 2018
`
`City and State where sworn and signed: Bree. Belgium
`
`Printed name: Albert Theuwissen
`
`Signature:
`
`”J7
`
`
`
`

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`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 6 of 68 PageID #: 1597
`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 6 of 68 PageID #: 1597
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`EXHIBIT B
`EXHIBIT B
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`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 7 of 68 PageID #: 1598
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`
`CV of :
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`
`
`Albert J.P. THEUWISSEN
`
`
`
`
`Personal data :
`
`
`Name :
`Given names :
`Birth date :
`
`Birth Place :
`Citizenship :
`
`
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`Address :
`
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`Telephone :
`
`E-mail :
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`Education :
`
`Theuwissen
`Albert Joseph Pierre
`20-12-1954
`Maaseik (B)
`Belgian
`Married, 3 daughters, 1 grandson, 2 granddaughters
`Kleine Schoolstraat, 9,
`3960 Bree (B)
`+32-89-472762 (private)
`+32-495-571431 (mobile)
`a.theuwissen@scarlet.be (private)
`albert@harvestimaging.com (work)
`
` -
`
` PhD in Applied Sciences, graduate from K.U. Leuven, in1983, cum laude,
`- MSc. Electrical Engineering, from K.U. Leuven, in 1977, cum laude,
`
`Professional courses :
`
` -
`
` Design for testability, a management overview,
`- Teaching to professionals,
`- Speed-reading,
`- Financial management for non-financial managers,
`- Road-mapping,
`- Negotiations,
`- Octagon (management training),
`- Manager Seminar,
`- Quality Aspects of R&D
`- Appraisal and evaluation of co-workers
`- Scientific Japanese,
`- Digitale Image Processing,
`- MatLAB.
`
`Experience :
`
` -
`
` 2007-today : Founder and CEO of Harvest Imaging,
`- 2004-2007 : Chief Scientist at DALSA Semiconductors,
`- 2002-2004 : Chief Technology Officer of DALSA Inc.
`- 2001-today : Parttime professor at Delft University of Technology,
`- 1991-2002 : manager of the R&D group “Imaging Devices” of “Philips
`Semiconductors Image Sensors”,
`- 1988-1991 : Projectleader of HDTV imagers within Philips Research,
`- 1985-1988 : Projectleader of SDTV imagers within Philips Research,
`- 1983-1985 : Member of the scientific staff of Philips Research,
`- 1977-1983 : PhD candidate at K.U. Leuven : “Indium-Tin Oxide en Polyimide
`technologie voor Ladingsgekoppelde Beeldsensoren”,
`- 1976-1977 : PhD candidate at K.U. Leuven: “Hardware Development of a 256-
`element linear CCD image sensor”,
`
`

`

`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 8 of 68 PageID #: 1599
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`
`
`Contribution to scientific and technical committees :
`
` -
`
` 1988, 1989, 1995, 1996 : member technical program committee IEDM,
`- 1997, 1998, 2003 : member technical program committee ESSDERC,
`- 1999-2010 : member technical program committee ISSCC,
`- 2001-2006 : secretary, vice-chair and chair European ISSCC Committee and
`member Executive Committee ISSCC,
`- 2009-2010 : vice-chair and chair of the technical program committee of ISSCC,
`-
`since 1995 : member steering committee of International Image Sensor
`Workshop,
`- 1997, 2003, 2009, 2015 : general chair of International Image Sensor Workshop,
`- 1997 : founder “Walter Kosonocky Award”,
`-
`since 1996 : member “editorial board” of Photonics Spectra,
`- 1991, 1997, 2003, 2009 : guest co-editor of special issue IEEE Trans. Electron
`Devices on Image Sensors; 2015 : guest editor-in-chief of special issue IEEE
`Trans. Electron Devices
`- 1998 : co-editor of special issue IEEE Micro on Digital Imaging,
`- 1998-2004; 2015-2016 : IEEE distinguished lecturer,
`- 2017 : President of the International Image Sensor Society.
`
`Awards :
`
` -
`
` 2008 : Fuji Gold Medal (SMPTE)
`- 2011 : Electronic Imaging Scientist of the Year (SPIE)
`- 2013 : Exceptional Service Award (IISS),
`- 2014 : SEMI-Award.
`
`Major Technical Achievements :
`
` -
`
` CCD and CMOS on a single chip (‘85),
`- Two dimensional stitching for large-area imagers (‘88),
`- Local W-interconnect to strap CCD gates (‘89),
`- Wafer-size CCD imager with 66 Mpixels (‘93),
`- Aspect ratio switching by Dynamic Pixel Management (‘96),
`Imager with 2.4 m pixel pitch (‘98),
`-
`-
`Imager with 1 M frames/s (‘01),
`- World record dark current for imagers (‘04),
`- Multi-slope, multi-ramp column-parallel ADC (’06),
`-
`Image sensor with 0.7 electrons of noise (’11).
`
`Completed PhD projects (under guidance of A. Theuwissen) :
`
` -
`
` Martijn Snoeij : “Analog Signal Processing for CMOS Image Sensors”,
`- Xinyang Wang : “Noise in sub-micron CMOS Image Sensor Pixels”,
`- Padmakumar Rao : “Device Physics Aspects of CMOS Image Sensors”,
`- Mukul Sarkar : “Biologically Inspired CMOS Image Sensor”,
`- Yue Chen : “High-Performance CMOS Image Sensor for Radio Molecular
`Imaging”,
`- Ning Xie : “Low Noise, Low Power CMOS Image Sensor”,
`-
`Jiaming Tan : “4T CMOS Active Pixel Sensors under Ionizing Radiation”.
`- Yang Xu : “Fundamental Characteristics of Pinned-Photodiode Pixels in CMOS
`Imagers”.
`
`
`
`

`

`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 9 of 68 PageID #: 1600
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`Completed MSc projects (under guidance of A. Theuwissen) :
`
` -
`
`- Qiang Yao : “The design of a 16x16 pixels CMOS image sensor with 0.5 e- rms
`
` Ning Xie : “CMOS image sensor in 0.18 µm technology for a micro-digital sun
`sensor”,
`- Kejia Ruan : “A novel readout architecture for a CMOS linescan image sensor”,
`- Yang Xu : “Charge domain interlacing CMOS image sensor design”,
`- Cheng Ma : “Pixel ADC design for hybrid CMOS image sensors”,
`-
`Jia Guo : “A DLL based single slope ADC”,
`- Yang Liu : “Design of a HDR CMOS Image Sensor in 110 nm Technology”,
`- Xiaoliang Ge : “Design of a Global Shutter CMOS Image Sensor in 110 nm
`CMOS Technology”,
`
`noise”,
`Jiaqi Zhu : “The design of a stitched high dynamic range CMOS particle sensor”,
`-
`- Ruijun Zhang : “A 1-Mega Pixel HDR and UV Sensitive Image Sensor with
`Interleaved 14-bit 64 Ms/s SAR ADC”,
`Jules Markenhof : “integrating a Temperature Sensor into a CMOS Image
`Sensor”,
`- Utsav Jain : “Characteristics of CMOS Image Sensors”.
`
`
`Publications (for details see further) :
`
`-
`
` -
`
` Over 220 publications in the field of Imaging (see www.harvestimaging.com)
`- 1995 : publication of the textbook “Solid-State Imaging with Charge-Coupled
`Devices”,
`- More than 20 (pending) patents in the field of Imaging
`- More than 200 workshops/courses/training around the theme of “Solid-State
`Image Sensors”.
`
`
`
`
`January 2018.
`
`

`

`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 10 of 68 PageID #: 1601
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`List of Publications :
`
`
`
`1.
`
`2.
`
`3.
`
`4.
`
`5.
`
`6.
`
`8.
`
`9.
`
`A. Theuwissen, A. Vits, J.P. Vermeiren : "Analysis of traffic flow with
`a CCD-camera and a micro-processor", Journal A, Vol. 21, no. 3,
`p.112-115, 1980.
`A. Theuwissen, G. Declerck : "Technology of CCD-imagers with
`transparent conductive ITO-electrodes", 10th ESSDERC/5th SSSDT,
`York (UK), Conf. Abstr. p.216-217, Sept. 15-18, 1980.
`A. Theuwissen, G. Declerck : "Linear CCD-imagers with a Poly-imide
`Insulation for Double Level Metallization", IEEE Electr. Dev. Lett., Vol.
`EDL-3, p.308-309, 1982.
`A.J.P. Theuwissen, G. Declerck : "Optical and Electrical Properties of
`Reactively DC-Magnetron Sputtered In2O3:Sn Films", Thin Solid Films,
`Vol. 121, p.109-119, 1984.
`J. van der Spiegel, J. Sevenhans, A. Theuwissen, J. Bosiers, I.
`Debusschere, G. Declerck : "Study of different sensor types for high
`resolution linear CCD-imagers", Sensors and Actuators, Vol. 6,
`p.51-64, 1984.
`A.J.P. Theuwissen, C.H.L. Weijtens, L.J.M. Esser, J.N.G. Cox,
`H.T.A.R. Duyvelaar, W.C. Keur : "The Accordion Imager : an ultra-
`high density Frame Transfer CCD", IEDM 84, San Francisco, Techn.
`Dig. p.40-43, 1984.
`7. M.G. Collet, J.G.C. Bakker, L.J.M. Esser, H.L. Peek, M.J.H. van de
`Steeg, A.J.P. Theuwissen, C.H.L. Weijtens : "High Density Frame
`Transfer Image Sensors with Vertical Anti-Blooming", SPIE Vol. 570
`Solid State Imaging Arrays, San Diego, p.27-34, 1985.
`A.J.P. Theuwissen, C.H.L. Weijtens, J.N.G. Cox : "The Accordion
`Imager : more than just a CCD-sensor", Electronic Imaging '85, Boston,
`p.87-90, Oct. 7-10, 1985.
`A. Theuwissen : "The Accordion Imager", Proc. Intern. Congress of
`Photographic Science : Progress in Basic Principles of Imaging
`Systems, Koln, p.638, Sept. 10-17, 1986.
`10. A.J.P. Theuwissen, C.H.L. Weijtens : "The accordion imager, a new
`solid-state image sensor", Philips Technical Review, Vol.43, p.1-8,
`1986.
`11. A.J.P. Theuwissen, J.G.C. Bakker, J.N.G. Cox, A.L. Kokshoorn,
`P.A.C. van Loon, B.C.J. O'Dwyer, J.M.A.M. Oppers, C.H.L. Weijtens
`: "A 400k pixel 1/2" Accordion CCD-Imager", ISSCC, San Francisco,
`Digest Tech. Papers, p.48-49, Febr. 17-19, 1988.
`12. L.J.M. Esser, H.C.G. van Kuijk. J.G.C. Bakker, C.H.L. Weijtens,
`A.J.P. Theuwissen : "A Smearfree Accordion CCD-Imager", Intern.
`Conf. Consumer Electronics, Rosemont, p.10-11, June 8-10, 1988.
`13. A.J.P. Theuwissen : "Recente Ontwikkelingen op het gebied van
`CCD-imagers", MediAVisie, Amsterdam, 18-21 sept., 1989.
`14. A.J.P. Theuwissen
`: "CCD-imagers
`for HDTV", Workshop on
`Advanced Solid-State Imagers, Harriman (NY), May 18-20, 1990.
`15. A.J.P. Theuwissen : "Charge-Coupled Devices als Bildaufnehmer",
`Elektronik, No. 23, p. 76-84, 1990.
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`16. J.G.C. Bakker, L.J.M. Esser, H.L. Peek, C.J. Sweeney, A.L.
`Kokshoorn, A.J.P. Theuwissen : "The Tacking CCD : A new CCD
`concept.", IEEE Transac. Electr. Dev., Vol. ED-38, p. 1193-1200, May
`1991.
`17. Theuwissen, H. Peek, P. Centen, R. Boesten, J. Cox, P. Hartog, A.
`Kokshoorn, H. van Kuijk, B. O'Dwyer, J. Oppers, F. Vledder : "A 2.2
`Mpixel FT-CCD imager according to the Eureka HDTV-standard.",
`IEDM 91, Washington DC, Techn. Dig. p. 167-170, 1991.
`18. A. Theuwissen, H. Peek, P. Centen, M. van de Steeg, R. Boesten,
`P. Hartog, A. Kokshoorn, E. de Koning, J. Oppers, F. Vledder :
`"HDTV
`image sensor
`:
`the pixel structure.",
`Intern. Broadcast
`Convention, Amsterdam, Techn. Papers, p. 488-491, July 1992.
`19. A. Theuwissen : "HDTV image sensors.", (invited paper) IS&T
`Proceedings of the Intern. Symp. on Electr. Photography, Koln (Germ.),
`Sept. 1992, p. 12-16.
`20. M. van de Steeg, R. Boesten, P. Centen, P. Hartog, A. Kokshoorn,
`E. de Koning, J. Oppers, H. Peek, A. Theuwissen, F. Vledder :
`"CCD-Imagers for HDTV.", "Imaging the Future", Cambridge (UK),
`22-25 Sept., 1992. Also The Journal of Photographic Science, Vol. 41,
`No. 3, 1993, p. 117-118.
`21. J. Blankevoort, H. Blom, P. Brouwer, B. van de Herik, R. Koppe, A.
`Moelands, J. van Rooy, F. Stok, A. Theuwissen : "A high
`performance, full bandwidth, HDTV camera, applying the first 2.2
`million pixel Frame Transfer CCD sensor.", 134th SMPTE Techn.
`Conf., Toronto (Can), Nov. 10-13, 1992.
`22. A.J.P. Theuwissen, H.L. Peek, M.J.H. van de Steeg, R.M.G.
`Boesten, P.B. Hartog, A.L. Kokshoorn, E.A. de Koning, J.M.A.M.
`Oppers, F.F. Vledder, P.G.M. Centen, H. Blom, W. Haar : "A 2.2M
`Pixel FT-CCD Imager According to the Eureka HDTV Standard.", IEEE
`Transac. Electron Devices, Vol. 40, No. 9, Sept. 1993, p. 1621-1629.
`23. L.J.M. Esser, A.J.P. Theuwissen : "Charge Coupled Devices :
`Physics, Technology and Imaging", in "Handbook on Semiconductors"
`ed. by T.S. Moss, Vol.4, ed. by C. Hilsum, Elsevier Science Publ.,
`1993, p. 389-473.
`24. H. Peek, A. Theuwissen, A. Kokshoorn, E. Daemen : "Groove-fill of
`tungsten and poly-Si membrane technology for high performance
`(HDTV) FT-CCD imagers.", IEDM 93, Washington DC, Techn. Dig. p.
`567-570, 1993.
`25. A. Theuwissen : "CCD-Imaging", Sensor Technology 1994, University
`of Twente, conference proceedings, p. 51-66, 1994.
`26. A. Theuwissen : "CCD-Imaging", Philips Journal of Research, Vol. 48,
`No. 3, p.147-158, 1994.
`27. P. Centen, H. Stoldt, A. Theuwissen, H. Peek, W. Huinink, L.
`Sankaranarayanan, A. Kleimann, G. Pine, M. Stekelenburg, A.
`Mierop, F. Vledder, D. Verbugt, J. Oppers, P. Opmeer : "Aspect ratio
`switching with equal horizontal pixel count.",
`Intern. Broadcast
`Convention, Amsterdam, Techn. Papers, p. 1-7, September 1994.
`28. A.J.P. Theuwissen : "Die leise Revolution der sehenden Chips",
`Bulletin VSE-UCS, No. 21, 1994, p. 19-23.
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`29. A. Theuwissen, J. Bosiers, H. Heijns, G. Kreider, H. Peek, E. Roks,
`C. Schaeffer, H. Stoldt
`: "Real-time
`imaging with mega-pixel
`charge-coupled devices.", Proc. Intelligent Robots and Computer
`Vision XIII : 3D Vision, Product Inspection, and Active Vision, SPIE Vol.
`2354, Boston, 2-4 Nov. 1994, pp.240-248.
`30. A. Theuwissen : “Broadcast CCD Imagers find new Applications”,
`Photonics Spectra, Jan. 1995, p. 109.
`31. A.J.P. Theuwissen
`: “Solid-State Imaging with Charge-Coupled
`Devices”, Kluwer Acad. Publishers, Dordrecht, ISBN 079-233456-6,
`April 1995.
`32. A. Theuwissen, J. Bosiers : "Consumer CCDs : masterpieces of 3D
`integration, Optics & Photonics News, April 1995, pp. 32-36.
`33. E. Roks, A. Theuwissen, H. Peek, M. van de Steeg, P. Centen, J.
`Bosiers, D. Verbugt, E. de Koning : "A low-noise, highly sensitive 1",
`2.2 Mpixel FT-CCD imager for high-definition applications, 1995 IEEE
`Workshop on Charge-Coupled Devices and Advanced
`Imager
`Sensors, Dana Point, April 20-22, 1995.
`34. P. Centen, A. Mierop, H. Stoldt, A. Theuwissen, G. Pine, M.
`Stekelenburg : "Dynamic Pixel Management for second generation
`aspect ratio switching", 19th
`Intern. Television Symposium and
`Technical Exhibition, Montreux, June 8-13, 1995, pp. 99-106.
`35. G. Kreider, J. Bosiers, B. Dillen, J. Van der Heijden, W. Hoekstra,
`A. Kleimann, P. Opmeer, J. Oppers, H. Peek, R. Pellens, A.
`Theuwissen : “An mK x nK Modular Image Sensor Design”, IEDM 95,
`Washington DC, Dig. Techn. Papers, p. 155-158, 1995.
`36. A. Theuwissen : "Large area imagers for Digital Photography", (invited
`paper) Intern. Symp. on Electr. Photography, Koln (Germ.), 21-22 Sept.
`1996.
`37. A. Theuwissen : “Modular CCD concept for large area CCD imagers”,
`ESO Workshop Optical detectors for Astronomy, 8-10 October, 1996,
`Proceedings pp. 37-44, Kluwer Acad. Publ., 1998.
`38. H. Stoldt, A.J.P. Theuwissen, F.F. Vledder, P.G.M. Centen, A.
`Mierop, A.C.M. Kleimann, H.L. Peek, D.W.E. Verbugt, P.B. Hartog,
`R.H.S. de Gruyter : “CCD Imagers for Broadcast Applications” (invited
`paper), IEDM 96, San Francisco, Dig. Techn. Papers, 1996.
`39. A. Theuwissen : “Modular CCDs”, Photonics Spectra, Jan. 1997, p.
`110-112.
`40. A. Theuwissen : “State-of-the-art and future developments in CCD
`image sensors”, 7. SGOEM Fachkurs Bildgebende Optische
`Messtechnik 1997, 10-14 March, Engelberg (CH).
`41. A. Theuwissen : “Image Sensing for Electronic Photography”, 7.
`SGOEM Fachkurs Bildgebende Optische Messtechnik 1997, 10-14
`March, Engelberg (CH).
`42. H. Folkerts, E. Roks, L. Korthout, A. Theuwissen : “Characterization
`of building block imagers with respect to linear dynamic range”, 1997
`IEEE Workshop on Charge-Coupled Devices and Advanced Image
`Sensors, Bruges, June 5-7, 1997.
`43. M. Lesser, D. Ouellette, A. Theuwissen, G. Kreider, H. Michaelis :
`“Packaging and operation of Philips 7K x 9K CCDs”, 1997 IEEE
`
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`

`Case 1:16-cv-00290-MN Document 56-1 Filed 02/16/18 Page 13 of 68 PageID #: 1604
`
`Workshop on Charge-Coupled Devices and Advanced Image Sensors,
`Bruges, June 5-7, 1997.
`44. A.J.P. Theuwissen : “Dynamic Range : Buyers Need Comparable
`Specifications”, Photonics Spectra, November 1997, p. 161-163.
`45. A. Theuwissen, M. Beenhakkers, B. Dillen, H.O. Folkerts, H.
`Heyns, L. Korthout, G. Kreider, P. Opmeer, H. Peek, E. Roks, H.
`Rosner, A. van der Sijde, F. Vledder : “Versatile building-block
`architecture
`for
`large area, high performance CCD
`imagers”,
`Proceedings of SPIE, Vol. 3301, pp. 37-43, San Jose, Jan. 26-27,
`1998.
`ISSCC Evening Panel
`the
`: moderator of
`46. A.J.P. Theuwissen
`Discussion on “Will CMOS Image Sensors Survive Scaling ?”, San
`Francisco (CA), Feb. 5-7, 1998.
`47. A. Theuwissen : “Versatile building-block architecture for large area,
`high performance CCD
`imagers”,
`(invited paper) Proceedings
`ESSDERC’98, Bordeaux (Fr), Sept. 8-10, 1998, pp. 56-61.
`48. Albert J.P. Theuwissen : “Solid-state Imaging Devices for Digital
`Photography”, ICPS, Sept. 7-11, 1998, Antwerp, pp. 326-329.
`49. Albert Theuwissen
`:
`“Update on
`today’s CCD
`technology”,
`Europractice “CMOS image sensors, technology and applications”, 16th
`September, 1998, Southampton, UK.
`technology”,
`today’s CCD
`50. Albert Theuwissen
`:
`“Update on
`Europractice “CMOS image sensors, technology and applications”, 30th
`September, 1998, Stuttgart, Germany, UK.
`51. Albert J.P. Theuwissen : “Professional digital photography : state-of-
`the-art”, Seybold seminars, March 2-5, 1999, Boston.
`52. Albert Theuwissen : “Update on today’s CCD technology”, BIVA
`meeting on “CMOS image sensors, technology and applications”, 26th
`May, 1999, Stuttgart, Germany, UK.
`53. H.-S. Philip Wong and Albert J.P. Theuwissen : “Guest Editor’s
`Introduction : Digital Imaging”, IEEE Micro, Vol.18, 1998, no. 6, pp.12-
`13.
`54. A.J.P. Theuwissen : “CMOS or CCD image sensors for digital still
`applications ?”, invited paper ESSCIRC, Duisburg, 21-23 Sept. 1999,
`p. 28.
`Image Sensors
`: “ Solid-State
`55. A.J.P. Theuwissen
`Photography”, 6th October, 1999, VDI-Vortrag, Koln.
`56. Albert Theuwissen : “For Pixels, Size Matters”, Photonics Spectra,
`August 2000, pp. 112-113.
`57. Albert Theuwissen and Edwin Roks : “Building a better mousetrap,
`modified CMOS processes improve image sensor performance.”, OE
`Magazine, Jan. 2001, pp. 29-32.
`58. Albert J.P. Theuwissen : “What you see is what you get ?!”, Seybold
`seminar, April 12, 2001, Boston.
`59. Albert J.P. Theuwissen : “CMOS or CCD image sensors for digital still
`applications ?”, invited paper, Proc. VLSI-TSA Symposium, Hsinchu
`(Taiwan), April 18-20, 2001, pp. 168-171.
`60. C. Draijer, G. Kreider, B. Dillen, W. Klaassens, H. Peek, A.
`Theuwissen : “A Color Image Sensor with 9 m Pixels for High-End
`
`for Digital
`
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`

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`Digital Still Photography”, 1999 IEEE Workshop on Charge-Coupled
`Devices and Advanced Image Sensors, Lake Tahoe, June 7-9, 2001.
`61. D. Poggemann, T.G. Etoh, A. Ruckelshausen, G. Kreider, A.
`Theuwissen, Y. Kondo, H. Maruno, K. Takubo, H. Soya : “An Ultra-
`High-Speed Camera with an In-situ Storage Image Sensor for
`Preliminary Test”, 1999 IEEE Workshop on Charge-Coupled Devices
`and Advanced Image Sensors, Lake Tahoe, June 7-9, 2001.
`62. Albert Theuwissen : “Solid-State Imaging Devices”, contribution to
`Encyclopedia of Physical Science and Technology, third edition,
`Academic Press, 2001.
`63. L. Le Cam, J. Bosiers, A. Kleimann, H. van Kuijk, J. Maas, M.
`Beenhakkers, H. Peek, P. van der Rijt, A. Theuwissen : “A 1/1.8”
`3M-pixel FT-CCD with On-Chip Horizontal Sub-Sampling for DSC
`Applications”, ISSCC, San Francisco, Digest Tech. Papers, p. 34-35,
`Febr. 4-6, 2002.
`64. T.G. Etoh, D. Poggemann, A. Ruckelshausen, A. Theuwissen, G.
`Kreider, H.-O. Folkerts, H. Mutoh, Y. Kondo, H. Maruno, K. Takubo,
`H. Soya, K. Takehara, T. Okinaka, Y. Takano, T. Reisinger, C.
`Lohmann : “A CCD Image Sensor of 1M frames/s for Continuous
`Image Capturing of >100 Frames.”, ISSCC, San Francisco, Digest
`Techn. Papers, p. 46-47, Febr. 4-6, 2002.
`65. J.T. Bosiers, A.C. Kleimann, H.C. van Kuijk, L. Le Cam, H. Peek, J.
`Maas, A.J. Theuwissen : “Frame Transfer CCDs for Digital Still
`Cameras : Concept, Design and Evaluation”, IEEE Transac. Electron
`Devices, Vol. 49, p. 377-386, 2002.
`66. Albert J.P. Theuwissen : “Small is Beautiful ?! Yes, but not for pixels
`of solid-state imagers”, Invited talk at the PICS Conference, Conf.
`Proc., p. 156-157, April 7-10, 2002, Portland (OR).
`67. Albert J.P. Theuwissen : “Small is Beautiful ?! Yes, but not for pixels
`of solid-state imagers.”, Invited talk at the 1st Fraunhofer CMOS Image
`Sensor Workshop, May 6-7, 2002, Duisburg (Germany).
`68. Albert J.P. Theuwissen : “Effect of shrinking pixels in solid-state
`image sensors”, Journee d’Etudes – Les capteurs d’images CCD-
`CMOS Etat de l’Art, Paris (France), June 10, 2002.
`69. Albert Theuwissen : “CCD Developments”, 3. Z/I Imaging Recce-
`Workshop, June 11-13, 2002, Oberkochen (Germany).
`70. M.F. Snoeij, A.J.P. Theuwissen and J.H. Huijsing : “Read-Out
`Circuits for Reduction of Fixed-Pattern Noise in a CMOS Active Pixel
`Sensor”, Proc. of the Semiconductor Sensors Conference SeSENS,
`Veldhoven (Nl), pp. 676-679, Nov. 2002.
`71. D. Poggemann, T.G. Etoh, A. Ruckelshausen, A. Theuwissen, J.
`Bosiers, H. Mutoh, Y. Kondo : “Simulation-based development and
`characterization of a CCD architecture for 1 million frames per second”,
`Proceedings of SPIE, Vol. 5017, p. 185-195, Santa Clara, Jan. 21-23,
`2003.
`72. A. Tanbakuchi, A. van der Sijde, B. Dillen, A. Theuwissen, W. de
`Haan : “Adaptive Pixel Defect Correction”, Proceedings of SPIE, Vol.
`5017, p. 360-370, Santa Clara, Jan. 21-23, 2003.
`73. N.V. Loukianova, H.O. Folkerts, J.P.V. Maas, D.W.E. Verbugt, A.J.
`Mierop, W. Hoekstra, E. Roks, A.J.P. Theuwissen : "Leakage
`
`

`

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`
`Current Modeling of Test Structures for Characterization of Dark
`Current in CMOS Image Sensors", IEEE Transac. Electron Devices,
`Vol. 50, No. 1, Jan. 2003, p. 77-83.
`74. T.G. Etoh, D. Poggemann, G. Kreider, H. Mutoh, A.J.P.
`Theuwissen, A. Ruckelshausen, Y. Kondo, H. Maruno, K. Takubo,
`H. Soya, K. Takehara, T. Okinaka, Y. Takano : "An Image Sensor
`Which Captures 100 Consecutive Frames at 1,000,000 Frames/s",
`IEEE Transac. Electron Devices, Vol. 50, No. 1, Jan. 2003, p. 144-151.
`75. J.T. Bosiers, B.G.M. Dillen, C. Draijer, A.C. Kleimann, F.J.
`Polderdijk, M.A.R.C. de Wolf, W. Klaassens, A.J.P. Theuwissen,
`H.L. Peek, H.O. Folkerts : "A 35 mm Format 11 M Pixel Full-Frame
`CCD for Professional Digital Still Imaging", IEEE Transac. Electron
`Devices, Vol. 50, No. 1, Jan. 2003, p. 254-265.
`76. Albert Theuwissen, John Coghill, Lucian Ion, Felicia Shu, Harald
`Siefken, Charles Smith : "Ultra-high Resolution Image Capturing and
`Processing for Digital Cinematography", ISSCC, San Francisco, Digest
`Tech. Papers, p.162-163, Febr. 9-13, 2003.
`77. Anthony A. Tanbakuchi, Arjen van der Sijde, Bart Dillen, Albert
`Theuwissen, Wim de Haan : “Adaptive Pixel Defect Correction”,
`poster at the University of Arizona Annual Photonics and Imaging
`Initiative Workshop, Marriott Hotel Tucson (AR), Jan. 21-23, 2004.
`78. Albert J.P. Theuwissen : “Photography on Mars”, Invited opening talk
`at North American Photography Festival “Contact”, May 1, 2004,
`Toronto (ON).
`79. Albert J.P. Theuwissen : “Characteristics of CMOS Image Sensors”,
`Invited talk at the 2nd Fraunhofer CMOS Image Sensor Workshop, May
`25-26, 2004, Duisburg (Germany).
`80. Albert J.P. Theuwissen : “Photography on Mars”, Journee d’Etudes –
`Les capteurs d’images CCD-CMOS Etat de l’Art, Paris (France), June
`4, 2004.
`81. Albert J.P. Theuwissen : “Image Processing Chain in a Digital Still
`Camera”, Invited plenary talk at IEEE Symposium on VLSI Circuits,
`Honolulu (HA), June 17-19, 2004.
`82. Albert J.P. Theuwissen : “Image Sensors for Ambient Intelligence
`Applications”, Invited talk at Philips Symposium on Hardware Drivers
`for Ambient
`Intelligence, Dec. 9-10, 2004, Veldhoven
`(the
`Netherlands).
`83. M.F. Snoeij, A.J.P. Theuwissen, J.H. Huijsing : “A 1.8 V 3.2 W
`Comparator for Use in a CMOS Imager Column-Level Single-Slope
`ADC”, ISCAS2005, Kobe, May 2005.
`84. M.F. Snoeij, A.J.P. Theuwissen, J.H.Huising : “A Low-Power
`Column-Parallel 12-bit ADC for CMOS Imagers”, IEEE Workshop on
`CCDs and Advanced Image Sensors, Karuizawa, June 9-11, 2005.
`85. M.F. Snoeij, A.P. van der Wel, A.J.P. Theuwissen, J.H. Huijsing :
`“The Effect of Switched-Biasing on 1/f Noise in CMOS Imager Front-
`Ends”, IEEE Workshop on CCDs and Advanced Image Sensors,
`Karuizawa, June 9-11, 2005.
`86. Xinyang Wang, Padmakumar R. Rao, Erik Bodegom, Albert J.P.
`Theuwissen
`: “Characterization of surface and buried channel
`MOSFET as on-pixel amplifier in CMOS image sensors”, 2005 Micro
`
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`

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`Nano Breakthrough Conference, July 25-28, Portland State Univ.,
`Portland, Oregon.
`87. Jan T. Bosiers, Inge Peters, Cees Draijer, Albert Theuwissen :
`“Overview : Technical Challenges and Recent Progress in CCD
`Imagers”, Invited Paper at Pixel2005 Workshop, Bonn, Sept. 5-8, 2005,
`88. Davies William de Lima Monteiro, Thomas Nirmaier, Gleb V.
`Vdovin and Albert J.P. Theuwissen
`: “Fast Hartmann-Shack
`Wavefront Sensors Manufactured in Standard CMOS Technology”,
`IEEE Sensors Journal, Vol. 5, Oct. 2005, pp. 976-982.
`89. Albert J.P. Theuwissen, Jan T.J. Bosiers, Edwin Roks : “The Hole
`Role”, Invited paper at IEDM 05, Washington DC, Techn. Dig., 2005.
`90. Albert J.P. Theuwissen : “Influence of Terrestrial Cosmic Rays on the
`Reliability of CCD Imagers”, IEDM 05, Washington DC, Techn. Dig.,
`2005.
`91. Albert J.P. Theuwissen, Martijn F. Snoeij, X. Wang, Padmakumar
`R. Rao, and Erik Bodegom : “CMOS Image Sensors For Ambient
`Intelligence”, as a chapter in : “Hardware Technology Drivers of
`Ambient Intelligence”, edited by S. Mukherjee, 2006, pp. 125-150.
`92. M.F. Snoeij, A. Theuwissen, K. Makinwa, J.H. Huijsing : “A CMOS
`Imager with Column-Level ADC Using Dynamic Column FPN
`Reduction“, ISSCC, San Francisco, Digest Tech. Papers, p. 498-499,
`Febr. 5-9, 2006.
`93. Albert Theuwissen : “Influence of Terrestrial Cosmic Rays on Solid-
`State
`Image Sensors”, Spektrum Forum, April 21, 2006,
`Fachhochschule, Koeln.
`94. Albert Theuwissen : “The Hole Role”, Invited talk at the 3rd Fraunhofer
`CMOS
`Image Sensor Workshop, May 16-17, 2006, Duisburg
`(Germany).
`95. Xinyang Wang, Padmakumar Rao, Albert Theuwissen : “Fixed-
`Pattern Noise Induced by Transmission Gate in Pinned 4T CMOS
`Image Sensor Pixels”, ESSDERC, Montreux, Switzerland, 2006.
`96. Martijn Snoeij, Albert Theuwissen, Kofi Makinwa, Johan Huijsing :
`“Column-Parallel Single-Slope ADCs for CMOS Image Sensors”,
`invited key-note speech, Eurosensors, Gothenburg, Sweden, Sept.
`2006.
`97. Jan T. Bosiers, Inge M. Peters, Cees Draijer, Albert Theuwissen :
`“Technical Challenges and Recent Progress in CCD Imagers”, Nuclear
`Inst. And Methods in Physics Research A, Sept. 2006, pp. 148-156.
`98. Johan Leijtens, Albert Theuwissen, Pierre Magnan : “Smart FPA’s :
`Are They Worth The Effort ?”, SPIE Conference, Stockholm, Sept. 13th,
`2006.
`: Technology and
`“Photographing Mars
`:
`99. Albert Theuwissen
`Photographs”,
`invited Luncheon speech,
`IEEE Bipolar/BiCMOS
`Circuits an